CN211577228U

CN211577228U - Display panel CELL end and board-to-board connector test jig

Info

Publication number: CN211577228U
Application number: CN202020121573.0U
Authority: CN
Inventors: 全冠旭; 雷鸣
Original assignee: Nanjing Microbridge Testing Technology Co ltd
Current assignee: Nanjing Microbridge Testing Technology Co ltd
Priority date: 2020-01-19
Filing date: 2020-01-19
Publication date: 2020-09-25
Anticipated expiration: 2030-01-19

Abstract

A jig for testing a CELL end and a board-to-board connector of a display panel comprises a detection mechanism, a patch panel and a checking machine, wherein the detection mechanism is connected with the patch panel, the patch panel is connected with the checking machine through a connecting flat cable, and a testing probe is arranged in the detection mechanism. The test probe is a diaphragm type test probe, the middle of the test probe is of a semicircular structure, the upper end vertical section is used for being in contact with the test end of a tested workpiece, the lower end vertical section is parallel to the upper end vertical section, and the test probe is manufactured in modes of laser cutting, sheet metal stamping parts and the like, so that mass production can be realized, the manufacturing cost of the probe is saved, and later-stage maintenance is facilitated. The membrane type probe can correspond to different test environments of a small PITCH and an upper PITCH and a lower PITCH, is high in universality, and can be used for panel detection industry and all industry detection with plates and plate connectors or with lines.

Description

Display panel CELL end and board-to-board connector test jig

Technical Field

The utility model relates to an electronic product components and parts subassembly test technical field specifically is a display panel CELL end and board are to tool for board connector test.

Background

With the rapid development of display-related electronic products such as smart phones, tablet computers, notebooks, high-definition televisions, smart watches, and the like, the demand of the market for the consumer electronics industry is increasing. The method also puts higher requirements on the product productivity, the yield and the like of display screen manufacturers. In the production process of the display screen, the detection link plays a very important role in the whole process, and is directly related to the production speed, the yield, the quality and other key factors of the display screen.

The existing test probe for testing the glass circuit is a double-head spring probe, and a spring needs to be manually assembled into the probe. Secondly, the application range of the double-head spring probe is limited, and the double-head spring probe cannot well correspond to the test environment of the micro PITCH.

SUMMERY OF THE UTILITY MODEL

In order to solve the problem, the utility model provides a only need equipment cutting preparation such as laser cutting or panel beating punching press to accomplish, can realize mass production's diaphragm formula probe and the test fixture who corresponds, specifically include detection mechanism, keysets and inspection machine, detection mechanism with the keysets is connected, the keysets through connect the winding displacement with the inspection machine is connected, be equipped with test probe among the detection mechanism, test probe is diaphragm formula test probe, and the centre is semi-circular structure, the upper end vertical section be used for with the test end contact of being surveyed the work piece, the lower extreme vertical section is parallel with the upper end vertical section.

Further, the detection mechanism comprises a bottom plate, and a support plate is fixedly connected to the bottom plate through a positioning pin.

Furthermore, the adapter plate comprises a hasp, and a probe seat is arranged below the hasp.

Further, detection mechanism includes the mounting panel, be equipped with the fixed plate on the mounting panel to fix a position on the fixed plate through the locating pin.

Furthermore, a floating plate groove is arranged on the fixed plate, and a floating plate is installed on the fixed plate.

Further, the floating plate is fixed on the fixed plate through screws.

Furthermore, a cavity is arranged on the floating plate.

Furthermore, a spring groove is formed in the floating plate and penetrates through the fixed plate downwards, and a spring is arranged in the spring groove.

Furthermore, a probe groove is arranged among the mounting plate, the fixed plate and the floating plate.

Furthermore, a flexible silica gel block is arranged in the probe groove.

The utility model has the advantages that the diaphragm type probe is cut and manufactured by equipment such as laser cutting or sheet metal stamping, the mass production can be realized, the manufacturing cost of the probe is saved, and the later maintenance is convenient; the membrane type probe can correspond to different test environments of upper and lower PITCHs, is high in universality, and can be used for panel detection industry and all industry detection with plates and plate connectors or with lines.

Drawings

Fig. 1 is a schematic structural view of the middle test fixture of the present invention.

Fig. 2 is a schematic structural view of the transfer board of the present invention.

Fig. 3 is a schematic structural diagram of the middle detecting mechanism of the present invention.

Fig. 4 is a sectional view of the detecting mechanism of the present invention.

Fig. 5 is a schematic diagram of a probe slot and a test probe portion of the present invention.

Fig. 6 is a schematic diagram of the middle test probe crimping according to the present invention.

The testing device comprises an adapter plate 1, an inspection machine 2, a connecting flat cable 3, a testing probe 4, a bottom plate 5, a carrier plate 6, a hasp 7, a probe seat 8, a mounting plate 9, a fixing plate 10, a positioning pin 11, a floating plate 12, a cavity 13, a spring groove 14, a spring 15, a probe groove 16, a flexible silica gel block 17, a fixed probe silica gel 18 and a tested workpiece 19.

Detailed Description

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly described below, and it is obvious that the drawings in the description below are only some embodiments of the present invention, and it is obvious for those skilled in the art that other obvious modifications can be obtained without inventive efforts.

