CN206481276U - A kind of dereliction grid solar cell IV test devices - Google Patents
A kind of dereliction grid solar cell IV test devices Download PDFInfo
- Publication number
- CN206481276U CN206481276U CN201621414541.XU CN201621414541U CN206481276U CN 206481276 U CN206481276 U CN 206481276U CN 201621414541 U CN201621414541 U CN 201621414541U CN 206481276 U CN206481276 U CN 206481276U
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- CN
- China
- Prior art keywords
- solar cell
- test devices
- dereliction
- dereliction grid
- band
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Photovoltaic Devices (AREA)
Abstract
This application discloses a kind of dereliction grid solar cell IV test devices, including rigid support, the surface of the rigid support is provided with two flexible layers being parallel to each other, the surface of each flexible layer is provided with the contact band for being contacted with the thin grid of solar cell, one of contact band is connected with voltage tester part, and another contact band is connected with testing current part.The above-mentioned dereliction grid solar cell IV test devices that the application is provided, contact belt surface has smaller contact than conventional semiconductors probe, all grid lines are integrated to be tested, all grid lines of dereliction grid cell can be reliably contacted repeatedly, it can avoid measuring loss caused by mechanical damage, improve measurement accuracy and the degree of accuracy.
Description
Technical field
The utility model is related to photovoltaic apparatus technical field, more specifically to a kind of dereliction grid solar cell IV
Test device.
Background technology
In the market in addition to conventional front band main grid battery, many new dereliction grid cells are have also appeared, are wrapped
Schmid Multi-Wire, Mayer-Berger Smart-Wire, GT Merlin-Wire etc. are included, they pass through lattice arrangement
Thin grid line and battery formation Ohmic contact.These crystal silicon batteries are reduced caused by main grid is covered by being designed without main grid
Optical absorption loss, reduces series resistance loss, dark saturation current and open-circuit voltage loss is reduced, so as to improve battery
Efficiency.
When the existing IV without main grid crystal silicon solar batteries is tested, discharged into generally by the probe for there are several times of probes
Row test, every grid line is contacted with portion of electrical current and voltage probe, and extra increased probe contact can cause more because of machine
Measurement loss caused by tool damage, and probe is not that special matched is corresponding one by one with grid line, can be caused because deviation of the alignment draws
The repeated mistake risen, influences measurement accuracy, it is impossible to ensure the degree of accuracy of test.
Utility model content
In order to solve the above technical problems, the utility model provides a kind of dereliction grid solar cell IV test devices, energy
Enough avoid measuring loss caused by mechanical damage, improve measurement accuracy and the degree of accuracy.
A kind of dereliction grid solar cell IV test devices that the utility model is provided, including rigid support, the rigidity
The surface of support is provided with two flexible layers being parallel to each other, and the surface of each flexible layer, which is provided with, to be used for and solar energy
The contact band of the thin grid contact of battery, one of contact band is connected with voltage tester part, another contact band and testing current
Part is connected.
It is preferred that, in above-mentioned dereliction grid solar cell IV test devices, the contact band is copper strips, aluminium strip, silver-plated
Copper strips, gold plated copper strip or copper beryllium alloy band.
It is preferred that, in above-mentioned dereliction grid solar cell IV test devices, the flexible layer is polyether foam layer, trimerization
Cyanamide froth bed, PVA froth beds, layer of polystyrene foam blow polyester form layer.
It is preferred that, in above-mentioned dereliction grid solar cell IV test devices, the surface of the contact band is sand blasted surface
Or with strip slot.
It is preferred that, in above-mentioned dereliction grid solar cell IV test devices, the thickness of the contact band is 0.05 millimeter
To 2.5 millimeters.
It is preferred that, in above-mentioned dereliction grid solar cell IV test devices, the thickness of the flexible layer for 5 millimeters extremely
7.5 millimeter.
It is preferred that, in above-mentioned dereliction grid solar cell IV test devices, the height of the rigid support is 10 millimeters
To 15 millimeters.
It is preferred that, in above-mentioned dereliction grid solar cell IV test devices, the rigid support is glass fiber reinforcement
Epoxy mount.
It can be seen from the above technical proposal that dereliction grid solar cell IV test devices provided by the utility model,
Because the surface including rigid support, the rigid support is provided with two flexible layers being parallel to each other, each flexible layer
Surface be provided with contact band for being contacted with the thin grid of solar cell, one of contact band and voltage tester part connect
Connect, another contact band is connected with testing current part, therefore, it is possible to avoid measuring loss caused by mechanical damage, is improved and is surveyed
Accuracy of measurement and the degree of accuracy.
