CN211553818U - Quick-release multi-position sample holder for X-ray diffractometer - Google Patents
Quick-release multi-position sample holder for X-ray diffractometer Download PDFInfo
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- CN211553818U CN211553818U CN201922379738.4U CN201922379738U CN211553818U CN 211553818 U CN211553818 U CN 211553818U CN 201922379738 U CN201922379738 U CN 201922379738U CN 211553818 U CN211553818 U CN 211553818U
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Abstract
The utility model relates to a many sample framves of quick-release formula for X-ray diffractometer relates to X-ray diffraction test field, and a more loaded down with trivial details problem of change sample when having solved the extensive X-ray diffraction test among the prior art. The method comprises the following steps: a single sample piece through which powder, liquid, gel and bulk samples are loaded; a multi-position sample chip slot for loading a plurality of single sample chips; and a transfer block for loading the multi-position sample chip slot on an electric displacement table of the diffractometer. The utility model is simple in operation, can realize the quick automatic switch-over of a plurality of samples, reduced in the past many sample frame need one put into when changing the sample loaded down with trivial details and occupation time problem.
Description
Technical Field
The utility model relates to an X-ray diffraction tests technical field, in particular to X-ray diffraction appearance is with many sample frame of quick-release type.
Background
X-ray diffraction is the most common method of characterizing the crystal structure of a material and has a very large number of applications. Generally, the sample grooves containing only one sample are replaced on the sample platform one by one during testing. If the sample amount is large and rapid testing and screening are needed, the operation method is very complicated and low in efficiency.
Diffraction instrument manufacturers have therefore introduced several multi-position sample holders, such as the wheeled 8-position sample holder of japan, and the row-type 9-position sample holder of bruke, germany. However, these sample holders tend to be bulky and complicated to replace; and when the samples are replaced, the instrument doors need to be opened one by one for replacement, so that the rapid replacement of a plurality of samples cannot be realized. In fact, instruments such as smartlab diffractometers of Japan science companies and the like are provided with electric translation tables which can be disassembled quickly, and on the other hand, mortise and tenon structures in the traditional Chinese woodworking technology can also realize quick combination and separation of parts, so that the development of a quick-disassembly type multi-position sample rack based on the electric translation tables is necessary.
SUMMERY OF THE UTILITY MODEL
The utility model discloses a change more loaded down with trivial details technical problem of sample when solving the extensive X-ray diffraction test among the prior art, provide a X-ray diffraction appearance is with many sample framves of quick-release formula.
In order to solve the technical problem, the technical scheme of the utility model is specifically as follows:
a quick release multi-position sample holder for an X-ray diffractometer comprising:
a single sample piece through which powder, liquid, gel and bulk samples are loaded;
a multi-sample plate slot through which a plurality of said individual sample plates are loaded;
and a transfer block for loading the multi-position sample piece groove on an electric displacement table of the diffractometer through the transfer block.
Preferably, the single sample piece comprises:
a single sample wafer substrate;
the sample loading groove is formed in the upper surface of the single sample chip substrate and is used for loading powder, liquid, colloid and block samples;
and the assembling limiting notch is arranged on the side surface of the single sample chip substrate.
Preferably, the multi-sample strip well includes:
a multi-position sample wafer slot substrate;
and the number of the rapid assembly grooves is 20, and the rapid assembly grooves are uniformly distributed on the upper surface of the multi-position sample plate groove substrate in a 4-row and 5-column mode, and the single sample plate is loaded through the assembly matching between the rapid assembly grooves and the assembly limiting notches.
Preferably, the lower surface side of the single sample chip substrate is an upwardly inclined bottom surface.
Preferably, the adaptor block includes:
the device comprises a transfer block base body, wherein one side of the transfer block base body, which faces an electric displacement table of the diffractometer, is a fixed surface, and one side of the transfer block base body, which faces the multi-position sample wafer groove base plate, is a splicing surface.
Preferably, a middle recess is formed in the splicing surface of the switching block base body, and a screw through hole for assembling with an electric displacement table of a diffractometer through a screw is formed in the inner side of the middle recess;
and the fixed surface of the adapter block substrate is in contact with an electric displacement table of the diffractometer.
