CN211100244U - Circuit and device for screening contact components - Google Patents
Circuit and device for screening contact components Download PDFInfo
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- CN211100244U CN211100244U CN201921613662.0U CN201921613662U CN211100244U CN 211100244 U CN211100244 U CN 211100244U CN 201921613662 U CN201921613662 U CN 201921613662U CN 211100244 U CN211100244 U CN 211100244U
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Abstract
The utility model provides a circuit and a device for screening contact components, which are formed by connecting a plurality of screening circuits in parallel, wherein each screening circuit comprises a power supply anode, a first load circuit, a shunt resistor and a power supply cathode which are connected in series in sequence, the first load circuit is connected with the tested contact components in parallel, and the shunt resistor is connected with a second load circuit in parallel; the first load circuit and the second load circuit are the same and are composed of a load resistor, a light emitting diode and a switch diode which are sequentially connected in series. Screening device with screening circuit can filter a plurality of contact class components and parts simultaneously, especially to the screening of temperature controller, puts into high low temperature test box with the screening device is whole, sets up different temperatures at high low temperature test box, when reaching the corresponding operating temperature of temperature controller, the temperature controller leads to the resistance change because temperature variation, the red light extinguishes the green light and lights, demonstrates this temperature controller normal operation, otherwise then abnormal working, can select unqualified temperature controller rapidly, conveniently in batches.
Description
Technical Field
The utility model belongs to circuit check out test set field, concretely relates to circuit and device for screening of contact class components and parts.
Background
The contact series temperature controller is a thermal sensitive reaction component which takes a bimetallic strip after temperature setting as a heat sensitive reaction component, when the temperature of a main component of a product rises, heat generated is transferred to a bimetallic strip, the bimetallic strip rapidly acts when the action temperature is set, and the bimetallic strip is electrically shocked to be disconnected or closed through the action of a mechanism; when the temperature drops to the reset temperature and is set, the bimetallic strip is rapidly recovered to the original state, so that the electric shock is closed or disconnected, the purpose of connecting or disconnecting the circuit is achieved, and the circuit is controlled.
In actual production, the contact temperature controller is an important component, and if the temperature controller generates parameter deviation and failure, the product cannot work normally. The temperature controller breaks down and needs to be repeatedly disassembled and assembled to the product, so that the contact of the connector is poor, and the reliability of the product is reduced.
At present, the original screening operation of the temperature controller is complex, the temperature controller needs to be installed in a product, and the product is subjected to power-on test under the conditions of high temperature and low temperature; only one temperature controller can be screened at a time, and the screening efficiency is low.
SUMMERY OF THE UTILITY MODEL
The utility model discloses embodiment provides a circuit and device for screening of contact class components and parts, its purpose is solved current problem that contact class components and parts screening efficiency is low.
In order to solve the technical problem, the utility model provides a circuit for screening contact components, which is formed by connecting a plurality of screening circuits in parallel, wherein each screening circuit comprises a power supply anode, a first load circuit, a shunt resistor and a power supply cathode which are sequentially connected in series, the first load circuit is connected with the tested contact components in parallel, and the shunt resistor is connected with a second load circuit in parallel;
the first load circuit and the second load circuit are the same, and the first load circuit and the second load circuit are respectively composed of a load resistor, a light emitting diode and a switch diode which are sequentially connected in series from the anode to the cathode, and the light emitting diodes of the two load circuits are different in color.
Further, the light emitting diode of the first load circuit is a red light emitting diode, and the light emitting diode of the second load circuit is a green light emitting diode.
Preferably, the tested contact component is a temperature controller.
The utility model also provides a device for contact class components and parts screening has the device that is used for contact class components and parts screening circuit.
Furthermore, the device for screening the contact type components comprises a box-shaped structure which is formed by sequentially connecting an installation plate, a front panel, a bottom plate and a rear panel end to end and is provided with two opposite openings; the mounting plate is used as a top plate and is positioned at the top of the box-shaped structure, a power supply wiring terminal and n uniformly distributed tested contact components are arranged on the surface of the mounting plate, and n is a positive integer; the panel surface of the front panel is provided with n groups of light-emitting diodes, n is a positive integer, each group of light-emitting diodes consists of a green light-emitting diode and a red light-emitting diode, an anode pin of the green light-emitting diode and an anode pin of the red light-emitting diode are respectively connected with a load resistor, and a cathode pin of the green light-emitting diode and a cathode pin of the red light-emitting diode are respectively connected with a switch diode; n shunt resistors which are uniformly distributed are arranged on the surface of the bottom plate;
the power supply anode, the load resistor of the first load circuit, the red light emitting diode, the switch diode of the first load circuit, the shunt resistor and the power supply cathode are sequentially connected in series, a tested contact component is connected in parallel between the power supply anode and a negative electrode pin of the switch diode of the first load circuit, the shunt resistor is connected in parallel with the second load circuit, and the second load circuit comprises the load resistor of the second load circuit, the green light emitting diode and the switch diode of the second load circuit which are sequentially connected in series from the input end to the output end of the shunt resistor;
and the positive pole of the power supply and the negative pole of the power supply power to the screening circuit through the power supply wiring terminal.
Furthermore, a plurality of support columns which are uniformly distributed are arranged on the outer bottom plate surface of the bottom plate.
Preferably, the box-like structure has four right angle corners, and each right angle corner sets up an upright, and the top and the mounting panel rigid coupling of upright, the bottom and the bottom plate rigid coupling of upright, the cylinder and front panel or the rear panel rigid coupling of upright.
Preferably, the positive pin and the negative pin of the tested contact component are respectively connected with wires of different colors.
The utility model has the advantages as follows:
the utility model provides a device for screening of contact class components and parts, the device has the screening circuit, can filter a plurality of contact class components and parts simultaneously, especially to the screening of temperature controller, put into high low temperature test case with the screening plant is whole, set up different temperatures at high low temperature test case, when reaching the corresponding action temperature of temperature controller, the temperature controller leads to the resistance value to change because temperature variation, the red light extinguishes the green light and lights, demonstrate this temperature controller normal work, otherwise abnormal work, can be rapidly, select unqualified temperature controller in batches conveniently.
In order to make the above and other objects of the present invention more comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
Fig. 1 is a circuit diagram for contact type component screening.
Fig. 2 is a schematic structural diagram of the device for screening contact type components.
Fig. 3 is a side view of an apparatus for contact type component screening.
Description of reference numerals:
1. a shunt resistor; 2. tested contact components; 3. a load resistance; 4. a light emitting diode; 5. a switching diode; 6. mounting a plate; 7. a front panel; 8. a base plate; 9. a rear panel; 10. a power supply wiring terminal; 11. a support pillar; 12. and (4) a column.
Detailed Description
The following description is provided for illustrative embodiments of the present invention, and other advantages and effects of the present invention will be readily apparent to those skilled in the art from the disclosure herein.
In the present invention, the upper, lower, left, and right sides in the drawings are referred to as the upper, lower, left, and right sides of the circuit for screening contact type components described in this specification.
The exemplary embodiments of the present invention will now be described with reference to the accompanying drawings, which, however, may be embodied in many different forms and are not limited to the embodiments described herein, which are provided for complete and complete disclosure of the present invention and to fully convey the scope of the invention to those skilled in the art. The terminology used in the exemplary embodiments presented in the accompanying drawings is not intended to be limiting of the invention. In the drawings, the same units/elements are denoted by the same reference numerals.
Unless otherwise defined, terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Further, it will be understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense.
First embodiment
The first embodiment of the utility model relates to a circuit for screening contact components, refer to fig. 1, it is parallelly connected by a plurality of screening circuits and constitutes, and each screening circuit includes power positive pole, first load circuit, shunt resistance 1 and the power negative pole that connects in series in proper order, and first load circuit connects in parallel by contact components and parts 2 under test, and shunt resistance 1 connects in parallel by the second load circuit; the first load circuit and the second load circuit are the same, the load resistor 3, the light emitting diode 4 and the switch diode 5 are sequentially connected in series from the anode to the cathode, and the light emitting diodes 4 of the two load circuits are different in color.
As shown in fig. 1, the power supply positive electrode, the load resistor 3 of the first load circuit, the red light emitting diodes (the second row and the fourth row of the light emitting diodes 4 in fig. 3), the switching diode 5 of the first load circuit, the shunt resistor 1, and the power supply negative electrode are sequentially connected in series, the contact type device 2 to be tested is connected in parallel between the power supply positive electrode and the negative electrode pin of the switching diode 5 of the first load circuit, the shunt resistor 1 is connected in parallel with the second load circuit, and the second load circuit includes the load resistor 3 of the second load circuit, the green light emitting diodes (the first row and the third row of the light emitting diodes 4 in fig. 3), and the switching diode 5 of the second load circuit, which are sequentially connected in series from the input end to the output end of the shunt.
