CN212364511U - Multifunctional microwave circuit detection and maintenance device - Google Patents
Multifunctional microwave circuit detection and maintenance device Download PDFInfo
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- CN212364511U CN212364511U CN202021560301.7U CN202021560301U CN212364511U CN 212364511 U CN212364511 U CN 212364511U CN 202021560301 U CN202021560301 U CN 202021560301U CN 212364511 U CN212364511 U CN 212364511U
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Abstract
The utility model discloses a multi-functional microwave circuit detects maintenance device relates to microwave subsides and pastes dress device test technical field, including base, radio frequency port, first local oscillator port, second local oscillator port, intermediate frequency port, power control port, altitude mixture control spare, surveyed a pin mounting, surveyed a spacing control, microstrip mainboard. The utility model can be used for testing multi-pin and multi-port microwave surface-mounted devices, has the characteristics of convenient operation and excellent performance, and well meets the production test work of mass products; because the device skillfully adds the window opening design in the auxiliary circuit and realizes the switch independent switching and automatic test design of the internal device of the tested piece, the device provides convenience for the work of a test engineer; the microwave circuit can be monitored on line and switched into a state, so that the operation time is saved for judging and positioning the microwave circuit faults; the method can be widely applied to the test and maintenance of various microwave circuits, and has important application value and practical significance.
Description
Technical Field
The utility model relates to a microwave pastes dress device test technical field, concretely relates to multi-functional microwave circuit detects maintenance device.
Background
With the rapid development of microwave technology, the functions of microwave circuits are more and more complicated, and the microwave circuits used by each product can be verified whether to meet the requirements of product technical conditions and complete the functions of product design through the processes of testing, debugging and the like. In order to realize high gain of the circuit or the component, the requirement must be met by designing multi-channel amplification, and the designed multi-channel amplification circuit needs to be realized through distribution, amplification, synthesis and other links. Therefore, the number of amplifiers and amplification stages required increases as the number of channels and indices increase. And along with the complexity of product functions, the interfaces between the devices and the outside are more and more increased, so that the test problem of the microwave devices produced in batches becomes more and more complicated, the more accurate test becomes more and more difficult, and meanwhile, the circuit or the assembly which cannot meet the requirements needs to meet the electrical function by debugging engineers to troubleshoot and position the circuit or the assembly and combining the replacement of the devices. Because the functions of the circuits are complex, the number of channels is large, microwave crosstalk among the functional circuits causes mutual influence, and the functions of the functional circuits are realized through multipath amplification, isolation and the like in the channels, which brings great challenges and difficulties to the test, debugging and maintenance of the functional circuits.
At present, the power supply connecting wire of a circuit is mainly dismounted and mounted again for debugging and maintenance of a large-scale single-path or multi-path functional circuit and a power amplifier, the requirement on whether the function is met or not is judged by monitoring the indexes of products for multiple times, and in order to meet the indexes of some products, multiple frequency shifting is adopted during design, so that fault location can be carried out only through multiple signal monitoring, power failure processing must be carried out on the products in the process, the operation cost is long, the appearance of the products is influenced, and the operation requirement on personnel is higher. The above-mentioned problems are to be solved, and a multifunctional microwave circuit inspection and maintenance device is provided.
SUMMERY OF THE UTILITY MODEL
The utility model discloses the technical problem that will solve lies in: how to solve the problems of difficult testing, troubleshooting, positioning and the like caused by complex product functions, multiple device interfaces and complicated testing problems of microwave devices, and provides a multifunctional microwave circuit detection and maintenance device.
The utility model solves the technical problems by the following technical proposal, the utility model comprises a base, a radio frequency port, a first local oscillator port, a second local oscillator port, an intermediate frequency port, a power control port, a height adjusting piece, a tested piece pin fixing piece, a tested piece limit control piece and a micro-strip mainboard, wherein the radio frequency port, the first local oscillator port, the second local oscillator port, the intermediate frequency port, the power control port, the height adjusting piece, the tested piece pin fixing piece, the tested piece limit control piece and the micro-strip mainboard are all arranged on the base;
first connectors are arranged among the radio frequency port, the first local oscillator port, the intermediate frequency port and the microstrip mainboard and are connected with the microstrip mainboard through the first connectors;
a second connector is arranged between the second local oscillator port and the microstrip mainboard, the second local oscillator port is connected with the microstrip mainboard through the second connector, and high-frequency signal transmission between a tested piece and an external test system is realized through the second connector;
a third connector is arranged between the power supply control port and the microstrip mainboard, the power supply control port is connected with the microstrip mainboard through the third connector, and an external test system adds voltage and control signals required by the work of a tested piece through the third connector;
the micro-strip mainboard is connected with a tested piece, and the micro-strip mainboard realizes signal exchange between the tested piece and an external test system through the radio frequency port, the first local oscillator port, the second local oscillator port, the intermediate frequency port and the power control port.