Preferably, the splicing surface of the switching block base body is provided with a switching end positioning column or a switching end positioning hole;
a loading end positioning hole or a loading end positioning column corresponding to the switching end positioning column or the switching end positioning hole is arranged on the surface of one side, facing the switching block base, of the multi-position sample wafer groove substrate;
and the splicing surface of the transfer block base body is contacted with the multi-position sample piece groove base plate.
The utility model discloses following beneficial effect has:
the utility model discloses a quick-release multi-position sample holder for X-ray diffractometer, firstly, a single sample sheet is similar to the structure of the traditional sample groove, and can be respectively filled and prepared according to the prior method; then, a plurality of single sample slices are placed in the multi-position sample slice groove outside the instrument, so that the time that one sample slice needs to be replaced inside the instrument when the sample of the conventional multi-position sample rack is replaced can be saved; then the sample is placed on a switching block of an electric translation table in the diffractometer, and the switching block is used for realizing the positioning, accurate and quick loading and unloading between the multi-position sample slice groove and the electric translation table in the diffractometer; and finally, controlling the movement of the electric translation stage of the diffractometer to move the single sample piece at the designated position to the position to be tested for carrying out the series of tests. To sum up, the utility model is simple in operation, can realize the quick automatic switch-over of a plurality of samples, reduced many sample frame in the past and need a loaded down with trivial details and the occupation time problem of putting into when changing the sample.
Drawings
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
FIG. 1 is a schematic structural view of a quick-release multi-position sample holder for an X-ray diffractometer according to the present invention;
FIG. 2 is an exploded view of a quick-release multi-position sample holder for an X-ray diffractometer according to the present invention;
FIG. 3 is a front view of a single sample wafer of a quick-release multi-position sample holder for an X-ray diffractometer according to the present invention;
FIG. 4 is a side sectional view of a single sample wafer of a quick-release multi-position sample holder for an X-ray diffractometer according to the present invention;
FIG. 5 is a front view of a multi-position sample slot of a quick-release multi-position sample holder for an X-ray diffractometer according to the present invention;
FIG. 6 is a side sectional view of a multi-position sample holder of the present invention;
FIG. 7 is a front view of a transfer block of a quick-release multi-position sample holder for an X-ray diffractometer according to the present invention;
fig. 8 is a side sectional view of the transfer block of the quick-release multi-position sample holder for an X-ray diffractometer according to the present invention.
The reference numerals in the figures denote:
1. a single sample wafer substrate; 2. a sample loading slot; 3. assembling a limiting notch; 4. a multi-position sample wafer slot substrate; 5. assembling the grooves quickly; 6. a transfer block substrate; 7. a middle recess; 8. a screw through hole; 9. a transfer terminal positioning column; 10. and a loading end positioning hole.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-8, a quick-release multi-stage sample holder for an X-ray diffractometer includes:
a single sample piece through which powder, liquid, gel and bulk samples are loaded;
a multi-position sample chip slot for loading a plurality of single sample chips;
and a transfer block for loading the multi-position sample chip slot on an electric displacement table of the diffractometer.
The individual sample pieces include:
a single sample wafer substrate 1;
the sample loading groove 2 is formed in the upper surface of the single sample chip substrate 1 and used for loading powder, liquid, colloid and block samples;
and the assembling limiting notch 3 is arranged on the side surface of the single sample film substrate 1.
The multi-sample sheet well includes:
a multi-position sample piece slot substrate 4;
and the rapid assembly grooves 5 are 20 in number and are uniformly distributed on the upper surface of the multi-position sample slice groove substrate 4 in a 4-row and 5-column mode, and a single sample slice is loaded through the assembly matching between the rapid assembly grooves 5 and the assembly limiting notches 3.
The lower surface side of the single sample piece substrate 1 is an upwardly inclined bottom surface.
The switching piece includes:
the switching block base body 6, the switching block base body 6 is the stationary plane towards the one side of the electronic displacement platform of diffractometer, and the switching block base body 6 is the concatenation face towards the one side of many sample wafer slot base plates 4.
The splicing surface of the transfer block base body 6 is provided with a middle recess 7, and the inner side of the middle recess 7 is provided with a screw through hole 8 which is used for being assembled with an electric displacement table of a diffractometer through a screw;
the fixed surface of the transfer block matrix 6 is contacted with an electric displacement table of the diffractometer.
The splicing surface of the switching block base body 6 is provided with a switching end positioning column 9 or a switching end positioning hole;
a loading end positioning hole 10 or a loading end positioning column corresponding to the switching end positioning column 9 or the switching end positioning hole is arranged on the surface of one side of the multi-position sample chip groove substrate 4 facing the switching block base body 6;
the splicing surface of the transfer block base body 6 is contacted with the multi-position sample slice groove base plate 4.
The working principle is as follows:
firstly, a sample loading groove 2 on a single sample piece substrate 1 in a single sample piece is used for loading powder, liquid, colloid and block samples, the single sample piece is placed in a rapid assembling groove 5 on a multi-sample piece groove substrate 4 in a multi-sample piece groove, wherein the rapid assembling groove 5 is matched with the single sample piece substrate 1 and an assembling limiting notch 3 on the single sample piece substrate 1, so that the single sample piece is placed in the rapid assembling groove 5 in a shape matching mode. Wherein lower surface one side on the single sample piece base plate 1 in the single sample piece is the bottom surface of tilt up, is in order to leave the gap between the lower surface on the single sample piece base plate 1 and the many sample piece groove base plate 4, and convenient tweezers are got when conveniently taking off single sample piece base plate 1 from many sample piece groove base plate 4 afterwards. The rapid splicing grooves 5 on the multi-position sample piece groove substrate 4 are provided with 20 and are uniformly arranged and distributed in 4 rows and 5 columns so as to be capable of loading a plurality of single sample pieces.
When detecting the sample, the multi-position sample slice groove is loaded on the electric displacement table of the diffractometer through the transfer block. Specifically, the fixing surface of the switching block base body 6 in the switching block, which faces the electric displacement table side of the diffractometer, is connected with the electric displacement table of the diffractometer, and is assembled on the electric displacement table of the diffractometer through a screw through hole 8 arranged on the inner side of the middle recess 7 by a screw. And then the mortise and tenon structure is utilized to realize the rapid combination and separation between the multi-position sample sheet groove and the switching block, and then the rapid combination and separation between the multi-position sample sheet groove and the electric displacement platform of the diffractometer are realized. Specifically, when the transfer end positioning columns 9 are arranged on the splicing surfaces of the transfer block substrates 6, the loading end positioning holes 10 corresponding to the transfer end positioning columns 9 are arranged on the surface of one side, facing the transfer block substrates 6, of the multi-position sample sheet slot substrates 4, so that the transfer end positioning columns 9 are inserted into the loading end positioning holes 10 to be spliced, and then the transfer block substrates 6 are connected with the multi-position sample sheet slot substrates 4. Or the splicing surface of the transfer block base body 6 is provided with a transfer end positioning hole, and the surface of one side of the multi-position sample piece groove substrate 4 facing the transfer block base body 6 is provided with a loading end positioning column corresponding to the transfer end positioning hole.
To sum up, the utility model is simple in operation, can realize the quick automatic switch-over of a plurality of samples, reduced many sample frame in the past and need a loaded down with trivial details and the occupation time problem of putting into when changing the sample.
Example (b): the switching block can be fixed on an XY electric displacement table of a Japan science smartlab diffractometer through a screw through hole 8 by utilizing three screws; filling and sample preparation in a single sample tank, and then placing the single sample tank into a multi-position sample sheet tank one by one; and finally, loading the multi-position sample sheet groove on the transfer block, and positioning and fixing the multi-position sample sheet groove and the positioning hole through the positioning column.
The single sample chip substrate 1 is made of PLLA materials through 3D printing, and is 25mm long, 25mm wide and 2.0mm thick; the middle sample loading groove 2 is a square groove with the depth of 0.2mm and the side length of 19 mm; the assembly limiting notch 3 is a triangular notch with the side length of 3 mm.
The multi-position sample wafer groove substrate 4 is made of a PLLA material through 3D printing, and is 120mm long, 120mm wide and 8.0mm thick; the front quick-assembling groove 5 is a groove with 4 rows and 5 columns and 20 sizes matched with the size of a single sample piece, and the back is provided with 3 loading end positioning holes 10 matched with the sizes of the switching end positioning columns 9 on the switching block base body 6.
A switching block base body 6 in the switching block is made of PLLA materials through 3D printing, a switching end positioning column 9 matched with a loading end positioning hole 10 in a multi-position sample sheet groove in size is arranged on the front face of the switching block base body, and a screw through hole 8 matched with an XY electric displacement table of a smartab diffractometer in position is formed in the middle concave portion 7.
It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications therefrom are within the scope of the invention.
Claims (7)
1. A quick-release multi-position sample holder for an X-ray diffractometer, comprising:
a single sample piece through which powder, liquid, gel and bulk samples are loaded;
a multi-sample plate slot through which a plurality of said individual sample plates are loaded;
and a transfer block for loading the multi-position sample piece groove on an electric displacement table of the diffractometer through the transfer block.
2. The quick release multi-stage sample holder according to claim 1, wherein said single sample plate comprises:
a single sample wafer substrate (1);
the sample loading groove (2) is formed in the upper surface of the single sample chip substrate (1) and used for loading powder, liquid, colloid and block samples;
and the assembling limiting notch (3) is arranged on the side surface of the single sample sheet substrate (1).
3. The quick release multi-stage sample holder according to claim 2, wherein said multi-stage sample slot comprises:
a multi-position sample chip groove substrate (4);
and quick assembly groove (5), the quantity of quick assembly groove (5) is 20 and is in with 4 form align distribution that arrange 5 rows many sample piece groove base plate (4) upper surface, through quick assembly groove (5) with assemble the cooperation between spacing breach (3) and load single sample piece.
4. The quick-release multi-stage sample holder according to claim 2, wherein the single sample plate substrate (1) has an upwardly inclined bottom surface on one side of its lower surface.
5. The quick release multi-stage sample holder according to claim 3, wherein said transfer block comprises:
the diffraction instrument is characterized by comprising a transfer block base body (6), wherein one side, facing the electric displacement table of the diffraction instrument, of the transfer block base body (6) is a fixed surface, and one side, facing the multi-position sample piece groove base plate (4), of the transfer block base body (6) is a splicing surface.
6. The quick-release multi-position sample holder for the X-ray diffractometer according to claim 5, wherein a middle recess (7) is formed in a splicing surface of the transfer block base body (6), and a screw through hole (8) for assembling with an electric displacement table of the diffractometer through a screw is formed in the inner side of the middle recess (7);
and the fixed surface of the transfer block matrix (6) is in contact with an electric displacement table of the diffractometer.
7. The quick-release multi-position sample holder for the X-ray diffractometer according to claim 5, wherein the splicing surface of the transfer block base body (6) is provided with transfer end positioning columns (9) or transfer end positioning holes;
a loading end positioning hole (10) or a loading end positioning column corresponding to the switching end positioning column (9) or the switching end positioning hole is arranged on the surface of one side, facing the switching block base body (6), of the multi-position sample chip groove base plate (4);
the splicing surface of the transfer block base body (6) is contacted with the multi-position sample slice groove base plate (4).
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922379738.4U CN211553818U (en) | 2019-12-26 | 2019-12-26 | Quick-release multi-position sample holder for X-ray diffractometer |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201922379738.4U CN211553818U (en) | 2019-12-26 | 2019-12-26 | Quick-release multi-position sample holder for X-ray diffractometer |
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| CN211553818U true CN211553818U (en) | 2020-09-22 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112242209A (en) * | 2020-10-16 | 2021-01-19 | 中国原子能科学研究院 | Inserted sheet formula irradiation experiment sample frame |
| CN113281362A (en) * | 2021-05-31 | 2021-08-20 | 南京铂锋科技有限公司 | Rapid X-ray diffractometer and testing method |
| CN113945591A (en) * | 2021-09-14 | 2022-01-18 | 中国电子科技集团公司第十一研究所 | Half-peak-width automatic test tool |
-
2019
- 2019-12-26 CN CN201922379738.4U patent/CN211553818U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112242209A (en) * | 2020-10-16 | 2021-01-19 | 中国原子能科学研究院 | Inserted sheet formula irradiation experiment sample frame |
| CN113281362A (en) * | 2021-05-31 | 2021-08-20 | 南京铂锋科技有限公司 | Rapid X-ray diffractometer and testing method |
| CN113945591A (en) * | 2021-09-14 | 2022-01-18 | 中国电子科技集团公司第十一研究所 | Half-peak-width automatic test tool |
| CN113945591B (en) * | 2021-09-14 | 2023-10-24 | 中国电子科技集团公司第十一研究所 | Half-peak width automatic test fixture |
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