CN211374829U

CN211374829U - Aging board test equipment

Info

Publication number: CN211374829U
Application number: CN201922061600.XU
Authority: CN
Inventors: 沈杰; 黄亮亮
Original assignee: Silicon Electric Semiconductor Equipment Shenzhen Co ltd
Current assignee: Silicon Electric Semiconductor Equipment Shenzhen Co ltd
Priority date: 2019-11-26
Filing date: 2019-11-26
Publication date: 2020-08-28
Anticipated expiration: 2029-11-26

Abstract

The utility model discloses an aging board test equipment. An aging board test apparatus includes a first connection part mounted on a base through an XY stage; the object carrying part is rotatably connected with the first connecting part; the object carrying part is provided with a testing part which is used for electrically connecting the aging plate placed on the object carrying part; the tester is electrically connected with the testing part in a wired mode; the first connecting part is connected with a second connecting part, and the testing machine is installed on the second connecting part; thereby shortening the connecting line between the testing part and the testing machine and reducing the loss of signal transmission; the movement amount of the testing machine relative to the loading part is reduced, and the stability of the testing data of the testing machine is enhanced.

Description

Aging board test equipment

Technical Field

The utility model relates to an aging board test equipment.

Background

The aging board is used for electrically connecting the bonding pad of the LED core particle on the PCB and electrically connecting the pin of the PCB with the bonding pad of the LED core particle, so that the corresponding LED core particle is electrically connected by conducting the pin of the PCB; the structure formed by connecting the LED core particles to the PCB is the aging board.

Because the pins of the aging board are convenient to electrically connect, the testing part needs to be contacted with the pins of the aging board in order to improve the efficiency, and the current is controlled by software to realize the conduction respectively so as to realize the control of the conduction of the LED core particles; in this case, the test section mounted on the loading section does not need to move for a long distance with respect to the loading section, and if the tester is placed on the base, the length of the wire connecting the tester to the test section becomes long, and the tester needs to move in the X direction, the Y direction, the Z direction, and around the Z direction with respect to the test section, which tends to cause a problem that test data is unstable.

SUMMERY OF THE UTILITY MODEL

For solving the problem that above-mentioned test machine and test portion electric connection line length, test portion are big for the test machine amount of exercise, the utility model provides an ageing board test equipment.

The technical scheme of the utility model is that: a burn-in board test apparatus, comprising,

the first connecting part is arranged on the base through an XY platform;

the object carrying part is rotatably connected with the first connecting part; the object carrying part is provided with a testing part which is used for electrically connecting the aging plate placed on the object carrying part;

the tester is electrically connected with the testing part in a wired mode;

the first connecting portion is connected with a second connecting portion, and the tester is installed on the second connecting portion.

Further, the object carrying part is provided with a vacuum adsorption hole for fixing the aging plate on the object carrying part.

Furthermore, the carrying part is provided with a plurality of positioning columns.

Furthermore, the aging board test equipment also comprises an integrating sphere, and the integrating sphere is connected to the base through a support.

Furthermore, the light receiving port of the integrating sphere is opposite to the corresponding aging plate along the vertical direction.

Further, the second connecting portion is provided with a plurality of limiting portions, and the limiting portions limit the position of the testing machine.

The beneficial effects of the utility model reside in that: thereby shortening the connecting line between the testing part and the testing machine and reducing the loss of signal transmission; the movement amount of the testing machine relative to the loading part is reduced, and the stability of the testing data of the testing machine is enhanced.

Drawings

Fig. 1 is the schematic view of the aging board testing apparatus of the present invention.

Detailed Description

In order to facilitate the understanding of the technical solutions of the present invention for those skilled in the art, the technical solutions of the present invention will be described in further detail with reference to specific embodiments.

As shown in fig. 1, a burn-in board test apparatus 100, the burn-in board test apparatus 100 includes,

a first connection part 20 mounted on the base 30 through an XY stage; thereby enabling the first connection part 20 to move in the X and Y directions with respect to the base 30; where X and Y directions are motion along parallel horizontal planes;

a loading part 40 rotatably connected to the first connecting part 20 to allow the aging board positioned on the loading part 40 to rotate with respect to the base 30, where the rotation is a rotation in a horizontal plane around the Z direction; the loading part 40 is provided with a testing part 50, and the testing part 50 is used for electrically connecting the aging plate placed on the loading part 40; the test part 50 is used for electrically connecting with the burn-in board;

a tester 60 electrically connected to the test unit 50 by wire; the length of the connecting wire for electrical connection needs to be shortened as much as possible to ensure stable and reliable transmission of the electrical connection signal from the testing part 50 to the testing machine 60;

the first connecting part 20 is connected with a second connecting part 70, and the testing machine 50 is mounted on the second connecting part 70; by placing the testing machine 60 on the second connecting part 70 instead of the base 30, the testing machine 60 can be as close to the testing part 50 as possible, so that the connecting line between the testing part 50 and the testing machine 60 is shortened, and the loss of signal transmission is reduced; and the testing machine 60 only has movement along the Z direction and/or rotation around the Z direction relative to the loading part 40, thereby reducing the movement amount of the testing machine 60 relative to the loading part 40 and enhancing the stability of the test data of the testing machine 60.

As shown in fig. 1, the loading part 40 is provided with vacuum absorption holes for fixing the aging plate on the loading part 40; the position of the aging plate placed on the loading part 40 is stable and reliable, the aging plate needs to move along the X direction and/or the Y direction when different LED core particles are tested, and the LED core particles can be stably and reliably positioned relative to the loading part 40 by the technical scheme that the aging plate is adsorbed on the loading part 40 in vacuum, so that the accuracy of the LED core particle test is ensured.

As shown in fig. 1, the loading part 40 is provided with a plurality of positioning posts 41; the positioning posts 41 correspond to the positioning holes on the aging plate, so that the aging plate can be placed at a preset position of the loading part 40 along the positioning posts 41, and the position error of the aging plate on the loading part 40 is reduced.

As shown in fig. 1, the burn-in board test apparatus 100 further includes an integrating sphere 80, the integrating sphere 80 being connected to the base 30 through a bracket 81; the integrating sphere 80 is needed to collect the optical parameters of the LED core particles during testing, and the integrating sphere 80 is fixed on the base 30 to keep the position of the integrating sphere 80 unchanged during the testing process of the LED core particles, so that the position of the LED core particles needs to be adjusted to make the LED core particles reach the light collecting position of the integrating sphere 80.

As shown in fig. 1, the light receiving opening of the integrating sphere 80 corresponds to the aging plate in the vertical direction; the aging plate can rotate along the X direction, the Y direction or the Z direction, so that the LED core particles are opposite to the light receiving opening of the corresponding integrating sphere 80 along the vertical direction; the distance from the aging plate to the light receiving opening of the integrating sphere 80 is changed by adjusting the Z-direction position of the aging plate, so that the LED core particles meet the light receiving requirement of the integrating sphere 80.

As shown in fig. 1, the second connecting portion 70 is provided with a plurality of position limiting portions 71, and the plurality of position limiting portions 71 limit the position of the testing machine 60; the position of the testing machine 60 relative to the second connecting part 70 is stable and reliable, and the testing machine 60 is prevented from falling or sliding when the position of the aging board is debugged.

The above is the preferred embodiment of the present invention, and is not used to limit the protection scope of the present invention. It should be recognized that non-inventive variations and modifications to the disclosed embodiments, as understood by those skilled in the art, are intended to be included within the scope of the present invention as claimed and claimed.

Claims

1. An aging board test device, characterized in that: the burn-in board test apparatus includes,

a first connection part (20) mounted on the base (30) through an XY stage;

a loading part (40) rotatably connected to the first connecting part (20); the object carrying part (40) is provided with a testing part (50), and the testing part (50) is used for electrically connecting the aging board placed on the object carrying part (40);

a tester (60) electrically connected to the test unit (50) by wire;

the first connecting portion (20) is connected with a second connecting portion (70), and the testing machine (60) is mounted on the second connecting portion (70).

2. The burn-in board test apparatus of claim 1, wherein: the object carrying part (40) is provided with a vacuum adsorption hole for fixing the aging plate on the object carrying part (40).

3. The burn-in board test apparatus of claim 2, wherein: the carrying part (40) is provided with a plurality of positioning columns (41).

4. The burn-in board test apparatus of claim 1, wherein: the aging board testing equipment further comprises an integrating sphere (80), and the integrating sphere (80) is connected to the base (30) through a support (81).

5. The burn-in board test apparatus of claim 4, wherein: the light receiving port of the integrating sphere (80) is in positive correspondence with the aging plate along the vertical direction.

6. The burn-in board test apparatus of claim 1, wherein: the second connecting portion (70) is provided with a plurality of limiting portions (71), and the plurality of limiting portions (71) limit the position of the testing machine (60).