CN211627741U - Pluggable board card connection structure and semiconductor automatic test equipment - Google Patents
Pluggable board card connection structure and semiconductor automatic test equipment Download PDFInfo
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- CN211627741U CN211627741U CN202021607340.8U CN202021607340U CN211627741U CN 211627741 U CN211627741 U CN 211627741U CN 202021607340 U CN202021607340 U CN 202021607340U CN 211627741 U CN211627741 U CN 211627741U
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Abstract
The utility model discloses a but plug-in board card is connected structure, automatic test equipment of semiconductor, including the load board with survey test panel, the load board with survey test panel between be provided with be used for guaranteeing its guide structure of both mutual translations and be used for guaranteeing its both interconnect's lead screw structure, guide structure with lead screw structure parallel arrangement, guide structure with the load board is arranged perpendicularly. The utility model can reliably and stably realize the inter-plate butt joint of the automatic test equipment, so that the connector butt joint of the automatic test equipment board card is more reliable, the replacement and maintenance of various test load boards are easier, and the integrity and the reliability of signals are ensured; and simultaneously, the hardware cost and the maintenance cost are effectively reduced.
Description
Technical Field
The utility model belongs to the technical field of the semiconductor test, concretely relates to pluggable board card connects structure, automatic test equipment of semiconductor.
Background
In the field of semiconductor testing, both wafer testing and finished product testing require automatic testing equipment to test high-speed signals and high-precision signals of a device to be tested, and professional high-speed probe schemes, such as vertical probes and other technologies, are often adopted in the wafer testing stage, so that the hardware cost of the automatic testing equipment is greatly increased. The biggest goal of wafer testing is to ensure that the bad wafers are screened out as much as possible before the chips are packaged, thereby saving the packaging and testing costs. The finished product test is a chip-level finished product test, mainly for the application aspect of the IC or Device chip (passing through the wafer test); the finished product test is to pick out the bad chips, to test the packaging yield, and the finished product test can test the manufacturing process level of the packaging factory.
In the wafer test and finished product test stages, automatic test equipment with high reliability and stability is required to be designed, the automatic test equipment consists of an electronic circuit and mechanical hardware, and is a geometric body of a power supply, a metering instrument, a signal generator, a Pattern generator and other hardware items under the command of the same main controller, and the test system relates to inter-board butt joint, board card connector butt joint, high-precision alignment and the like so as to ensure the integrity and reliability of signals. The automatic test equipment is not only considered to have high reliability and high stability, but also considered to have cost reduction and easy maintainability.
The test board and the load board of the automatic test equipment with the existing scheme often need to be separated or aligned with the connector through a manual power-assisted wrench, and in the operation of connector alignment or separation, due to the fact that the insertion and extraction force is large, the left hand and the right hand are needed to operate simultaneously, the problem of inaccurate alignment or unreliable connection is easily caused, and more serious damage to the connector and the board card can be caused.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problem, the utility model adopts the pluggable board card connecting structure and the automatic semiconductor testing equipment, which can reliably and stably realize the inter-board butt joint of the automatic testing equipment, so that the butt joint of the connector of the automatic testing equipment board card is more reliable, a plurality of test load boards are easier to replace and maintain, and the integrity and the reliability of signals are ensured; and simultaneously, the hardware cost and the maintenance cost are effectively reduced.
The technical scheme adopted by the invention is as follows: a pluggable board card connecting structure comprises a load board and a test board, wherein a guide structure for ensuring mutual translation of the load board and the test board and a lead screw structure for ensuring mutual connection of the load board and the test board are arranged between the load board and the test board, the guide structure is arranged in parallel with the lead screw structure, and the guide structure is arranged perpendicular to the load board.
In a preferred embodiment of the present invention, the guide structure comprises a guide pin disposed on the load board and a guide hole disposed on the test board and engaged with the guide pin.
In a preferred embodiment of the present invention, the load board is provided with a plurality of guide pins, and the diameter of at least one guide pin is different from the diameters of the other guide pins.
In a preferred embodiment of the present invention, the screw structure includes a screw rod disposed on the test board and rotatable only around its axis and a nut disposed on the load board and engaged with the screw rod.
In a preferred embodiment of the present invention, the screw is connected to the test board through a bearing, the central axis of the screw is perpendicular to the test board, and a notch for driving the screw to rotate is formed on the end surface of the screw facing the load board.
In a preferred embodiment of the present invention, the nut includes internal threads machined into the hole and the inner wall of the hole in the load plate.
In a preferred embodiment of the present invention, the load plate includes an upper load part and a lower support part which are connected to each other, and the upper load part and the lower support part are detachably connected to each other.
