CN113777467A

CN113777467A - Test system and test method of flexible circuit board

Info

Publication number: CN113777467A
Application number: CN202110994954.9A
Authority: CN
Inventors: 刘震; 赖秋凤; 郭金鸿; 黄志胜; 张飞
Original assignee: Fujian Nebula Electronics Co Ltd
Current assignee: Fujian Nebula Electronics Co Ltd
Priority date: 2021-08-27
Filing date: 2021-08-27
Publication date: 2021-12-10

Abstract

The invention provides a test system and a test method of a flexible circuit board, which comprises a jig, a switching device, a supporting frame and a test device, wherein the jig is arranged on the flexible circuit board; the probe A is fixedly embedded into the through hole A, the bottom end of the probe A protrudes out of the bottom surface of the first fixing plate, and the top end of the probe A movably penetrates through the second probe A through hole and the first probe A through hole upwards in sequence; placing the FPC in the FPC accommodating groove; the probe A is directly connected and conducted with the contact A on the FPC, so that the contact on the FPC is directly tested without switching test, and the test precision is higher.

Description

Test system and test method of flexible circuit board

Technical Field

The invention relates to the field of flexible circuit board testing, in particular to a flexible circuit board testing system and a flexible circuit board testing method.

Background

The flexible printed circuit board is a flexible printed circuit board which is made of polyimide or polyester film as a base material and has high reliability and excellent performance, and has the characteristics of high wiring density, light weight, thin thickness and good bending performance; in the process of producing the flexible circuit board, in order to ensure that the produced flexible circuit board is qualified, each flexible circuit board needs to be tested by a testing device.

The defects of the prior art are mainly shown in that:

firstly, the existing FPC test adopts a circuit adapter plate, an FPC contact is connected to the adapter plate in a switching mode, a probe is used for testing the contact on the adapter plate, the contact on the adapter plate is only an analog contact, and the test portability is greatly improved because the size of the contact of the adapter plate is far larger than that of the contact of the FPC, but the test precision is reduced, and the switching impedance on the adapter plate exists, so that the test result is influenced;

secondly, the existing FPC testing equipment adopts the principle that a fixed probe is matched with a testing jig, the updating form of the FPC cannot be flexibly compatible in the FPC product market with rapid updating, and the transformation cost of the testing is reduced.

Disclosure of Invention

The technical problem to be solved by the invention is to provide a test system and a test method of a flexible circuit board, which are used for directly testing a contact on an FPC (flexible printed circuit), are free from switching tests and have higher test precision.

The invention is realized by the following steps: the invention provides a test system of a flexible circuit board, which comprises a jig, a switching device, a supporting frame and a test device, wherein the jig is arranged on the supporting frame;

the jig comprises a jig base and an upper pressing plate;

the top of the jig base is provided with an FPC accommodating tank; the jig base is positioned in the FPC accommodating tank and is also provided with a vertical first A probe movable through hole;

a pressing block is convexly arranged at the bottom of the upper pressing plate; the upper pressing plate is movably connected to the jig base, and the pressing block movably extends into the FPC accommodating groove;

the adapter device comprises a bottom plate and a contact A testing part;

the contact A testing part comprises a first fixing plate, an A floating plate and a probe A;

the first fixing plate is provided with a vertical through hole A; the first fixing plate is fixedly connected to the bottom plate;

the A floating plate is provided with a vertical second A probe movable through hole; the A floating plate is connected to the first fixed plate in a vertically sliding manner;

the jig base is detachably connected to the bottom plate;

the probe A is fixedly embedded into the through hole A, the bottom end of the probe A protrudes out of the bottom surface of the first fixing plate, and the top end of the probe A movably penetrates through the second probe A through hole and the first probe A through hole upwards in sequence;

the support frame comprises a support top plate and a support bottom plate; the supporting top plate is provided with an A avoidance opening;

the testing device is fixedly connected to the supporting bottom plate;

the switching device is connected to the supporting top plate; and the probe A downwards passes through the A avoidance opening and then is connected to the testing device.

Further, the automatic moving device and the clamping jaw part are further included;

the clamping jaw part comprises a connecting top plate, a clamping jaw, a pneumatic jaw and an executing element;

the connecting top plate is detachably connected to the automatic moving equipment;

the actuating element is fixedly connected to the bottom of the connecting top plate;

the number of the gas claws is two; the two gas claws are symmetrically connected to the actuating element, and are driven by the actuating element to synchronously move towards or away from each other;

the number of the clamping jaws is two; a pin is convexly arranged on the side surface of each clamping jaw; the two clamping jaws are fixedly connected to the two gas claws in a one-to-one correspondence manner, the two clamping jaws are symmetrically arranged, and the pins are oppositely arranged;

pin holes are symmetrically formed in the two opposite side surfaces of the jig base;

the pins are detachably embedded into the pin holes in a one-to-one correspondence mode.

Further, the jig also comprises a probe part B;

the probe part B comprises a probe B, B fixed block, a conductor sheet and a floating plate B;

the bottom of the floating plate B is provided with a convex block; the conductor sheet is fixedly connected to the bottom surface of the bump;

the upper pressing plate is provided with a guide opening; the floating plate B can be connected to the upper pressure plate in a vertically sliding mode, and the convex block is embedded into the guide opening in a sliding mode;

the B fixing block is provided with a B through hole;

the B fixing block is fixedly connected to the lug; the probe B is fixedly connected into the through hole B, the top end of the probe B is connected and conducted with the conductor sheet, and the bottom end of the probe B penetrates through the guide opening at the lower part and extends into the FPC accommodating groove;

the switching device also comprises a B switching probe part; the B switching probe part comprises a B switching fixed block and a B switching probe;

the B switching fixing block is provided with a vertical first B switching through hole;

the floating plate A is also provided with a second B switching through hole;

the B switching fixed block is fixedly connected to the A floating plate;

the B switching probe is fixedly arranged in the first fixing plate in a penetrating mode, the top end of the B switching probe penetrates through the second B switching through hole and the first B switching through hole and then is detachably connected and communicated with the conductor sheet, and the bottom end of the B switching probe penetrates through the A avoiding opening downwards and then is connected to the testing device.