Brief description of the drawings
, below will be to embodiment in order to illustrate more clearly of the utility model embodiment or technical scheme of the prior art
Or the accompanying drawing used required in description of the prior art is briefly described, it should be apparent that, drawings in the following description are only
It is embodiment of the present utility model, for those of ordinary skill in the art, on the premise of not paying creative work, also
Other accompanying drawings can be obtained according to the accompanying drawing of offer.
The schematic diagram for the first dereliction grid solar cell IV test device that Fig. 1 provides for the embodiment of the present application.
Embodiment
Core concept of the present utility model is to provide a kind of dereliction grid solar cell IV test devices, can avoid because
Measurement loss caused by mechanical damage, improves measurement accuracy and the degree of accuracy.
Below in conjunction with the accompanying drawing in the utility model embodiment, the technical scheme in the utility model embodiment is carried out
Clearly and completely describe, it is clear that described embodiment is only a part of embodiment of the utility model, rather than whole
Embodiment.Based on the embodiment in the utility model, those of ordinary skill in the art are not under the premise of creative work is made
The every other embodiment obtained, belongs to the scope of the utility model protection.
The first dereliction grid solar cell IV test device that the embodiment of the present application is provided is as shown in figure 1, Fig. 1 is this Shen
Please embodiment provide the first dereliction grid solar cell IV test device schematic diagram.The device includes rigid support 1, institute
The surface for stating rigid support 1 is provided with two flexible layers being parallel to each other 2, and the surface of each flexible layer 2 is provided with use
In the contact band 3 contacted with the thin grid of solar cell 4, one of contact band is connected with voltage tester part 5, another contact
Band is connected with testing current part 6.
Flexible layer 2 therein uses the high flexible material such as surface (surface-contour-compliant, SCC),
For providing mechanical support for contact band, while the slight thin grid line for complying with solar cell printing of contact band can be allowed,
To form fully good contact with every thin grid line, contact belt surface can be coarse, to ensure the continous way with grid line
Contact, has smaller contact than conventional semiconductors probe, integrates all grid lines and is tested, can reliably be connect repeatedly
Touch all grid lines of dereliction grid cell.The device operationally, first pass through mechanical driving device drop to battery surface set up connect
Touch, voltage and current data are collected in test, rise to original position after the completion of test again.
It can be seen from the above technical proposal that the first dereliction grid solar cell IV that the embodiment of the present application is provided is surveyed
Trial assembly is put, because the surface including rigid support, the rigid support is provided with two flexible layers being parallel to each other, each described
The surface of flexible layer is provided with the contact band for being contacted with the thin grid of solar cell, one of contact band and voltage tester
Part is connected, and another contact band is connected with testing current part, therefore, it is possible to avoid measuring loss caused by mechanical damage,
Improve measurement accuracy and the degree of accuracy.
Second of dereliction grid solar cell IV test device that the embodiment of the present application is provided, is in the first above-mentioned dereliction
On the basis of grid solar cell IV test devices, in addition to following technical characteristic：
The contact band is copper strips, aluminium strip, silver-plated copper band, gold plated copper strip or copper beryllium alloy band.
It should be noted that the contact band of these species is made up of flexible, malleable low resistivity metal material,
To ensure that the thin grid line with solar cell silk screen printing forms good Ohmic contact, and possesses high electrical conductivity.
The third dereliction grid solar cell IV test device that the embodiment of the present application is provided, is in the first above-mentioned dereliction
On the basis of grid solar cell IV test devices, in addition to following technical characteristic：
The flexible layer is polyether foam layer, melamine foamed plastic layer, PVA froth beds, layer of polystyrene foam or blows poly-
Ester froth bed.
It should be noted that the flexible layer of these species can provide mechanical support to contact band, while can allow to connect
The slight thin grid line for complying with solar cell printing of band is touched, to form fully good contact with every thin grid line.These kinds
The froth bed of class foams in a mold to be made, as long as therefore mould such as meets at the high standard, with regard to its surface can be made contour.
The 4th kind of dereliction grid solar cell IV test device that the embodiment of the present application is provided, is in the first above-mentioned dereliction
On the basis of grid solar cell IV test devices, in addition to following technical characteristic：
The surface of the contact band is for sand blasted surface or with strip slot.
That is, can with blasting treatment to obtain rough surface, can also be made with mould contact belt surface annular knurl or
Stria is formed, can be in contact this makes it possible to more preferable each position for ensureing contact band with thin grid.
The 5th kind of dereliction grid solar cell IV test device that the embodiment of the present application is provided, is in the first above-mentioned dereliction
On the basis of grid solar cell IV test devices, in addition to following technical characteristic：
The thickness of the contact band is 0.05 millimeter to 2.5 millimeters.