In a preferred embodiment of the present invention, the upper load portion is provided with a plurality of first connectors, and the lower support portion is provided with a guide pin and a nut.
In a preferred embodiment of the present invention, the load board is provided with a first connector, the test board is provided with a second connector, the number of the first connectors corresponds to the number of the second connectors, and the arrangement positions of the first connectors correspond to the arrangement positions of the second connectors.
The utility model also discloses an automatic test equipment of semiconductor, it is including pluggable board card connection structure
The utility model discloses an in a preferred embodiment, automatic test equipment of semiconductor includes that the array concatenation is arranged the polylith can plug board card connection structure.
The utility model has the advantages that: the utility model has simple structure and convenient use, effectively improves the stability and reliability of the butt joint between the boards of the automatic test equipment by adding the guide structure and the lead screw structure on the load board and the test board, and leads the butt joint or the separation of the connectors between the boards to be more labor-saving and effective; furthermore, the utility model adopts the structural design of the guide pin and the guide hole, so that the cost is low and the alignment is accurate; furthermore, the utility model adopts guide pins with different sizes, which can effectively prevent the false plugging, ensure the accuracy of the butt joint between the board cards and prevent the misoperation damage, and simultaneously, the better guide performance ensures the precise butt joint; furthermore, the load board and the test board of the utility model adopt a modular design, can be quickly copied in a simple array arrangement mode, and can be applied in a large scale; further, the utility model discloses can be to the different tested piece test demands, can quick replacement load board, have fine compatibility, the comprehensive testing cost is lower.
Drawings
FIG. 1 is a schematic diagram of a prior art test board;
FIG. 2 is a schematic diagram of a pluggable board card connection structure according to the present invention;
FIG. 3 is a schematic diagram of a pluggable board card connection structure according to the present invention;
FIG. 4 is a top view of a pluggable board card connecting structure according to the present invention;
FIG. 5 is a cross-sectional view A-A of FIG. 4;
FIG. 6 is a schematic diagram of a connector docking state of a pluggable board card connection structure according to the present invention;
FIG. 7 is a schematic diagram of a connector docking state of a pluggable board card connection structure according to the present invention;
FIG. 8 is a schematic diagram of a connector separated state of the pluggable board connection structure according to the present invention;
FIG. 9 is a schematic diagram of a connector separated state of the pluggable board connection structure according to the present invention;
FIG. 10 is a scale application diagram of a pluggable board card connecting structure according to the present invention;
in the figure: 1. a load board; 2. a test board; 3. a guide pin; 4. a guide hole; 5. a screw; 6. a nut; 7. a bearing; 8. a notch; 9. an upper load section; 10. a lower support section; 11. a first connector; 12. a second connector; 13. a device under test.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the invention.
Referring to fig. 1-10, the present invention discloses a pluggable board card connection structure, which includes a load board 1 and a test board 2, wherein a guiding structure for ensuring the mutual translation of the load board 1 and the test board 2 and a lead screw structure for ensuring the mutual connection of the load board and the test board are disposed between the load board 1 and the test board 2, the guiding structure is disposed in parallel with the lead screw structure, and the guiding structure is disposed perpendicular to the load board 1.
Preferably, the guide structure comprises guide pins 3 provided on the load board 1 and guide holes 4 provided on the test board 2 to mate with the guide pins 3.
Preferably, 4 guide pins 3 are arranged on the load board 1, wherein the diameter of 1 guide pin is R1, the diameter of the other 3 guide pins is R2, R1 is smaller than R2, the load board 1 can only be inserted and conducted with the test board 2 from one angle, if the guide pins 3 with the same size are not used, the installation angle of the load board 1 during installation cannot be confirmed, so that incorrect installation of the load board 1 may be caused (if the load board is rotated about its own axis by more than 90 degrees relative to a standard installation position), and if the angle of the load board 1 is not correct, the guide pins 3 are not corresponding in position, so that the installation accuracy of the load board 1 is ensured.
Preferably, the screw structure comprises a screw 5 arranged on the test plate 2 and rotatable only about its own axis, and a nut 6 arranged on the load plate 1 to cooperate with the screw 5.
Preferably, the screw 5 is connected with the test plate 2 through a bearing 7, the central axis of the screw 5 is perpendicular to the test plate 2, and a notch 8 for driving the screw 5 to rotate is formed on the end face of the screw 5 facing to the load plate 1 side.
Preferably, the nut 6 includes internal threads machined into the hole in the load plate 1 and the inner wall of the hole.
Preferably, the load plate 1 includes an upper load part 9 and a lower support part 10 connected to each other, and the upper load part 9 and the lower support part 10 are detachably connected to each other.
