CN212041566U - Automatic sorting system for solar cell silicon wafers - Google Patents
Automatic sorting system for solar cell silicon wafers Download PDFInfo
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- CN212041566U CN212041566U CN202020278764.8U CN202020278764U CN212041566U CN 212041566 U CN212041566 U CN 212041566U CN 202020278764 U CN202020278764 U CN 202020278764U CN 212041566 U CN212041566 U CN 212041566U
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Abstract
The utility model discloses an automatic separation system of solar cell silicon chip, include: the AOI color testing machine is used for testing the color depth of the battery silicon wafer and determining the corresponding color grade according to the color depth of the battery silicon wafer; the IV testing machine is used for testing the photoelectric conversion rate of the battery silicon chip, and a sunlight simulation light source is arranged in the IV testing machine; an EL tester; a sorting machine and a transplanting machine. Has the advantages that: by arranging a plurality of sorting machines in series, the battery silicon wafers can be more finely classified after being detected by the AOI color testing machine, the IV testing machine and the EL testing machine, so that the performance difference among the battery silicon wafers at the same level is reduced; the transplanter is arranged at the tail end of the sorting machine, so that the sorting machine can be matched with the sorting machine to circularly transport the material boxes bearing the silicon wafers after the battery silicon wafers are sorted, the material boxes do not need manual participation in the transportation process, and the sorting efficiency of the battery silicon wafers is improved.
Description
Technical Field
The utility model relates to a solar energy silicon chip automated production technical field, concretely relates to automatic separation system of solar cell silicon chip.
Background
The performance of the solar cell silicon wafer needs to be detected after production, and the detection process comprises color sorting, photoelectric conversion rate detection and the like. The existing battery silicon wafer sorting system can only detect the photoelectric conversion rate, and the grading of products is less in the sorting process and not fine enough, so that the difference of the photoelectric conversion rates of the battery silicon wafers at the same grade is large, and the quality of the assembled follow-up batteries is influenced.
In the prior art, if color sorting of battery silicon wafers is required, detection lines need to be independently set, so that the space of a production field is occupied, and the setting cost of the detection lines is high.
The existing detection and sorting system needs to take out empty material boxes manually after the silicon chip detection is finished, is low in efficiency and cannot meet the automatic sorting requirement.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing an automatic separation system of solar cell silicon chip for solving above-mentioned problem just, the utility model provides an among a great deal of technical scheme preferred technical scheme have: the classification of the grade of the photoelectric conversion rate can be refined, the color sorting is added, meanwhile, the automatic circulation mode of the empty material box is used as an auxiliary mode, the precision of the detection and classification of the battery silicon wafer is improved, the technical effects of the automatic detection requirement of the battery silicon wafer and the like are met, and the details are explained below.
In order to achieve the above purpose, the utility model provides a following technical scheme:
the utility model provides a pair of automatic separation system of solar cell silicon chip, include: the AOI color testing machine is used for testing the color depth of the battery silicon wafer and determining the corresponding color grade according to the color depth of the battery silicon wafer; the IV testing machine is used for testing the photoelectric conversion rate of the battery silicon chip, a sunlight simulation light source is arranged in the IV testing machine, the battery silicon chip is subjected to photoelectric conversion by simulating sunlight to irradiate the battery silicon chip, and the photoelectric conversion rate grade of the battery silicon chip is determined by detecting the light conversion rate of the battery silicon chip; the EL testing machine is used for detecting the electrical attenuation degree of the battery silicon chip and determining the level of the electrical attenuation degree of the battery silicon chip; the sorter is used for storing the battery silicon wafers into corresponding silicon wafer material boxes according to different color grades, photoelectric conversion rate grades and electric attenuation degree grades according to the battery silicon wafer grades determined by the AOI color tester, the IV tester and the EL tester, sending out the filled silicon wafer material boxes, and simultaneously transporting empty material boxes to fill up vacant positions; the transplanter is used for receiving the full-load silicon wafer material box output by the sorting machine and returning the empty material box into the sorting machine after the silicon wafers on the full-load silicon wafer material box are manually taken out;
the system is formed by sequentially connecting the AOI color testing machine, the IV testing machine, the EL testing machine, the sorting machine and the transplanting machine.
Preferably, an upper detection light source testing station and a lower detection light source testing station are arranged in the AOI color testing machine.
Preferably, the transplanter is provided with an automatic feeding mechanism, the automatic feeding mechanism comprises a full-material-box conveying structure and an empty-material-box conveying structure, the tail part of the full-material-box conveying structure in the movement direction and the head part of the empty-material-box conveying structure in the movement direction are both provided with transplanting conveying devices, and the transplanting conveying devices are used for transferring the material boxes transported on the full-material-box conveying structure to the empty-material-box conveying structure;
the full-load silicon wafer material box output end of the sorting machine is connected with the full-load material box conveying structure, and the empty material box conveying structure is connected with the empty material box input end of the sorting machine.
Preferably, the transplanting machine is provided with a jacking part for jacking the silicon wafer box fully loaded.
Preferably, the sorter is internally provided with a plurality of silicon wafer magazine placing parts corresponding to different color grades, photoelectric conversion rate grades and electric attenuation degree grades.
Preferably, the silicon wafer box placing parts are 2-22.
Preferably, the AOI color testing machine, the IV testing machine, the EL testing machine, the sorter, and the transplanter are connected by a belt conveyor.
To sum up, the utility model has the advantages that: 1. by arranging a plurality of sorting machines in series, the battery silicon wafers can be more finely classified after being detected by the AOI color testing machine, the IV testing machine and the EL testing machine, so that the performance difference among the battery silicon wafers at the same level is reduced;
2. the transplanter is arranged at the tail end of the sorting machine, so that the sorting machine can be matched with the sorting machine to circularly transport the material boxes bearing the silicon wafers after the battery silicon wafers are sorted, the material boxes do not need manual participation in the transportation process, and the sorting efficiency of the battery silicon wafers is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a schematic view of the dual-line test sorting layout of the present invention;
fig. 2 is a schematic view of the two-line test sorting layout of the present invention.
The reference numerals are explained below:
1. AOI color tester; 2. IV, testing machine; 3. an EL tester; 4. a sorting machine; 5. a transplanting machine.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be described in detail below. It is to be understood that the embodiments described are only some embodiments of the invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
Referring to fig. 1-2, the utility model provides an automatic sorting system of solar cell silicon chip, this system is by AOI color test machine 1, IV test machine 2, EL test machine 3, sorter 4 and transplanter 5 connect gradually and form, and all be connected with the host computer, by the same control AOI color test machine 1 of host computer, IV test machine 2, EL test machine 3, the switching of sorter 4 and transplanter 5, all connect through the belt conveyer between AOI color test machine 1, IV test machine 2, EL test machine 3, sorter 4 and the transplanter 5, AOI color test machine 1 is used for testing the color depth of battery silicon chip, and confirm corresponding color grade according to the color depth of battery silicon chip; an upper detection light source testing station and a lower detection light source testing station are arranged in the AOI color testing machine 1, and the color grade of the battery silicon wafer can be accurately determined by carrying out light transmission tests on the front side and the back side of the battery silicon wafer; the IV testing machine 2 is used for testing the photoelectric conversion rate of the battery silicon wafer, a sunlight simulation light source is arranged in the IV testing machine, the battery silicon wafer is subjected to photoelectric conversion by simulating sunlight to irradiate the battery silicon wafer, and the photoelectric conversion rate grade of the battery silicon wafer is determined by detecting the light conversion rate of the battery silicon wafer; the EL testing machine 3 is used for detecting the electrical attenuation degree of the battery silicon chip and determining the level of the electrical attenuation degree of the battery silicon chip; the sorting machine 4 is used for storing the battery silicon wafers into corresponding silicon wafer material boxes according to different color grades, photoelectric conversion rate grades and electric attenuation degree grades according to the battery silicon wafer grades determined by the AOI color testing machine 1, the IV testing machine 2 and the EL testing machine 3, sending out the filled silicon wafer material boxes, and simultaneously transporting empty material boxes to fill up vacant positions; 22 silicon wafer box placing parts corresponding to different color grades, photoelectric conversion rate grades and electric attenuation degree grades are arranged in the sorting machine 4, the silicon wafer box placing parts correspond to battery silicon wafer grades determined by the AOI color testing machine 1, the IV testing machine 2 and the EL testing machine 3, and the sorting machine 4 places the battery silicon wafers of corresponding grades in corresponding obtained silicon wafer boxes and outputs the battery silicon wafers after the silicon cassettes are filled; the transplanter 5 is used for receiving a full-load silicon wafer material box output by the sorting machine 4, and returning an empty material box into the sorting machine 4 after manually taking out a silicon wafer on the full-load silicon wafer material box, the transplanter 5 is provided with an automatic feeding mechanism, the automatic feeding mechanism comprises a full material box conveying structure and an empty material box conveying structure, the tail part of the full material box conveying structure in the moving direction and the head part of the empty material box conveying structure in the moving direction are both provided with transplanting conveying devices, and the transplanting conveying devices are used for transferring the material box conveyed on the full material box conveying structure to the empty material box conveying structure; the full material box conveying structure is connected with the output end of a full silicon wafer material box of the sorting machine 4, and the empty material box conveying structure is connected with the input end of an empty material box of the sorting machine 4; the transplanter 5 is provided with a jacking part for jacking the silicon wafer magazine full of silicon wafers, and both sides of the jacking part are provided with liftable limiting structures; after the full-load silicon wafer material box of the internal output of the sorting machine 4 is conveyed to the full-load material box conveying structure, the full-load silicon wafer material box is driven by the full-load material box conveying structure to move, when the full-load silicon wafer material box reaches the top of the jacking part, the jacking part jacks up the corresponding full-load silicon wafer material box, the silicon wafer inside the material box is manually taken out, then the jacking part falls, the empty material box continues to move along with the full-load material box conveying structure until the empty material box reaches the transplanting conveying device, the transplanting conveying device conveys the empty material box to the transplanting conveying device at the head part of the empty material box conveying device, then the empty material box conveying device is conveyed to the empty material box conveying device, and finally the empty material box conveying device returns.
By arranging a plurality of sorting machines 4 in series, the battery silicon wafers can be more finely classified after being detected by the AOI color testing machine 1, the IV testing machine 2 and the EL testing machine 3, so that the performance difference among the battery silicon wafers at the same level is reduced; through set up transplanter 5 at the end of sorter 4, can select separately the back at the battery silicon chip, cooperate sorter 4 to carry out the circulation transportation to the magazine that bears the weight of the silicon chip, the magazine transportation process need not artifical the participation, has improved the efficiency that the battery silicon chip was selected separately.
The above description is only for the specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art can easily think of the changes or substitutions within the technical scope of the present invention, and all should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (7)
1. An automatic sorting system for solar cell silicon wafers is characterized by comprising:
the AOI color testing machine (1) is used for testing the color depth of the battery silicon wafer and determining the corresponding color grade according to the color depth of the battery silicon wafer;
the IV testing machine (2) is used for testing the photoelectric conversion rate of the battery silicon chip, a sunlight simulation light source is arranged in the IV testing machine (2), the battery silicon chip is irradiated by simulated sunlight to perform photoelectric conversion, and the photoelectric conversion rate grade of the battery silicon chip is determined by detecting the light conversion rate of the battery silicon chip;
the EL testing machine (3), the said EL testing machine (3) is used for detecting the electric attenuation degree of the battery silicon chip, and confirm the electric attenuation degree grade of the battery silicon chip;
the sorter (4) is used for storing the battery silicon wafers into corresponding silicon wafer material boxes according to different color grades, photoelectric conversion rate grades and electric attenuation degree grades according to the battery silicon wafer grades determined by the AOI color testing machine (1), the IV testing machine (2) and the EL testing machine (3), sending out the filled silicon wafer material boxes, and simultaneously transporting empty material boxes to fill vacant positions; and
the transplanter (5) is used for receiving the full-load silicon wafer material boxes output by the sorting machine (4), and returning empty material boxes into the sorting machine (4) after the silicon wafers on the full-load silicon wafer material boxes are manually taken out;
the system is formed by sequentially connecting the AOI color testing machine (1), the IV testing machine (2), the EL testing machine (3), the sorting machine (4) and the transplanting machine (5).
2. The automatic sorting system of solar cell silicon wafers as claimed in claim 1, wherein: an upper detection light source testing station and a lower detection light source testing station are arranged in the AOI color testing machine (1).
3. The automatic sorting system of solar cell silicon wafers as claimed in claim 1, wherein: the automatic feeding mechanism is arranged on the transplanter (5) and comprises a full material box conveying structure and an empty material box conveying structure, transplanting conveying devices are arranged at the tail part of the full material box conveying structure in the moving direction and at the head part of the empty material box conveying structure in the moving direction, and the transplanting conveying devices are used for transferring the material boxes transported on the full material box conveying structure to the empty material box conveying structure;
the full-material box conveying structure is connected with the full-load silicon wafer material box output end of the sorting machine (4), and the empty material box conveying structure is connected with the empty material box input end of the sorting machine (4).
4. The automatic sorting system of solar cell silicon wafers as claimed in claim 3, wherein: the transplanter (5) is provided with a jacking part for jacking the silicon wafer box fully loaded.
5. The automatic sorting system of solar cell silicon wafers as claimed in claim 1, wherein: the sorting machine (4) is internally provided with a plurality of silicon chip material box placing parts corresponding to different color grades, photoelectric conversion rate grades and electric attenuation degree grades.
6. The automatic sorting system of solar cell silicon wafers as claimed in claim 5, wherein: the silicon chip material box placing parts are 2-22.
7. The automatic sorting system of solar cell silicon wafers as claimed in claim 1, wherein: the AOI color testing machine (1), the IV testing machine (2), the EL testing machine (3), the sorting machine (4) and the transplanting machine (5) are connected through belt conveyors.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020278764.8U CN212041566U (en) | 2020-03-09 | 2020-03-09 | Automatic sorting system for solar cell silicon wafers |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020278764.8U CN212041566U (en) | 2020-03-09 | 2020-03-09 | Automatic sorting system for solar cell silicon wafers |
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| Publication Number | Publication Date |
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| CN212041566U true CN212041566U (en) | 2020-12-01 |
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| CN202020278764.8U Active CN212041566U (en) | 2020-03-09 | 2020-03-09 | Automatic sorting system for solar cell silicon wafers |
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| CN (1) | CN212041566U (en) |
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Address after: 213000 No. 239, Xincheng Avenue, Jintan District, Changzhou City, Jiangsu Province Patentee after: Changzhou kelongwei Intelligent Technology Co.,Ltd. Address before: 213000 168 Huacheng Road, Jintan District, Changzhou, Jiangsu Patentee before: Changzhou xinlongwei Intelligent Technology Co.,Ltd. |
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