CN211437054U - Chip resistor screening device - Google Patents

Abstract

A chip resistor screening device is characterized in that a tray positioning frame and a tray are arranged on a conveyor belt, and a product storage frame to be tested, a positioning detection mechanism, a turnover mechanism, a defective product suction mechanism and a finished product storage frame are sequentially arranged above the conveyor belt from right to left; the positioning detection mechanism comprises a detection frame, a left CCD camera and a right CCD camera, and the right CCD camera photographs and measures the height of the front surface of the chip resistor; the turnover mechanism comprises two groups, and the two groups are composed of tray grabbing hands and tray turning hands which are symmetrically arranged on two sides of the conveyor belt, and the tray turning hands enable the left CCD camera to photograph the back of the chip resistor and measure the height of the chip resistor by turning the tray; the defective product suction mechanism is provided with a suction module which can move in the directions of an X axis, a Y axis and a Z axis; the defective product storage tray is positioned between the connecting rack and the conveyor belt; the utility model discloses but the two-sided to chip resistor of automatic integration detects, has both ensured the precision that detects, has ensured follow-up off-the-shelf quality, has improved the efficiency that detects simultaneously.

Description

Chip resistor screening device

Technical Field

The utility model relates to a chip resistor field, more specifically say, relate to a chip resistor sieving mechanism.

Background

The chip resistor is also called a chip fixed resistor, is one of metal glass glaze resistors, and is a resistor manufactured by mixing metal powder and glass glaze powder and printing the mixture on a substrate by a screen printing method. All processes of the chip resistor are required to be packaged and placed on the carrier tape to form a strip-shaped object, the phenomena of material crushing, material mixing, material standing, material reversing, material stacking, material emptying, material jumping, material corner lacking, carrier tape contamination, carrier tape damage and the like can be caused in the packaging, the defect of one resistor flows to a client terminal to be attached to a circuit board, the defect of a final product can be caused, and the possibility of potential safety hazard can be even caused.

However, in the screening process of most of the existing chip resistors, the appearance and defects of products are detected by naked eyes manually by using a microscope, the quality is unstable due to fatigue of naked eyes during manual detection, the production efficiency is low, and the accuracy of the detected appearance is not enough, so that the labor amount of production personnel is increased, the screening speed is slow, the working efficiency of screening the chip resistors is low, and meanwhile, the specification uniformity after screening the chip resistors cannot be guaranteed due to different judgment standards of everyone; at present, the appearance of a product is detected by a CCD detector, but the CCD detector can only detect one side of the product, so that the detection is needed twice by matching with a conveying device, and a large amount of detection time is consumed; in order to solve the problems, the chip resistor screening device capable of rapidly detecting the double surfaces of the chip resistor and selecting the unqualified floating resistor is particularly provided.

SUMMERY OF THE UTILITY MODEL

In view of this, for solving above-mentioned prior art not enough, the utility model aims at providing a chip resistor sieving mechanism, through setting up two CCD cameras, chip resistor tilting mechanism in the data send process, but the automatic integration detects chip resistor's two-sided, has both ensured the precision that detects, has ensured follow-up off-the-shelf quality, has improved the efficiency that detects simultaneously.

In order to achieve the above object, the utility model adopts the following technical scheme:

a chip resistor screening device comprises a rack, wherein a control box is arranged below the rack, a conveyor belt is arranged above the rack, a tray positioning frame and a tray are arranged on the conveyor belt, and a product storage frame to be tested, a positioning detection mechanism, a turnover mechanism, a defective product suction mechanism and a finished product storage frame are sequentially arranged above the conveyor belt from right to left;

the positioning detection mechanism comprises a detection frame, a left CCD camera and a right CCD camera which are respectively arranged at two ends of the detection frame and can move on the detection frame along the X-axis direction and the Y-axis direction, and the right CCD camera photographs and measures the height of the front surface of the chip resistor;

the turnover mechanism comprises two groups, one group is arranged between the left CCD camera and the right CCD camera, the other group is arranged on the left side of the left CCD camera, the turnover mechanism comprises tray grabbing hands and tray turning hands which are symmetrically arranged on two sides of the conveyor belt, and the tray turning hands enable the left CCD camera to shoot and measure the height of the back of the chip resistor by turning the tray;

the defective product suction mechanism comprises connecting frames, a cross beam, a suction module and a defective product storage tray, the connecting frames are symmetrically arranged on two sides of the conveyor belt, the top of each connecting frame is provided with a first sliding block group in the length direction, the cross beam is arranged on the first sliding block groups of the two connecting frames in a spanning mode, a second sliding block group is arranged in the length direction, the suction module comprises a third sliding block group and a vacuum suction nozzle which are arranged on the second sliding block group, and the vacuum suction nozzle is driven to move in the X-axis direction, the Y-axis direction and the Z-axis direction through the first sliding block group, the second sliding block group and the third sliding block group; and the defective product storage tray is positioned between the connecting rack and the conveyor belt.

Furthermore, be located the location detection mechanism below be equipped with spacing cylinder on the tray locating rack, the tray of placing a plurality of rows and waiting to filter chip resistor is fixed a position through spacing cylinder to by the centre gripping on the tray locating rack.

Further, the product storage rack to be tested and the finished product storage rack are composed of two baffles and a chip resistor placing rack arranged between the baffles, and the distance between the two baffles is the same as the width of the tray.

Further, the first slider group includes a first guide rail and a first slider that move in the X-axis direction, the second slider group includes a second guide rail and a second slider that move in the Y-axis direction, and the third slider group includes a third guide rail and a third slider that move in the Z-axis direction.

Further, the bottom both ends of test rack are passed through the fourth slider setting on the fourth guide rail parallel with Y axle direction, just be equipped with the drive on the bottom plate of test rack the first cylinder that the fourth slider removed, the top of test rack is passed through the riser and is connected, the riser is equipped with fifth guide rail and slide on the one side of conveyer belt, be equipped with on the another side with the second cylinder that the slide is connected, establish respectively with right CCD camera left side CCD camera the both ends of slide, thereby the second cylinder makes left CCD camera and right CCD camera detect the chip resistor on the tray through driving the slide removal.

Furthermore, the tray grabbing hand comprises a sixth guide rail, a sixth sliding block and a third cylinder, the sixth guide rail is arranged on the rack through a support, the sixth sliding block is arranged on the sixth guide rail, the third cylinder arranged on the sixth sliding block drives the tray grabbing hand to slide in the Y-axis direction perpendicular to the length of the conveyor belt, and the tray is grabbed through two fingers at the front end of the third cylinder.

Furthermore, the tray overturning hand comprises an overturning frame and a cylinder frame, wherein an overturning controller is arranged on the overturning frame, one end of the cylinder frame is fixed on the conveying belt, the other end of the cylinder frame is connected with the overturning frame through a fourth cylinder and drives the overturning frame to move up and down through the fourth cylinder, and a fifth cylinder for controlling the overturning frame to move forward or backward in the conveying belt direction is arranged at the bottom of the cylinder frame.

Further, a motor for providing power is arranged below the right side of the conveyor belt.

Furthermore, a control keyboard and a central controller electrically connected with the product storage rack to be detected, the positioning detection mechanism, the turnover mechanism, the defective product suction mechanism and the finished product storage rack are arranged in the control box.

Furthermore, a latch used for fixing the tray is arranged on the chip resistor placing frame.

The utility model has the advantages that:

1. the utility model provides a chip resistor screening device, which is provided with a positioning detection mechanism and a turnover mechanism, wherein the positioning detection mechanism comprises a left CCD camera and a right CCD camera which move along the X-axis and Y-axis directions, the right CCD camera takes pictures and measures the height of the front surface of a chip resistor, the turnover mechanism is matched to turn over the chip resistor with the front surface completely detected, and then the left CCD camera takes pictures and measures the height of the back surface of the chip resistor, thereby realizing the automatic integrated double-surface floating height detection of the chip resistor, ensuring the detection precision, ensuring the quality of subsequent finished products and simultaneously improving the detection efficiency;

2. the positioning detection mechanism is provided with a left CCD camera and a right CCD camera, and a limiting cylinder is arranged on a tray positioning frame for placing the chip resistor, so that the tray can be fixed and clamped, the position of a detection head of the CCD camera is adjusted, accurate detection is realized, and the deviation in the measurement process is avoided;

3. because the positioning detection mechanism is provided with the left CCD camera and the right CCD camera, the turnover mechanism is correspondingly provided with two groups, one group is used for turning the veneering resistor with the front surface detected to the back surface, the other group is used for returning the position of the veneering resistor, the detection and turnover processes are carried out in sequence on a conveying production line, and the problem of returning and retesting does not exist, so the detection efficiency can be improved;

4. the tail end of the conveying belt is also provided with a defective product suction mechanism, the selected floating high chip resistors are taken out from the tray through the vacuum suction nozzle, placed in a defective product storage tray for concentrated storage, and qualified products are left in the tray and placed on a finished product storage rack on one side of the conveying belt, so that subsequent treatment is facilitated.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.

FIG. 1 is a schematic structural diagram of a chip resistor screening device;

FIG. 2 is a schematic structural view of a positioning detection mechanism;

FIG. 3 is a top view of the positioning detection mechanism;

FIG. 4 is a top view of two sets of turnover mechanisms;

FIG. 5 is a schematic structural diagram of one of the turnover mechanisms;

FIG. 6 is a schematic structural view of a defective suction mechanism;

fig. 7 is a plan view of the defective item suction mechanism;

FIG. 8 is a schematic structural diagram of a product storage rack to be tested or a finished product storage rack;

reference numerals: 1. a machine frame, 2, a control box, 201, a control keyboard, 202, a central controller, 3, a conveyor belt, 301, a motor, 4, a tray positioning frame, 5, a limiting cylinder, 6, a tray, 7, a storage frame for products to be detected, 8, a positioning detection mechanism, 801, a detection frame, 802, a left CCD camera, 803, a right CCD camera, 804, a vertical plate, 9, a turnover mechanism, 10, a defective product suction mechanism, 1001, a connecting frame, 1002, a beam, 1003, a suction module, 1004, a defective product storage disc, 11, a finished product storage frame, 12, a tray grabbing hand, 1201, a sixth guide rail, 1202, a sixth slider, 1203, a third air cylinder, 1204, a support, 1205, a two fingers grabbing hand, 13, a tray turnover hand, 1301, a turnover frame, 1302, an air cylinder frame, 1303, a turnover controller, 1304, a fourth air cylinder, 1305, a fifth air cylinder, 14, a first slider group, 1401, a first guide rail, 1402, a first slider, 15, a second slider group, 1501. the second guide rail, 1502, the second slider, 16, the third slider group, 1601, the third guide rail, 1602, the third slider, 17, the vacuum nozzle, 18, the baffle, 19, the chip resistor rack, 1901, the latch, 20, the fourth slider, 21, the fourth guide rail, 22, the first cylinder, 23, the fifth guide rail, 24, the slide, 25, the second cylinder.

Detailed Description

The following provides specific embodiments, which will further clearly, completely and specifically explain the technical solutions of the present invention. The present embodiment is the best embodiment based on the technical solution of the present invention, but the scope of the present invention is not limited to the following embodiments.

A chip resistor screening device is shown in figure 1 and comprises a frame 1, wherein a control box 2 is arranged below the frame 1, a conveying belt 3 is arranged above the frame 1, and a motor 301 for providing power is arranged below the right side of the conveying belt 3; the device is characterized in that a tray positioning frame 4 and a tray 6 are arranged on the conveyor belt 3, and a product storage frame 7 to be detected, a positioning detection mechanism 8, a turnover mechanism 9, a defective product suction mechanism 10 and a finished product storage frame 11 are sequentially arranged above the conveyor belt 3 from right to left; a control keyboard 201 and a central controller 202 electrically connected with the product storage rack 7 to be detected, the positioning detection mechanism 8, the turnover mechanism 9, the defective product suction mechanism 10 and the finished product storage rack 11 are arranged in the control box 2; as shown in fig. 8, each of the product storage rack 7 to be tested and the finished product storage rack 11 is composed of two baffles 18 and a chip resistor placement rack 19 arranged between the baffles 18, the distance between the two baffles 18 is the same as the width of the tray 6, and a latch 1901 for fixing the tray 6 is arranged on the chip resistor placement rack 19;

as shown in fig. 2, the positioning detection mechanism 8 includes a detection frame 801, and a left CCD camera 802 and a right CCD camera 803 which are respectively disposed at two ends of the detection frame 801 and can move on the detection frame 801 along the X-axis and Y-axis directions, and the right CCD camera 803 photographs and measures the height of the front surface of the chip resistor; a limiting cylinder 5 is arranged on the tray positioning frame 4 below the positioning detection mechanism 8, a plurality of rows of trays 6 with chip resistors to be screened are positioned through the limiting cylinders 5 and clamped on the tray positioning frame 4, the position of a CCD camera detection head can be adjusted, accurate detection is realized, and deviation in the measurement process is avoided;

as shown in fig. 2 and 3, two ends of the bottom of the detection frame 801 are arranged on a fourth guide rail 21 parallel to the Y-axis direction through a fourth slider 20, a bottom plate of the detection frame 801 is provided with a first cylinder 22 for driving the fourth slider 20 to move, the top end of the detection frame 801 is connected through a vertical plate 804, one surface of the vertical plate 804 facing the conveyor belt 3 is provided with a fifth guide rail 23 and a sliding plate 24, the other surface is provided with a second cylinder 25 connected with the sliding plate 24, the left CCD camera 802 and the right CCD camera 803 are respectively arranged at two ends of the sliding plate 24, and the second cylinder 25 drives the sliding plate 24 to move so that the left CCD camera 802 and the right CCD camera 803 detect the chip resistors on the tray 6;

as shown in fig. 1 and 4, the turnover mechanism 9 includes two groups, one group is disposed between the left CCD camera 802 and the right CCD camera 803, and is used for turning over the detected veneering resistor on the front side to the back side; the other group is arranged at the left side of the left CCD camera 802, the other group is used for returning the positions of the chip resistors, the detection and the overturning processes are carried out in sequence on a conveying production line, and the problem of returning and retesting does not exist, so that the detection efficiency can be improved; the turnover mechanism 9 comprises a tray grabbing hand 12 and a tray turning hand 13 which are symmetrically arranged at two sides of the conveyor belt 3, and the tray turning hand 13 enables the left CCD camera 802 to photograph the back of the chip resistor and measure the height of the chip resistor by turning over the tray 6;

as shown in fig. 4 and 5, the tray grabbing hand 12 includes a sixth guide rail 1201, a sixth slider 1202 and a third cylinder 1203, the sixth guide rail 1201 is disposed on the frame 1 through a support 1204, the sixth slider 1202 is disposed on the sixth guide rail 1201, the third cylinder 1203 on the sixth slider 1202 drives the tray grabbing hand 12 to slide in the Y-axis direction perpendicular to the length of the conveyor belt 3, and the tray 6 is grabbed by a two-finger grab 1205 at the front end of the third cylinder 1203; the tray overturning hand 13 comprises an overturning frame 1301 and a cylinder frame 1302, wherein an overturning controller 1303 is arranged on the overturning frame 1301, one end of the cylinder frame 1302 is fixed on the conveyor belt 3, the other end of the cylinder frame 1302 is connected with the overturning frame 1301 through a fourth cylinder 1304, the overturning frame 1301 is driven to move up and down through the fourth cylinder 1304, and a fifth cylinder 1305 for controlling the overturning frame 1301 to move forward or backward in the direction of the conveyor belt 3 is arranged at the bottom of the cylinder frame 1302;

as shown in fig. 6 and 7, the defective product suction mechanism 10 includes a link 1001, a beam 1002, suction modules 1003, and a defective product storage tray 1004, the link 1001 is symmetrically disposed on both sides of the conveyor 3, and the top of the link is provided with a first slider group 14 in the length direction, the first slider group 14 includes a first guide rail 1401 and a first slider 1402 moving in the X-axis direction, the beam 1002 straddles the first slider group 14 of the two links 1001 and is provided with a second slider group 15 in the length direction, the second slider group 15 includes a second guide rail 1501 and a second slider 1502 moving in the Y-axis direction, the suction modules 1003 include a third slider group 16 and a vacuum suction nozzle 17 disposed on the second slider group 15, and the first slider group 14, the second slider group 15, and the third slider group 16 drive the vacuum nozzle 17 to move in the X-axis, Y-axis, and Z-axis directions, the third slider group 16 includes a third guide 1601 and a third slider 1602 that move in the Z-axis direction; the defective storage tray 1004 is located between the link 1001 and the conveyor belt 3.

The utility model discloses a chip resistor screening device's working process as follows:

the first step is as follows: placing the chip resistors to be screened on the PCB in the tray 6, placing the tray 6 on the storage rack 7 for the products to be tested, and limiting the tray through the latch 1901 on the chip resistor placing rack 19 to prevent the tray from shifting;

the second step is that: the method comprises the following steps of carrying out positive measurement on a chip resistor by using a positioning detection mechanism 8, placing a tray 6 on a conveyor belt 3, driving the tray 6 to a tray positioning frame 4 by the conveyor belt 3, limiting a cylindrical column 5 on the tray positioning frame 4, fixing and clamping the tray 6, measuring the height dimension by a right CCD camera 803, then conveying the tray 6 forwards to a turnover mechanism 9 arranged between a left CCD camera 802 and the right CCD camera 803 by the conveyor belt 3, grabbing the tray 6 to rise to a certain height by two finger grippers 1205 of a tray grabbing hand 12, clamping the tray 6 by a gripper of a tray turnover hand 13, and turning the tray 6 for 180 degrees;

the third step: the positioning detection mechanism 8 is used for measuring the back of the chip resistor, the reversed tray 6 is placed back to the tray positioning frame 4 through the tray grabbing hand 12 and is moved to the position below the left CCD camera 802 to measure the height dimension of the back, after the measurement is finished, the conveyor belt 3 forwards conveys the tray 6 to the reversing mechanism 9 arranged on the left side of the left CCD camera 802, and the tray 6 is turned back to the initial state through the tray grabbing hand 12 and the tray reversing hand 13;

the fourth step: the conveyor belt 3 conveys the tray 6 to the lower part of the defective product suction mechanism 10, the first slider group 14 drives the beam 1002 to move in the X-axis direction, and the second slider group 15 and the third slider group 16 drive the vacuum suction nozzle 17 on the beam 1002 to move in the Y-axis and Z-axis directions, so that the floating resistance detected on the tray is taken down and placed in the defective product storage tray 1004;

the fifth step: the chip resistors after screening are arranged on the PCB of the tray 6 in order and are conveyed to the tail end of the conveying belt through the conveying belt 3, and if the finished product resistors are accumulated excessively, the tray 6 can be placed on the finished product storage rack 11 to be collected.

The utility model discloses a chip resistor screening device is provided with location detection mechanism and tilting mechanism, wherein location detection mechanism includes left CCD camera and right CCD camera along X axle and Y axle direction removal, take a picture, height measurement to the front of chip resistor through right CCD camera, cooperate tilting mechanism to detect the paster resistor upset that finishes openly, take a picture, height measurement to the back of chip resistor through left CCD camera again, can realize the automatic integrated two-sided height detection that floats to the paster resistor, both ensure the precision of detection, the quality of follow-up finished product has been ensured, the efficiency of detection has been improved simultaneously; the tail end of the conveying belt is also provided with a defective product suction mechanism, the selected floating high chip resistors are taken out from the tray through the vacuum suction nozzle, placed in a defective product storage tray for concentrated storage, and qualified products are left in the tray and placed on a finished product storage rack on one side of the conveying belt, so that subsequent treatment is facilitated.

The essential features, the basic principle and the advantages of the invention have been shown and described above. It should be understood by those skilled in the art that the present invention is not limited to the above embodiments, and the above embodiments and descriptions are only illustrative of the principles of the present invention, and that the present invention can be modified in various ways according to the actual situation without departing from the spirit and scope of the present invention, and these modifications and improvements are all within the scope of the present invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims (10)

1. A chip resistor screening device is characterized by comprising a rack (1), wherein a control box (2) is arranged below the rack (1), a conveying belt (3) is arranged above the rack, a tray positioning frame (4) and a tray (6) are arranged on the conveying belt (3), and a to-be-tested product storage frame (7), a positioning detection mechanism (8), a turnover mechanism (9), a defective product suction mechanism (10) and a finished product storage frame (11) are sequentially arranged above the conveying belt (3) from right to left;

the positioning detection mechanism (8) comprises a detection frame (801), a left CCD camera (802) and a right CCD camera (803) which are respectively arranged at two ends of the detection frame (801) and can move on the detection frame (801) along the X-axis direction and the Y-axis direction, and the right CCD camera (803) is used for photographing the front surface of the chip resistor and measuring the height of the chip resistor;

the turnover mechanism (9) comprises two groups, one group is arranged between the left CCD camera (802) and the right CCD camera (803), the other group is arranged on the left side of the left CCD camera (802), the turnover mechanism (9) comprises a tray grabbing hand (12) and a tray turning hand (13) which are symmetrically arranged on two sides of the conveyor belt (3), and the tray turning hand (13) enables the left CCD camera (802) to photograph the back of the chip resistor and measure the height of the chip resistor by turning over the tray (6);

the defective product suction mechanism (10) comprises connecting frames (1001), a cross beam (1002), suction modules (1003) and a defective product storage tray (1004), the connecting frames (1001) are symmetrically arranged on two sides of the conveyor belt (3), a first slider group (14) is arranged on the top of each connecting frame in the length direction, the cross beam (1002) is arranged on the first slider groups (14) of the two connecting frames (1001) in a crossing mode, a second slider group (15) is arranged in the length direction, each suction module (1003) comprises a third slider group (16) and a vacuum suction nozzle (17) which are arranged on the second slider group (15), and the vacuum suction nozzle (17) is driven to move in the X-axis direction, the Y-axis direction and the Z-axis direction through the first slider group (14), the second slider group (15) and the third slider group (16); the defective storage tray (1004) is located between the link rack (1001) and the conveyor belt (3).

2. A resistance chip screening device according to claim 1, wherein a limiting cylinder (5) is provided on the tray positioning frame (4) below the positioning detection mechanism (8), and a tray (6) on which a plurality of rows of resistance chips to be screened are placed is positioned by the limiting cylinder (5) and clamped on the tray positioning frame (4).

3. A resistance chip screening device according to claim 1, wherein the product storage rack (7) to be tested and the finished product storage rack (11) are both composed of two baffles (18) and a resistance chip placing rack (19) arranged between the baffles (18), and the distance between the two baffles (18) is the same as the width of the tray (6).

4. A patch resistance screening apparatus according to claim 1, wherein the first slider group (14) comprises a first guide rail (1401) and a first slider (1402) moving in the X-axis direction, the second slider group (15) comprises a second guide rail (1501) and a second slider (1502) moving in the Y-axis direction, and the third slider group (16) comprises a third guide rail (1601) and a third slider (1602) moving in the Z-axis direction.

5. The chip resistor screening device according to claim 1, wherein the bottom two ends of the detection frame (801) are arranged on a fourth guide rail (21) parallel to the Y-axis direction through a fourth sliding block (20), a first cylinder (22) for driving the fourth sliding block (20) to move is arranged on the bottom plate of the detection frame (801), the top ends of the detection frames (801) are connected through a vertical plate (804), one surface of the vertical plate (804) facing the conveyor belt (3) is provided with a fifth guide rail (23) and a sliding plate (24), the other surface is provided with a second cylinder (25) connected with the sliding plate (24), the left CCD camera (802) and the right CCD camera (803) are respectively arranged at two ends of the sliding plate (24), and the second cylinder (25) drives the sliding plate (24) to move so that the left CCD camera (802) and the right CCD camera (803) can detect the chip resistors on the tray (6).

6. The chip resistor screening device according to claim 1, wherein the tray grabbing hand (12) comprises a sixth guide rail (1201), a sixth sliding block (1202) and a third air cylinder (1203), the sixth guide rail (1201) is arranged on the rack (1) through a support (1204), the sixth sliding block (1202) is arranged on the sixth guide rail (1201), and the third air cylinder (1203) on the sixth sliding block (1202) drives the tray grabbing hand (12) to slide in a Y-axis direction perpendicular to the length of the conveyor belt (3) and grab the tray (6) through a two-finger grabbing hand (1205) at the front end of the third air cylinder (1203).

7. The chip resistor screening device according to claim 1, wherein the tray overturning hand (13) comprises an overturning frame (1301) and a cylinder frame (1302), an overturning controller (1303) is arranged on the overturning frame (1301), one end of the cylinder frame (1302) is fixed on the conveyor belt (3), the other end of the cylinder frame (1302) is connected with the overturning frame (1301) through a fourth cylinder (1304), the overturning frame (1301) is driven to move up and down through the fourth cylinder (1304), and a fifth cylinder (1305) for controlling the overturning frame (1301) to move forward or backward towards the conveyor belt (3) is arranged at the bottom of the cylinder frame (1302).

8. A chip resistance screening device according to claim 1, wherein a motor (301) for providing power is arranged below the right side of the conveyor belt (3).

9. The chip resistor screening device according to claim 1, wherein a control keyboard (201), and a central controller (202) electrically connected with the product storage rack (7) to be tested, the positioning detection mechanism (8), the turnover mechanism (9), the defective product suction mechanism (10) and the finished product storage rack (11) are arranged in the control box (2).

10. A device as claimed in claim 3, wherein the placement frame (19) is provided with a latch (1901) for fixing the tray (6).

Images