Further, the jig also comprises a C floating pressing part; the C floating pressing part comprises a C floating plate;

the top of the C floating plate is provided with a contact C limiting accommodating groove; the C floating plate is positioned in the contact C limiting accommodating groove and is also provided with a C probe moving through hole;

the jig base is provided with a first C avoidance opening;

the C floating plate is connected to the jig base in a vertically sliding mode and located above the first C avoidance opening, and the first C avoidance opening is communicated with the C probe movable through hole;

the adapter device further comprises a probe part C; the C probe part comprises a probe C and a C probe fixing plate;

the supporting top plate is also provided with a second C avoidance opening;

the probe C is fixedly arranged on the probe fixing plate C in a penetrating manner;

c probe fixed plate can connect in with sliding from top to bottom the bottom plate, just probe C's bottom passes second C dodges after the opening connect in testing arrangement, probe C's top upwards can pass in proper order with dismantling first C dodges opening, C probe activity through-hole.

Furthermore, the device also comprises a collecting upper fixing plate, a collecting lower fixing plate, a PCB collecting circuit board, a first connecting probe block, a second connecting probe block and a third connecting probe block;

the first connection probe block comprises a first connection fixing block; a first connecting probe penetrates through the first connecting fixing block; the number of the first connecting probes is equal to the sum of the probes A and B switching probes;

the second connection probe block comprises a second connection fixing block; a second connecting probe penetrates through the second connecting fixed block; the number of the second ligation probes is equal to the number of probes C;

the third connection probe block comprises a third connection fixing block; a third connecting probe penetrates through the third connecting fixing block; the number of the third ligation probes is equal to the sum of the number of the first ligation probes and the number of the second ligation probes;

the collecting upper fixing plate is provided with a first avoiding opening and a second avoiding opening;

the first connecting fixing block is fixedly connected to the first avoiding opening, and the first connecting probes are connected to the probe A and the probe B through-connection probes in a one-to-one correspondence manner;

the second connection fixing block is fixedly connected to the second avoidance opening, and the second connection probe is correspondingly connected to the probe C;

the collecting upper fixing plate is fixedly connected to the bottom of the bottom plate;

the PCB gathering circuit board is fixedly connected to the bottom of the gathering upper fixing plate, and the first connecting probe and the second connecting probe are respectively connected to the PCB gathering circuit board;

the collecting lower fixing plate is fixedly connected to the bottom of the PCB collecting circuit board;

the third connecting fixed block is fixedly connected to the bottom of the collecting lower fixed plate, the third probes are connected with the PCB collecting circuit board, and meanwhile the third connecting probes are connected and conducted with the first connecting probes and the second connecting probes in a one-to-one correspondence mode through the PCB collecting circuit board;

and the third connecting probe penetrates through the supporting top plate and then is connected to the testing device.

Further, the device also comprises a supporting pin and a first bolt;

the supporting needle comprises a telescopic part and a fixing part; the top end of the telescopic part is provided with a threaded hole; the top end of the fixing part is provided with a flange; the telescopic part can be connected to the fixing part in a vertically sliding manner;

the number of the first bolts is equal to that of the support pins;

three first step through holes are formed in the first fixing plate; three first bolt holes are formed in the floating plate A; the fixing parts of the three support pins are embedded into the first stepped through holes one by one, and the three first bolts correspondingly penetrate through the first bolt holes one by one and then are correspondingly locked into the threaded holes of the three support pins;

the probe part C also comprises a first fixing plate C, a second fixing plate C, an upper floating plate C and two light plate positioning pins;

the upper floating plate C is provided with a probe C movable perforation, two second bolt holes and two first bolt holes;

the probe fixing plate C is provided with two first through holes and two second bolt stepped holes;

the first C fixing plate is provided with two second through holes, two third bolt holes and a first probe C mounting hole;

the second C fixing plate is provided with a second probe C mounting hole, two second step through holes and two fourth bolt holes;

the light plate positioning pins penetrate through the first bolt hole, the second bolt stepped hole, the third bolt hole and the fourth bolt hole in sequence in a one-to-one correspondence manner;

the two supporting needles sequentially penetrate through the first through hole, the second through hole and the second stepped through hole in a one-to-one correspondence mode, and then the two first bolts penetrate through the two second bolt holes in a one-to-one correspondence mode and are locked into the threaded holes of the two supporting needles.

Furthermore, a chamfer is formed at the edge of the top of the FPC accommodating groove;

the B fixing block is provided with a first positioning pin hole; the bottom surface of the lug is convexly provided with a positioning pin; the top surface of the jig base is provided with a second positioning pin hole; the positioning pin sequentially penetrates through the first positioning pin hole and the second positioning pin hole;

the probe part B also comprises a second bolt and a first spring; the floating plate B is symmetrically provided with two first through holes; the upper pressing plate is provided with two first screw holes; each second bolt correspondingly penetrates through one first through hole, then is sleeved with one first spring, and finally is locked into the first screw hole;

the jig further comprises two third bolts, two bushings and two torsion springs; the bottom surface of the upper pressure plate is symmetrically provided with two rotating lugs; each rotary lug is provided with a second through hole; the left side of the top end of the jig base is provided with two symmetrical first notches and two symmetrical second notches; the jig base is provided with a second screw hole along the front-back direction, and the second screw hole penetrates through the first notch and the second notch; the bushings are embedded into the second through holes in a one-to-one correspondence mode; each rotating lug is arranged in the first notch, each torsion spring is arranged in the second notch, one end of each torsion spring abuts against the upper pressure plate, the other end of each torsion spring abuts against the jig base, and each third bolt extends into the second screw hole and sequentially penetrates through the bushing and the torsion spring to be locked;

the C floating compression part also comprises four third bolts and four second springs; the jig base is positioned in the FPC accommodating groove and is also provided with four third screw holes; the C floating plate is provided with four third through holes; each third bolt sequentially penetrates through the third through hole, then is sleeved with a second spring, and finally is locked into the third screw hole;

the bottom surface of the jig base is provided with two third positioning pin holes which are symmetrically arranged; two third positioning pins are convexly arranged on the bottom plate; the two third positioning pins are detachably embedded into the third positioning pin holes in a one-to-one correspondence manner.

Further, the jig also comprises four magnets; the two magnets are fixedly connected to the bottom surface of the upper pressing plate, the other two magnets are fixedly connected to the jig base, and the two magnets on the upper pressing plate and the two magnets on the jig base are attracted correspondingly.

Further, the device also comprises a pressing part; the pressing part comprises a pressing driving device, a lower pressing plate, a first transverse supporting plate and a second vertical supporting plate;

the bottom surface of the lower pressing plate is provided with a pressing block C and a pressing block B;

the first transverse supporting plate is fixedly connected to the bottom plate;

the second vertical support plate is fixedly connected to the first transverse support plate;

the pressing driving device is fixedly connected to the second vertical supporting plate;

the lower pressing plate is connected with the pressing driving device and driven by the pressing driving device to move up and down; and the C compression block is positioned right above the C floating plate, and the B compression block is positioned right above the B floating plate.

The invention also provides a test method of the flexible circuit board, which comprises the following steps:

placing the FPC in an FPC accommodating groove and a contact C limiting accommodating groove of the jig, and closing the upper pressing plate and the C floating plate;

the automatic moving equipment moves the clamping claw part and the jig according to a preset track to carry out butt joint and clamping;

the automatic moving equipment moves the clamping jaw part according to a preset track to transport and place the jig on a preset position of the switching device;

the pressing part presses the upper pressing plate and the C floating plate downwards according to a preset track, so that the probe A, the probe B and the probe C on the jig are correspondingly connected and conducted with the contact A, the contact B and the contact C on the FPC; meanwhile, the probe A, the probe B and the probe C are respectively connected and conducted through the switching device and the testing device;

starting a testing device to test, correspondingly acquiring test data of the contact A, the contact B and the contact C through the probe A, the probe B and the probe C, and feeding back the test data to the testing device through electric signals;

the test device analyzes the received test data according to a preset condition and gives a conclusion;

the pressing part moves upwards according to a preset track to reset;

and the automatic moving equipment clamps the jig through the clamping jaw part according to a preset track, and moves the jig away from the switching device to be separated from the switching device.

The invention has the following advantages: the invention relates to a test system and a test method of a flexible circuit board, which comprises a jig, a switching device, a supporting frame and a test device, wherein the jig is arranged on the flexible circuit board; the probe A is fixedly embedded into the through hole A, the bottom end of the probe A protrudes out of the bottom surface of the first fixing plate, and the top end of the probe A movably penetrates through the second probe A through hole and the first probe A through hole upwards in sequence; placing the FPC in the FPC accommodating groove; the probe A is directly connected and conducted with the contact A on the FPC, so that the contact on the FPC is directly tested without switching test, and the test precision is higher.

Drawings

The invention will be further described with reference to the following examples with reference to the accompanying drawings.

Fig. 1 and 2 are perspective views of an FPC according to an embodiment of the present invention.

Figure 3 is a perspective view of a test system according to the present invention.

Fig. 4 is an exploded view of the jaw portion and jig according to the present invention.

Fig. 5 is a top view of the jig of the present invention with the FPC mounted.

Fig. 6 is a perspective view of the jig of the present invention with the FPC mounted.

Fig. 7 is an exploded view of the jig according to the present invention.

Fig. 8 is a bottom view of the jig of the present invention.

Fig. 9 and 10 are perspective views of the adapter device according to the present invention.

Fig. 11 is a perspective view of a B-junction probe section according to the present invention.

Fig. 12 is a schematic structural view of the needle holder of the present invention.

Fig. 13 is a cross-sectional view of a B-junction probe portion of the present invention at a probe mount.

Fig. 14 is an exploded view of a B-junction probe unit and a first connection probe block according to the present invention.

Fig. 15 is a cross-sectional view of a B-junction probe portion of the present invention at probe a.

Fig. 16 is a perspective view of the adapter and summary of the present invention.

FIG. 17 is an exploded view of the C probe portion and the second connection probe block according to the present invention.

Fig. 18 is an exploded view of a C probe portion and a second connection probe block according to the present invention.

FIG. 19 is a plan view of the probe C according to the present invention.

Fig. 20 is a sectional view a-a in fig. 19.

Fig. 21 is a partially enlarged schematic view B in fig. 20.

Fig. 22 is an exploded view of the adapter and summary of the invention.

FIG. 23 is an exploded view of the adapter, summing portion and testing device of the present invention.

Fig. 24 and 25 are exploded views of the pressing part, the jig and the adapter according to the present invention.

Fig. 26 is a perspective view of the pressing part, the jig, and the adapter according to the present invention.

Fig. 27 is a top view of the pressing part, the jig, and the adapter according to the present invention.

Fig. 28 is a cross-sectional view taken along line C-C of fig. 27.

Fig. 29 is a partially enlarged schematic view E of fig. 28.

Fig. 30 is a cross-sectional view taken along line D-D of fig. 27.

Fig. 31 is a partially enlarged schematic view F of fig. 30.

Fig. 32 is a plan view of the jig of the present invention.

FIG. 33 is a schematic diagram of the structure of the testing device of the present invention.

Description of reference numerals:

a test system 100 for a flexible circuit board,

the jig 1 comprises a plurality of parts, wherein,

the jig base 11, the FPC accommodating groove 111 and the chamfer 1111; a first probe A movable through hole 112, a pin hole 113, a first C avoiding opening 114, a second positioning pin hole 115, a first notch 116, a second notch 117, a second screw hole 118, a third screw hole 119 and a third positioning pin hole 1110;

an upper press plate 12, a press block 121, a guide opening 122, a first screw hole 123, a rotary lug 124, a second through hole 1241,

a probe part B13, a probe B131, a fixed block B132, a through hole B1321, a first positioning pin hole 1322, a conductor sheet 133, a floating plate B134, a bump 1341, a positioning pin 1342, a first through hole 1343, a screw 135, a second bolt 136 and a first spring 137;

the C floating pressing part 14, the C floating plate 141, the contact C limiting accommodating groove 1411, a C probe moving through hole 1412, a third bolt 142 and a second spring 143;

a third bolt 15, a bushing 16, a torsion spring 17, a magnet 18;

the adapter 2, the bottom plate 21;

