CN208270625U - A kind of test contact chip for testing needle assemblies and its composition - Google Patents
A kind of test contact chip for testing needle assemblies and its composition Download PDFInfo
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- CN208270625U CN208270625U CN201820971578.5U CN201820971578U CN208270625U CN 208270625 U CN208270625 U CN 208270625U CN 201820971578 U CN201820971578 U CN 201820971578U CN 208270625 U CN208270625 U CN 208270625U
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- needle
- main body
- testing needle
- testing
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Abstract
The utility model discloses a kind of test needle assemblies and its test contact chips of composition.Test needle assemblies include at least two groups testing needle group arranged side by side, and the testing needle group includes the first testing needle main body and the second testing needle main body for being arranged in above the first testing needle main body；The first testing needle main body is equipped with the first test syringe needle, and the second testing needle main body is equipped with the second test syringe needle being located on the right side of the first test syringe needle, and the first testing needle main body and the second testing needle Your Majesty are equipped with test board contact surface.Test contact chip, including test contact plate base, and at least one the above-mentioned test needle assemblies being arranged thereon.The utility model structure is simple, it is low in cost, two test syringe needles of testing needle group are in contact and are tested with pins of products simultaneously when use, and it tests needle assemblies and includes at least two groups of testing needle groups arranged side by side, then at least there are four test syringe needles to be in contact with pins of products when test, greatly solves the problems, such as that test needle assemblies contact failure with pins of products.
Description
Technical field
The utility model relates to a kind of mechanical structure for semiconductor product test more particularly to a kind of it is made from it
Test contact chip.
Background technique
Before the completion of semiconductor product manufacturing process, need to enter the final test stage, final test is to utilize test machine
Platform (Tester), sorting machine (Handler), taking between test board (DUT Board) and test contact chip (Test Finger)
Each product is tested with combination, the p-wire of test machine is connected on the route on test board, and the route on test board connects
It is connected to one end of the testing needle of test contact chip, the other end of testing needle is directly contacted with the pin of semiconductor product again, in turn
Product is tested.Burr, while the contact of pin are easy to produce on the contact surface of pin and testing needle in the fabrication process
Face is also easy to generate irregular face, so that testing needle is easy to cause to contact failure with pin, product be then mistaken for it is unqualified, because
This reduces the qualification rate of product, also results in great waste to product.
Summary of the invention
One of the purpose of this utility model is in view of the above deficiencies, a kind of test needle assemblies to be provided, to be solved existing
Contact Problem of Failure of the testing needle with pins of products when having test semiconductor product.The utility model also provides a kind of testing needle group
The test contact chip of part composition.
The purpose of utility model is achieved through the following technical solutions:
A kind of test needle assemblies, including the testing needle group that at least two groups are arranged side by side, the testing needle group includes the first survey
Test point main body and the second testing needle being arranged in above the first testing needle main body；The first testing needle main body is equipped with first
Test syringe needle, the second testing needle main body be equipped be located at first test syringe needle on the right side of second test syringe needle, described first
Test board contact surface is equipped in testing needle main body and the second testing needle main body.
Further, the first test syringe needle is equipped with the first test syringe needle contact surface, and described second tests on syringe needle
Equipped with the second test syringe needle contact surface.
Further, the difference in height between the first test syringe needle contact surface and the second test syringe needle contact surface is h,
And 0≤h≤2mm.
A kind of test contact chip, including test contact plate base, the test contact plate base is equipped at least one survey
Test point component, the test needle assemblies include at least two groups testing needle group arranged side by side, and the testing needle group includes being respectively provided with
The first testing needle main body on test contact plate base and the second testing needle main body above the first testing needle main body；Institute
The first testing needle main body is stated equipped with the first test syringe needle, the second testing needle main body is equipped with right positioned at the first test syringe needle
The second of side tests syringe needle, is equipped with test board contact surface in the first testing needle main body and the second testing needle main body.
Further, dielectric is filled between the first testing needle main body and the second testing needle main body.
The utility model compared with the prior art, have the following advantages that and the utility model has the advantages that
(1) the utility model is not only simple in structure, and low in cost, when use on two test syringe needles of testing needle group
It is in contact and is tested with pins of products simultaneously, and test needle assemblies and include at least two groups of testing needle groups arranged side by side, survey
Then at least there are four test syringe needles to be in contact with pins of products when examination, therefore significantly reduces test needle assemblies and pins of products
The problem of contact failure, to improve the accuracy rate of product test result, and improve the qualification rate of product.
(2) the first test syringe needle of the utility model is equipped with the first test syringe needle contact surface, sets on the second test syringe needle
There is the second test syringe needle contact surface, each test syringe needle passed through contact surface and was in contact with pins of products when test, so as to increase
Effective contact area of big test syringe needle and pins of products, that is, can be improved the accuracy rate of product test result.
(3) difference in height between the first test syringe needle contact surface of the utility model and the second test syringe needle contact surface is h,
And 0≤h≤2mm, so that the contact surface of each syringe needle is in contact with pins of products by pressing force when test, in order to can be preferably
It is in contact with the irregular contact face of pins of products.
(4) the test contact chip of the utility model includes test contact plate base, and tests contact plate base and be equipped with extremely
Few test needle assemblies, in order to be in contact and tested with pins of products using multiple contact syringe needles.
(5) dielectric is filled between the first testing needle main body and the second testing needle main body of the utility model, with true
It protects between the first testing needle main body and the second testing needle main body and insulate.
Detailed description of the invention
Fig. 1 is the overall structure diagram of the testing needle group of the utility model.
Fig. 2 is the overall structure diagram of the test contact chip of the utility model.
Wherein, title corresponding to the appended drawing reference in attached drawing are as follows:
1-the first testing needle main body, the 2-the second testing needle main body, the 3-the first test syringe needle, the 4-the second test syringe needle,
5-test board contact surfaces, the 6-the first test syringe needle contact surface, the 7-the second test syringe needle contact surface, 8-test contact chip bases
Plate.
Specific embodiment
The utility model is described in further detail below with reference to embodiment.
Embodiment 1
As shown in Figure 1, a kind of test needle assemblies, including the testing needle group that at least two groups are arranged side by side, the testing needle group
Including the first testing needle main body 1 and the second testing needle main body 2, the second testing needle main body 2 is arranged in the first testing needle main body 1
Top.The first testing needle main body 1 is equipped with the first test syringe needle 3, is then equipped with and is located in the second testing needle main body 2
The second test syringe needle 4 on 3 right side of the first test syringe needle.Meanwhile it is described first test syringe needle 3 be equipped with for pins of products phase
First test syringe needle contact surface 6 of contact, likewise, being then equipped with the second test syringe needle contact surface on the second test syringe needle 4
7.The test needle assemblies of the utility model are for being in contact and being tested with pins of products, and the test needle assemblies include at least
Two groups of testing needle groups, and each testing needle group includes two faces being in contact with pins of products, then using the use of the new type and production
The contact surface of at least four test syringe needles is in contact with pins of products when product pin contacts, therefore significantly reduces testing needle
Component contacts the problem of failure with pins of products, to improve the accuracy rate of product test result, and improves the conjunction of product
Lattice rate.
In order to which the irregular contact face preferably with pins of products is in contact, it is described first test syringe needle contact surface 6 with
Second tests the difference in height between syringe needle contact surface 7 as h, and 0≤h≤2mm, and the h in the present embodiment is 1mm.For the ease of with
P-wire is connected, and is equipped with test board contact surface 5 in the first testing needle main body 1 and the second testing needle main body 3.
Embodiment 2
As shown in Fig. 2, the test contact chip of the utility model includes test contact plate base 8, the test contacts chip base
Plate 8 is equipped at least one test needle assemblies as described in example 1 above.The test needle assemblies are fixed on test contact chip base
On plate 8, and dielectric is filled between the first testing needle main body 1 and the second testing needle main body 2, to ensure the first testing needle master
It insulate between body 1 and the second testing needle main body 2.
The above is only the preferred embodiment of the utility model only, is not intended to limit the utility model, all at this
Made any modifications, equivalent replacements, and improvements etc., should be included in the utility model within the spirit and principle of utility model
Protection scope within.
Claims (5)
1. a kind of test needle assemblies, it is characterised in that: including the testing needle group that at least two groups are arranged side by side, the testing needle group packet
The the second testing needle main body (2) for including the first testing needle main body (1) and being arranged above the first testing needle main body (1)；Described first
Testing needle main body (1) is equipped with the first test syringe needle (3), and the second testing needle main body (2), which is equipped with, is located at the first testing needle
Second on the right side of head (3) tests syringe needle (4), is equipped with survey in the first testing needle main body (1) and the second testing needle main body (3)
Test plate (panel) contact surface (5).
2. a kind of test needle assemblies according to claim 1, it is characterised in that: first test syringe needle (3) is equipped with
First test syringe needle contact surface (6), second test syringe needle (4) are equipped with the second test syringe needle contact surface (7).
3. a kind of test needle assemblies according to claim 2, it is characterised in that: first test syringe needle contact surface (6)
The difference in height between syringe needle contact surface (7) is tested as h second, and 0≤h≤2mm.
4. a kind of test contact chip, including test contact plate base (8), it is characterised in that: on test contact plate base (8)
Needle assemblies are tested equipped at least one, the test needle assemblies include at least two groups testing needle group arranged side by side, the test
Needle group includes being arranged at test to contact the first testing needle main body (1) on plate base (8) and be located at the first testing needle main body (1)
Second testing needle main body (2) of top；The first testing needle main body (1) is equipped with the first test syringe needle (3), and described second surveys
Test point main body (2) is equipped with the second test syringe needle (4) being located on the right side of the first test syringe needle (3), the first testing needle main body
(1) and test board contact surface (5) are equipped in the second testing needle main body (2).
5. a kind of test needle assemblies according to claim 4, it is characterised in that: the first testing needle main body (1) and the
Dielectric is filled between two testing needle main bodys (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820971578.5U CN208270625U (en) | 2018-06-23 | 2018-06-23 | A kind of test contact chip for testing needle assemblies and its composition |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820971578.5U CN208270625U (en) | 2018-06-23 | 2018-06-23 | A kind of test contact chip for testing needle assemblies and its composition |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208270625U true CN208270625U (en) | 2018-12-21 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820971578.5U Active CN208270625U (en) | 2018-06-23 | 2018-06-23 | A kind of test contact chip for testing needle assemblies and its composition |
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| CN (1) | CN208270625U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108957053A (en) * | 2018-06-23 | 2018-12-07 | 四川峰哲精密设备有限公司 | A kind of test contact chip for testing needle assemblies and its composition |
-
2018
- 2018-06-23 CN CN201820971578.5U patent/CN208270625U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108957053A (en) * | 2018-06-23 | 2018-12-07 | 四川峰哲精密设备有限公司 | A kind of test contact chip for testing needle assemblies and its composition |
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