Further, be equipped with a plurality of independent change over switch on the microstrip mainboard, it is a plurality of independent change over switch is the matrix setting, each independent change over switch is connected with each chip in being surveyed the piece according to the test needs, and is through a plurality of independent change over switch can carry out automatic acquisition and control each way operating current's break-make to the operating current of being surveyed single or a plurality of chips in the piece, is convenient for realize real-time supervision to the operating condition of being surveyed the piece, and product reliability and work efficiency improve greatly, and change over switch and the inside chip one-to-one of corresponding utensil quilt survey piece, during the test, combine software, can realize the collection of single way or multichannel electric current as required.
Furthermore, the first connector is an SMA-KFD radio frequency connector.
Further, the second connector is an SMA-KFK connector.
Further, the third connector is a J30J-9ZKP connector.
Furthermore, the height adjusting piece is perpendicular to the plane of the base and connected with the plane of the base, and the height adjusting piece has a height adjusting range of +/-0.2 mm and is used for being compatible with the use requirements of the tested pieces with different heights.
Furthermore, the tested part pin fixing part is rotationally connected with the base through a fixing shaft, and the tested part pin fixing part is turned over during use and is fastened with the height adjusting part, so that the tested part is fixed.
Furthermore, the tested part pin fixing part is of a frame structure, and a reserved window is formed in the middle of the tested part pin fixing part.
Furthermore, the tested part limiting control part adopts two U-shaped gold-plated parts which are arranged in a face-to-face mode and used for fixing the placing position of the tested part and ensuring that the tested part is correctly connected with a corresponding circuit on the micro-strip main board.
Compared with the prior art, the utility model has the following advantages: the device can be used for testing multi-pin and multi-port microwave surface-mounted devices, has the characteristics of convenience in operation and excellent performance, and well meets the production test work of mass products; because the device skillfully adds the window opening design in the auxiliary circuit and realizes the switch independent switching and automatic test design of the internal device of the tested piece, the device provides convenience for the work of a test engineer; the microwave circuit can be monitored on line and switched into a state, so that the operation time is saved for judging and positioning the microwave circuit faults; the method can be widely applied to the test and maintenance of various microwave circuits, and has important application value and practical significance.
Drawings
Fig. 1 is a top view of the multifunctional microwave circuit inspecting and repairing device according to the embodiment of the present invention when the device is opened;
FIG. 2 is a real-time plan view of the multifunctional microwave circuit inspecting and repairing device in the embodiment of the present invention;
fig. 3 is a front view of the multifunctional microwave circuit inspection and maintenance device in the embodiment of the present invention;
fig. 4 is a side view of the multifunctional microwave circuit inspecting and maintaining device in the embodiment of the present invention;
fig. 5 is a schematic diagram of a test connection of a device under test according to an embodiment of the present invention.
Detailed Description
The embodiments of the present invention will be described in detail below, and the present embodiment is implemented on the premise of the technical solution of the present invention, and a detailed implementation manner and a specific operation process are given, but the scope of the present invention is not limited to the following embodiments.
As shown in fig. 1 to 4, the present embodiment provides a technical solution: a multifunctional microwave circuit detection and maintenance device comprises a base 1, a radio frequency port 2, a first local oscillator port 3, a second local oscillator port 4, an intermediate frequency port 5, a power control port 6, a height adjusting piece 7, a tested piece pin fixing piece 8, a tested piece limiting control piece 9 and a microstrip mainboard 10, wherein the radio frequency port 2, the first local oscillator port 3, the second local oscillator port 4, the intermediate frequency port 5, the power control port 6, the height adjusting piece 7, the tested piece pin fixing piece 8, the tested piece limiting control piece 9 and the microstrip mainboard 10 are all arranged on the base 1;
first connectors are arranged among the radio frequency port 2, the first local oscillator port 3, the intermediate frequency port 5 and the microstrip mainboard 10, and are connected with the microstrip mainboard 10 through the first connectors;
a second connector is arranged between the second local oscillator port 4 and the microstrip mainboard 10, the second local oscillator port 4 is connected with the microstrip mainboard 10 through the second connector, and high-frequency signal transmission between a tested piece and an external test system is realized through the second connector;
a third connector is arranged between the power control port 6 and the microstrip mainboard 10, the power control port 6 is connected with the microstrip mainboard 10 through the third connector, and an external test system adds voltage and control signals required by the work of a tested piece through the third connector;
the micro-strip mainboard 10 is connected with a tested piece through a micro-strip line (a left strip line in fig. 1), and the micro-strip mainboard 10 realizes signal exchange between the tested piece and an external test system through the radio frequency port 2, the first local oscillator port 3, the second local oscillator port 4, the intermediate frequency port 5 and the power control port 6.
Be equipped with a plurality of independent change over switch (right side middle part in figure 1) on the microstrip mainboard 10, it is a plurality of independent change over switch is the matrix setting, each independent change over switch is connected with the chip in being surveyed the piece according to the test needs, and is through a plurality of independent change over switch can carry out automatic acquisition and control each way operating current's break-make to the operating condition who is surveyed the piece to the operating current of being surveyed single or a plurality of chip in the piece, is convenient for realize real-time supervision to the operating condition who is surveyed the piece, and product reliability and work efficiency improve greatly, and change over switch is surveyed an inside chip one-to-one with corresponding utensil, during the test, combines software, can realize the collection of one way or multichannel electric current as required.
The first connector is an SMA-KFD332 radio frequency connector.
The second connector is an SMA-KFK connector.
The type of the third connector is determined according to the product characteristics of the tested piece, and in the embodiment, the third connector is a J30J-9ZKP connector.
The tested part pin fixing part 8 is rotationally connected with the base 1 through a fixing shaft, the tested part pin fixing part 8 is turned over during use and is tightly buckled with the height adjusting part 7, and the tested part is compressed and fixed.
The tested part pin fixing part 8 is provided with a window, when the tested part pin fixing part 8 is buckled with the height adjusting part 7, the pin of the tested part is correspondingly connected with the microstrip line on the microstrip mainboard 10, external testing equipment can be connected with the pin of the tested part from the window, windowing design is carried out in the tested part pin fixing part 8, and real-time monitoring and testing of any circuit of the tested part can be realized by means of the external testing equipment.
The tested part limiting control part 9 adopts two U-shaped gold-plated parts, is arranged on the base 1 in a face-to-face installation mode and is used for limiting the placement position of the tested part and ensuring that the tested part is correctly connected with a corresponding circuit on the microstrip mainboard 10.
As shown in fig. 5, the tested device is connected to the microstrip motherboard 10 by pressing contact, and the peripheral circuit on the microstrip motherboard 10 provides the working condition of the tested circuit. The power supply of the tested piece is introduced from the power supply control port 6 and outputs 3V voltage after passing through the voltage stabilizing integrated block.
The working principle is as follows: firstly, a tested piece is placed on a micro-strip mainboard 10 and is controlled and fixed by a tested piece pin fixing part 8 and a tested piece limiting control part 9 together, so that the tested piece is correctly connected with a corresponding circuit on the micro-strip mainboard 10. Each port is correctly connected with the micro-strip mainboard 10 by adopting a corresponding connector, and then after each port is connected with an external test system, a high-frequency input signal required by a tested piece is added into the radio frequency port 2, the first local oscillator port 3, the second local oscillator port 4 and the intermediate frequency port 5, and a low-frequency signal is accessed into the power control port 6 according to the product requirement of the tested piece, so that the function of the product is tested.
The detection maintenance device in the embodiment considers the parallel power supply of the working voltage of each stage of amplifier according to the product characteristics of the tested piece, and can quickly solve the fault of small working current. When the working current is small, the current detection of a single path can be carried out, and the chips with small current are found by checking one by one according to the characteristics of the chips in the tested piece, so that the quick fault maintenance is realized. Such as: the inside chip that has 3 different models of a certain piece formula measured, with whole unit mount on microstrip mainboard 10, through measured a pin mounting 8 and measured a spacing control 9 common control of piece fixed, the electric current of every chip is 80mA when the subassembly normally works, three chip during simultaneous operation electric current is 240mA, the peripheral circuit's on the detection maintenance device of this embodiment operating current is about 50mA simultaneously, the subassembly is total current 290mA when normally working. If the working current test is 210mA, one chip fails, if a conventional detection method is adopted, the power supply needs to be turned off for multiple times, the power supply gold wire of each chip is disconnected from the assembly, and the currents of the other two chips in working are observed to judge which chip fails.
The detection and maintenance device of the embodiment can greatly simplify the test flow, because the whole assembly is arranged on the micro-strip mainboard 10, the independent change-over switch which is added on the micro-strip mainboard 10 and controls the working voltage of each chip inside the tested piece can control the on-off of a single path or multiple paths according to the production test requirement, namely, the working voltage power supply ends corresponding to different chips are switched on or off, and the on-off and collection of the working current of the single path or multiple paths of chips are realized. Such as: the independent change over switch that corresponds first way at first cuts off, and the switching of other two ways is put through, observes and shows the electric current, through switching and acquisition current, alright carry out fault localization to the product fast, need not frequently close and open the instrument power, and need not carry out the broken circuit processing to the gold wire of product inside, has also practiced thrift the time of circulation between the work load that the gold wire resumes and the process. Simple operation and rapid fault location.
Along with the requirements of functions and indexes of products are higher and higher, the integration level of components and the number of stages of amplifiers are more and more, all devices are interconnected, the influence of the design of a matching circuit on the performance of the devices is increased, and the fault phenomena of the products are relatively dispersed in production. The reserved window of the detection and maintenance device of the embodiment realizes the integration of detection and maintenance and can quickly solve the fault of product gain subclass. And through the reserved window, the signal points of all stages of circuits are detected and judged by means of a multimeter and a detection cable, so that real-time monitoring and testing of any circuit of the tested piece are ensured.
In conclusion, the multifunctional microwave circuit detection and maintenance device can be used for testing multi-pin and multi-port microwave surface-mounted devices, has the characteristics of convenience in operation and excellent performance, and well meets the production test work of mass products; because the device skillfully adds the window opening design in the auxiliary circuit and realizes the switch independent switching and automatic test design of the internal device of the tested piece, the device provides convenience for the work of a test engineer; the microwave circuit can be monitored on line and switched into a state, so that the operation time is saved for judging and positioning the microwave circuit faults; the method can be widely applied to the test and maintenance of various microwave circuits, and has important application value and practical significance.
Although embodiments of the present invention have been shown and described, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art without departing from the scope of the present invention.
Claims (8)
1. A multifunctional microwave circuit detection and maintenance device is characterized by comprising a base, a radio frequency port, a first local oscillator port, a second local oscillator port, an intermediate frequency port, a power control port, a height adjusting piece, a tested piece pin fixing piece, a tested piece limiting control piece and a micro-strip main board, wherein the radio frequency port, the first local oscillator port, the second local oscillator port, the intermediate frequency port, the power control port, the height adjusting piece, the tested piece pin fixing piece, the tested piece limiting control piece and the micro-strip main board are all arranged on the base;
first connectors are arranged among the radio frequency port, the first local oscillator port, the intermediate frequency port and the microstrip mainboard and are connected with the microstrip mainboard through the first connectors;
a second connector is arranged between the second local oscillator port and the microstrip mainboard, and the second local oscillator port is connected with the microstrip mainboard through the second connector;
a third connector is arranged between the power supply control port and the microstrip mainboard, and the power supply control port is connected with the microstrip mainboard through the third connector;
the micro-strip mainboard is connected with a tested piece, and the micro-strip mainboard realizes signal exchange between the tested piece and an external test system through the radio frequency port, the first local oscillator port, the second local oscillator port, the intermediate frequency port and the power control port.
2. The multifunctional microwave circuit detection and maintenance device of claim 1, wherein: the microstrip mainboard is provided with a plurality of independent change over switches, and is a plurality of the independent change over switches are arranged in a matrix form, and each of the independent change over switches is connected with each chip in the tested piece according to the test requirement, and is a plurality of the independent change over switches automatically collect the working current of a single or a plurality of chips in the tested piece and control the on-off of each working current.
3. The multifunctional microwave circuit detection and maintenance device of claim 1, wherein: the first connector is an SMA-KFD radio frequency connector.
4. The multifunctional microwave circuit detection and maintenance device of claim 1, wherein: the second connector is an SMA-KFK connector.
5. The multifunctional microwave circuit detection and maintenance device of claim 1, wherein: the height adjusting piece is perpendicular to the plane of the base and connected with the base.
6. The multifunctional microwave circuit detection and maintenance device of claim 1, wherein: and the tested part pin fixing part is rotationally connected with the base.
7. The multifunctional microwave circuit detection and maintenance device of claim 1, wherein: the tested part pin fixing piece is of a frame structure, and a reserved window is formed in the middle of the tested part pin fixing piece.
8. The multifunctional microwave circuit detection and maintenance device of claim 1, wherein: the tested part limiting control part comprises two U-shaped gold-plated parts, the two U-shaped gold-plated parts are symmetrically arranged on the base, and the tested part is located between the two U-shaped gold-plated parts.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021560301.7U CN212364511U (en) | 2020-07-31 | 2020-07-31 | Multifunctional microwave circuit detection and maintenance device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021560301.7U CN212364511U (en) | 2020-07-31 | 2020-07-31 | Multifunctional microwave circuit detection and maintenance device |
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| Publication Number | Publication Date |
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| CN212364511U true CN212364511U (en) | 2021-01-15 |
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| CN202021560301.7U Active CN212364511U (en) | 2020-07-31 | 2020-07-31 | Multifunctional microwave circuit detection and maintenance device |
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| CN (1) | CN212364511U (en) |
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