CN108957055A - A kind of test contact chip of testing needle and its composition - Google Patents
A kind of test contact chip of testing needle and its composition Download PDFInfo
- Publication number
- CN108957055A CN108957055A CN201811046626.0A CN201811046626A CN108957055A CN 108957055 A CN108957055 A CN 108957055A CN 201811046626 A CN201811046626 A CN 201811046626A CN 108957055 A CN108957055 A CN 108957055A
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- CN
- China
- Prior art keywords
- test
- testing needle
- needle
- branch
- testing
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- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 197
- 238000012797 qualification Methods 0.000 abstract description 4
- 230000001788 irregular Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000013100 final test Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
A kind of testing needle, it is characterised in that: including at least two testing needle branches arranged side by side, the testing needle group includes the second testing needle branch (2) of the first testing needle branch (1) and setting above the first testing needle branch (1)；First testing needle branch (1) is equipped with the first test syringe needle (3), second testing needle branch (2) is equipped with the second test syringe needle (4) being located on the right side of the first test syringe needle (3), is equipped with test board contact surface (5) in first testing needle branch (1) and the second testing needle branch (3).The present invention is not only simple in structure, and it is low in cost, it is in contact and is tested with pins of products simultaneously on two test syringe needles of testing needle when use, and include at least two groups of testing needles arranged side by side, then at least there are four test syringe needles to be in contact with pins of products when test, therefore significantly reduces the problem of testing needle contacts failure with pins of products, to improve the accuracy rate of product test result, and the qualification rate of product is improved, it is suitble to promote the use of.
Description
Technical field
The present invention relates to a kind of mechanical structures more particularly to a kind of test being made from it for semiconductor product test
Contact chip.
Background technique
Before the completion of semiconductor product manufacturing process, need to enter the final test stage, final test is to utilize test machine
Platform (Tester), sorting machine (Handler), taking between test board (DUT Board) and test contact chip (Test Finger)
Each product is tested with combination, the p-wire of test machine is connected on the route on test board, and the route on test board connects
It is connected to one end of the testing needle of test contact chip, the other end of testing needle is directly contacted with the pin of semiconductor product again, in turn
Product is tested.Burr, while the contact of pin are easy to produce on the contact surface of pin and testing needle in the fabrication process
Face is also easy to generate irregular face, so that testing needle is easy to cause to contact failure with pin, product be then mistaken for it is unqualified, because
This reduces the qualification rate of product, also results in great waste to product.
Summary of the invention
One of the aims of the present invention is to provide...in response to the above drawbacks a kind of testing needles, to existing test half to be solved
Contact Problem of Failure of the testing needle with pins of products when conductor product.The present invention also provides a kind of test contacts of testing needle composition
Piece.
The purpose of invention is achieved through the following technical solutions:
A kind of testing needle, the testing needle include the first testing needle branch and the second survey being arranged in above the first testing needle branch
Test point branch；First testing needle branch is equipped with the first test syringe needle, and second testing needle branch, which is equipped with, is located at the
Second on the right side of one test syringe needle tests syringe needle, is equipped with test board in first testing needle branch and the second testing needle branch
Contact surface.
Further, the first test syringe needle is equipped with the first test syringe needle contact surface, and described second tests on syringe needle
Equipped with the second test syringe needle contact surface.
Further, the difference in height between the first test syringe needle contact surface and the second test syringe needle contact surface is h,
And 0≤h≤2mm.
A kind of test contact chip, including test contact plate base, the test contact plate base is equipped at least one survey
Test point, the testing needle include the first testing needle branch being arranged on test contact plate base and are located at the first testing needle point
The second testing needle branch of Zhi Shangfang；First testing needle branch is equipped with the first test syringe needle, second testing needle point
Branch is equipped with the second test syringe needle being located on the right side of the first test syringe needle, first testing needle branch and the second testing needle branch
On be equipped with test board contact surface.
Further, fill-media-free between first testing needle branch and the second testing needle branch.
The present invention compared with the prior art, have the following advantages that and the utility model has the advantages that
(1) present invention is not only simple in structure, and low in cost, when use on two test syringe needles of testing needle group simultaneously with production
Product pin is in contact and is tested, and testing needle includes at least two groups of testing needles arranged side by side, then at least four when test
A test syringe needle is in contact with pins of products, therefore significantly reduces the problem of testing needle contacts failure with pins of products, from
And the accuracy rate of product test result is improved, and improve the qualification rate of product.
(2) first test syringe needle of the invention is equipped with the first test syringe needle contact surface, and the second test syringe needle is equipped with the
Two test syringe needle contact surfaces, each test syringe needle passed through contact surface and was in contact with pins of products when test, so as to increase survey
Effective contact area of test point head and pins of products, that is, can be improved the accuracy rate of product test result.
(3) the first test syringe needle contact surface of the invention and second tests the difference in height between syringe needle contact surface as h, and 0
≤ h≤2mm makes the contact surface of each syringe needle be in contact with pins of products when test by pressing force, in order to can preferably with
The irregular contact face of pins of products is in contact.
(4) test contact chip of the invention includes test contact plate base, and tests contact plate base and be equipped at least one
A testing needle, in order to be in contact and tested with pins of products using multiple contact syringe needles.
(5) fill-media-free between the first testing needle branch and the second testing needle branch of the invention, to ensure the first survey
There are gaps between test point branch and the second testing needle branch.
Detailed description of the invention
Fig. 1 is the overall structure diagram of testing needle of the invention.
Fig. 2 is the overall structure diagram of test contact chip of the invention.
Wherein, title corresponding to the appended drawing reference in attached drawing are as follows:
1-the first testing needle branch, the 2-the second testing needle branch, the 3-the first test syringe needle, the 4-the second test syringe needle, 5-survey
Test plate (panel) contact surface, the 6-the first test syringe needle contact surface, the 7-the second test syringe needle contact surface, 8-test contact plate bases.
Specific embodiment
The present invention is described in further detail below with reference to embodiment:
Embodiment 1
As shown in Figure 1, a kind of testing needle, the testing needle includes the first testing needle branch 1 and the second testing needle branch 2, described
The top of the first testing needle branch 1 is arranged in second testing needle branch 2.First testing needle branch 1 is equipped with the first test
Syringe needle 3 is then equipped with the second test syringe needle 4 for being located at 3 right side of the first test syringe needle in second testing needle branch 2.Meanwhile institute
It states the first test syringe needle 3 and is equipped with the first test syringe needle contact surface 6 for being in contact with pins of products, likewise, described the
The second test syringe needle contact surface 7 is then equipped on two test syringe needles 4.Testing needle of the invention is gone forward side by side for being in contact with pins of products
Row test, and each testing needle includes two faces being in contact with pins of products, then is connect using the use of the new type and pins of products
The contact surface of at least four test syringe needles is in contact with pins of products when touching, therefore significantly reduces testing needle and draw with product
The problem of foot contact failure, to improve the accuracy rate of product test result, and improve the qualification rate of product.
In order to which the irregular contact face preferably with pins of products is in contact, it is described first test syringe needle contact surface 6 with
Second tests the difference in height between syringe needle contact surface 7 as h, and 0≤h≤2mm, and the h in the present embodiment is 1mm.For the ease of with
P-wire is connected, and is equipped with test board contact surface 5 in first testing needle branch 1 and the second testing needle branch 3.
Embodiment 2
As shown in Fig. 2, test contact chip of the invention includes test contact plate base 8, the test contact plate base 8 is equipped with
At least one testing needle as described in example 1 above.The testing needle is fixed on test contact plate base 8, and the first test
Fill-media-free between needle branch 1 and the second testing needle branch 2, to ensure the first testing needle branch 1 and the second testing needle branch 2
Between there are gaps.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.
Claims (5)
1. a kind of testing needle, it is characterised in that: including at least two testing needle branches arranged side by side, the testing needle group includes
First testing needle branch (1) and the second testing needle branch (2) being arranged above the first testing needle branch (1)；Described first surveys
Test point branch (1) is equipped with the first test syringe needle (3), and second testing needle branch (2), which is equipped with, is located at the first test syringe needle
(3) second on the right side of tests syringe needle (4), is equipped with test in first testing needle branch (1) and the second testing needle branch (3)
Plate contact surface (5).
2. a kind of testing needle according to claim 1, it is characterised in that: first test syringe needle (3) is equipped with first
It tests syringe needle contact surface (6), second test syringe needle (4) is equipped with the second test syringe needle contact surface (7).
3. a kind of testing needle according to claim 2, it is characterised in that: first test syringe needle contact surface (6) and the
Two test the difference in height between syringe needle contact surface (7) as h, and 0≤h≤2mm.
4. a kind of test contact chip, including test contact plate base (8), it is characterised in that: on test contact plate base (8)
Equipped at least one testing needle, the testing needle includes the first testing needle branch being arranged in test contact plate base (8)
(1) and be located at the first testing needle branch (1) above the second testing needle branch (2)；First testing needle branch (1) is equipped with
First test syringe needle (3), second testing needle branch (2) are equipped with the second test being located on the right side of the first test syringe needle (3)
Test board contact surface (5) are equipped in syringe needle (4), first testing needle branch (1) and the second testing needle branch (2).
5. a kind of testing needle according to claim 4, it is characterised in that: first testing needle branch (1) surveys with second
Fill-media-free between test point branch (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811046626.0A CN108957055A (en) | 2018-09-08 | 2018-09-08 | A kind of test contact chip of testing needle and its composition |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811046626.0A CN108957055A (en) | 2018-09-08 | 2018-09-08 | A kind of test contact chip of testing needle and its composition |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108957055A true CN108957055A (en) | 2018-12-07 |
Family
ID=64476155
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811046626.0A Pending CN108957055A (en) | 2018-09-08 | 2018-09-08 | A kind of test contact chip of testing needle and its composition |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108957055A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1271157A1 (en) * | 2001-06-28 | 2003-01-02 | EM Microelectronic-Marin SA | Needles for probe card for testing semi conductor devices, manufacturing procedure and positioning procedure |
| JP2005069711A (en) * | 2003-08-27 | 2005-03-17 | Japan Electronic Materials Corp | Probe card and contact used for the same |
| CN101685104A (en) * | 2008-09-27 | 2010-03-31 | 京元电子股份有限公司 | Test probe and manufacturing method thereof |
| CN102435798A (en) * | 2011-10-14 | 2012-05-02 | 日月光半导体制造股份有限公司 | Probe card and test method |
| CN102549848A (en) * | 2009-09-28 | 2012-07-04 | 日本麦可罗尼克斯股份有限公司 | Contactor and electrical connection device |
| CN106338623A (en) * | 2015-07-10 | 2017-01-18 | 渭南高新区木王科技有限公司 | Novel probe and erroneous judgement reducing method |
| CN108957053A (en) * | 2018-06-23 | 2018-12-07 | 四川峰哲精密设备有限公司 | A kind of test contact chip for testing needle assemblies and its composition |
-
2018
- 2018-09-08 CN CN201811046626.0A patent/CN108957055A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1271157A1 (en) * | 2001-06-28 | 2003-01-02 | EM Microelectronic-Marin SA | Needles for probe card for testing semi conductor devices, manufacturing procedure and positioning procedure |
| JP2005069711A (en) * | 2003-08-27 | 2005-03-17 | Japan Electronic Materials Corp | Probe card and contact used for the same |
| CN101685104A (en) * | 2008-09-27 | 2010-03-31 | 京元电子股份有限公司 | Test probe and manufacturing method thereof |
| CN102549848A (en) * | 2009-09-28 | 2012-07-04 | 日本麦可罗尼克斯股份有限公司 | Contactor and electrical connection device |
| CN102435798A (en) * | 2011-10-14 | 2012-05-02 | 日月光半导体制造股份有限公司 | Probe card and test method |
| CN106338623A (en) * | 2015-07-10 | 2017-01-18 | 渭南高新区木王科技有限公司 | Novel probe and erroneous judgement reducing method |
| CN108957053A (en) * | 2018-06-23 | 2018-12-07 | 四川峰哲精密设备有限公司 | A kind of test contact chip for testing needle assemblies and its composition |
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| PB01 | Publication | ||
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| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20181207 |
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| WD01 | Invention patent application deemed withdrawn after publication |