CN213302432U - Function testing device and system - Google Patents

Abstract

The application relates to a functional test device and system, functional test device includes: the test assembly comprises a first adapter plate, a plurality of first connectors and a test assembly. This application functional test device is through being provided with a plurality of first connectors, and a plurality of first connectors divide into different signal groups with the output signal of first switching board according to type etc. tests a plurality of signal groups through the test component and can confirm whether functional test device breaks down to and the position point of trouble. And all cables and electronic devices do not need to be checked one by one, and only the first connector corresponding to the failed signal and the cable connected with the first connector need to be checked, so that the checking frequency is greatly reduced. The function test device that this application provided has solved the technical problem that present function test equipment that exists overhauls and maintenance efficiency is low among the prior art, has reached the technological effect who improves function test equipment and overhauls and maintain efficiency.

Description

Function testing device and system

Technical Field

The present application relates to the field of device testing technologies, and in particular, to a function testing apparatus and system.

Background

Functional Circuit Test (FCT) is a method for providing a simulated operating environment, such as excitation and load, to a Test target board (UUT: Unit Under Test), so that the Test target board works in various design states, thereby obtaining parameters of each state, and verifying whether the function of the Test target board is normal or not by using the parameters. The test target board has a plurality of test points, each test point has a signal, and since a signal needs to be transmitted through one cable, the functional test equipment has a plurality of cables. However, once the functional test device fails, when the functional test device needs to be checked, all cables need to be checked one by one, which results in a large workload, and thus, the current functional test device has low overhaul and maintenance efficiency.

SUMMERY OF THE UTILITY MODEL

In view of the above, it is necessary to provide a functional testing apparatus and system for solving the problem of low repair and maintenance efficiency of the current functional testing equipment.

A functional test apparatus for testing a function of a test target board, the test target board including a plurality of first target test sites, the functional test apparatus comprising:

the first adapter plate comprises a plurality of first test points, and the first test points are respectively electrically connected with the first target test sites in a one-to-one correspondence manner;

the first connectors are arranged on the first adapter plate, each first connector comprises a plurality of first connecting points, and each first connecting point is electrically connected with one first test point;

and the test assembly is electrically connected with the plurality of first connectors and used for carrying out functional test on the test target board according to the output signals of the plurality of first connectors.

In one embodiment, the plurality of first test points includes: the test circuit comprises an analog-digital signal test point, a communication signal test point and a power signal test point; the plurality of first connectors includes:

the analog-digital signal connector is arranged on the first adapter plate, one end of the analog-digital signal connector is electrically connected with the analog-digital signal test point, and the other end of the analog-digital signal connector is electrically connected with the test component;

the communication signal connector is arranged on the first adapter plate, one end of the communication signal connector is electrically connected with the communication signal test point of the first adapter plate, and the other end of the communication signal connector is electrically connected with the test component;

and the power supply signal connector is arranged on the first adapter plate, one end of the power supply signal connector is electrically connected with the power supply signal test point of the first adapter plate, and the other end of the power supply signal connector is electrically connected with the test component.

In one embodiment, the test target plate further comprises a plurality of second target test sites, the test target plate comprises a first test surface and a second test surface opposite to each other, the first target test sites are exposed on the first test surface, the second target test sites are exposed on the second test surface, and the functional test device further comprises:

the second adapter plate comprises a plurality of second test points, and the plurality of second test points are respectively and correspondingly electrically connected with the plurality of second target test sites one by one; the second adapter plate is electrically connected with the first adapter plate.

In one embodiment, the method further comprises the following steps:

and one end of the signal cable is electrically connected with the second adapter plate, and the other end of the signal cable is detachably and electrically connected with the first adapter plate.

In one embodiment, the function testing apparatus further includes:

the plurality of second connectors are arranged on the second adapter plate, each second connector comprises a plurality of second connection points, and each second connection point is electrically connected with one second test point;

the test assembly is electrically connected with the plurality of second connectors and is further used for carrying out functional test on the test target board according to output signals of the plurality of second connectors.

In one embodiment, the method further comprises the following steps:

and the plurality of electrical contact pins are arranged on the first adapter plate, and each electrical contact pin is electrically connected with one first test point and one first target test site respectively.

In one embodiment, the test assembly comprises:

the input end of the test chip is electrically connected with the plurality of first connectors, and the test chip is used for carrying out functional test on the test target board according to the output signals of the plurality of first connectors;

and the control switch is electrically connected with the control end of the test chip and is used for controlling the working state of the test chip.

In one embodiment, the test assembly further comprises:

and one end of the power switch is electrically connected with the power end of the test chip, the other end of the power switch is used for connecting an external power supply, and the power switch is used for controlling the external power supply to supply power to the test chip.

A functional test system, comprising:

a functional test device as described above;

the test target plate comprises a plurality of first target test sites, and the first target test sites are respectively and correspondingly electrically connected with the first test points one by one.

In one embodiment, the method further comprises the following steps:

the first aerial plug is arranged on the first adapter plate, and a plurality of leads on the first aerial plug are electrically connected with the first test points respectively;

and the second aerial plug is arranged on the test target board, a plurality of leads on the second aerial plug are respectively and electrically connected with the plurality of first target test sites, and the second aerial plug is matched with the first aerial plug.

The embodiment of the application provides a function test device, includes: the first adapter plate, the plurality of first connectors, and the test assembly. The embodiment of the application function test device is through being provided with a plurality of first connectors, a plurality of first connectors will the output signal of first switching board divides into different signal groups according to type etc. through test assembly is to a plurality of the signal group is tested and can be confirmed whether function test device breaks down to and the position point of trouble. And all cables and electronic devices do not need to be checked one by one, and only the first connector corresponding to the failed signal and the cable connected with the first connector need to be checked, so that the checking frequency is greatly reduced. The embodiment of the application provides function test device has solved the technical problem that present function test equipment overhauls and the maintenance inefficiency that exists among the prior art, has reached and has improved function test equipment overhauls and the technical effect of maintenance efficiency.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments or the conventional technologies of the present application, the drawings used in the descriptions of the embodiments or the conventional technologies will be briefly introduced below, it is obvious that the drawings in the following descriptions are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a schematic structural diagram of a functional testing apparatus according to an embodiment of the present application;

FIG. 2 is a schematic partial structure diagram of a functional testing apparatus according to an embodiment of the present application;

FIG. 3 is a schematic structural diagram of a functional testing apparatus according to an embodiment of the present application;

FIG. 4 is a schematic structural diagram of a functional testing apparatus according to an embodiment of the present application;

FIG. 5 is a schematic structural diagram of a functional testing device testing assembly according to an embodiment of the present application;

FIG. 6 is a schematic structural diagram of a functional test system according to an embodiment of the present application;

fig. 7 is a schematic structural diagram of a functional test system according to an embodiment of the present application.

Description of reference numerals:

10. a function testing device;

100. a first transfer plate;

110. a first test point;

200. a first connector;

210. an analog-to-digital signal connector;

220. a communication signal connector;

230. a power signal connector;

300. testing the component;

310. testing the chip;

320. a control switch;

330. a power switch;

400. a second adapter plate;

410. a second test point;

500. a signal cable;

600. a second connector;

800. electrical pin insertion;

20. a functional test system;

21. testing a target board;

22. a first target test site;

23. a second target test site;

24. a first air navigation plug;

25. and a second aviation plug.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, a function testing apparatus and a system of the present application are further described in detail by embodiments and with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

The numbering of the components as such, e.g., "first", "second", etc., is used herein only to distinguish the objects as described, and does not have any sequential or technical meaning. The term "connected" and "coupled" when used in this application, unless otherwise indicated, includes both direct and indirect connections (couplings). In the description of the present application, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations or positional relationships based on those shown in the drawings, and are used only for convenience in describing the present application and for simplicity in description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, are not to be considered as limiting the present application.

In this application, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through intervening media. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

An embodiment of the present application provides a function test apparatus 10 for testing a function of a test target board 21. The test target board 21 refers to a circuit board or a chip with functionality to be tested, and the surface of the test target board 21 is generally provided with a plurality of first target test sites 22, for example, an a320 board of an OBD device, which includes 54 test points, that is, 54 first target test sites 22.

Referring to fig. 1, an embodiment of the present application provides a function testing apparatus 10, including: a first adapter plate 100, a first connector 200, and a test assembly 300.

The first adapter board 100 includes a plurality of first test points 110, and the first test points 110 are electrically connected to the first target test sites 22 in a one-to-one correspondence manner, so as to implement signal transmission between the first adapter board 100 and the test target board 21. The first adapter plate 100 may be a PCBA plate that includes two sides, such as a TOP side (i.e., the TOP side of the PCBA plate) and a BOTTOM side (i.e., the BOTTOM side of the PCBA plate), to which the first target test site 22 may be exposed or to which the BOTTOM side is exposed. In practical use, the first test points 110 correspond to the first target test sites 22 and are electrically connected one by one, and signals of the plurality of first target test sites 22 are switched to the first test points 110, that is, to the first adapter plate 100. The first test point 110 and the first target test site 22 may be connected by a flat cable, or may be connected by a pin, which is not limited in this embodiment and may be specifically selected or set according to actual situations.

The number of the first connectors 200 is plural, a plurality of the first connectors 200 are all disposed on the first adapter plate 100, and each of the first connectors 200 includes a plurality of first connection points, and each of the first connection points is electrically connected to one of the first test points 110. For example, the number of the first connectors 200 is M, and each of the connectors is provided with N first connection points, so that the number of the corresponding first test points 110 is MN, and each of the first connection points is electrically connected to each of the first test points 110 in a one-to-one correspondence manner. Each of the first connection points serves as a communication channel of each of the first test points 110, and may be connected to the first connection point through a communication cable, or may be connected to the first connection point through a pin or the like. The M first connectors 200 divide the signals of the MN first test points 110 into M groups, and group the signals of the MN first test points 110 according to the category and the like. The first connector 200 may be a terminal or the like, or may be other electronic devices having a signal transmission function, and the present embodiment does not limit the specific type, model, and the like of the first connector 200, and only needs to satisfy the function of implementing the channel-by-channel transmission of the signals of the plurality of first test points 110.

The test assembly 300 is electrically connected to the plurality of first connectors 200, and the test assembly 300 is configured to perform a functional test on the test target board 21 according to the output signals of the plurality of first connectors 200. The function test is to test whether or not a plurality of functions of the test target board 21 are normal, and may compare the test parameter preset parameter range or the standard parameter range of the obtained output signal, and determine whether or not the functions of the test target board 21 are normal by determining whether or not the test parameter is within the preset parameter range or the standard parameter range. The testing component 300 may be a controller, a control chip, or the like, which is not limited in this embodiment and can be specifically selected according to actual situations. The output signals of the first connector 200 include a plurality of types, and a plurality of different output signals are used to represent different functional parameters of the test target board 21, the test component 300 can determine whether the function of the test target board 21 is normal by comparing the test parameters with a preset parameter range or a standard parameter range, and when part of the functions of the test target board 21 fails, a worker can conveniently determine the type of the failure through a signal corresponding to the failure, so that the worker can process the failure in time.

The working principle of the function testing device 10 provided by the embodiment of the application is as follows:

the functional testing device 10 provided by the embodiment of the present application includes the first adapter plate 100, the first connector 200, and the testing component 300. The plurality of first test points 110 of the first adapter board 100 are electrically connected to the plurality of first target test sites 22 of the test target board 21 in a one-to-one correspondence, and transmit signals of the first target test sites 22 to the plurality of first connectors 200. The plurality of first connectors 200 classify the signals of the plurality of first target test sites 22 according to categories, etc., and transmit the signals to the test module 300 for testing. When function test device 10 appears unusually and need overhaul, only need pass through test component 300's test result can judge which kind of signal appears unusually, then to the first connector 200 that this abnormal signal corresponds and with the cable that first connector 200 is relevant carries out the investigation one by one and can determine trouble cable and in time handle.

The embodiment of the present application provides a function testing device 10, including: the first adapter plate 100, the plurality of first connectors 200, and the test assembly 300. In the embodiment of the present application, the function testing device 10 is provided with the plurality of first connectors 200, the plurality of first connectors 200 divide the output signal of the first adaptor board 100 into different signal groups according to types and the like, and the test component 300 is used to test a plurality of signal groups to determine whether the function testing device fails or not and the location of the failure. And all cables and electronic devices do not need to be checked one by one, and only the first connector 200 corresponding to the failed signal and the cable connected with the first connector 200 need to be checked, so that the checking frequency is greatly reduced. The embodiment of the application provides function test device 10 has solved the technical problem that present function test equipment overhauls and the maintenance inefficiency that exists among the prior art, has reached and has improved function test equipment overhauls and the technical effect of maintenance efficiency.

Referring to fig. 2, in an embodiment, the signals on the test target board 21 generally include analog-to-digital signals, communication signals, and power supply signals, and the corresponding test points can be classified into three types according to the types: an analog-to-digital signal test point, a communication signal test point, and a power signal test point. The number of the first connectors 200 is plural, each of the first connectors 200 is connected to a test point, and the plural first connectors 200 may include plural different types of connectors, for example: an analog-to-digital signal connector 210, a communication signal connector 220, and a power signal connector 230.

The analog-to-digital signal connector 210 is disposed on the first adapter board 100, and one end of the analog-to-digital signal connector 210 is electrically connected to the analog-to-digital signal test point, and may be connected through a connection cable or a contact pin, and the embodiment is not particularly limited. The other end of the analog-to-digital signal connector 210 is electrically connected to the test assembly 300. The analog-to-digital signal connector 210 may also be connected by a connecting cable or pin, etc. The analog-to-digital signal connector 210 is configured to transmit an analog-to-digital signal, that is, an ADC signal, and the analog-to-digital signal connector 210 classifies the analog-to-digital signal and the cable transmitting the analog-to-digital signal into a group to form an analog-to-digital signal group, so as to facilitate fault location of the analog-to-digital signal and the cable transmitting the analog-to-digital signal during subsequent maintenance. The analog-to-digital signal connector 210 may be a signal terminal, and the connection number of the analog-to-digital signal connector 210 may be specifically set according to an actual situation, which is not specifically limited in this embodiment, and only needs to satisfy a function of transmitting the analog-to-digital signal.

The communication signal connector 220 is disposed on the first adapter plate 100, and one end of the communication signal connector 220 is electrically connected to a communication signal test point of the first adapter plate 100, and may be connected through a connection cable or a pin, and the embodiment is not particularly limited. The other end of the communication signal connector 220 is electrically connected to the testing component 300, and may also be connected via a connecting cable or a pin. The communication signal connector 220 is used for transmitting communication signals, and the communication signal connector 220 classifies the communication signals and cables for transmitting the communication signals into one type to form a communication signal group, so that fault location is performed on the communication signals and the cables for transmitting the communication signals during subsequent maintenance. The communication signal connector 220 may be a signal terminal, and the number of connection bits of the communication signal connector 220 may be specifically set according to actual conditions, which is not specifically limited in this embodiment, and only needs to satisfy the function of transmitting the communication signal.

The power signal connector 230 is disposed on the first adapter board 100, and one end of the power signal connector 230 is electrically connected to the power supply signal test point of the first adapter board 100, and may be connected through a connection cable or a contact pin, and the embodiment is not particularly limited. The other end of the power signal connector 230 is electrically connected to the test assembly 300. And may be connected by a connecting cable or pin, etc. The power signal connector 230 is used for transmitting power signals, and the power signal connector 230 classifies the power signals and cables for transmitting the power signals into one type to form a power signal group, so that fault location is performed on the power signals and the cables for transmitting the power signals during subsequent maintenance. The power signal connector 230 may be a signal terminal, etc., and the connection number of the power signal connector 230 may be specifically set according to actual conditions, which is not specifically limited in this embodiment and only needs to satisfy the function of transmitting the power signal.

Referring to fig. 3, in one embodiment, the test target board 21 further includes a plurality of second target test sites 23, the test target board 21 includes a first test surface and a second test surface opposite to each other, the first test surface and the second test surface both have target test sites, the target test sites include a first target test site 22 and a second target test site 23, the first target test site 22 is exposed on the first test surface, and the second target test site 23 is exposed on the second test surface. The function test apparatus 10 further includes: a second patch panel 400 and a signal cable 500.

For example, the first adapter plate 100 is a PCBA TOP test plate (i.e., TOP _ tester point _ PCBA plate) that is positioned opposite to the first test surface, the first test surface has a plurality of first target test sites 22, the PCBA TOP test plate surface has a plurality of first test points 110, and the plurality of first test points 110 are electrically connected to the plurality of first target test sites 22 in a one-to-one correspondence. The second adapter plate 400 is a PCBA BOTTOM test plate (i.e., a BOTTOM test point PCBA plate), the PCBA BOTTOM test plate is opposite to the second test surface, the second test surface has a plurality of second target test sites 23, the surface of the PCBA BOTTOM test plate has a plurality of second test points 410, and the plurality of second test points 410 are electrically connected with the plurality of second target test sites 23 in a one-to-one correspondence manner. The second interposer 400 is electrically connected to the first interposer 100, the test signal on the second test surface is transmitted to the first interposer 100 through the second interposer 400, and the test signals are sorted by the plurality of first connectors 200 on the first interposer 100 and transmitted to the test module 300 for testing.

The signal cable 500 includes a first end and a second end, the first end of the signal cable 500 is electrically connected to the second interposer 400, and the signal cable 500 may be fixed to the second interposer 400 by welding or the like. The second end of the signal cable 500 is electrically connected to the first interposer 100, and the second end of the signal cable 500 may be detachably connected to the first interposer 100 through a metal clip, a connector, or the like, so that the second interposer 400 is conveniently detached when only one test surface of the test target board 21 is tested.

Referring to fig. 4, in an embodiment, the function testing apparatus 10 further includes: a second interposer 400 and a second connector 600. The second interposer 400 includes a plurality of second test points 410, and the plurality of second test points 410 are electrically connected to the plurality of second target test sites 23 in a one-to-one correspondence manner. The number of the second connectors 600 is plural, the second connectors 600 are all disposed on the second interposer 400, each of the second connectors 600 includes a plurality of second connection points, and each of the second connection points is electrically connected to one of the second test points. The test assembly 300 is electrically connected to the plurality of second connectors 600, and the test assembly 300 is further configured to perform a functional test on the test target board 21 according to the output signals of the plurality of second connectors 600. The second interposer 400 is provided with a plurality of second connectors 600, so that the test signals of the second test surface can be directly divided into different signal groups on the second interposer 400 to be transmitted to the test assembly 300 for testing. The first interposer 100 and the second interposer 400 are independent from each other, and the signal on the second interposer 400 can be transmitted to the test component 300 for testing without passing through the first interposer 100, so that the signal transmission path is short and the fidelity is high.

In one embodiment, the functional test device 10 further comprises: electrical pins 800. The number of the electrical pins 800 is plural, a plurality of the electrical pins 800 are all disposed on the first adapter plate 100, and each electrical pin 800 is electrically connected to one of the first test points 110 and one of the first target test points 22. The plurality of electrical pins 800 may be fixed to the first adapter plate 100 by welding, etc. to prevent looseness caused by long-term use. A plurality of electrical pins 800 may also be disposed on the second interposer 400, and each electrical pin 800 is electrically connected to one of the second test points 410 and one of the second target test sites 23, respectively, so as to electrically connect the second test surface and the second interposer 400.

Referring to fig. 5, in one embodiment, the test assembly 300 includes: a test chip 310, a control switch 320, and a power switch 330.

The input terminal of the test chip 310 is electrically connected to the plurality of first connectors 200, and the test chip 310 is configured to perform a functional test on the test target board 21 according to the output signals of the plurality of first connectors 200. The test chip 310 may include a plurality of receiving ports, and the receiving ports are respectively connected to the ports of the first connectors 200 through signal connection lines and the like. The test chip 310 mainly determines whether the function of the test target board 21 is normal through the received test signal on the test target board 21, and determines a fault type according to a comparison result of a test signal parameter and a preset parameter or a standard parameter when the function test device 10 fails, so as to inspect the first connector 200 corresponding to the fault signal and a transmission cable connected to the first connector 200 through the fault type, thereby quickly determining a fault source.

The control switch 320 is electrically connected to the control terminal of the test chip 310, and is configured to control the working state of the test chip 310, that is, to control the on/off of the control chip. The control switch 320 may be a button switch, or a toggle switch, or the like, and the control switch 320 is not limited in this embodiment, and may be specifically selected according to actual conditions, and only needs to satisfy a function of controlling the operating state of the test chip 310.

One end of the power switch 330 is electrically connected to a power end of the test chip 310, and the other end of the power switch 330 is used for connecting an external power source, and the power switch 330 is used for controlling the external power source to supply power to the test chip 310. The power switch 330 may be a button switch, a toggle switch, or the like, and the present embodiment does not specifically limit the power switch 330, and may specifically select the power switch according to actual conditions, and only needs to satisfy the function of controlling the external power supply to supply power to the test chip 310. It should be noted that the external power of the test chip 310 in this embodiment may be directly obtained from a power grid, or may be provided by a mobile power source.

The test assembly 300 further includes a transmission structure, the test chip 310, the control switch 320 and the power switch 330 are all disposed in the transmission structure, and the transmission structure is used to provide a carrier for the test chip 310, the control switch 320 and the power switch 330, move the test target board 21 to a test site, calibrate the position of the test target board 21, and the like.

Referring to fig. 6, an embodiment of the present application provides a functional test system 20, including: a function test device 10 and a test target board 21.

The advantageous effects of the function testing device 10 are described in detail in the above embodiments, and are not described in detail herein.

The test target board 21 includes a plurality of first target test sites 22, and the plurality of first target test sites 22 are electrically connected to the plurality of first test points 110 in a one-to-one correspondence manner. Meanwhile, the test target plate 21 may include two test surfaces: a first test face and a second test face. The first test surface and the second test surface are provided with target test sites, the target test sites comprise a first target test site 22 and a second target test site 23, the first target test site 22 is exposed on the first test surface, and the second target test site 23 is exposed on the second test surface. The test target board 21 may be any chip or circuit board or the like that needs to be subjected to a functional test, and may be, for example, an a320 board of an OBD device or the like. The test target plate 21 is not particularly limited in this embodiment, and may be specifically selected or set according to actual conditions.

Referring to fig. 7, in an embodiment, the functional test system 20 further includes: a first pod 24 and a second pod 25.

The first interposer 24 is disposed on the first interposer 100, and a plurality of leads on the first interposer 24 are electrically connected to the first test points 110, respectively. The second aerial plug 25 is disposed on the test target board 21, and a plurality of leads on the second aerial plug 25 are electrically connected to the plurality of first target test sites 22, respectively. The first aviation plug 24 can be a male plug and can also be a female plug, and only the second aviation plug 25 needs to be matched with the first aviation plug 24, that is, when the first aviation plug 24 can be a male plug, the second aviation plug 25 is a female plug, and when the first aviation plug 24 can be a female plug, the second aviation plug 25 can be a male plug. When the function test is performed on the test target board 21, the first aerial plug 24 and the second aerial plug 25 are only required to be plugged, so that the electrical connection between the first aerial plug and the second aerial plug can be realized, and then the function test can be performed on the test target board 21 through the function test device 10, so that the field wiring is not needed, the misconnection of lines can be avoided, and the like, and the detection efficiency is greatly and effectively improved.

The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the claims. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (10)

1. A function testing apparatus for testing a function of a test target board including a plurality of first target test sites, the function testing apparatus comprising:

the first adapter plate comprises a plurality of first test points, and the first test points are respectively electrically connected with the first target test sites in a one-to-one correspondence manner;

the first connectors are arranged on the first adapter plate, each first connector comprises a plurality of first connecting points, and each first connecting point is electrically connected with one first test point;

and the test assembly is electrically connected with the plurality of first connectors and used for carrying out functional test on the test target board according to the output signals of the plurality of first connectors.

2. The functional test device of claim 1, wherein the plurality of first test points comprise: the test circuit comprises an analog-digital signal test point, a communication signal test point and a power signal test point; the plurality of first connectors includes:

the analog-digital signal connector is arranged on the first adapter plate, one end of the analog-digital signal connector is electrically connected with the analog-digital signal test point, and the other end of the analog-digital signal connector is electrically connected with the test component;

the communication signal connector is arranged on the first adapter plate, one end of the communication signal connector is electrically connected with the communication signal test point of the first adapter plate, and the other end of the communication signal connector is electrically connected with the test component;

and the power supply signal connector is arranged on the first adapter plate, one end of the power supply signal connector is electrically connected with the power supply signal test point of the first adapter plate, and the other end of the power supply signal connector is electrically connected with the test component.

3. The functional test device of claim 1, wherein the test target plate further comprises a plurality of second target test sites, the test target plate comprising opposing first and second test faces, the first target test sites exposed at the first test face and the second target test sites exposed at the second test face, the functional test device further comprising:

the second adapter plate comprises a plurality of second test points, and the plurality of second test points are respectively and correspondingly electrically connected with the plurality of second target test sites one by one; the second adapter plate is electrically connected with the first adapter plate.

4. The functional test device of claim 3, further comprising:

and one end of the signal cable is electrically connected with the second adapter plate, and the other end of the signal cable is detachably and electrically connected with the first adapter plate.

5. The functional test device of claim 3, further comprising:

the plurality of second connectors are arranged on the second adapter plate, each second connector comprises a plurality of second connection points, and each second connection point is electrically connected with one second test point;

the test assembly is electrically connected with the plurality of second connectors and is further used for carrying out functional test on the test target board according to output signals of the plurality of second connectors.

6. The functional test device of claim 1, further comprising:

and the plurality of electrical contact pins are arranged on the first adapter plate, and each electrical contact pin is electrically connected with one first test point and one first target test site respectively.

7. The functional testing device of claim 1, wherein the testing component comprises:

the input end of the test chip is electrically connected with the plurality of first connectors, and the test chip is used for carrying out functional test on the test target board according to the output signals of the plurality of first connectors;

and the control switch is electrically connected with the control end of the test chip and is used for controlling the working state of the test chip.

8. The functional testing device of claim 7, wherein the testing assembly further comprises:

and one end of the power switch is electrically connected with the power end of the test chip, the other end of the power switch is used for connecting an external power supply, and the power switch is used for controlling the external power supply to supply power to the test chip.

9. A functional test system, comprising:

the functional test device of any of claims 1-8;

the test target plate comprises a plurality of first target test sites, and the first target test sites are respectively and correspondingly electrically connected with the first test points one by one.

10. The functional test system of claim 9, further comprising:

the first aerial plug is arranged on the first adapter plate, and a plurality of leads on the first aerial plug are electrically connected with the first test points respectively;

and the second aerial plug is arranged on the test target board, a plurality of leads on the second aerial plug are respectively and electrically connected with the plurality of first target test sites, and the second aerial plug is matched with the first aerial plug.

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