a contact a testing part 22, a first fixing plate 221, an a through hole 2211, a first step through hole 2212, an a floating plate 222, a second a probe moving through hole 2221, a first bolt hole 2222, a second B through hole 2223 and a probe a 223;

a B transfer probe part 23, a B transfer fixing block 231, a first B transfer through hole 2311, a B transfer probe 232;

c probe portion 24, probe C241, C probe fixing plate 242, first through hole 2421, second pin stepped hole 2422, first C fixing plate 243, second through hole 2431, third pin hole 2432, first probe C mounting hole 2433, second C fixing plate 244, second probe C mounting hole 2441, second stepped through hole 2442, fourth pin hole 2443, C upper floating plate 245, probe C movable through hole 2451, second bolt hole 2452, first pin hole 2453, and two optical plate positioning pins 246;

a third positioning pin 25;

a support frame 3, a support top plate 31, an a avoidance opening 311, a second C avoidance opening 312, and a support bottom plate 32;

the testing device 4 comprises an A socket 41, a B socket 42, a C socket 43 and a limit pin hole 44;

an automatic moving device 5;

a clamping jaw part 6, a connecting top plate 61, a clamping jaw 62, a pin 621, a gas claw 63, an actuating element 64, a pressure regulating valve 65,

the upper fixing plate 7, the first avoidance opening 71, and the second avoidance opening 72 are combined;

the lower fixing plate 8 is collected together with the lower fixing plate,

the PCB-aggregate circuit board 9 is provided with,

a first connection probe block 10, a first connection fixing block 101, first connection probes 102,

a second connection probe block 20, a second connection fixing block 201, a second connection probe 202,

a third connection probe block 30, a third connection fixing block 301, a third connection probe 302,

the supporting needle 40, the telescopic part 401, the threaded hole 4011, the fixing part 402 and the flange 4021;

a first bolt 50;

the pressing part 60, the pressing driving device 601, the lower pressing plate 602, the C pressing block 6021, the B pressing block 6022, the first transverse supporting plate 603 and the second vertical supporting plate 604;

a stopper pin 70;

FPC200, contact a2001, contact B2002, contact C2003.

Detailed Description

Word interpretation: FPC, i.e. a flexible circuit board.

The invention concept of the invention is as follows:

(1) placing the FPC200 in the FPC holding groove 111; the probe A223 is directly connected and conducted with the contact A2001 on the FPC200, so that the contact on the FPC200 is directly tested, the contact does not need to be subjected to transfer test, and the test precision is higher.

(2) The invention adopts the testing principle that the jig 1 contacts the probes, and can be disassembled, if the shape of the FPC200 is modified, the jig 1 can be changed, the probes of the invention are connected with the PCB gathering circuit board 9 by adopting the contact pins, and if the shape of the FPC is modified and the testing contacts are also modified, the jig and the probes can be completely replaced, thereby improving the testing flexibility of the equipment and reducing the equipment modification cost.

(3) The FPC accommodating groove 111 of the jig 1 is provided with the chamfer which is in a multi-stage inverted V shape, and an adjusting gap is reserved according to the characteristics of the FPC flexible circuit board, so that the circuit board can be smoothly placed into the jig groove, the shape error of a product can be corrected, and the testing efficiency can be improved.

In a specific embodiment, such as FPC200 shown in fig. 1, test contact a2001 is on the bottom surface, contact B2002 is on the top surface, and contact C2003 is on the bottom surface.

Please refer to fig. 1 to 33. In fig. 3, there are two jigs 1, that is, two motion states in the corresponding carrying process, one of them is in a state that the clamping claw part 6 clamps the jig 1 in the moving process, and the other is in a state that the adaptor device 2 is assembled in place, and there is only one jig 1 in actual use.

The invention provides a test system 100 of a flexible circuit board, which comprises a jig 1, a switching device 2, a supporting frame 3 and a test device 4;

the jig 1 comprises a jig base 11 and an upper pressing plate 12;

the top of the jig base 11 is provided with an FPC holding tank 111 for holding an FPC200, and in a specific embodiment, the shape of the FPC holding tank is the same as that of the FPC, and the FPC holding tank and the FPC are in clearance fit, so that the FPC200 can be conveniently held and taken out; the jig base 11 is positioned in the FPC accommodating groove 111 and is also provided with a vertical first A probe movable through hole 112;

a pressing block 121 is convexly arranged at the bottom of the upper pressing plate 12; the upper pressing plate 12 is movably connected to the jig base 11, the pressing block 121 movably extends into the FPC accommodating groove 111, in specific implementation, the pressing block 121 is opposite to the contact a, and the FPC200 is pressed tightly by the pressing block 121; the upper press plate 12 is used for fixing a test contact a2001 and a contact B2002 of the FPC, so that it is avoided that the FPC200 deforms and cannot be effectively tested in the probe test process, and therefore, two press blocks 121 are fixed on the upper press plate 12 at positions corresponding to the contacts a2001, and in a specific embodiment, the press blocks 121 are made of polyurethane, so that they form an insulating contact with the FPC.

The adapter 2 comprises a bottom plate 21 and a contact A testing part 22; one point to explain, so as not to cause a false positive, is: the transfer device 2 of the present invention is different from the transfer test of the prior art. The switching device 2 functions as a wire and is used for switching the probe out to be conveniently connected with the testing device 4, and is different from switching tests in the prior art, wherein the switching in the prior art is performed by a contact, and then the switched simulation contact is tested. Certainly, in other embodiments, the adapter 2 may not be needed, but the probe and the testing device 4 are directly connected by using a wire, which is only a connection manner, because the FPC has various types, when different types of replacement tests are performed, the connection by using the wire is inconvenient to disassemble, assemble and replace, and the connection wire needs to be disassembled and assembled again each time.

The contact a test part 22 includes a first fixing plate 221, an a floating plate 222, and a probe a 223;

the first fixing plate 221 is provided with a vertical a through hole 2211; the first fixing plate 221 is fixedly connected to the bottom plate 21;

the floating plate a 222 is provided with a vertical second probe a moving through hole 2221; the a floating plate 222 is connected to the first fixed plate 221 to be vertically slidable; the floating plate a 222 is designed to float to accommodate the accumulated error caused by the manufacturing error and the assembly error of each component, so as to improve the accuracy of the contact position between the probe a223 and the contact a2001 during the test.

The jig base 11 is detachably connected to the bottom plate 21;

the probe a223 is fixedly inserted into the a through hole 2211, the bottom end of the probe a223 protrudes out of the bottom surface of the first fixing plate 221, the top end of the probe a223 movably penetrates the second a probe movable through hole 2221 and the first a probe movable through hole 112 upwards in sequence, so that the probe a can be in contact with and conducted with the contact a2001, in a specific implementation, the probe a223 and the contact a2003 are vertically opposite, and the position of the probe a223 is set according to the position of the contact a 2003; the probe a223 penetrates the first a-probe movable through hole 112 from bottom to top because the contact a2001 is on the bottom surface of the FPC.

The support frame 3 comprises a support top plate 31 and a support bottom plate 32; the supporting top plate 31 is provided with an A avoidance opening 311;

the testing device 4 is fixedly connected to the supporting bottom plate 32;

the adapter device 2 is connected to the supporting top plate 31; and the probe a223 is connected to the testing device 4 after passing through the a avoidance opening 311 downwards.

The automatic moving device 5 and the clamping jaw part 6 are also included;

the clamping jaw part 6 comprises a connecting top plate 61, a clamping jaw 62, a pneumatic jaw 63 and an actuating element 64; in a specific embodiment, the actuator 64 is a cylinder, and a pressure regulating valve 65 is provided in communication with the cylinder for regulating the pressure of the cylinder.

The connecting top plate 61 is detachably connected to the automatic carrying apparatus 5;

the actuating element 64 is fixedly connected to the bottom of the connecting top plate 61;

two air claws 63 are arranged; the two air claws 63 are symmetrically connected to the actuating element 64, and the actuating element 64 drives the two air claws 63 to synchronously move towards or away from each other; in a specific embodiment, the actuating element 64 may be two cylinders symmetrically arranged with piston rods arranged in opposite directions; the piston rods are respectively connected and fixed with the air claws 63, the piston rods of the two air cylinders synchronously move in the opposite direction or in the opposite direction, so that the two air claws 63 are driven to synchronously move in the opposite direction or in the opposite direction, and finally the two clamping jaws 62 are driven to clamp or loosen.

Two of the clamping jaws 62 are provided; a pin 621 is convexly arranged on the side surface of each clamping jaw 62; the two clamping jaws 62 are fixedly connected to the two pneumatic jaws 63 in a one-to-one correspondence manner, the two clamping jaws 62 are symmetrically arranged, and the pins 621 are oppositely arranged;

pin holes 113 are symmetrically formed in the two opposite side surfaces of the jig base 11;

the pins 621 can be detachably embedded into the pin holes 113 in a one-to-one correspondence manner, so that the jig 1 is clamped by the clamping jaws 62, the carrying is facilitated, in a specific implementation, two pin holes 113 are formed in each side, and therefore when the jig is clamped, two limiting clamping points are arranged on each side, and the jig 1 cannot rotate.

The jig 1 further comprises a probe part B13;

the B probe portion 13 includes a probe B131, a B fixed block 132, a conductor piece 133, and a B floating plate 134; the conductor sheet 133 is provided to facilitate the switching of the probe B131 and the connection with the testing apparatus 4.

A bump 1341 is arranged at the bottom of the B floating plate 134; the conductor sheet 133 is fixedly connected to the bottom surface of the bump 1341; in a specific embodiment, the bottom surface of the bump 1341 is provided with a groove, the shape of the groove is the same as the shape of the conductor sheet 133, and the groove and the conductor sheet 133 are in clearance fit, so that the installation position of the conductor sheet 133 after installation is more accurate and is not easy to move.

The upper press plate 12 is provided with a guide opening 122; the B floating plate 134 is connected to the upper press plate 12 in a vertically slidable manner, and the projection 1341 is inserted into the guide opening 122 in a slidable manner;

the B fixing block 132 is provided with a B through hole 1321;

the B fixing block 132 is fixedly connected to the protrusion 1341, and in a specific embodiment, as shown in fig. 7, a screw 135 is inserted through the B fixing block 132 and then locked to the protrusion 1341; the probe B131 is fixedly connected in the B through hole 1321, the top end of the probe B131 is connected and conducted with the conductor sheet 133, the bottom end of the probe B131 passes through the guide opening 122 below and extends into the FPC accommodating groove 111, in a specific implementation, the probe B131 is opposite to the contact B2002, and when the upper pressing plate 12 is rotationally attached to the jig base 11 and is pressed downwards by the pressing part, the probe B131 is connected and conducted with the contact B2002;

the switching device 2 further comprises a B switching probe part 23; the B-switching probe part 23 comprises a B-switching fixed block 231 and a B-switching probe 232; the B relay probe unit 23 is for switching the probe B131 to be connected to the testing apparatus 4, and the B relay probe 232 is attached to the conductor piece 133 in a non-fixed manner so as to be easily removed and replaced.

The B-switching fixing block 231 is provided with a vertical first B-switching through hole 2311;

the floating plate a 222 is further provided with a second B transfer through hole 2223;

the B adaptor fixing block 231 is fixedly connected to the a floating plate 222;

the B via probe 232 is fixedly inserted into the first fixing plate 221, and the top end of the B via probe passes through the second B via hole 2223 and the first B via hole 2311 to be detachably connected to and conducted with the conductor sheet 133, and the bottom end of the B via probe passes through the a avoiding opening 311 downward to be connected to the testing apparatus 4.

The jig 1 further comprises a C floating pressing part 14; the C floating pressing portion 14 includes a C floating plate 141; the C floating pressing part 14 is also designed to be floating so as to adapt to manufacturing errors and accumulated errors caused by assembly errors of various parts on different FPCs and jigs, so that the contact positions of the contact C2003 of the FPC200 and the probe C are more accurate, and the FPC can be assembled conveniently during testing.

The top of the C floating plate 141 is provided with a contact C limiting accommodating groove 1411; the C floating plate 141 is positioned in the contact C limiting accommodating groove 1411 and is also provided with a C probe moving through hole 1412;

the jig base 11 is provided with a first C avoidance opening 114;

the C floating plate 141 is connected to the jig base 11 in a vertically slidable manner and is located above the first C avoiding opening 114, and the first C avoiding opening 114 is communicated with the C probe moving through hole 1412, so that the probe C241 passes through the C probe moving through hole 1412 and is connected and communicated with the contact C2003;

the adapter 2 further comprises a C probe portion 24; the C probe part 24 includes a probe C241 and a C probe fixing plate 242;

the supporting top plate 31 is further provided with a second C avoiding opening 312; in a specific embodiment, the a avoidance opening 311 and the second C avoidance opening 312 are communicated and combined into the same avoidance opening.

The probe C241 is fixedly arranged on the C probe fixing plate 242 in a penetrating way;

the C probe fixing plate 242 is connected to the bottom plate 21 in a vertically sliding manner, the bottom end of the probe C241 passes through the second C avoiding opening 312 and then is connected to the testing device 4, and the top end of the probe C241 upwards passes through the first C avoiding opening 114 and the C probe movable through hole 1412 in sequence in a detachable manner.

The test device also comprises a summarizing upper fixing plate 7, a summarizing lower fixing plate 8, a PCB summarizing circuit board 9, a first connecting probe block 10, a second connecting probe block 20 and a third connecting probe block 30 which form a summarizing part, wherein circuits are summarized and integrated together, and the positions of the probes are summarized and adjusted to correspond to the positions of the interfaces on the test device 4, so that the probes are convenient to insert; the PCB summary circuit board 9 plays a role in summary, and in the specific implementation, the PCB summary circuit board can be set according to the circuit logic of the probe A223, the probe B131 and the probe C241,

the first connection probe block 10 includes a first connection fixing block 101; a first connecting probe 102 penetrates through the first connecting fixed block 101; the number of first ligation probes 101 is equal to the sum of the probes A223 and B adapter probes 232;

the second connection probe block 20 includes a second connection fixing block 201; a second connecting probe 202 penetrates through the second connecting fixing block 201; the number of second connection probes 202 is equal to the number of probes C241;

the third connection probe block 30 includes a third connection fixing block 301; a third connecting probe 302 penetrates through the third connecting fixing block 301; the number of the third connection probes 302 is equal to the sum of the number of the first connection probes 102 and the second connection probes 202;

the summarizing upper fixing plate 7 is provided with a first avoidance opening 71 and a second avoidance opening 72;

the first connecting and fixing block 101 is fixedly connected to the first avoiding opening 71, and the first connecting probes 102 are connected to the probe a223 and the B transit probe 232 in a one-to-one correspondence manner;

the second connection fixing block 201 is fixedly connected to the second avoiding opening 72, and the second connection probe 202 is correspondingly connected to the probe C241;

the summarizing upper fixing plate 7 is fixedly connected to the bottom of the bottom plate 21;

the PCB summary circuit board 9 is fixedly connected to the bottom of the summary upper fixing plate 7, and the first connection probe 102 and the second connection probe 202 are respectively connected to the PCB summary circuit board 9;

the collecting lower fixing plate 8 is fixedly connected to the bottom 9 of the PCB collecting circuit board;

the third connection fixing block 301 is fixedly connected to the bottom of the summary lower fixing plate 8, the third probe 302 is connected to the PCB summary circuit board 9, and meanwhile, the third connection probe 302 is connected and conducted with the first connection probe 102 and the second connection probe 202 in a one-to-one correspondence manner through the PCB summary circuit board 9;

the third connection probe 302 is connected to the testing device 4 after passing through the top support plate 31.

In a specific embodiment, the PCB collecting circuit board 9 can be connected to the first connection probe 102, the second connection probe 202, and the third connection probe 302 through a pluggable lead terminal, one end of the pluggable lead is welded to the PCB collecting circuit board 9, the other end of the pluggable lead is a plugging needle tube, and the plugging needle tube is correspondingly plugged into each connection probe.

As shown in fig. 23, in a specific embodiment, a limit pin hole 44 is formed in the top surface of the testing device 4, and the summarizing part is inserted into the limit pin hole 44 through a limit pin 70 to limit the summarizing part and the testing device, so as to prevent each probe and the testing device 4 from being horizontally dislocated due to mistaken collision, and further damage the socket or the connection probe.

Also includes a supporting pin 40 and a first bolt 50;

the supporting needle 40 is an existing device, and for example, the adopted types are: GP-1T;

the supporting needle 40 is used according to the principle shown in fig. 12: the supporting needle 40 mainly comprises a telescopic part 401 and a fixing part 402, one end of the fixing part 402 close to the telescopic part 401 is provided with a flange 4021 for effectively fixing the fixing part 402 in the vertical direction without displacement, and the telescopic part 401 can axially move relative to the fixing part 402; a threaded hole 4011 is formed in the tail end of the telescopic part 401 and used for fixing a required floating part, so that the floating part can float up and down.

The supporting needle 40 comprises a telescopic part 401 and a fixing part 402; a threaded hole 4011 is formed in the top end of the telescopic part 401; the top end of the fixing part 402 is provided with a flange 4021; the telescopic part 401 is connected to the fixing part 402 in a vertically slidable manner;

the number of the first bolts 50 is equal to that of the support pins 40;

as shown in fig. 13, the first fixing plate 221 is provided with three first step through holes 2212; the floating plate a 222 is provided with three first bolt holes 2222; the three fixing parts 402 of the support pins 40 are inserted into the first stepped through holes 2212 one by one, and the three first bolts 50 correspondingly penetrate through the first bolt holes 2222 one by one and then are correspondingly locked into the threaded holes 4011 of the three support pins 40;

the C probe part 24 further includes a first C fixing plate 243, a second C fixing plate 244, a C upper floating plate 245, and a two-optical-plate positioning pin 246; the light panel alignment pins 246 are conventional devices, such as the types: GP-1S, the working principle is similar to that of the supporting pin 40, except that the telescopic end of the supporting pin 40 locked with the bolt is changed into a positioning pin.

The upper floating plate 245 is provided with a probe C movable perforation 2451, two second bolt holes 2452 and two first bolt holes 2453;

the probe fixing plate 242 is provided with two first through holes 2421 and two second pin stepped holes 2422;

the first C fixing plate 243 is provided with two second through holes 2431, two third pin holes 2432 and a first probe C mounting hole 2433;

the second C fixing plate 244 is provided with a second probe C mounting hole 2441, two second stepped through holes 2442 and two fourth pin holes 2443;

the light panel positioning pins 246 correspondingly penetrate through the first bolt hole 2453, the second bolt stepped hole 2422, the third bolt hole 2432 and the fourth bolt hole 2443 in sequence;

the two supporting pins 40 are used to sequentially penetrate through the first through hole 2421, the second through hole 2431 and the second stepped through hole 2442 in a one-to-one correspondence manner, and then the two first bolts 50 are used to penetrate through the two second bolt holes 2452 in a one-to-one correspondence manner and are locked into the threaded holes 4011 of the two supporting pins 40.

The top edge of the FPC accommodating groove 111 is provided with a chamfer 1111; chamfer 1111 changes in the direction of FPC product side circuit board, and FPC circuit board is in its leading process, and the L type can't be guaranteed to be 90, has 5 angle error, can successfully bring 5 limit error into the guide range through chamfer C, when guaranteeing final test, FPC's angle on the tool is unified.

As shown in fig. 7, the B fixing block 132 is provided with a first positioning pin hole 1322; a positioning pin 1342 is convexly arranged on the bottom surface of the bump 1341; the top surface of the jig base 11 is provided with a second positioning pin hole 115; the positioning pin 1342 sequentially passes through the first positioning pin hole 1322 and the second positioning pin hole 115;

the B probe portion 13 further includes a second bolt 136 and a first spring 137; the B floating plate 134 is symmetrically provided with two first through holes 1343; the upper press plate 12 is provided with two first screw holes 123; each second bolt 136 correspondingly penetrates through one first through hole 1343, is sleeved with one first spring 137, and is finally locked into the first screw hole 123; in specific implementation, the second bolt 136 reserves a length for the B floating plate 134 to float up and down, and is reset and floated up by the first spring 137.

As shown in fig. 7, the jig 1 further includes two third bolts 15, two bushings 16, and two torsion springs 17; the bottom surface of the upper pressing plate 12 is symmetrically provided with two rotating lugs 124; each rotating lug 124 is provided with a second through hole 1241; the left side of the top end of the jig base 11 is provided with two symmetrical first notches 116 and two symmetrical second notches 117; the jig base 11 is provided with a second screw hole 118 along the front-back direction, and the second screw hole 118 penetrates through the first notch 116 and the second notch 117; the bushings 16 are inserted into the second through holes 1241 in a one-to-one correspondence; each rotating lug 124 is arranged in the first notch 116, each torsion spring 17 is arranged in the second notch 117, one end of each torsion spring 17 abuts against the upper pressing plate 12, the other end of each torsion spring 17 abuts against the jig base 11, and each third bolt 15 extends into the second screw hole 118 and sequentially penetrates through the bushing 16 and the torsion spring 17 to be locked; thereby realizing that the upper press plate 12 overturns relative to the jig base 11. In a specific embodiment, the section of the second screw hole 118 opening to the second notch 117 is a light hole portion for facilitating rotation, and the second notch 117 is terminated by a threaded portion.

The C floating compression part 14 further includes four third bolts 142 and four second springs 143; the jig base 11 is also provided with four third screw holes 119 inside the FPC holding groove 111; the C floating plate 141 is provided with four third through holes (not shown); each third bolt 142 sequentially passes through the third through hole (not shown), is sleeved with one second spring 143, and is finally locked into the third screw hole 119;

as shown in fig. 8 and 9, the bottom surface of the jig base 11 is provided with two third positioning pin holes 1110 which are symmetrically arranged; two third positioning pins 25 are convexly arranged on the bottom plate 21; the two third positioning pins 25 are detachably inserted into the third positioning pin holes 1110 in a one-to-one correspondence, and in a specific implementation, the two positioning pins are in clearance fit.

The jig 1 further comprises four magnets 18; two of the magnets 18 are fixedly connected to the bottom surface of the upper press plate 12, the other two magnets 18 are fixedly connected to the jig base 11, and the two magnets 18 on the upper press plate 12 and the two magnets 18 on the jig base 11 are attracted correspondingly. The upper press plate 12 is provided with a magnet 18 corresponding to the magnet 18 on the jig base 11, so that the upper press plate 12 does not move or flip when being covered.

Further comprises a pressing part 60; the pressing part 60 comprises a pressing driving device 601, a lower pressing plate 602, a first transverse supporting plate 603 and a second vertical supporting plate 604; in a specific embodiment, the pressing driving device 601 employs an air cylinder, a piston rod of which is disposed vertically downward and fixed with the lower pressing plate 602.

The bottom surface of the lower pressure plate 602 is provided with a C pressing block 6021 and a B pressing block 6022;

the first transverse supporting plate 603 is fixedly connected to the bottom plate 21;

the second vertical support plate 604 is fixedly connected to the first horizontal support plate 603;

the pressing driving device 601 is fixedly connected to the second vertical supporting plate 604;

the lower pressure plate 602 is connected to the pressing driving device 601 and is driven by the pressing driving device 601 to move up and down; and the C clamp block 6021 is positioned directly above the C floating plate 141 and the B clamp block 6022 is positioned directly above the B floating plate 134.

placing the FPC200 in the FPC accommodating groove 111 and the contact C limiting accommodating groove 1411 of the jig 1, and closing the upper pressure plate 12 and the C floating plate 141;

the automatic moving equipment 5 moves the clamping claw part 6 and the jig 1 according to a preset track to carry out butt joint and clamping;

the automatic moving equipment 5 moves the clamping claw part 6 according to a preset track to transport and place the jig 1 on a preset position of the switching device 2;

the pressing part 60 presses the upper pressing plate 12 and the C floating plate 141 downwards according to a preset track, so that the probe A223, the probe B131 and the probe C241 on the jig 1 are correspondingly connected and conducted with the contact A2001, the contact B2002 and the contact C2003 on the FPC 200; meanwhile, the probe A223, the probe B131 and the probe C241 are respectively connected and conducted through the adapter 2 and the testing device 4;

starting the testing device 4 for testing, correspondingly acquiring test data of the contact A2001, the contact B2002 and the contact C2003 through the probe A223, the probe B131 and the probe C241, and feeding back the test data to the testing device 4 through electric signals;

the testing device 4 analyzes the received test data according to a preset condition and gives a conclusion;

the pressing part 60 moves upward according to a predetermined trajectory to perform resetting;

the automatic moving equipment 5 clamps the jig 1 through the clamping claw parts 6 according to a preset track, and moves the jig 1 away from the switching device 2.

A specific test method comprises the following steps:

the testing device 4 is conventional, and the testing device 4 can be connected with a computer through a data line, so that a testing result can be conveniently displayed on the computer.

The automatic transfer device 5 may be an existing robot, manipulator, or the like.

The conductor sheet is a copper sheet.

The pressing driving device 601 adopts an air cylinder.

The actuator 64 is a cylinder.

Connect each cylinder, robot, testing arrangement 4 to PLC, for example model: 6ES7515-2AM01-0AB0, which are controlled in a unified manner, although each component may be controlled individually. And presetting a motion track.

Before testing, the upper pressing plate 12 is rotated upwards to a vertical state, the FPC200 is placed in the FPC accommodating groove 111 and the contact C limiting accommodating groove 1411 of the jig 1, and the upper pressing plate 12 and the C floating plate 141 are combined;

the robot 5 moves the clamping claw part 6 and the jig 1 according to a preset track to carry out butt joint and clamping, the pin 621 is inserted into the pin hole 113 to carry out positioning, and the clamping claw 62 is driven by the air cylinder 64 to clamp the jig 1;

the robot 5 moves the claw part 6 to transport and place the jig 1 on a predetermined position of the adapter 2, that is, when the two third positioning pins 25 are inserted into the two third positioning pin holes 1110 one by one, the a floating plate 222 and the C upper floating plate 245 jack up the jig 1 to a certain height and keep balance, because the internal spring force of the supporting pin 40 and the light plate positioning pin 246 may be larger than the gravity of the jig 1, at this time, the lower pressing plate 602 is pushed forward under the action of the cylinder 601, the B pressing block 6022 at the extending end of the lower pressing plate 602 contacts with the B floating plate 134 above the upper pressing plate 12 of the jig, the B floating plate 134 is pushed to press down first, and after the C pressing block 6021 of the lower pressing plate 602 contacts with the C floating plate 141 on the jig 1, the jig 1 is pressed down together by the two, so that the gravity of the jig 1 and the cylinder thrust of the lower pressing plate 602 are larger than the elastic force of the supporting pin 40 and the positioning pin 246, thereby bringing a floating plate 222 and C and floating plate 245 down, probe a223 and probe C241 will protrude from a floating plate 222 and C and floating plate 245 to abut against test contact a2001 and contact C2003, thereby obtaining test data of contact a2001 and contact C2003. For test contact B2002, probe B131 will contact conductor patch 133 on B floating plate 134, thereby obtaining the data signal of test contact B2002; after the test is finished, the air cylinder 601 ascends to drive the lower pressing plate 602 to ascend step by step, and finally, the state before the test is recovered, and the robot clamps the jig 1 away according to a preset track 5; the C pressing block 6021 is a part where the contact C2003 needing more accurate testing is located, and a boss is designed below the C pressing block 6021 and matched with the C floating plate 141, and the size of the boss is slightly smaller than a corresponding notch in the C floating plate 141.

Circuit signal transmission route:

contact a2001 → probe a223 → first connection probe block 10 → third connection probe block 30 → testing device 4.

The contact point B2002 → the probe B131 → the conductor piece 133 → the B relay probe 232 → the first connection probe block 10 → the third connection probe block 30 → the testing device 4.

Contact C2003 → probe C241 → second connection probe block 20 → third connection probe block 30 → testing device 4.

Although specific embodiments of the invention have been described above, it will be understood by those skilled in the art that the specific embodiments described are illustrative only and are not limiting upon the scope of the invention, and that equivalent modifications and variations can be made by those skilled in the art without departing from the spirit of the invention, which is to be limited only by the appended claims.

Claims

1. A test system of a flexible circuit board is characterized in that: comprises a jig, a switching device, a supporting frame and a testing device;

the jig comprises a jig base and an upper pressing plate;

the adapter device comprises a bottom plate and a contact A testing part;

the jig base is detachably connected to the bottom plate;

the testing device is fixedly connected to the supporting bottom plate;

2. The system for testing a flexible circuit board according to claim 1, wherein: the automatic moving device and the clamping jaw part are also included;

3. The system for testing a flexible circuit board according to claim 1, wherein: the jig also comprises a probe part B;

the B fixing block is provided with a B through hole;

the floating plate A is also provided with a second B switching through hole;

the B switching fixed block is fixedly connected to the A floating plate;

4. The system for testing a flexible circuit board according to claim 3, wherein: the fixture further comprises a C floating pressing part; the C floating pressing part comprises a C floating plate;

the jig base is provided with a first C avoidance opening;

the supporting top plate is also provided with a second C avoidance opening;

5. The system for testing a flexible circuit board according to claim 4, wherein: the PCB summary circuit board is connected with the first connection probe block and the second connection probe block through the second connection probe block;

6. The system for testing a flexible circuit board according to claim 4, wherein: the device also comprises a supporting pin and a first bolt;

the number of the first bolts is equal to that of the support pins;

7. The system for testing a flexible circuit board according to claim 4, wherein: the top edge of the FPC accommodating tank is provided with a chamfer;

8. The system for testing a flexible circuit board according to claim 7, wherein: the jig also comprises four magnets; the two magnets are fixedly connected to the bottom surface of the upper pressing plate, the other two magnets are fixedly connected to the jig base, and the two magnets on the upper pressing plate and the two magnets on the jig base are attracted correspondingly.

9. The system for testing a flexible circuit board according to claim 4, wherein: the pressing part is also included; the pressing part comprises a pressing driving device, a lower pressing plate, a first transverse supporting plate and a second vertical supporting plate;

the first transverse supporting plate is fixedly connected to the bottom plate;

10. A test method of a flexible circuit board is characterized in that: the method comprises the following steps:

the pressing part moves upwards according to a preset track to reset;