CN211784797U

CN211784797U - Test fixture

Info

Publication number: CN211784797U
Application number: CN202020386091.8U
Authority: CN
Inventors: 王学辉; 陈安稳
Original assignee: InfoVision Optoelectronics Kunshan Co Ltd
Current assignee: InfoVision Optoelectronics Kunshan Co Ltd
Priority date: 2020-03-24
Filing date: 2020-03-24
Publication date: 2020-10-27
Anticipated expiration: 2030-03-24

Abstract

The utility model relates to a display device tests technical field, specifically discloses a test fixture. The test fixture comprises a substrate and an adjusting assembly, wherein a via hole is formed in the substrate, a backboard to be tested can be installed on one side of the substrate, a PCB is pasted on the backboard to be tested through a double-faced adhesive tape to be tested, a FPC board is arranged on the PCB, the adjusting assembly is arranged on the other side of the substrate, the adjusting assembly comprises an adjusting portion, the adjusting portion comprises a fixing piece and a tension testing piece which are connected, one end, away from the PCB, of the FPC board can penetrate through the via hole and then be fixed on the fixing piece, and the tension testing piece is arranged on the. The utility model provides a test fixture, test procedure is simple, saves off-the-shelf backlight unit's use, and the test cost is low.

Description

Test fixture

Technical Field

The utility model relates to a display device tests technical field, especially relates to a test fixture.

Background

With the increasing maturity of the optoelectronic technology and the semiconductor manufacturing technology, the flat panel display device is developed. Among them, the liquid crystal display has advantages of low voltage operation, no radiation scattering, light weight, and small volume, and has been widely applied to various electronic devices such as notebook computers, personal digital assistants, and mobile phones.

To some backlight unit, paste on the PCB board after the FPC board need buckle, the PCB board passes through double faced adhesive tape and affixes on the backplate, nevertheless when high temperature work, the warpage easily takes place owing to receive the resilience force influence of FPC board for the PCB board, consequently, need look for a double faced adhesive tape, under the prerequisite that satisfies the electrical property of module, avoids the PCB board to take place the warpage under high temperature.

In the prior art, in order to find a suitable double-sided adhesive tape, an assembled backlight module is generally adopted for testing so as to simulate the influence of the resilience force of the FPC board on the PCB board. In actual test, one backlight module can only test the double-sided adhesive tape of one material, and the material of the double-sided adhesive tape in the industry at present exceeds 50, so that a large number of finished backlight modules are needed in the test process, and the material consumption and the labor consumption are high, and the cost is high.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a test fixture, its test procedure is simple, saves the off-the-shelf backlight unit's of test usefulness use, and is with low costs.

As the conception, the utility model adopts the technical proposal that:

a test fixture, comprising:

the PCB board is pasted on the backboard to be tested through a double faced adhesive tape to be tested, and the PCB board is provided with an FPC board;

the adjusting component is arranged on the other side of the substrate and comprises an adjusting portion, the adjusting portion comprises a fixing piece and a tension testing piece which are connected, one end of the FPC board, which is far away from the PCB board, can penetrate through the via hole and then is fixed on the fixing piece, and the tension testing piece is arranged on the substrate in a sliding mode.

Preferably, the adjusting assembly further comprises a sliding portion, the sliding portion is arranged on the substrate, and the sliding portion is used for driving the tensile test piece to slide.

Preferably, the sliding part includes a guide slide rail and a guide slider, the guide slide rail is disposed on the substrate, the guide slider is disposed on the tensile test piece, and the guide slider is slidably fitted to the guide slide rail.

Preferably, the adjustment assembly further comprises a first locking member configured to lock the guide slider.

Preferably, the first locking member is a screw guide post, and the screw guide post sequentially penetrates through the guide slide rail and the guide slide block.

Preferably, each of the sliding portions is provided with at least two of the adjusting portions, and the two adjusting portions pull one FPC board together.

Preferably, the base plate is provided with a plurality of test positions, the test positions are distributed along the length direction and/or the width direction of the base plate, each test position can be provided with one backboard to be tested, and each test position corresponds to one adjusting component.

Preferably, one end of the fixing piece, which is far away from the tension test piece, is provided with a jaw, a second locking piece is arranged at a position corresponding to the jaw, and one end of the FPC board, which is far away from the PCB board, can extend into the jaw and is fixed through the second locking piece.

