CN205265623U - Solar cell testing equipment - Google Patents
Solar cell testing equipment Download PDFInfo
- Publication number
- CN205265623U CN205265623U CN201521126884.1U CN201521126884U CN205265623U CN 205265623 U CN205265623 U CN 205265623U CN 201521126884 U CN201521126884 U CN 201521126884U CN 205265623 U CN205265623 U CN 205265623U
- Authority
- CN
- China
- Prior art keywords
- probe
- mount pad
- silicon chip
- solar cell
- carriage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
The utility model discloses a solar cell testing equipment belongs to solar cell testing equipment technical field. The utility model relates to a solar cell testing equipment, including probe mount pad and load -bearing platform, the probe mount pad includes probe mount pad and probe mount pad down, load -bearing platform lie in the probe mount pad and down be used for bearing the weight of the silicon chip between the probe mount pad, the probe mount pad include probe carriage, base and probe row, the probe carriage is installed on the base, processing has that the mounting groove is arranged to two gridded probes, the mounting groove is arranged to three gridded probes and the mounting groove is arranged to four gridded probes respectively on the probe carriage, and above -mentioned probe arrange the mounting groove position and interval respectively with corresponding silicon chip on grid line position and interval corresponding. The utility model discloses a testing arrangement can be used for testing two bars, triple grid and four bars silicon chips simultaneously, has satisfied the test demand of existing market silicon chip to practiced thrift the equipment resource, and can prevent effectively that the silicon chip from being crushed in test procedure.
Description
Technical field
The utility model belongs to solar cell test device technique field, more particularly, relates to a kind of solar cell testDevice.
Background technology
Conventional fossil fuel approach exhaustion day by day, in existing sustainable energy, it is the most clean, that solar energy is undoubtedly oneGeneral and most potential alternative energy source, photovoltaic generation is one of generation technology of tool sustainable development desired characteristics. At present,In all solar cells, the solar cell that silicon solar cell is compared other types has excellent electric property and machineTool performance, and silicon materials have extremely abundant reserves in the earth's crust, along with the further raising of silicon solar cell photoelectric properties,The further reduction of silicon materials price, silicon solar cell has occupied consequence in photovoltaic field.
In solar battery sheet production process, be an inevitable procedure to the performance test of cell piece. Survey by performanceExamination can significantly reduce the risk of silicon chip fracture, improves qualification rate, reduces to greatest extent downtime, is conducive to ensure follow-upThe validity of processing links. Wherein, BACCINI rigid line testing equipment is a kind of common cell slice test device, this test dressPut and generally include upper and lower two row's probes, wherein cell piece carrying platform is assemblied on lower probe mounting base, and holds at cell pieceBetween carrying platform and lower probe mounting base, rely on stage clip to do flexible support, on upper probe mounting base, be fixed with last item, adoptWhen this device is tested cell piece, first cell piece is placed on cell piece carrying platform, by cell piece level locating mechanismCell piece is positioned, then go up probe along with the downward movement together of upper probe mounting base, when on upper probe mounting baseWhen depression bar contacts with cell piece carrying platform, drive carrying platform to move downward by this depression bar, thus the row's of making probe and electricityThe front contact of pond sheet, and lower row's probe contacts with the back side of cell piece, has completed the performance test to cell piece.
But traditional BACCINI rigid line testing equipment is only suitable for testing two grid and the three grid silicon chips at market initial stage, and current marketMain product has been three grid and four grid products, and position and the size of variety classes cell piece grid line are all different, therefore originalThe structure of equipment can not adapt to the needs of current production, conventionally adopts new testing equipment, thereby lead in prior artCause the waste of a large amount of existing equipment resources, caused larger economic loss. In addition, because above-mentioned BACCINI rigid line test is establishedDepression bar in standby is fixed on the inner side at cell piece edge, nearer apart from cell piece edge, when the position of cell piece in transport process is sent outWhen raw deflection, depression bar downward movement can cause the edge of cell piece crushed, thereby causes scrapping of cell piece.
Utility model content
1. the technical problem that utility model will solve
The purpose of this utility model is to overcome original BACCINI rigid line testing equipment can only be used for testing two grid and three grid silicon chips,And can not test four grid silicon chips, thereby cause waste and original BACCINI rigid line testing equipment of existing equipment resourceThe deficiency that easily causes cell piece to crush, provides a kind of solar cell test device. Solar cell test of the present utility modelDevice be on the basis of original two grid and three grid silicon test devices, carry out improved, can be simultaneously for to two grid, three grid andFour grid silicon chips are tested, and meet the testing requirement of existing market silicon chip, thereby saved device resource, and can be effectively anti-Only silicon chip is crushed in test process.
2. technical scheme
For achieving the above object, the technical scheme that the utility model provides is:
A kind of solar cell test device of the utility model, comprises probe mount pad and carrying platform, and probe mount pad comprisesProbe mount pad and lower probe mount pad, described carrying platform between upper probe mount pad and lower probe mount pad for holdingCarry silicon chip, described probe mount pad comprises probe carriage, pedestal and probe row, and described probe carriage is installed on pedestal, is visitingOn punch block, be processed with respectively two gridded probe row mounting grooves, three gridded probe row's mounting grooves and four gridded probes row mounting groove, and above-mentioned probePosition and the spacing of row's mounting groove are corresponding with grid line position and spacing on corresponding silicon chip respectively.
Further, the front-end and back-end of described probe carriage are all fixed with depression bar, the position of above-mentioned depression bar respectively with carrying platformFour drift angle edges corresponding, and be all positioned at the outside of silicon chip edge.
Further, described probe carriage is provided with fixed head, and this fixed head is positioned at the top of all probe row mounting grooves, andThe two ends of fixed head are connected with probe carriage by bolt.
Further, the material loading end of described carrying platform is all connected with conveyer with discharging end, and carrying platform material loading endConveyer is connected with sintering furnace.
3. beneficial effect
The technical scheme that adopts the utility model to provide, compared with prior art, has following beneficial effect:
(1) a kind of solar cell test device of the present utility model carries out on the basis of original solar cell test deviceImprove, on probe carriage, be processed with two gridded probe row mounting grooves, three gridded probe row's mounting grooves and four gridded probes row mounting groove simultaneously,And position and the spacing of above-mentioned probe row mounting groove are corresponding with grid line position and spacing on corresponding silicon chip respectively, thereby can adoptAll can carry out performance test to two grid silicon chips, three grid silicon chips and four grid silicon chips with this device, meet existing market to silicon chip productTesting requirement, has solved original solar cell test device and can not be used for testing four grid silicon chips, thereby caused large number quipments resourceThe problem of waste, and while adopting this device to test different size silicon chip, change more convenient, simple in structure.
(2) a kind of solar cell test device of the present utility model, the front-end and back-end of its probe carriage are all fixed with depression bar, onThe position of stating depression bar is corresponding with four drift angle edges of carrying platform respectively, and is all positioned at the outside of silicon chip edge. This practicality is newIn type, the position of depression bar in original device has been moved on to the outside of silicon chip edge by silicon chip edge inside, from silicon chip edge relatively away from,Thereby can avoid crushing silicon chip edge because position of silicon wafer generation deflection in transport process causes depression bar in production process, greatlyReduce the fragment rate of silicon chip in test process.
(3) a kind of solar cell test device of the present utility model, its probe carriage is provided with fixed head, and this fixed head is positioned at instituteHave the top of probe row mounting groove, and the two ends of fixed head are connected with probe carriage by bolt. Passable by arranging of this fixed headProbe row in probe row mounting groove is fixed, thereby can prevent that probe from coming in probe row mounting groove shakes,Thereby cause test unstable.
Brief description of the drawings
Fig. 1 is the structural representation of a kind of solar cell test device middle probe mount pad of the present utility model;
Fig. 2 is the structural representation of carrying platform in a kind of solar cell test device of the present utility model.
