CN212160006U

CN212160006U - Digital chip tester

Info

Publication number: CN212160006U
Application number: CN202020577865.5U
Authority: CN
Inventors: 黄辉
Original assignee: Shenzhen Chip Testing Technology Co ltd
Current assignee: Shenzhen Chip Testing Technology Co ltd
Priority date: 2020-04-17
Filing date: 2020-04-17
Publication date: 2020-12-15
Anticipated expiration: 2030-04-17

Abstract

The utility model discloses a digital chip testing machine, which comprises a socket main body and a testing needle seat, wherein the top surface of the socket main body is downwards provided with a supporting groove body, stepped grooves are arranged on two sides of the supporting groove body, a socket groove is arranged in the stepped grooves along the length direction, a right elastic part is extended outwards in the socket groove along the side wall direction, and the right elastic part is used for contacting one end surface of a chip pin; the test needle base comprises a cover plate matched with the stepped groove and a test probe arranged on the cover plate, the cover plate is provided with a through hole matched with the socket groove, the test probe is movably arranged on the through hole in a matched mode, a left elastic piece arranged opposite to the right elastic piece is arranged at the extending section of the test needle base, one end of the test probe penetrates through the through hole to extend into the socket groove, and the right elastic piece and the left elastic piece form an elastic body for clamping chip pins; the other end of test probe passes through the wire and connects test module respectively, the utility model provides a digital chip test machine aims at improving the life of test machine, guarantees the sustainable accurate test of test machine.

Description

Digital chip tester

Technical Field

The application relates to the technical field of chip testing, in particular to a digital chip testing machine.

Background

With the growth of emerging industries such as mobile internet, cloud computing, internet of things, big data and the like, the electronic information industry enters a new development stage. Control, communication, man-machine interaction, network interconnection and the like are integrated into a large number of emerging electronic technologies, the functions of equipment are more and more complex, and the system integration level is more and more complex. The development of new electronic information technology depends on the continuous push of the semiconductor industry, and therefore, the use of chips as a core technology is becoming more and more frequent and important.

The chip generally refers to an integrated circuit carrier, which is formed by dividing a wafer, and also refers to a result of the integrated circuit after design, manufacture, packaging and test, after the mass production of the chip is completed, the basic function of the chip needs to be detected, so as to select out the unqualified chip, thereby the qualified chip is reserved, however, when the current digital chip test is carried out, the test socket mainly comprises a lower test socket main body, a test probe and an elastic body of which the lower test socket is connected with the probe, the chip pin is embedded on the elastic body to complete the test, but each time of the test, the pin can generate repeated load to the elastic body, so that macroscopic visible or detectable cracks can appear on the elastic body, once the fatigue life is reached, the elastic force of the elastic body disappears, the phenomenon of poor contact of a USB interface of a mobile phone can be caused, and errors can appear in the measurement, therefore, a digital chip tester is necessary to be, to solve the above problems.

Disclosure of Invention

The utility model discloses mainly to above problem, provide a digital chip test machine, aim at improving the life of test machine, guarantee the sustainable accurate test of test machine.

In order to achieve the above purpose, the utility model provides a following technical scheme:

according to an aspect, the utility model provides a digital chip test machine, it includes:

the socket comprises a socket main body, wherein a supporting groove body is arranged on the top surface of the socket main body downwards, stepped grooves are arranged on two sides of the supporting groove body, a plurality of socket grooves used for inserting chip pins are formed in the stepped grooves along the length direction, a right elastic piece extends outwards along the side wall direction in each socket groove, and the right elastic piece is used for contacting one end surface of each chip pin;

the test needle base is covered on the socket main body and comprises a cover plate matched with the stepped groove and a test probe arranged on the cover plate, the cover plate is provided with a through hole matched with the socket groove, the test probe is movably arranged on the through hole, one end of the test probe penetrates through the through hole to extend into the socket groove, a left elastic piece arranged opposite to the right elastic piece is arranged at an extending section of the test probe, and the right elastic piece and the left elastic piece form an elastic body for clamping chip pins; and the other end of the test probe is respectively connected with the test module through a lead.

As the utility model relates to an improvement of digital chip test machine, the draw-in groove has been seted up on the test probe, the draw-in groove inlays through the block and adorns a connecting rod, even as an organic whole with each test probe.

As an improvement of the utility model relates to a digital chip test machine, the latch segment has been set respectively at the both ends of apron, the latch segment link up a locking groove and a connecting groove respectively along vertical direction and along the horizontal direction, the connecting rod stretches into the spread groove, passes locking groove and connecting rod threaded connection through the retaining member, will the connecting rod is adorned admittedly on the apron.

According to the above technical scheme, can learn, the utility model provides a digital chip test machine for among the prior art, has following beneficial effect:

1. after the chip pin is inserted, the traditional mode of contacting the chip pin by using the elastic body is changed into a mode of dividing the elastic body into a fixed right elastic part and a movable left elastic part by moving the test probe, the adoption of the adjustable mode is favorable for improving the strain range of the elastic body subjected to stress, and corresponding strain can be carried out according to pins with different specification thicknesses, so that the fatigue service life of the elastic body is prolonged, and the accurate test of a test machine is ensured;

2. when the corresponding test probe has a problem, the test probe with the problem can be independently replaced, so that the cost for integrally replacing the probe is reduced; other advantages of the present invention are further clarified in the detailed description.

Drawings

Fig. 1 is a schematic perspective view of the present application for testing a digital chip.

Fig. 2 is a partially enlarged schematic view of a portion a in fig. 1.

Fig. 3 is an exploded view of a digital chip tester.

Fig. 4 is a schematic top view of a digital chip tester according to the present application.

Fig. 5 is a schematic cross-sectional structural view of the connection between the chip pins and the elastic body.

Fig. 6 is a schematic view of a connection structure of the test probe and the connection rod.

Reference numerals shown in the drawings:

10. a socket main body; 101. a supporting trough body; 102. a stepped groove; 103. a socket slot;

20. testing the needle seat; 21. a cover plate; 22. testing the probe; 23. a wire; 24. a test module; 25. a connecting rod; 26. a locking block; 27. an elastomer; 28. a locking member; 201. a through hole; 220. a card slot; 260. a locking groove; 261. connecting grooves; 271. a left elastic member; 272. a right elastic member;

30. a chip; 31. a pin.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings. Wherein like elements in different embodiments are numbered with like associated elements. In the following description, numerous details are set forth in order to provide a better understanding of the present application. However, those skilled in the art will readily recognize that some of the features may be omitted or replaced with other elements, materials, methods in different instances. In some instances, certain operations related to the present application have not been shown or described in detail in order to avoid obscuring the core of the present application from excessive description, and it is not necessary for those skilled in the art to describe these operations in detail, so that they may be fully understood from the description in the specification and the general knowledge in the art.

The numbering of the components as such, e.g., "first", "second", etc., is used herein only to distinguish the objects as described, and does not have any sequential or technical meaning. The term "connected" and "coupled" when used in this application, unless otherwise indicated, includes both direct and indirect connections (couplings).

Referring to fig. 1 to 6, the present embodiment provides a digital chip tester, which includes a socket body 10 and a test socket 20 covering the socket body 10 for testing a chip 30, wherein:

for the socket main body 10, a supporting groove body 10 is arranged downward on the top surface of the socket main body 10, the supporting groove body 10 circumferentially fixes the chip 30 to be tested, stepped grooves 102 are arranged on two sides, each stepped groove 102 is provided with a plurality of socket grooves 103 formed along the length direction, right elastic pieces 272 extend outwards along the side wall direction in the socket grooves 103, and after the pins 31 of the chip 30 pass through the stepped grooves 102 and enter the socket grooves 103, the right elastic pieces 272 can tightly abut against one end surfaces of the pins 31 and contact with the pins 31;

for the test pin holder 20, the test pin holder 20 includes a cover plate 21 matching with the stepped groove 102 and a plurality of through holes 201 formed on the cover plate 21 and matching with the socket groove 103, a test probe 22 is movably disposed on each individual through hole 201, one end of the test probe 22 passes through the through hole 201 and extends into the socket groove 103, and a left elastic member 271 disposed opposite to the right elastic member 272 is disposed at an extending section to form an elastic body 27 for clamping the pins 31 of the chip 30 in the prior art, and the other end of the test probe 22 is connected to the test module 24 through a wire 23.

With the above embodiment, it can be understood that, when the main body of the chip 30 is placed in the supporting slot body 101, and the pin 31 is inserted into the socket slot 103, one end of the right elastic member 272 abuts against one end face of the pin 31, then the test needle base 20 is covered, and each test probe 22 is moved along the length direction of the through hole 201, so that the left elastic piece 271 on each test probe 22 contacts with the other end surface of the pin 31, the circuit is conducted by the contact of the end face, and the information of the chip 30 is transmitted to the testing module 24 through the left elastic member 271, the testing probe 22 and the conducting wire 23, so as to select the qualified digital chip 30, by using this adjustable approach it is advantageous to increase the strain range over which elastomer 27 is stressed, corresponding strain can be carried out according to the pins 31 with different specifications and thicknesses, so that the fatigue service life of the elastic body 27 is prolonged, and the accurate test of a testing machine is ensured.

As a preferable scheme in the above embodiment, a clamping groove 220 may be formed on each test probe 22, and each test probe 22 is connected into a whole by clamping one connecting rod 25 in the clamping groove 220, it can be understood that the left elastic member 271 can contact the pin 31 only by the detection person folding the two connecting rods 25 along the middle part with the thumb and the forefinger, which greatly reduces the operation difficulty.

In addition, as a further preferable scheme in the above embodiment, two ends of the cover plate 21 are respectively provided with a locking block 26, the locking blocks 26 respectively penetrate through a locking groove 260 and a connecting groove 261 in the vertical direction and in the horizontal direction, the connecting rod 25 extends into the connecting groove 261, the locking piece 28 penetrates through the locking groove 260 and is in threaded connection with the connecting rod 25, the connecting rod 25 is fixedly mounted on the cover plate 21, and the operation of releasing the hand can be realized through the scheme.

The present invention is not limited to the above embodiments, and any embodiments mentioned in the description fall within the scope of the present invention.

It is right to have used specific individual example above the utility model discloses expound, only be used for helping to understand the utility model discloses, not be used for the restriction the utility model discloses. To the technical field of the utility model technical personnel, the foundation the utility model discloses an idea can also be made a plurality of simple deductions, warp or replacement.

Claims

1. A digital chip tester, comprising:

2. A digital chip tester as claimed in claim 1, wherein said test probes are provided with slots, and a connecting rod is fitted in said slots by snap-fitting to connect the test probes together.

3. A digital chip testing machine as claimed in claim 2, wherein locking blocks are provided at both ends of the cover plate, the locking blocks respectively penetrate a locking groove and a connecting groove in the vertical direction and in the horizontal direction, the connecting rod extends into the connecting groove, and the connecting rod is fixedly mounted on the cover plate by means of a locking member passing through the locking groove and being in threaded connection with the connecting rod.