Specifically, the circuit for screening contact type components protected by the embodiment is formed by connecting a plurality of screening circuits in parallel, each screening circuit includes a tested contact type component 2, whether the tested contact type component 2 in the screening circuit is normal or not is judged by turning on or turning off the lamps of the light emitting diodes with different colors in the screening circuits, and the screening process and the screening principle are as follows:
connect according to the schematic circuit diagram of fig. 1 and form the screening circuit, put into high low temperature test chamber with the sieving mechanism who contains the screening circuit, for the device circular telegram, all red lights light, see through the glass window of high low temperature test chamber and observe, then operate the cooling of high low temperature test chamber, when reaching 2 action temperature of the contact class components and parts of being surveyed, the contact class components and parts of being surveyed 2 lead to resistance change because temperature variation, the red light extinguishes the green light and lights, show that this contact class components and parts of being surveyed 2 work normally, otherwise then work is abnormal, can be rapid, convenient select unqualified contact class components and parts of being surveyed 2.
The circuit for screening the contact components and parts protected by the embodiment can realize the on-load screening of a plurality of tested contact components and parts at the same time, can eliminate early failure elements caused by a manufacturing process, effectively reduces the faults of the temperature control circuit, reduces the poor contact phenomenon caused by secondary disassembly and assembly of the sensor parts, improves the working quality of the sensor parts, has the characteristics of simple operation, reliable test and error prevention, and particularly meets the requirements of the technical scheme for screening the temperature controllers.
Second embodiment
In the first embodiment, the contact component 2 to be tested is preferably a temperature controller.
In addition, the light emitting diode 4 of the first load circuit is a red light emitting diode, the light emitting diode 4 of the second load circuit is a green light emitting diode, the red light emitting diode and the green light emitting diode are adopted to respectively show the on-off working state of the temperature controller, and the number of components can be effectively reduced by matching with a mode of regulating the current of two light emitting diodes through a resistance value, so that the circuit is miniaturized, and the reliability of the circuit is improved.
Third embodiment
This embodiment has protected a device for contact class components and parts screening circuit, has the device that is used for contact class components and parts screening circuit.
Specifically, referring to fig. 2 and 3, the device for screening contact type components comprises a box-shaped structure which is formed by connecting a mounting plate 6, a front panel 7, a bottom plate 8 and a rear panel 9 end to end in sequence and has two opposite openings; the mounting plate 6 is used as a top plate and is positioned at the top of the box-shaped structure, a power supply wiring terminal 10 and n uniformly distributed tested contact components 2 are arranged on the surface of the mounting plate 6, and n is a positive integer; the panel surface of the front panel 7 is provided with n groups of light-emitting diodes, n is a positive integer, each group of light-emitting diodes consists of a green light-emitting diode and a red light-emitting diode, an anode pin of the green light-emitting diode and an anode pin of the red light-emitting diode are respectively connected with a load resistor 3, and a cathode pin of the green light-emitting diode and a cathode pin of the red light-emitting diode are respectively connected with a switch diode 5; n shunt resistors 1 which are uniformly distributed are arranged on the surface of the bottom plate 8;
the power supply anode, the load resistor 3 of the first load circuit, the red light emitting diode, the switch diode 5 of the first load circuit, the shunt resistor 1 and the power supply cathode are sequentially connected in series, a tested contact component 2 is connected in parallel between the power supply anode and a cathode pin of the switch diode 5 of the first load circuit, the shunt resistor 1 is connected in parallel with the second load circuit, and the second load circuit comprises the load resistor 3 of the second load circuit, the green light emitting diode and the switch diode 5 of the second load circuit which are sequentially connected in series from the input end to the output end of the shunt resistor 1; the positive and negative power supplies supply power to the screening circuit through power terminals 10.
In order to put the screening device into the high-low temperature test chamber conveniently, a plurality of support columns 11 which are uniformly distributed are installed on the outer bottom plate surface of the bottom plate 8, and the support columns 11 can realize stable placement of the screening device.
Because there is the insecure possibility of installation in the installation of four boards, in order to improve the convenience of installation and can dismantle, have four right angle corners at box-like structure, each right angle corner sets up an stand 12, the top and the mounting panel 6 rigid coupling of stand 12, the bottom and the bottom 8 rigid coupling of stand 12, the cylinder and the front panel 7 or the rear panel 9 rigid coupling of stand 12.
In the screening device, the positive pin and the negative pin of the tested contact component 2 are respectively connected with leads with different colors, for example, the positive electrode and the negative electrode of the tested component are distinguished by the leads with red and white different lengths and colors, so that connection errors can be prevented.
While the present embodiment protects the apparatus including the screening circuit for the contact-type component, the preferred screening apparatus is preferably provided in fig. 2 and 3, but the present invention is not limited thereto, and other apparatuses including the screening circuit may be used.
Fourth embodiment
In the embodiment, a temperature controller JUC-027MA/-5 ℃ ± 5 ℃ (-below 5 ℃, the temperature controller is on; above-5 ℃, the temperature controller is off) is selected as the tested contact component 2, and the screening process and the screening principle of the screening device will be described in detail by taking the temperature controller of this type as an example:
in the configuration shown in figures 2 and 3, the support post 11 is mounted to the base plate 8 and secured; the shunt resistor 1 is arranged on a bottom plate 8 and is fastened by screws; mounting four upright posts 12 on the bottom plate 8, taking the mounting direction into consideration, with the plane facing outwards, and fastening by screws; mounting the front panel 7 on the upright 12 and fastening by using screws; mounting the rear panel 9 on the upright 12 and fastening by screws;
a load resistor 3 is welded to the anode of the green light emitting diode, and a switch diode 5 is welded to the cathode of the green light emitting diode (note direction); a load resistor 3 is welded to the anode of the red light-emitting diode, and a switch diode 5 is welded to the cathode of the red light-emitting diode (note direction);
mounting the soldered green light emitting diodes to the front panel 7; mounting the soldered red light emitting diodes to the front panel 7; connecting according to the figure 1, and reserving enough lines; mounting the mounting plate 6 to the upright 12, and fastening with screws; mounting the terminal red to the mounting board 6; mounting the terminal black to the mounting board 6; mounting the temperature controller to the mounting plate 6; and connecting the 28V voltage-stabilized power supply with the binding post in a red and black mode according to the relation of the positive and negative poles, and connecting the temperature controller with the red light-emitting diode and the green light-emitting diode according to the corresponding relation.
Because there are 24 temperature controllers to be screened, 24 temperature controllers are installed on the installation plate 6, 24 groups of screening circuits are connected on the screening device according to the circuit schematic diagram of fig. 1, and the 24 groups of screening circuits are connected in parallel to form the screening device containing the screening circuits.
The temperature controller screening method by using the screening device comprises the following steps:
1) the temperature controller JUC-027MA/-5 +/-5 ℃ is arranged on a temperature controller screening device, a power line is connected with a direct-current 28V power supply, and the screening device is arranged in a high-low temperature test box;
2) the temperature is reduced to +1 ℃ and the temperature is kept for 1 hour. The direct current 28V voltage is switched on, a red indicator light corresponding to the temperature controller is on, a green indicator light is off to be qualified, and otherwise, the temperature controller is off to be unqualified;
3) disconnecting the direct current of 28V;
4) the temperature of the high-low temperature test box is reduced to-11 ℃, and the temperature is kept for 1 hour. And D, connecting the direct current 28V voltage, turning off a red indicator lamp corresponding to the temperature controller, and turning on a green indicator lamp to be qualified, otherwise, turning off the green indicator lamp to be unqualified.
5) Disconnecting the direct current of 28V;
6) and (3) reducing the temperature of the high-low temperature test box to-40 ℃, keeping the temperature for 1 hour, switching on the direct current 28V voltage, electrifying for 15 minutes, turning off a red indicator lamp corresponding to the temperature controller, turning on a green indicator lamp to be qualified, and otherwise, turning off the green indicator lamp to be unqualified.
7) Disconnecting the direct current of 28V;
8) the temperature of the high-low temperature test chamber is raised to +1 ℃, and the temperature is kept for 1 hour. And (4) switching on the direct current of 28V, turning on a red indicator lamp corresponding to the temperature controller, turning off a green indicator lamp to be qualified, and otherwise, turning off the green indicator lamp to be unqualified.
9) Disconnecting the direct current of 28V;
10) the temperature of the high-low temperature test chamber is raised to +60 ℃, and the temperature is kept for 1 hour. And D, connecting the direct current 28V voltage, enabling a red indicator lamp corresponding to the temperature controller to be on, and enabling a green indicator lamp to be off to be qualified, otherwise, enabling the green indicator lamp to be unqualified.
11) The direct current is cut off by 28V, and the normal temperature is recovered.
According to above step, can once only filter 24 temperature controllers, and then select unqualified temperature controller, compare the tradition temperature controller that can only filter, the utility model provides a sieving mechanism screening efficiency is higher.
In this embodiment, a resistor RJ14-0.25-6.2KI is selected as a load resistor 3, a resistor J-RIG5-50W-30 omega-J is selected as a shunt resistor 1, and a model 2CK84A is selected as a switch diode 5, i.e., the screening device comprises a mounting board, a bottom board, a front panel, a rear panel, a column, a support column, a green diode, a red diode, a resistor RJ14-0.25-6.2KI, a switch diode 2CK84A, a resistor J-RIG5-50W-30 omega-J, a terminal red, a terminal black, a temperature controller, a 28V regulated power supply and a connecting line, wherein the green diode and the red diode are mounted on the front panel, the resistor J-RIG5-50W-30 omega-J is mounted on the bottom board, the resistor RJ14-0.25-6.2KI and the switch diode 2CK84A are mounted on the, The positive and negative both ends of green diode, terminal red and terminal black are installed on the mounting panel, and the temperature controller is installed on the mounting panel, connects temperature controller sieving mechanism according to the corresponding relation on the schematic diagram of circuit, and puts into high low temperature case with temperature controller sieving mechanism behind the 28V constant voltage power supply, screens the temperature controller.
Specifically, the operating temperature of the temperature controller selected in this embodiment is: below minus 5 ℃, the temperature controller is switched on; the temperature controller is disconnected when the temperature is above minus 5 ℃.
According to the principle, the temperature is below minus 5 ℃, if the temperature controller is qualified, current passes through the temperature controller, does not pass through the first load circuit, the red light is turned off, the current is shunted at the output end of the temperature controller, part of the current passes through the shunt resistor 1, the other part of the current passes through the load resistor 3 of the second load circuit, the green light emitting diode and the switch diode 5 of the second load circuit, the green light is turned on, namely the red indicator light is turned off, the green indicator light is turned on to be qualified, otherwise, the green indicator light is unqualified, such as step 4) and step 6).
The temperature is above-5 ℃, if the temperature controller is qualified, the temperature controller is disconnected, then the current does not pass through the temperature controller, the current passes through the first load circuit, the red light is on, the current passes through the shunt resistor 1, and because the voltage and the current do not reach the voltage and the current for starting the green light-emitting diode, the current does not pass through the second load circuit, the green light is off, namely the red indicator light is on, the green indicator light is off to be qualified, otherwise, the green indicator light is off to be unqualified, such as step 2), step 8) and step 10).
Through screening a plurality of temperature controllers (model JUC-027 MA) with loads, normal temperature, low temperature and high temperature screening and testing are carried out according to the screening technical scheme, early failure elements caused by the manufacturing process can be eliminated, the temperature control circuit fault is effectively reduced, the poor contact phenomenon caused by secondary disassembly and assembly of the sensor component is reduced, and the working quality of the sensor component is improved.
The screening device can quickly and reliably complete the installation of 24 temperature control devices and the on-load conduction test in the normal temperature, high temperature and low temperature states at one time, has the characteristics of simple operation, reliable test and error prevention, meets the requirements of the screening technical scheme of the temperature controller, and also can meet the testing and screening work of other products of the same type and similar temperature control devices.
In conclusion, the screening device indicator lamp adopts the red light-emitting diode and the green light-emitting diode to respectively show the on-off working state and the on-off working state of the temperature controller device, and the number of the components can be effectively reduced by matching the resistance value to adjust the current of the two light-emitting diodes, so that the circuit is miniaturized, and the reliability of the circuit is improved; the device can screen 24 temperature controllers at one time, and greatly improves the screening efficiency of devices; the device is designed to be error-proof, and red and white lead wires with different lengths and colors are selected to distinguish the anode and the cathode of the tested device. Correspondingly lettering and numbering the mounting position of the tested device and the display position of the panel to ensure that the tested device corresponds to the red light-emitting diode and the green light-emitting diode; the device fully considers the power and heat dissipation requirements, under the condition of load, the power of each set of temperature control circuit is about 30W, 24 sets of temperature control circuits are measured at one time, and the total power is 720W, so that the device mounting plate and the load mounting plate are connected by only four support columns by adopting the convection ventilation design.
It will be understood by those skilled in the art that the foregoing embodiments are specific examples of the invention, and that various changes in form and details may be made therein without departing from the spirit and scope of the invention in its practical application.
Claims (8)
1. The utility model provides a circuit for screening of contact class components and parts which characterized in that: the device is formed by connecting a plurality of screening circuits in parallel, each screening circuit comprises a power supply anode, a first load circuit, a shunt resistor (1) and a power supply cathode which are sequentially connected in series, the first load circuit is connected with a tested contact component (2) in parallel, and the shunt resistor (1) is connected with a second load circuit in parallel;
the first load circuit and the second load circuit are the same, the first load circuit and the second load circuit are composed of a load resistor (3), a light emitting diode (4) and a switch diode (5) which are sequentially connected in series from the positive pole to the negative pole, and the light emitting diodes (4) of the two load circuits are different in color.
2. The circuit for screening contact type components according to claim 1, wherein: the light emitting diode (4) of the first load circuit is a red light emitting diode, and the light emitting diode (4) of the second load circuit is a green light emitting diode.
3. The circuit for screening contact type components according to claim 1, wherein: the tested contact component (2) is a temperature controller.
4. The utility model provides a device for screening of contact class components and parts which characterized in that: the circuit for screening the contact type components and parts is provided with the circuit for screening the contact type components and parts as claimed in any one of claims 1 to 3.
5. The apparatus for screening contact type components according to claim 4, wherein: comprises a box-shaped structure which is formed by connecting an installation plate (6), a front panel (7), a bottom plate (8) and a rear panel (9) end to end in sequence and is provided with two opposite openings; the mounting plate (6) is used as a top plate and is positioned at the top of the box-shaped structure, a power supply wiring terminal (10) and n tested contact type components (2) which are uniformly distributed are arranged on the surface of the mounting plate (6), and n is a positive integer; n groups of light-emitting diodes are mounted on the surface of the front panel (7), n is a positive integer, each group of light-emitting diodes consists of a green light-emitting diode and a red light-emitting diode, an anode pin of the green light-emitting diode and an anode pin of the red light-emitting diode are respectively connected with a load resistor (3), and a cathode pin of the green light-emitting diode and a cathode pin of the red light-emitting diode are respectively connected with a switch diode (5); the surface of the bottom plate (8) is provided with n shunt resistors (1) which are uniformly distributed;
the power supply positive pole, the load resistor (3) of the first load circuit, the red light emitting diode, the switch diode (5) of the first load circuit, the shunt resistor (1) and the power supply negative pole are sequentially connected in series, a tested contact component (2) is connected between the power supply positive pole and the negative pole pin of the switch diode (5) of the first load circuit in parallel, the shunt resistor (1) is connected with the second load circuit in parallel, and the second load circuit comprises the load resistor (3) of the second load circuit, the green light emitting diode and the switch diode (5) of the second load circuit which are sequentially connected in series from the input end to the output end of the shunt resistor (1);
and the positive pole and the negative pole of the power supply power to the screening circuit through the power supply wiring terminal (10).
6. The apparatus for screening contact type components according to claim 5, wherein: and a plurality of supporting columns (11) which are uniformly distributed are arranged on the outer bottom plate surface of the bottom plate (8).
7. The apparatus for screening contact type components according to claim 5, wherein: the box-shaped structure is provided with four right-angle corners, each right-angle corner is provided with a stand column (12), the top end of the stand column (12) is fixedly connected with the mounting plate (6), the bottom end of the stand column (12) is fixedly connected with the bottom plate (8), and the cylindrical surface of the stand column (12) is fixedly connected with the front panel (7) or the rear panel (9).
8. The apparatus for screening contact type components according to claim 5, wherein: and the positive pin and the negative pin of the tested contact component (2) are respectively connected with wires with different colors.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921613662.0U CN211100244U (en) | 2019-09-26 | 2019-09-26 | Circuit and device for screening contact components |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921613662.0U CN211100244U (en) | 2019-09-26 | 2019-09-26 | Circuit and device for screening contact components |
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| Publication Number | Publication Date |
|---|---|
| CN211100244U true CN211100244U (en) | 2020-07-28 |
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| CN201921613662.0U Active CN211100244U (en) | 2019-09-26 | 2019-09-26 | Circuit and device for screening contact components |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112713884A (en) * | 2020-12-29 | 2021-04-27 | 宁波技冠智能科技发展股份有限公司 | Electronic switch for low-voltage direct-current large-current circuit |
-
2019
- 2019-09-26 CN CN201921613662.0U patent/CN211100244U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112713884A (en) * | 2020-12-29 | 2021-04-27 | 宁波技冠智能科技发展股份有限公司 | Electronic switch for low-voltage direct-current large-current circuit |
| CN112713884B (en) * | 2020-12-29 | 2024-05-10 | 宁波技冠智能科技发展股份有限公司 | Electronic switch for low-voltage direct-current large-current circuit |
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