As shown in fig. 1, the jig for testing the CELL end and board-to-board connector of the display panel comprises a detection mechanism, an adapter plate 1 and an inspection machine 2, wherein the detection mechanism is connected with the adapter plate 1, and the adapter plate 1 is connected with the inspection machine 2 through a connecting flat cable 3.

As shown in fig. 2, the adapter plate 1 includes a buckle 7, and a probe seat 8 is disposed below the buckle 7.

As shown in fig. 3, the detection mechanism includes a mounting plate 9, and a fixing plate 10 is disposed on the mounting plate 9 and is positioned on the fixing plate 10 by a positioning pin 11. The fixed plate 10 is provided with a floating plate groove and a floating plate 12, and the floating plate 12 is provided with a cavity 13.

It should be noted that the size of the cavity 13 corresponds to the size of the workpiece 19 to be measured. The workpiece 19 to be tested is placed in the cavity 13, and the testing end of the workpiece 19 to be tested is in contact with the vertical section of the upper end of the testing probe 4.

The test probe 4 is a diaphragm type test probe, the middle part of the test probe is of a semicircular structure, the vertical section at the upper end is used for being in contact with the test end of the tested workpiece, and the vertical section at the lower end is parallel to the vertical section at the upper end. It should be noted that the vertical section at the upper end is not overlapped with the vertical section at the lower end, and the design scheme can be applied to test environments with different upper and lower center distances. The test probe 4 is a stamping sheet metal part or a laser cutting sheet metal part, and the middle semicircular structure plays a certain spring type buffering role. The vertical section at the lower end is connected with the middle semicircular structure, and the protruding part plays a role in increasing the strength and can also be used as a test probe when facing complex test conditions.

Preferably, the thickness of the test probe 4 can be processed to be very thin according to the thickness of the sheet metal part, and various shapes can be made according to the test environment.

A spring groove 16 is formed in the floating plate 12 and penetrates the fixed plate 10 downward, and a spring 15 is arranged in the spring groove 16. It should be noted that, in a normal state, the spring 15 is ejected upward to protect the test probe 4, and during a test, the spring 15 is pressed downward, and a vertical section at the upper end of the test probe 4 is in contact with a test end of a workpiece to be tested.

When the test probe 4 is used for testing, the floating plate 12 is pressed down by the pressure head, and the test end of the workpiece to be tested is contacted with the test probe 4. It should be noted that the semicircular structure part of the test probe 4 is connected with the fixing plate 10 through a fixing probe silica gel 18, the flexible silica gel block 17 is connected between the vertical sections at the lower end of the test probe 4, during testing, the test probe 4 can deform under a downward stress, the flexible silica gel block 17 deforms accordingly, and after the pressure head is bounced open, the test probe 4 is jacked upwards by the flexible silica gel block 17 to restore the original shape.

The utility model has the advantages that the probe is manufactured and finished in the modes of laser cutting, metal plate stamping parts and the like, so that mass production can be realized, the manufacturing cost of the probe is saved, and the later maintenance is convenient; the membrane type probe can correspond to different test environments of a small PITCH and an upper PITCH and a lower PITCH, is high in universality, and can be used for panel detection industry and all industry detection with plates and plate connectors or with lines.

Claims

1. The utility model provides a display panel CELL end and board are tool for board to board connector test, includes detection mechanism, keysets and inspection machine, detection mechanism with the keysets is connected, the keysets through connecting the winding displacement with the inspection machine is connected, be equipped with the test probe among the detection mechanism, its characterized in that, the test probe is diaphragm formula test probe, and the centre is semi-circular structure, and the upper end vertical section is used for holding the contact with the test of being surveyed the work piece, and the lower extreme vertical section is parallel with the upper end vertical section.

2. The fixture for testing the CELL end of the display panel and the board-to-board connector as claimed in claim 1, wherein the inspecting mechanism comprises a bottom board, and a carrier board is fixedly connected to the bottom board through a positioning pin.

3. The fixture for testing the CELL end of the display panel and the board-to-board connector as claimed in claim 1, wherein the adapter board comprises a hasp, and a probe seat is disposed under the hasp.

4. The fixture of claim 1, wherein the inspection mechanism comprises a mounting plate, and the mounting plate is provided with a fixing plate and is positioned on the fixing plate by a positioning pin.

5. The fixture for testing the CELL end of a display panel and the board-to-board connector as claimed in claim 4, wherein the fixing plate has a floating plate slot and a floating plate mounted thereon.

6. The fixture for testing the CELL end of the display panel and the board-to-board connector as claimed in claim 5, wherein the floating plate is fixed on the fixing plate by screws.

7. The fixture for testing the CELL end of a display panel and the board-to-board connector as claimed in claim 5, wherein the floating plate has a cavity.

8. The fixture of claim 5, wherein a spring slot is formed in the floating plate and extends downward through the fixing plate, and a spring is disposed in the spring slot.

9. The fixture for testing the CELL end of a display panel and the board-to-board connector as claimed in claim 5, wherein probe slots are defined between the mounting plate, the fixing plate and the floating plate.

10. The fixture for testing the CELL end of a display panel and the board-to-board connector as claimed in claim 9, wherein the probe slot is further provided with a flexible silica gel block.