Preferably, a plurality of first connectors 11 are provided on the upper load part 9, the guide pins 3 and the nuts 6 are provided on the lower load part 10, and the upper end surfaces of the pair of upper load parts 9 are used for mounting the device under test 13.
Preferably, the load board 1 is provided with first connectors 11, the test board 2 is provided with second connectors 12, the number of the first connectors 11 corresponds to the number of the second connectors 12, the arrangement position of the first connectors 11 corresponds to the arrangement position of the second connectors 12, and the first connectors 11 and the second connectors 12 can be quickly, accurately and reliably butted.
The utility model discloses a use method as follows:
during installation, the loading plate is placed on the test plate, the correctness of the direction can be guaranteed by the guide pin, and the alignment accuracy of the connector can be protected. And the screw rod on the test board is rotated clockwise by the screwdriver, the screw rod is meshed with the threaded hole on the load board, the load board is pulled downwards, and the first connector and the second connector are reliably butted.
When the connector is disassembled or replaced, the connector and the connector can be quickly, accurately and reliably separated. And the screw rod is rotated anticlockwise, the screw rod is meshed with a threaded hole in the load plate, the load plate is pushed upwards, the connectors are accurately separated, and the guide pin ensures smooth separation.
The load board and the test board are in modular design, can be applied in a large scale through rapid replication, provide and test data, and can effectively reduce hardware cost and test cost.
The utility model also discloses an automatic test equipment of semiconductor, it includes aforementioned pluggable board card connection structure, and automatic test equipment's survey test panel is used for switching on by the test piece, and automatic test equipment's load board is used for the location by the test piece and makes it and survey test panel and switch on.
Preferably, the semiconductor automatic test equipment includes a plurality of pluggable board card connection structures arranged in an array mosaic as shown in fig. 10.
The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope defined by the claims.
Claims (10)
1. The utility model provides a pluggable board card connects structure, includes load board and test panel, its characterized in that: the loading board and the test board are provided with a guide structure for ensuring mutual translation of the loading board and the test board and a lead screw structure for ensuring mutual connection of the loading board and the test board, the guide structure and the lead screw structure are arranged in parallel, and the guide structure and the loading board are arranged vertically.
2. The pluggable-card connection structure of claim 1, wherein: the guide structure comprises a guide pin arranged on the load plate and a guide hole arranged on the test plate and matched with the guide pin.
3. The pluggable-card connection structure of claim 2, wherein: the load plate is provided with a plurality of guide pins, and the diameter of at least one guide pin is different from the diameters of the rest guide pins.
4. The pluggable-card connection structure of claim 1, wherein: the lead screw structure comprises a screw rod which is arranged on the test board and can only rotate around the axis of the screw rod and a nut which is arranged on the load board and is matched with the screw rod.
5. The pluggable-card connection structure of claim 4, wherein: the screw rod is connected with the test plate through a bearing, the central axis of the screw rod is perpendicular to the test plate, and a notch for driving the screw rod to rotate is machined in the end face, facing to the load plate side, of the screw rod.
6. The pluggable-card connection structure of claim 4, wherein: the nut includes a hole machined in the load plate and internal threads on the inner wall of the hole.
7. The pluggable-card connection structure of claim 1, wherein: the load plate includes an upper load part and a lower support part which are connected to each other, and the upper load part and the lower support part are detachably connected to each other.
8. The pluggable-card connection structure of claim 1, wherein: the load board is provided with a first connector, the test board is provided with a second connector, the number of the first connectors corresponds to that of the second connectors, and the arrangement positions of the first connectors correspond to those of the second connectors.
9. An automatic test equipment for semiconductor, characterized in that: comprising a pluggable-card connection structure according to any one of claims 1-8.
10. The semiconductor automatic test equipment of claim 9, wherein: the card connecting structure comprises a plurality of pluggable board card connecting structures which are spliced in an array manner.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021607340.8U CN211627741U (en) | 2020-08-05 | 2020-08-05 | Pluggable board card connection structure and semiconductor automatic test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021607340.8U CN211627741U (en) | 2020-08-05 | 2020-08-05 | Pluggable board card connection structure and semiconductor automatic test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211627741U true CN211627741U (en) | 2020-10-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202021607340.8U Active CN211627741U (en) | 2020-08-05 | 2020-08-05 | Pluggable board card connection structure and semiconductor automatic test equipment |
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| Country | Link |
|---|---|
| CN (1) | CN211627741U (en) |
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- 2020-08-05 CN CN202021607340.8U patent/CN211627741U/en active Active
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