It should be noted that the contact band in this thickness range both can guarantee that the thin grid line with battery surface had well
Continuity contact, production cost can be effectively controlled again.
The 6th kind of dereliction grid solar cell IV test device that the embodiment of the present application is provided, be it is above-mentioned the first to the
In five kinds of dereliction grid solar cell IV test devices it is any on the basis of, in addition to following technical characteristic：
The thickness of the flexible layer is 5 millimeters to 7.5 millimeters.
It should be noted that the thickness range of this flexible layer is enough to ensure that contact band has contour surface, so that with
All thin grid line contacts, to obtain voltage and current data effective enough, while being unlikely to blocked up again and causing production cost
Raising.
The 7th kind of dereliction grid solar cell IV test device that the embodiment of the present application is provided, be it is above-mentioned the first to the
In five kinds of dereliction grid solar cell IV test devices it is any on the basis of, in addition to following technical characteristic：
The height of the rigid support is 10 millimeters to 15 millimeters.
It should be noted that the rigid support of this altitude range has enough strength and stiffness, to ensure whole dress
The stability put.
The 8th kind of dereliction grid solar cell IV test device that the embodiment of the present application is provided, is in above-mentioned 7th kind of dereliction
On the basis of grid solar cell IV test devices, in addition to following technical characteristic：
The rigid support is glass fiber reinforced epoxy resin support.
It should be noted that this is that have identical material with rigid support of the prior art, it is easy to obtain, and cost
It is relatively low.
The foregoing description of the disclosed embodiments, enables professional and technical personnel in the field to realize or new using this practicality
Type.A variety of modifications to these embodiments will be apparent for those skilled in the art, determine herein
The General Principle of justice can in other embodiments be realized in the case where not departing from spirit or scope of the present utility model.Cause
This, the utility model is not intended to be limited to the embodiments shown herein, and is to fit to and principles disclosed herein
The most wide scope consistent with features of novelty.
Claims (8)
1. a kind of dereliction grid solar cell IV test devices, it is characterised in that including rigid support, the table of the rigid support
Face is provided with two flexible layers being parallel to each other, and the surface of each flexible layer, which is provided with, to be used for and the thin grid of solar cell
The contact band of contact, one of contact band is connected with voltage tester part, and another contact band is connected with testing current part.
2. dereliction grid solar cell IV test devices according to claim 1, it is characterised in that the contact band is copper
Band, aluminium strip, silver-plated copper band, gold plated copper strip or copper beryllium alloy band.
3. dereliction grid solar cell IV test devices according to claim 1, it is characterised in that the flexible layer is poly-
Ether froth bed, melamine foamed plastic layer, PVA froth beds, layer of polystyrene foam blow polyester form layer.
4. dereliction grid solar cell IV test devices according to claim 1, it is characterised in that the table of the contact band
Face is for sand blasted surface or with strip slot.
5. dereliction grid solar cell IV test devices according to claim 1, it is characterised in that the thickness of the contact band
Spend for 0.05 millimeter to 2.5 millimeters.
6. the dereliction grid solar cell IV test devices according to claim any one of 1-5, it is characterised in that described soft
Property layer thickness be 5 millimeters to 7.5 millimeters.
7. the dereliction grid solar cell IV test devices according to claim any one of 1-5, it is characterised in that described firm
Property support height be 10 millimeters to 15 millimeters.
8. dereliction grid solar cell IV test devices according to claim 7, it is characterised in that the rigid support is
Glass fiber reinforced epoxy resin support.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621414541.XU CN206481276U (en) | 2016-12-21 | 2016-12-21 | A kind of dereliction grid solar cell IV test devices |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621414541.XU CN206481276U (en) | 2016-12-21 | 2016-12-21 | A kind of dereliction grid solar cell IV test devices |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206481276U true CN206481276U (en) | 2017-09-08 |
Family
ID=59750859
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621414541.XU Expired - Fee Related CN206481276U (en) | 2016-12-21 | 2016-12-21 | A kind of dereliction grid solar cell IV test devices |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206481276U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112794277A (en) * | 2021-03-05 | 2021-05-14 | 深圳清华大学研究院 | Large-scale ultra-smooth device and processing and manufacturing method thereof |
-
2016
- 2016-12-21 CN CN201621414541.XU patent/CN206481276U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112794277A (en) * | 2021-03-05 | 2021-05-14 | 深圳清华大学研究院 | Large-scale ultra-smooth device and processing and manufacturing method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170908 Termination date: 20201221 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |