CN211318662U - PCB testing device capable of being quickly connected with testing jig - Google Patents
PCB testing device capable of being quickly connected with testing jig Download PDFInfo
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- CN211318662U CN211318662U CN201921668102.5U CN201921668102U CN211318662U CN 211318662 U CN211318662 U CN 211318662U CN 201921668102 U CN201921668102 U CN 201921668102U CN 211318662 U CN211318662 U CN 211318662U
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- lower die
- upper die
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Abstract
The utility model discloses a PCB testing device capable of being connected with a testing jig quickly, which comprises a lower die, an upper die arranged above the lower die and a lifting driving mechanism; the lifting driving mechanism is used for driving the upper die to be close to or far away from the lower die; the upper die comprises an upper die test fixture, an upper die mounting seat and an upper die line switching module; one end of the upper die test fixture is detachably connected with the bottom of the upper die mounting seat, and the other end of the upper die test fixture is electrically connected to the upper die line switching module; the lower die comprises a lower die test fixture, a lower die mounting seat and a lower die line switching module; one end of the lower die test fixture is detachably connected with the top of the lower die mounting seat, and the other end of the lower die test fixture is electrically connected to the lower die line switching module; the upper die test fixture and the lower die test fixture are used for clamping a PCB for testing and are electrically connected to an external electrical testing system through the upper die circuit switching module and the lower die circuit switching module respectively. The utility model discloses can install test fixture fast, improve the installation effectiveness, reduce when remodeling, practice thrift manufacturing cost.
Description
Technical Field
The utility model relates to a PCB board test equipment field especially relates to a but quick connect test fixture's PCB board testing arrangement.
Background
In order to test the PCB (whether the circuit has flaws or not), a needle bed jig full of probes and pin contacts of the PCB are generally adopted for testing, because the size of the jig is related to the number of the probes, in the prior art, a common testing jig is used for measuring the PCB with small size through a 64P flat cable, the sizes of the PCBs with different models and the positions of the pin contacts are different, when one device needs to test the PCBs with different models, the corresponding testing jig needs to be replaced, the operation is complex during installation or disassembly, the wiring is difficult, and the type changing efficiency is influenced.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a but quick connect test fixture's PCB board testing arrangement can match corresponding test fixture according to the size of different PCB boards and stitch contact position, can install test fixture fast, improves the installation effectiveness, reduces when remodeling, practices thrift manufacturing cost.
In order to realize the purpose, the following technical scheme is adopted:
a PCB testing device capable of being quickly connected with a testing jig comprises a lower die, an upper die arranged above the lower die and a lifting driving mechanism; the lifting driving mechanism is used for driving the upper die to be close to or far away from the lower die; the upper die comprises an upper die testing jig, an upper die mounting seat and an upper die line switching module; one end of the upper die test fixture is detachably connected with the bottom of the upper die mounting seat, and the other end of the upper die test fixture is electrically connected to the upper die line switching module; the lower die comprises a lower die testing jig, a lower die mounting seat and a lower die line switching module; one end of the lower die test fixture is detachably connected with the top of the lower die mounting seat, and the other end of the lower die test fixture is electrically connected to the lower die line switching module; the upper die test fixture and the lower die test fixture are used for clamping a PCB for testing and are electrically connected to an external electrical testing system through the upper die circuit switching module and the lower die circuit switching module respectively.
Furthermore, the upper die line switching module and the lower die line switching module respectively comprise a plurality of clamping components and a plurality of measuring point connecting plates; the measuring point connecting plates are laid at the bottom of the upper die mounting seat or at the top of the lower die mounting seat, and the clamping assemblies are arranged on the periphery of the measuring point connecting plates in parallel; and a plurality of elastic positioning pins used for guiding the upper die test fixture or the lower die test fixture are arranged on each measuring point connecting plate.
Further, the clamping assembly comprises a driving cylinder and a clamping plate; the clamp plate is connected with the upper die mounting seat or the lower die mounting seat in a sliding mode through the guide rods, and the driving cylinder is used for driving the guide rods to drive the clamp plate to clamp the upper die testing jig or the lower die testing jig.
Furthermore, the elastic positioning pin comprises a positioning pin seat, a positioning pin body and a buffer spring, wherein the positioning pin body is connected in the positioning pin seat in a sliding mode through the buffer spring, and the positioning pin seat is embedded on the measuring point connecting plate.
Furthermore, the upper die test fixture and the lower die test fixture both comprise a needle bed carrier plate and a plurality of circuit connecting plates, and each circuit connecting plate is electrically connected with the needle bed carrier plate through a wire harness; the needle bed support plate is detachably connected with the upper die mounting seat or the lower die mounting seat; the line connecting plate is electrically connected with the corresponding measuring point connecting plate and is clamped by the clamping assembly.
Further, the circuit connecting plate includes the fixed frame of circuit, installs a plurality of first probes on the fixed frame of circuit, be provided with a plurality of first locating holes that are used for with the cooperation installation of elastic locating pin on the fixed frame of circuit.
Furthermore, a plurality of second probes are arranged on the needle bed carrier plate, one end of each second probe correspondingly contacts a pin at the bottom of the PCB to be tested, and the other end of each second probe is electrically connected with the corresponding first probe through a wiring harness.
Furthermore, a plurality of fixing positioning pins for fixing the PCB to be tested are arranged on the needle bed support plate of the upper die test fixture, and a second positioning hole for matching the fixing positioning pins is arranged on the needle bed support plate of the lower die test fixture.
Further, lift actuating mechanism includes driving motor, lead screw assembly, driving motor warp lead screw assembly and last mould mount pad top drive connection.
Adopt above-mentioned scheme, the beneficial effects of the utility model are that:
the circuit connecting plate is tightly attached to the corresponding measuring point connecting plate through the clamping assembly and is electrically connected with the measuring point connecting plate, so that a quick wiring function can be realized; the needle bed support plate is detachably connected with the upper die mounting seat or the lower die mounting seat respectively, so that the test fixture can be quickly mounted; the test points on the test point connecting plates can meet the test of the PCB with different sizes or stitch contact positions, only the circuit connecting plates and the needle bed support plates need to be replaced quickly during model changing, each set of test jig corresponds to one PCB, repeated wiring is not needed, the model changing efficiency is improved, and the applicability of equipment is enhanced.
Drawings
Fig. 1 is a top perspective view of the present invention;
fig. 2 is a perspective view of the present invention;
fig. 3 is a perspective view of the upper mold/lower mold testing jig and the upper mold/lower mold line switching module of the present invention;
fig. 4 is an exploded view of the upper mold/lower mold testing jig and the upper mold/lower mold line switching module of the present invention;
FIG. 5 is a schematic structural view of the needle bed carrier plate of the present invention;
fig. 6 is a schematic structural view of the elastic positioning pin of the present invention;
wherein the figures identify the description:
1-an upper die, 2-a lower die,
3-a lifting driving mechanism, 11-an upper die testing jig,
12-upper die mounting seat, 13-upper die line switching module,
21-a lower die test fixture, 22-a lower die mounting seat,
23-lower mould circuit switching module, 31-driving motor,
32-a lead screw component, 111/211-a needle bed carrier plate,
112/212-circuit connection board, 1111/2111-second probe,
1121/2121-line holder, 1122/2122-first probe,
131/231-clamping unit, 132/232-measuring point connecting plate,
1321/2321-elastic positioning pin, 1311/2311-driving cylinder,
1312/2312-clamping plate, 2112-fixing pin.
Detailed Description
The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.
Referring to fig. 1 to 6, a PCB testing apparatus capable of fast connecting a testing fixture includes a lower mold 2, an upper mold 1 disposed above the lower mold, and a lifting driving mechanism 3; the lifting driving mechanism 3 is used for driving the upper die 1 to approach or separate from the lower die 2; the upper die 1 comprises an upper die test fixture 11, an upper die mounting base 12 and an upper die line switching module 13; one end of the upper die test fixture 11 is detachably connected with the bottom of the upper die mounting seat 12, and the other end of the upper die test fixture is electrically connected to the upper die line switching module 13; the lower die 2 comprises a lower die test jig 21, a lower die mounting seat 22 and a lower die line switching module 23; one end of the lower die test fixture 21 is detachably connected with the top of the lower die mounting seat 22, and the other end of the lower die test fixture is electrically connected to the lower die line switching module 23; the upper die testing jig 11 and the lower die testing jig 21 are used for clamping a PCB for testing, and are electrically connected to an external electrical testing system through the upper die circuit switching module 13 and the lower die circuit switching module 23 respectively.
The upper die line switching module 13 and the lower die line switching module 23 both comprise a plurality of clamping components 131/231 and a plurality of measuring point connecting plates 132/232, the plurality of measuring point connecting plates 132/232 are respectively paved at the bottom of the upper die mounting seat 12 or at the top of the lower die mounting seat 22, and the plurality of clamping components 131/231 are arranged on the periphery of the plurality of measuring point connecting plates 132/232 in parallel; each test point connecting plate 132/232 is provided with a plurality of elastic positioning pins 1321/2321 for guiding the upper mold test fixture 11 or the lower mold test fixture 21. Clamping assembly 131/231 is including driving actuating cylinder 1311/2311, splint 1312/2312, splint 1312/2312 is through a plurality of guide arms and last mould mount pad 12 or lower mould mount pad 22 sliding connection, drives actuating cylinder 1311/2311 and is used for driving the guide arm and drives splint 1312/2312 and press from both sides tight mould test fixture 11 or lower mould test fixture 21 on. The elastic positioning pin 1321/2321 comprises a positioning pin seat, a positioning pin body and a buffer spring, wherein the positioning pin body is connected in the positioning pin seat in a sliding manner through the buffer spring, and the positioning pin seat is embedded on the measuring point connecting plate 132/232.
The upper die testing jig 11 and the lower die testing jig 21 both include a needle bed carrier 111/211 and a plurality of circuit connecting plates 112/212, and each circuit connecting plate is electrically connected with the needle bed carrier through a wire harness (not shown in the figure); the needle bed carrier plate 211 is detachably connected with the upper die mounting seat 12 or the lower die mounting seat 22; the plurality of circuit connection boards 112/212 are electrically connected to the corresponding plurality of station connection boards 132/232 and clamped by the clamping assembly 131/231. The circuit connecting plate 112/212 all includes the fixed frame 1121/2121 of circuit, installs a plurality of first probes 1122/2122 on the fixed frame 1121/2121 of circuit, be provided with on the fixed frame 1121/2121 of circuit and be used for the first locating hole with the cooperation installation of elasticity locating pin 1321/2321. The needle bed carrier plate 211 is provided with a plurality of second probes 1111/2111, one end of each second probe 1111/2111 is correspondingly contacted with a pin at the bottom of the PCB to be tested, and the other end is electrically connected with the corresponding first probe 1122/2122 through a wire harness. A plurality of fixing positioning pins 2112 for fixing the PCB to be tested are disposed on the needle bed carrier 111/211 of the upper die test fixture 11, and a second positioning hole for matching the fixing positioning pins 2112 is disposed on the needle bed carrier 111/211 of the lower die test fixture 21.
The lifting driving mechanism 3 comprises a driving motor 31 and a screw rod assembly 32, and the driving motor 31 is in driving connection with the top of the upper die mounting seat 12 through the screw rod assembly 32.
The utility model discloses a theory of operation:
the screw assembly 32 comprises a ball screw and a nut slider, the driving motor is connected with the ball screw through a coupler in a driving mode, the top of the upper die mounting seat 12 is fixedly connected with the nut slider, and the driving motor 31 drives the ball screw to rotate so as to drive the nut slider to lift and achieve the lifting function of the upper die mounting seat 12. The lifting driving mechanism 3 further includes a limit photoelectric sensor (not shown in the figure), which is installed on the periphery of the upper die mounting seat 12 and used for sensing the position of the upper die mounting seat 12. The upper die 1 and the lower die 2 are arranged in parallel, and six groups of guide assemblies are arranged between the upper die 1 and the lower die 2 and comprise guide rods and guide sleeves; the guide rod movably penetrates through the guide sleeve, and the bottom of the guide rod is fixedly connected with the lower die 2; the guide sleeve is arranged on the upper die 1, and the upper die 1 slides along the guide direction through the guide sleeve.
The top of the elastic positioning pin 1321/2321 is provided with a fillet, and the internal buffer spring is used for buffering and shrinking the positioning pin body when being clamped, thereby facilitating the guiding.
In an embodiment, the upper film circuit switching module 13 and the lower film circuit switching module 23 are respectively provided with three clamping assemblies 131/231 and two measuring point connecting plates 132/232, and two clamping assemblies 131/231 are respectively arranged on two sides and in the middle of the two measuring point connecting plates 132/232.
Each clamping assembly 131/231 is provided with three guide rods, the guide rods are slidably connected with the upper die mounting seat 12 or the lower die mounting seat 22, the top ends of the guide rods are fixedly connected with a clamping plate 1312/2312, a driving cylinder 1311/2311 is in driving connection with one of the guide rods, and the clamping plate 1312/2312 clamps the circuit connecting plate 112/212 along the sliding direction of the three guide rods.
The PCB to be tested is placed between the needle bed carrier 111/211 of the upper die test fixture 11 and the needle bed carrier 111/211 of the lower die test fixture 21, the second probe 1111/2111 of the needle bed carrier 111/211 of the upper die test fixture 11 correspondingly detects a test point at the top of the PCB to be tested, and the second probe 1111/2111 of the needle bed carrier 111/211 of the lower die test fixture 21 correspondingly detects a test point at the bottom of the PCB to be tested.
The second probes 1111/2111 on the needle bed carrier 111 of the upper mold testing fixture 11 are electrically connected to the first probes 1122/2122 on the circuit connecting board 112/212 one by one through wiring harnesses; since the first probes 1122/2122 are mounted on the circuit fixing frame 1121/2121, the circuit fixing frame 1121/2121 is clamped by the clamping assembly 131/231 of the upper mold circuit switching module 13, so that the first probes 1122/2122 thereon are electrically connected to the measuring points on the measuring point connecting plate 132/232 of the upper mold circuit switching module 13 one by one, and the measuring point connecting plate 132/232 is connected to an external electrical measurement system.
The electrical connection mode and structure of the lower die 2 are similar to those of the upper die 1, the difference lies in the top of the upper die 1 for testing the PCB, and the bottom of the lower die 2 for testing the PCB is matched with the two for completing the testing of the PCB, so the description is omitted here.
The above description is only exemplary of the present invention and should not be construed as limiting the present invention, and any modifications, equivalents and improvements made within the spirit and principles of the present invention are intended to be included within the scope of the present invention.
Claims (9)
1. A PCB testing device capable of being quickly connected with a testing jig is characterized by comprising a lower die, an upper die arranged above the lower die and a lifting driving mechanism; the lifting driving mechanism is used for driving the upper die to be close to or far away from the lower die; the upper die comprises an upper die testing jig, an upper die mounting seat and an upper die line switching module; one end of the upper die test fixture is detachably connected with the bottom of the upper die mounting seat, and the other end of the upper die test fixture is electrically connected to the upper die line switching module; the lower die comprises a lower die testing jig, a lower die mounting seat and a lower die line switching module; one end of the lower die test fixture is detachably connected with the top of the lower die mounting seat, and the other end of the lower die test fixture is electrically connected to the lower die line switching module; the upper die test fixture and the lower die test fixture are used for clamping a PCB for testing and are electrically connected to an external electrical testing system through the upper die circuit switching module and the lower die circuit switching module respectively.
2. The PCB testing device capable of being quickly connected with the testing jig according to claim 1, wherein the upper die circuit switching module and the lower die circuit switching module respectively comprise a plurality of clamping components and a plurality of testing point connecting plates; the measuring point connecting plates are laid at the bottom of the upper die mounting seat or at the top of the lower die mounting seat, and the clamping assemblies are arranged on the periphery of the measuring point connecting plates in parallel; and a plurality of elastic positioning pins used for guiding the upper die test fixture or the lower die test fixture are arranged on each measuring point connecting plate.
3. The PCB testing device capable of being quickly connected with the testing jig according to claim 2, wherein the clamping assembly comprises a driving cylinder and a clamping plate; the clamp plate is connected with the upper die mounting seat or the lower die mounting seat in a sliding mode through the guide rods, and the driving cylinder is used for driving the guide rods to drive the clamp plate to clamp the upper die testing jig or the lower die testing jig.
4. The PCB testing device capable of being quickly connected with the testing jig according to claim 2, wherein the elastic positioning pin comprises a positioning pin seat, a positioning pin body and a buffer spring, the positioning pin body is connected in the positioning pin seat in a sliding manner through the buffer spring, and the positioning pin seat is embedded on the testing point connecting plate.
5. The PCB testing device capable of being rapidly connected with the testing jig according to claim 2, wherein the upper die testing jig and the lower die testing jig each comprise a needle bed carrier plate and a plurality of circuit connecting plates, and each circuit connecting plate is electrically connected with the needle bed carrier plate through a wire harness; the needle bed support plate is detachably connected with the upper die mounting seat or the lower die mounting seat; the line connecting plate is electrically connected with the corresponding measuring point connecting plate and is clamped by the clamping assembly.
6. The PCB testing device capable of being quickly connected with the testing jig according to claim 5, wherein the circuit connecting plate comprises a circuit fixing frame and a plurality of first probes mounted on the circuit fixing frame, and a plurality of first positioning holes for being matched with the elastic positioning pins are formed in the circuit fixing frame.
7. The PCB testing device capable of being fast connected to the testing fixture according to claim 5, wherein the needle bed carrier has a plurality of second probes, one end of each second probe correspondingly contacts a pin at the bottom of the PCB to be tested, and the other end of each second probe is electrically connected to the corresponding first probe through a wire harness.
8. The PCB testing device capable of being quickly connected with the testing jig as claimed in claim 5, wherein the needle bed carrier of the upper die testing jig is provided with a plurality of fixing pins for fixing the PCB to be tested, and the needle bed carrier of the lower die testing jig is provided with second positioning holes for matching with the fixing pins.
9. The PCB testing device capable of being quickly connected with the testing jig according to claim 1, wherein the lifting driving mechanism comprises a driving motor and a lead screw assembly, and the driving motor is in driving connection with the top of the upper die mounting seat through the lead screw assembly.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921668102.5U CN211318662U (en) | 2019-09-30 | 2019-09-30 | PCB testing device capable of being quickly connected with testing jig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921668102.5U CN211318662U (en) | 2019-09-30 | 2019-09-30 | PCB testing device capable of being quickly connected with testing jig |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211318662U true CN211318662U (en) | 2020-08-21 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921668102.5U Active CN211318662U (en) | 2019-09-30 | 2019-09-30 | PCB testing device capable of being quickly connected with testing jig |
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| CN (1) | CN211318662U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112269119A (en) * | 2020-10-25 | 2021-01-26 | 苏州市方普电子科技有限公司 | Switching test fixture and switching method for high-density measuring points |
| CN112578265A (en) * | 2020-11-25 | 2021-03-30 | 苏州市高威电子有限公司 | Relay test fixture |
-
2019
- 2019-09-30 CN CN201921668102.5U patent/CN211318662U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112269119A (en) * | 2020-10-25 | 2021-01-26 | 苏州市方普电子科技有限公司 | Switching test fixture and switching method for high-density measuring points |
| CN112269119B (en) * | 2020-10-25 | 2023-05-23 | 苏州方普智能装备有限公司 | High-density measuring point switching test fixture and switching method |
| CN112578265A (en) * | 2020-11-25 | 2021-03-30 | 苏州市高威电子有限公司 | Relay test fixture |
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