Label declaration in schematic diagram:
1, probe carriage; 2, two gridded probe row mounting grooves; 3, three gridded probe row mounting grooves; 4, four gridded probe row mounting grooves; 5,Depression bar; 501, B pressing position; 502, A pressing position; 6, pedestal; 7, fixed head; 8, conveyer; 9, carryingPlatform; 10, silicon chip; 11, sintering furnace.
Detailed description of the invention
For further understanding content of the present utility model, now in conjunction with the accompanying drawings and embodiments the utility model is described in detail.
Embodiment 1
As shown in Figure 1 and Figure 2, a kind of solar cell test device of the present embodiment, comprises probe mount pad and carrying platform 9,Probe mount pad comprises probe mount pad and lower probe mount pad, and described carrying platform 9 is positioned at probe mount pad and testBetween pin mount pad, for carrying silicon chip 10, and carrying platform 9 is assemblied on lower probe mount pad by stage clip. As shown in Figure 1,Above-mentioned probe mount pad comprises probe carriage 1, pedestal 6 and probe row, and described probe carriage 1 is installed on pedestal 6, at probeOn frame 1, be processed with respectively two gridded probe row mounting grooves 2, three gridded probe row's mounting grooves 3 and four gridded probes row mounting groove 4, and above-mentionedPosition and the spacing of probe row mounting groove are corresponding with grid line position and spacing on corresponding silicon chip respectively. In the present embodiment, be formerThere is the improvement of carrying out on solar cell test device basic, thus can be to two grid silicon chips, three grid silicon chips and the equal energy of four grid silicon chipsCarry out performance test, meet the testing requirement of existing market to silicon chip product, having solved original solar cell test device can notBe used for testing four grid silicon chips, thereby cause the problem of the large number quipments wasting of resources, and adopt this device to carry out different size silicon chipWhen test, change more conveniently, simple in structure, only probe row need be installed in corresponding probe row mounting groove. And it is realDuring border produces, the distribution between two gridded probe row mounting grooves 2, three gridded probe row's mounting grooves 3 and four gridded probes row mounting groove 4 canTo redefine according to actual conditions, as long as can meet the requirement of grating spacing on all size silicon chip. Described probe carriage1 front-end and back-end are all fixed with depression bar 5, and the position of depression bar 5 is corresponding with four drift angle edges of carrying platform 9 respectively, andAll be positioned at the outside at silicon chip 10 edges. The present embodiment has been moved on to the position of depression bar 5 in original device by silicon chip 10 inside, edgeThe outside at silicon chip 10 edges, from silicon chip 10 edges relatively away from, thereby can avoid due to silicon chip 10 position in transport processThere is deflection and cause depression bar 5 to crush silicon chip edge, greatly reduce the fragment rate of silicon chip 10 in test process. As shown in Figure 2,The material loading end of described carrying platform 9 is provided with conveyer 8, and the material loading end of this conveyer 8 is connected with sintering furnace 11. Silicon chip10 are transmitted and are entered carrying platform 9, depression bar in original cell slice test device by conveyer 8 after sintering furnace 11 sintering complete5 with the pressing position of carrying platform 9 be the A pressing position 502 in figure, this A pressing position 502 is positioned at silicon chip 10 edgesInside, nearer with silicon chip 10 Edge Distances, in the time that skew occurs silicon chip in transport process 10, easily cause silicon chip 10 to crush, andThe depression bar 5 of the present embodiment is the B pressing position 501 in figure with the pressing position of carrying platform 9, and this position is apart from silicon chip 10 edgesAnd the edge of conveyer 8 is all far away, thereby can effectively avoid silicon chip 10 to crush the generation of phenomenon. The probe carriage of the present embodimentOn 1, be also provided with fixed head 7, this fixed head 7 is positioned at the top of all probe row mounting grooves, and bolt is passed through at the two ends of fixed head 7Be connected with probe carriage 1, be fixed by the probe row that can arrange in mounting groove probe that arranges of this fixed head 7, fromShake and can prevent that probe from coming in probe row mounting groove, thereby cause test unstable.
Below schematically the utility model and embodiment thereof are described, this description does not have restricted, shown in accompanying drawingBe also one of embodiment of the present utility model, actual structure is not limited to this. So, if this area is commonTechnical staff is enlightened by it, in the situation that not departing from the utility model creation aim, designs and this technology without creationaryThe frame mode that scheme is similar and embodiment, all should belong to protection domain of the present utility model.
Claims (4)
1. a solar cell test device, comprises probe mount pad and carrying platform (9), and probe mount pad comprises probeMount pad and lower probe mount pad, described carrying platform (9) between upper probe mount pad and lower probe mount pad for holdingCarry silicon chip (10), it is characterized in that: described probe mount pad comprises probe carriage (1), pedestal (6) and probe row, described inProbe carriage (1) to be installed on pedestal (6) upper, on probe carriage (1), be processed with respectively two gridded probes row's mounting grooves (2), threeGridded probe row mounting groove (3) and four gridded probes row's mounting grooves (4), and above-mentioned probe arrange the position of mounting groove and spacing respectively with phaseAnswer grid line position and spacing on silicon chip corresponding.
2. a kind of solar cell test device according to claim 1, is characterized in that: described probe carriage (1)Front-end and back-end are all fixed with depression bar (5), the position of above-mentioned depression bar (5) respectively with four drift angle edges of carrying platform (9)Corresponding, and be all positioned at the outside at silicon chip (10) edge.
3. a kind of solar cell test device according to claim 1 and 2, is characterized in that: described probe carriage (1)Be provided with fixed head (7), this fixed head (7) is positioned at the top of all probe row mounting grooves, and the two ends of fixed head (7) are logicalCrossing bolt is connected with probe carriage (1).
4. a kind of solar cell test device according to claim 3, is characterized in that: described carrying platform (9)Material loading end be all connected with conveyer (8) with discharging end, and conveyer (8) and the sintering of carrying platform (9) material loading endStove (11) is connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521126884.1U CN205265623U (en) | 2015-12-29 | 2015-12-29 | Solar cell testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521126884.1U CN205265623U (en) | 2015-12-29 | 2015-12-29 | Solar cell testing equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205265623U true CN205265623U (en) | 2016-05-25 |
Family
ID=56007125
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201521126884.1U Expired - Fee Related CN205265623U (en) | 2015-12-29 | 2015-12-29 | Solar cell testing equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205265623U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106328553A (en) * | 2016-08-19 | 2017-01-11 | 晶澳太阳能有限公司 | Full-automatic crystalline silicon solar cell quality testing machine |
| CN106814224A (en) * | 2017-01-20 | 2017-06-09 | 尚德太阳能电力有限公司 | It is easy to probe row's support of switching |
-
2015
- 2015-12-29 CN CN201521126884.1U patent/CN205265623U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106328553A (en) * | 2016-08-19 | 2017-01-11 | 晶澳太阳能有限公司 | Full-automatic crystalline silicon solar cell quality testing machine |
| CN106328553B (en) * | 2016-08-19 | 2019-08-09 | 晶澳太阳能有限公司 | A kind of automatic crystal silicon solar cell quality tester |
| CN106814224A (en) * | 2017-01-20 | 2017-06-09 | 尚德太阳能电力有限公司 | It is easy to probe row's support of switching |
| CN106814224B (en) * | 2017-01-20 | 2019-04-12 | 尚德太阳能电力有限公司 | Bracket is arranged convenient for the probe of switching |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 243000, Anhui, Ma'anshan Ma'anshan industrial transfer Demonstration Industry Park, Taicang Road, No. 1033 Patentee after: ANHUI YINXIN NEW ENERGY TECHNOLOGY CO., LTD. Address before: 243000, Anhui, Ma'anshan Ma'anshan industrial transfer Demonstration Industry Park, Taicang Road, No. 1033 Patentee before: ANHUI YINYANG PHOTOVOLTAIC TECHNOLOGY CO., LTD. |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160525 Termination date: 20181229 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |