CN212341257U - Probe fixing device for testing machine - Google Patents
Probe fixing device for testing machine Download PDFInfo
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- CN212341257U CN212341257U CN202020532601.8U CN202020532601U CN212341257U CN 212341257 U CN212341257 U CN 212341257U CN 202020532601 U CN202020532601 U CN 202020532601U CN 212341257 U CN212341257 U CN 212341257U
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- fixing plate
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Abstract
The utility model discloses a probe fixing device for test machine, include: the probe comprises a probe, a first fixing plate and a second fixing plate, wherein the first fixing plate is used for connecting the probe; the second fixing plate is used for connecting one end of the probe, which is far away from the first fixing plate; the bearing plate is arranged at one end, far away from the first fixing plate, of the second fixing plate and is used for mounting a chip to be detected; the fixing column is arranged between the second fixing plate and used for fixing the second fixing plate on the first fixing plate; and the guiding device is arranged between the second fixing plate and the bearing plate and is used for guiding the second fixing plate to be far away from or close to the bearing plate. The utility model discloses a set up guiding device guide probe and aim at chip pin to improve chip test efficiency.
Description
Technical Field
The utility model belongs to the technical field of the test machine technique and specifically relates to a probe fixing device for test machine is related to.
Background
The circuit board or chip needs to be tested after being manufactured, and the test of the circuit board or chip is performed by using a tester in the prior art, but with the requirement of chip size miniaturization, the pin of the chip or circuit board is also miniaturized, so that the test difficulty of the small chip or circuit board is more difficult.
The existing tester directly adopts a probe on the tester to directly connect pins of a chip or a circuit board for testing a small chip or the circuit board, and because the tester is used for a long time, the probe can be driven to slightly deviate from the pins connected with the chip or the circuit board at each time, so that the probe cannot be accurately connected to the pins of the chip or the circuit board, and the position of the probe needs to be calibrated in time, so that the detection efficiency is reduced.
SUMMERY OF THE UTILITY MODEL
The utility model discloses aim at solving the technical problem who exists among the prior art at least. Therefore, the utility model provides a probe fixing device for test machine can improve the accuracy that chip or circuit board pin were aimed at to the probe, and then improves the efficiency of chip test.
An embodiment of the utility model provides a probe fixing device for test machine, include: a probe is arranged on the outer surface of the probe,
the first fixing plate is used for connecting the probe;
the second fixing plate is used for connecting one end of the probe, which is far away from the first fixing plate;
the bearing plate is arranged at one end, far away from the first fixing plate, of the second fixing plate and is used for mounting a chip to be detected;
the fixing column is arranged between the second fixing plate and used for fixing the second fixing plate on the first fixing plate;
and the guiding device is arranged between the second fixing plate and the bearing plate and used for guiding the second fixing plate to be far away from or close to the bearing plate.
The utility model discloses a probe fixing device for test machine has following beneficial effect at least: when the probe on the second fixing plate is connected with the chip pin arranged on the bearing plate, the second fixing plate can be guided to be stably close to the bearing plate through the guiding device, the deviation of the second fixing plate relative to the bearing plate is reduced, the accuracy of the probe connected with the chip pin is improved, and the chip testing efficiency is improved.
According to another embodiment of the present invention, a probe fixing device for a testing machine, the guide device includes:
the first guide assembly is arranged between the second fixing plate and the bearing plate and is used for guiding the second fixing plate to be close to or far away from the bearing plate;
the second guide assembly is arranged between the second fixing plate and the bearing body, is close to the first guide assembly, and is used for assisting the first guide assembly in guiding the second fixing plate to be close to or far away from the bearing plate.
According to another embodiment of the present invention, a probe fixture for a testing machine, the first guide assembly comprises:
the lantern ring is arranged at one end, close to the first fixing plate, of the second fixing plate;
the first guide post is arranged on the bearing plate and inserted into the lantern ring.
According to another embodiment of the present invention, a probe fixture for a testing machine, the first guide assembly comprises:
the lantern ring is arranged at one end, close to the first fixing plate, of the second fixing plate;
the first guide post is arranged on the bearing plate and inserted into the lantern ring.
According to the utility model discloses a probe fixing device for test machine of other embodiments, the second guide post orientation the direction of second guide through-hole is equipped with first guide face.
According to the utility model discloses a probe fixing device for test machine of other embodiments, the probe test hole has been seted up on the first fixed plate, be equipped with on the first fixed plate with the adjacent backshank test hole of probe test hole, the probe inserts rethread backshank test hole stretches out behind the probe test hole.
According to the utility model discloses a probe fixing device for test machine of other embodiments, the probe test hole in bank sets up in two rows between the needle tail test hole.
According to the utility model discloses a probe fixing device for test machine of other embodiments, the needle tail test hole with probe test hole crisscross setting.
According to the utility model discloses a probe fixing device for test machine of other embodiments, first guide post passes through the screw thread to be fixed on the loading board.
According to the utility model discloses a probe fixing device for test machine of other embodiments, the thread groove has been seted up at both ends about the first guide post.
Drawings
Fig. 1 is a schematic structural diagram of an embodiment of a probe fixing device for a testing machine according to the present invention;
FIG. 2 is a top view of an embodiment of a probe fixture for a testing machine according to an embodiment of the present invention;
FIG. 3 is a cross-sectional view taken along line A-A of FIG. 2;
fig. 4 is a partial cross-sectional view of a first fixing plate in an embodiment of a probe fixture for a testing machine according to an embodiment of the present invention.
Reference numerals: 100. a probe; 200. a first fixing plate; 210. a probe test hole; 220. a pin tail test hole; 300. a second fixing plate; 400. a carrier plate; 410. a first guide through-hole; 420. a second guide through hole; 430. connecting holes; 500. fixing a column; 600. a guide device; 610. a first guide assembly; 611. a collar; 612. a first guide post; 613. a first guide surface; 614. a thread groove; 620. a second guide assembly; 621. a second guide post.
Detailed Description
The conception and the resulting technical effects of the present invention will be described clearly and completely with reference to the following embodiments, so that the objects, features and effects of the present invention can be fully understood. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all embodiments, and other embodiments obtained by those skilled in the art without inventive labor based on the embodiments of the present invention all belong to the protection scope of the present invention.
In the description of the present invention, if an orientation description is referred to, for example, the directions or positional relationships indicated by "upper", "lower", "front", "rear", "left", "right", etc. are based on the directions or positional relationships shown in the drawings, only for convenience of description and simplification of description, and it is not intended to indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. If a feature is referred to as being "disposed," "secured," "connected," or "mounted" to another feature, it can be directly disposed, secured, or connected to the other feature or indirectly disposed, secured, connected, or mounted to the other feature.
In the description of the embodiments of the present invention, if "a plurality" is referred to, it means one or more, if "a plurality" is referred to, it means two or more, if "greater than", "less than" or "more than" is referred to, it is understood that the number is not included, and if "more than", "less than" or "within" is referred to, it is understood that the number is included. If reference is made to "first" or "second", this should be understood to distinguish between features and not to indicate or imply relative importance or to implicitly indicate the number of indicated features or to implicitly indicate the precedence of the indicated features.
Referring to fig. 1, the embodiment of the present invention discloses a probe fixing device for a testing machine, including a first fixing plate 200, a probe 100 is connected to the first fixing plate 200, and one end of the probe 100 away from the first fixing plate 200 is connected to a second fixing plate 300, and a fixing column 500 for fixing the first fixing plate 200 and the second fixing plate 300 is arranged between the first fixing plate 200 and the first fixing plate 200. One end of the second fixing plate 300, which is far away from the first fixing plate 200, is provided with a carrier plate 400 for mounting a chip to be tested, and a guide device 600 for guiding the second fixing plate 300 to be close to or far away from the carrier plate 400 is arranged between the carrier plate 400 and the second fixing plate 300.
Wherein, the fixing columns 500 are provided with three and are respectively located around the first fixing plate 200 and the second fixing plate 300 connected to the probe 100, and fix the first fixing plate 200 and the second fixing plate 300 through the fixing columns 500, and then straighten the probe 100 on the first fixing plate 200 and the second fixing plate 300, so that the probe 100 can stably transmit a detection signal after being connected to a chip.
Specifically, when the probe 100 on the second fixing plate 300 is connected to the chip pin on the carrier plate 400, the second fixing plate 300 is directly close to the carrier plate 400 along the fixing posts 500 so that the probe 100 on the second fixing plate 300 is connected to the chip pin, and the probe 100 can be guided to align with the chip pin on the carrier plate 400 by the guiding device 600, so that the probability that the probe 100 is not aligned with the chip pin is reduced, and the efficiency of chip testing is improved.
Referring to fig. 2 and 3, in some embodiments of the present invention, the guiding device 600 comprises: the first guide assembly 610 is disposed between the second fixing plate 300 and the loading plate 400 and used for the second fixing plate 300 to approach the loading plate 400, and the second guide assembly 620 is disposed between the second fixing plate 300 and the loading plate 400 and adjacent to the first guide assembly 610, and the second guide assembly 620 is used for assisting the first guide assembly 610 in guiding the second fixing plate 300. The accuracy of the probe 100 connecting to the chip on the carrier plate 400 is further increased by the dual guiding of the first guide assembly 610 and the second guide assembly 620.
Wherein, the first guide assembly 610 includes: the collar 611 is fixedly disposed on the second fixing plate 300, the first guiding post 612 is disposed on the bearing plate 400 and inserted into the collar 611, and when the second fixing plate 300 is far away from or close to the bearing plate 400, the first guiding post 612 extends and retracts along the inner control of the collar 611. In this embodiment, the number of the first guiding assemblies 610 is four, and the four first guiding assemblies 610 are located around the probe 100 on the second fixing plate 300, so that the second fixing plate 300 can be stably close to the carrier plate 400 by the arrangement of the first guiding assemblies 610 around the periphery of the probe 100, thereby improving the accuracy of the probe 100 in connecting the chip pins.
The upper and lower ends of the first guiding column 612 are provided with screw grooves 614, the first guiding column 612 is fastened to the bearing plate 400 by screw threads, the bearing plate 400 is provided with a connecting hole 430 corresponding to the screw grooves 614, and the connecting hole 430 is stepped, so that a screw is screwed into the screw groove 614 of the first guiding column 612 and then abuts against a step of the connecting hole 430, thereby stably mounting the first guiding column 612 on the bearing plate 400. The upper and lower ends of the first guide post 612 are provided with the screw grooves 614 to facilitate direct screw insertion into the screw grooves 614 without finding the screw grooves 614 and then aligning the connection holes 430.
In some embodiments of the present invention, the second guiding assembly 620 comprises: and a second guide post 621. The loading plate 400 is provided with a first guide through hole 410, the second fixing plate 300 is provided with a second guide through hole 420 corresponding to the first guide through hole 410, and the first guide post 612 is inserted into the first guide through hole 410 and the second guide through hole 420. The diameter of the first guide post 612 is similar to the inner diameters of the first and second guide through- holes 410 and 420, so that the second guide post 621 is fixed between the first and second guide through- holes 410 and 420 by the hole accuracy limitation of the first and second guide through- holes 410 and 420.
Wherein the first guide post 612 is provided with a first guide surface 613 toward one end of the second guide through-hole 420, the insertion of the first guide post 612 into the first guide through-hole 410 and the second guide through-hole 420 can be facilitated by the provision of the first guide surface 613.
Referring to fig. 1 and 4, in some embodiments of the present invention, a probe testing hole 210 is formed on the first fixing plate 200, and a pin testing hole 220 adjacent to the probe testing hole 210 is formed on the first fixing plate 200, and the probe testing holes 210 are arranged in a row, and the pin testing holes 220 are also arranged in a row. The probe 100 is inserted into the probe testing hole 210 after extending out of the second fixing plate 300, and the probe 100 passing through the probe testing hole 210 winds up along the pin tail testing hole 220, so that the probe 100 can be directly connected to the front surface of the first fixing plate 200, and an input line is directly connected to the probe 100 of the pin tail testing hole 220 at the front surface of the first fixing plate 200.
The row of probe test holes 210 is disposed between the two rows of pin tail test holes 220, so that the probes 100 can be conveniently led out, and a gap is left between the probes 100. And the probe test holes 210 and the pin tail test holes 220 are alternately disposed in the first fixing plate 200. The gaps between the probes 100 can be increased through the staggered arrangement of the probe test holes 210 and the pin tail test holes 220, so that the probes 100 are prevented from touching to generate short circuit, and the test safety is improved.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge of those skilled in the art. Furthermore, the embodiments of the present invention and features of the embodiments may be combined with each other without conflict.
Claims (10)
1. A probe fixture for a testing machine, comprising: a probe is characterized in that the probe is provided with a probe body,
the first fixing plate is used for connecting the probe;
the second fixing plate is used for connecting one end of the probe, which is far away from the first fixing plate;
the bearing plate is arranged at one end, far away from the first fixing plate, of the second fixing plate and is used for mounting a chip to be detected;
the fixing column is arranged between the second fixing plate and used for fixing the second fixing plate on the first fixing plate;
and the guiding device is arranged between the second fixing plate and the bearing plate and used for guiding the second fixing plate to be far away from or close to the bearing plate.
2. The probe fixture for a testing machine of claim 1, wherein the guide comprises:
the first guide assembly is arranged between the second fixing plate and the bearing plate and is used for guiding the second fixing plate to be close to or far away from the bearing plate;
the second guide assembly is arranged between the second fixing plate and the bearing body, is close to the first guide assembly, and is used for assisting the first guide assembly in guiding the second fixing plate to be close to or far away from the bearing plate.
3. The probe fixture for a testing machine of claim 2, wherein the first guide assembly includes:
the lantern ring is arranged at one end, close to the first fixing plate, of the second fixing plate;
the first guide post is arranged on the bearing plate and inserted into the lantern ring.
4. The probe fixing device for the testing machine as claimed in claim 2, wherein the carrier plate is provided with a plurality of first guiding through holes, and the second fixing plate is provided with second guiding through holes corresponding to the first guiding through holes;
the second guide assembly includes: and a second guide post inserted into the first guide through hole and the second guide through hole, wherein the diameters of the first guide through hole and the second guide through hole are similar to the diameter of the second guide post.
5. The probe fixture for a testing machine as set forth in claim 4, wherein the second guide column is provided with a first guide surface in a direction toward the second guide through-hole.
6. The apparatus as claimed in any one of claims 1 to 5, wherein the first fixing plate has a probe testing hole, the first fixing plate has a pin testing hole adjacent to the probe testing hole, and the probe is inserted into the probe testing hole and then extends out through the pin testing hole.
7. The apparatus as claimed in claim 6, wherein the probe test holes are arranged in a row between two rows of the tail test holes.
8. The probe fixture for a testing machine of claim 6, wherein the tail test holes and the probe test holes are staggered.
9. The probe fixture for a testing machine of claim 3, wherein the first guide post is fixed to the carrier plate by a screw thread.
10. The apparatus as claimed in claim 3, wherein the first guide post has screw grooves formed at upper and lower ends thereof.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020532601.8U CN212341257U (en) | 2020-04-10 | 2020-04-10 | Probe fixing device for testing machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020532601.8U CN212341257U (en) | 2020-04-10 | 2020-04-10 | Probe fixing device for testing machine |
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| Publication Number | Publication Date |
|---|---|
| CN212341257U true CN212341257U (en) | 2021-01-12 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202020532601.8U Active CN212341257U (en) | 2020-04-10 | 2020-04-10 | Probe fixing device for testing machine |
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| CN (1) | CN212341257U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112730927A (en) * | 2020-12-29 | 2021-04-30 | 北京纬百科技有限公司 | Testing device |
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2020
- 2020-04-10 CN CN202020532601.8U patent/CN212341257U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112730927A (en) * | 2020-12-29 | 2021-04-30 | 北京纬百科技有限公司 | Testing device |
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