Preferably, the backboard to be tested is detachably connected to the substrate.

Preferably, the test fixture further comprises a plurality of support columns, and the support columns are arranged at intervals along the circumferential direction of the substrate.

The utility model has the advantages that:

the utility model provides a test fixture, this test fixture includes base plate and adjusting part, one side of base plate is provided with the backplate that awaits measuring, the PCB board is pasted on the backplate that awaits measuring through the double faced adhesive tape that awaits measuring, the FPC board sets up on the PCB board, and the FPC board keeps away from the one end of PCB board and can pass on the mounting after the via hole is fixed in, adjustment pulling force test piece to default, then place this test fixture in the environment box, keep warm the preset time under the preset temperature, whether there is the warpage phenomenon between observation PCB board and the backplate that awaits measuring, then change different backplates that await measuring and the double faced adhesive tape that awaits measuring on this test fixture, through the test many times, select suitable double faced adhesive tape, promptly under the prerequisite that satisfies backlight unit's electrical property, avoid the PCB board to. The test fixture has simple test process, saves the use of the finished backlight module and has low test cost.

Drawings

Fig. 1 is a schematic structural diagram of a test fixture provided in an embodiment of the present invention at a viewing angle;

fig. 2 is a schematic structural diagram of a test fixture at another viewing angle according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of an adjusting assembly of a test fixture according to an embodiment of the present invention;

fig. 4 is a schematic structural view illustrating a warpage of a PCB in a natural state of the backlight module according to an embodiment of the present invention;

fig. 5 is a schematic structural diagram of the backlight module according to an embodiment of the present invention after a predetermined pulling force is applied.

In the figure:

100-a backboard to be tested; 200-a PCB board; 300-FPC board;

1-a substrate; 11-a via hole;

2-a regulating component; 21-a fixing member; 211-fixed columns; 212-a second lock; 22-tensile test piece; 23-a guide rail; 24-a guide slide; 25-a first locking member;

and 3-support column.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.

In the description of the present invention, unless expressly stated or limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, e.g., as meaning permanently connected, detachably connected, or integral to one another; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

In the present disclosure, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact between the first and second features, or may comprise contact between the first and second features not directly. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.

In the description of the present embodiment, the terms "upper", "lower", "left", "right", and the like are used in the orientation or positional relationship shown in the drawings only for convenience of description and simplicity of operation, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used only for descriptive purposes and are not intended to have a special meaning.

FIG. 1 is a schematic structural view of a test fixture provided by an embodiment of the present invention at one viewing angle, FIG. 2 is a schematic structural view of the test fixture provided by an embodiment of the present invention at another viewing angle, FIG. 3 is a schematic structural view of an adjusting component of the test fixture provided by an embodiment of the present invention, as shown in FIGS. 1-3, this embodiment provides a test fixture comprising a substrate 1 and an adjusting component 2, wherein a through hole 11 is provided on the substrate 1, a backplate 100 to be tested can be mounted on one side of the substrate 1, a PCB 200 is adhered to the backplate 100 to be tested by a double-sided adhesive tape to be tested, a FPC board 300 is provided on the PCB 200, the adjusting component 2 is disposed on the other side of the substrate 1, the adjusting component 2 comprises an adjusting portion, the adjusting portion comprises a fixing member 21 and a tension testing member 22 connected, one end of the FPC board 300 far away from the PCB 200 can pass through the through hole 11 and then, the tensile test piece 22 is slidably disposed on the substrate 1.

In the test fixture provided by this embodiment, during testing, firstly, the backplane 100 to be tested is disposed on the substrate 1, and one end of the FPC board 300 away from the PCB 200 is fixed on the fixing member 21 after passing through the hole 11, then the tension testing member 22 is slid on the substrate 1, when the tension testing member 22 indicates a preset tension, the sliding of the tension testing member 22 is stopped, and finally, the test fixture is placed in an environment box, and is kept at a preset temperature for a preset time, and whether a warping phenomenon occurs between the PCB 200 and the backplane 100 to be tested is observed; and then replacing the backboard to be tested 100 and the double-sided adhesive tape to be tested again, repeating the experiment process, and selecting a proper double-sided adhesive tape after a plurality of tests so as to avoid the warping of the PCB 200 at high temperature on the premise of meeting the electrical performance of the backlight module.

Alternatively, the tensile testing member 22 is a tensile meter, and of course, other tensile testing members 22 capable of testing the tensile force of the FPC board 300 may be used.

Fig. 4 is the warped structure diagram of the backlight module according to the embodiment of the present invention in the natural state, and fig. 5 is the warped structure diagram of the backlight module according to the embodiment of the present invention, and it should be noted that, as shown in fig. 4-5, the preset pulling force indicated on the pulling force testing member 22 of the testing fixture means that the pulling force used for pulling the PCB 200 to be smoothly adhered to the back plate through the double-sided adhesive tape is also the internal stress F between the FPC board 300 and the PCB 200.

With continued reference to fig. 1-3, the backplane 100 to be tested is preferably detachably connected to the substrate 1. Set up to the backplate 100 that awaits measuring to be connected with base plate 1 can dismantle, not only can realize the backplate 100 that awaits measuring and base plate 1's stable connection in the test procedure, only need set up a test fixture moreover, can accomplish the test to the backplate 100 that awaits measuring of multiple different materials and the double faced adhesive tape of multiple different grade type promptly to select suitable double faced adhesive tape from it and be used for backlight unit.

Specifically, the backboard 100 to be tested is provided with a first connecting hole, the substrate 1 is provided with a second connecting hole, and the connecting member sequentially penetrates through the first connecting hole and the second connecting hole. Preferably, in this embodiment, first connecting hole and second connecting hole are the screw hole, and the connecting piece is the screw, and threaded connection has processing simply, easy dismounting's advantage.

Further, the size of the substrate 1 may be designed according to the size of the environmental chamber, and is not limited herein. Preferably, in order to reduce the number of tests, the size of the substrate 1 may be designed to be slightly smaller than the size of the carrying area of the environmental chamber. By adopting the mode, a plurality of test positions can be arranged on the substrate 1, the test positions are distributed along the length direction and/or the width direction of the substrate 1, one backboard 100 to be tested can be placed on each test position, and each test position corresponds to one adjusting component 2. That is, during each test, the substrate 1 may be provided with the back plate 100 to be tested of different materials and the double-sided adhesive tape to be tested of the same kind, and may also be provided with the back plate 100 to be tested of the same material and the double-sided adhesive tape to be tested of different kinds for testing. Of course, the operator can also combine the backplane 100 to be tested made of any material and the double-sided adhesive tape to be tested of any kind on the substrate 1 as required, so as to select the most suitable double-sided adhesive tape for the backlight module through the fewest number of test groups, thereby saving the test time. It should be noted that the backplane 100 to be tested used in the test is not reused, and a new backplane 100 to be tested and a new double-sided tape to be tested need to be replaced during each test, so as to ensure the accuracy of the test result.

Further, as shown in fig. 2-3, the test fixture further includes a plurality of support columns 3, and the plurality of support columns 3 are disposed at intervals along the circumferential direction of the substrate 1. When the test fixture is placed in the environment box, the test fixture is fixed in the bearing area of the environment box through the support column 3.

Further, the adjusting assembly 2 further includes a sliding portion disposed on the substrate 1, and the sliding portion is used for driving the tension testing piece 22 to slide. Specifically, the sliding portion includes a guide rail 23 and a guide slider 24, the guide rail 23 is provided on the substrate 1, the guide slider 24 is provided on the tensile test piece 22, and the guide slider 24 is slidably fitted to the guide rail 23. Through setting up mutual sliding fit's guide slide rail 23 and direction slider 24, can provide the direction for the slip of tensile test piece 22 on base plate 1, guarantee its stable slip on base plate 1.

Further, the adjustment assembly 2 further comprises a first locking member 25, the first locking member 25 being configured to lock the guide slider 24. Preferably, in this embodiment, the first locking member 25 is a screw guide post, and the screw guide post is sequentially inserted through the guide rail 23 and the guide slider 24. When the pulling force of the fixing part 21 on the FPC board 300 needs to be adjusted, the screw guide posts are screwed, so that the guide sliders 24 slide on the guide slide rails 23, and after the pulling force testing part 22 indicates the preset pulling force value, the screw guide posts are screwed, so that the fixing part 21 applies the preset pulling force to the FPC board 300, and it is ensured that the pulling force applied by the fixing part 21 on the FPC board 300 is unchanged in the process of putting the testing jig into an environment box for heat preservation, so as to ensure the accuracy of the testing result.

Preferably, the number of the screw guide posts is two, and the two screw guide posts are respectively located at two ends of the guide slider 24, so that the position of the guide slider 24 relative to the substrate 1 can be more accurate, and the locking effect is better.

Further, in the present embodiment, each test bit corresponds to two vias 11 and two sliders. Specifically, in order to simulate the influence of the resilience of the FPC board 300 on the PCB 200 in the actual use process, in this embodiment, each test site is provided with one backplane 100 to be tested, one PCB 200 is attached to each backplane 100 to be tested, two FPC boards 300 are provided on each PCB 200, and each FPC board 300 corresponds to one via hole 11 and one sliding portion, so as to ensure that the test result is similar to the actual use condition. Of course, in other embodiments, one or more FPC boards 300 may be further disposed on each PCB 200, and the number of the via holes 11 and the number of the sliding portions corresponding to each test position are the same as the number of the FPC boards 300, so as to simulate the use condition of the finished backlight module.

Preferably, at least two adjustment portions are provided on each sliding portion, and the two adjustment portions pull one FPC board 300 together to reduce measurement errors.

Further, as shown in fig. 3, the fixing member 21 includes a fixing column 211 and a second locking member 212, one end of the fixing column 211 is connected to the tensile testing member 22, and the other end is provided with a jaw, and one end of the FPC board 300 away from the PCB 200 can extend into the jaw and be fixed by the second locking member 212.

The test fixture provided by the embodiment has the advantages of simple test process, capability of saving the use of the finished backlight module and lower test cost.

The above embodiments have been described only the basic principles and features of the present invention, and the present invention is not limited by the above embodiments, and is not departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims

1. A test fixture, comprising:

the PCB comprises a substrate (1), a through hole (11) is formed in the substrate, a backboard (100) to be tested can be installed on one side of the substrate (1), a PCB (200) is pasted on the backboard (100) to be tested through a double-sided adhesive tape to be tested, and an FPC board (300) is arranged on the PCB (200);

adjusting part (2), it set up in the opposite side of base plate (1), adjusting part (2) include the regulating part, the regulating part is including continuous mounting (21) and pulling force test piece (22), FPC board (300) are kept away from the one end of PCB board (200) can pass through via hole (11) after-fixing in on mounting (21), pulling force test piece (22) slide set up in on base plate (1).

2. The testing jig according to claim 1, wherein the adjusting assembly (2) further comprises a sliding portion, the sliding portion is disposed on the substrate (1), and the sliding portion is used for driving the tensile testing element (22) to slide.

3. The test fixture according to claim 2, wherein the sliding portion comprises a guide rail (23) and a guide slider (24), the guide rail (23) is disposed on the substrate (1), the guide slider (24) is disposed on the tensile test piece (22), and the guide slider (24) is slidably fitted to the guide rail (23).

4. A test fixture according to claim 3, wherein the adjustment assembly (2) further comprises a first locking member (25), the first locking member (25) being configured to lock the guide slider (24).

5. The test fixture according to claim 4, wherein the first locking member (25) is a screw guide post, and the screw guide post is sequentially inserted into the guide rail (23) and the guide slider (24).

6. The testing fixture according to claim 2, wherein each sliding portion is provided with at least two adjusting portions, and the two adjusting portions pull one FPC board (300) together.

7. The test fixture according to any one of claims 1 to 6, wherein a plurality of test sites are disposed on the substrate (1), the plurality of test sites are distributed along a length direction and/or a width direction of the substrate (1), each test site can be placed with one backboard (100) to be tested, and each test site corresponds to one adjusting component (2).

8. The test fixture according to any one of claims 1 to 6, wherein a jaw is disposed at an end of the fixture (21) away from the tensile test piece (22), a second locking piece (212) is disposed at a position corresponding to the jaw, and an end of the FPC board (300) away from the PCB (200) can extend into the jaw and be fixed by the second locking piece (212).

9. The test fixture according to any one of claims 1-6, wherein the back plate (100) to be tested is detachably connected to the substrate (1).

10. A test fixture according to any one of claims 1-6, further comprising a plurality of support columns (3), wherein the plurality of support columns (3) are arranged at intervals along the circumference of the substrate (1).