CN218994680U

CN218994680U - Circuit board testing device

Info

Publication number: CN218994680U
Application number: CN202320006368.3U
Authority: CN
Inventors: 余晓云; 奚永恒; 徐燃; 王奥
Original assignee: Hefei Yofo Medical Technology Co ltd
Current assignee: Hefei Yofo Medical Technology Co ltd
Priority date: 2023-01-03
Filing date: 2023-01-03
Publication date: 2023-05-09
Anticipated expiration: 2033-01-03

Abstract

The present disclosure provides a circuit board testing device, comprising: a vibration table for providing vibration; and a vibration plate fixedly installed on the vibration table such that vibration provided by the vibration table can be transferred to the vibration plate; the vibration board includes base plate portion and a plurality of location erection columns of fixed mounting on base plate portion, and location erection column can cooperate with the location mounting hole that disposes on the circuit board that awaits measuring in order to keep the circuit board that awaits measuring on the vibration board to make the vibration board transmit the vibration to the circuit board that awaits measuring and carry out vibration test.

Description

Circuit board testing device

Technical Field

The disclosure relates to the technical field of circuit board testing, and in particular relates to a circuit board testing device.

Background

After the circuit board is manufactured, the welding process, the electrical performance and the like of the circuit board need to be tested.

Testing the soldering process of the circuit board includes checking whether the soldering process of the circuit board has the bad phenomena of cold joint and connection.

In order to check whether the circuit board has the bad phenomena of virtual lighting, non-lighting and the like of the indicator lamp in the long-time power-on process, the circuit board is also required to be subjected to power-on test.

For example, chinese patent document CN213986727U discloses an inspection tool for inspecting the cold joint and short circuit of a battery module PCB, which includes components such as a dc power supply, an indicator light, a resistor, a spring pin, a cold joint end, a short circuit end, and a plugging mechanism, and the inspection tool can only detect the cold joint, the short circuit, and the like of the PCB based on an energizing test.

Disclosure of Invention

The present disclosure provides a new circuit board testing device, which is realized by the following technical scheme.

A circuit board testing apparatus comprising:

a vibrating table for providing vibration;

a vibration plate fixedly mounted on the vibration table such that vibration provided by the vibration table can be transmitted to the vibration plate;

the vibration plate comprises a substrate part and a plurality of positioning mounting columns fixedly mounted on the substrate part, wherein the positioning mounting columns can be matched with positioning mounting holes configured on a circuit board to be tested to keep the circuit board to be tested on the vibration plate, so that the vibration plate transmits vibration to the circuit board to be tested to perform vibration test.

According to the circuit board testing device of at least one embodiment of the present disclosure, a plurality of the positioning mounting posts may be arranged in a row-column array on the substrate portion.

According to the circuit board testing device of at least one embodiment of the present disclosure, the substrate portion includes a plurality of positioning screw holes arranged in a row-column array, and the number of positioning mounting posts arranged on the substrate portion can be adjusted based on the positioning screw holes.

A circuit board testing apparatus according to at least one embodiment of the present disclosure, further comprising:

and the base is used for supporting the vibrating table.

the baking machine test board is used for testing the electrical performance of the circuit board to be tested; the toaster test plate can be positioned on the base plate portion based on positioning mounting posts of the vibration plate.

According to the circuit board testing device of at least one embodiment of the present disclosure, the toaster testing plate is provided with a plurality of positioning holes for being matched with the positioning mounting posts of the vibrating plate, and the positioning holes can be penetrated by the positioning mounting posts so that the toaster testing plate is positioned by the positioning mounting posts.

According to the circuit board testing device of at least one embodiment of the present disclosure, the plurality of positioning holes are arranged in a row-column array on the baking machine testing board so as to correspond to the plurality of positioning screw holes arranged in a row-column array on the base plate portion.

According to the circuit board testing device of at least one embodiment of the present disclosure, the aperture size of the positioning hole is larger than the radial size of the positioning mounting post, so that a gap is formed between the positioning hole and the positioning mounting post after the positioning mounting post passes through the positioning hole.

According to the circuit board testing device of at least one embodiment of the present disclosure, the power lines are configured on the testing board of the baking machine, so that the testing board of the baking machine can perform electrical performance testing on a plurality of circuit boards to be tested.

According to the circuit board testing device of at least one embodiment of the present disclosure, a plurality of the power lines are arranged in a row/column form, and each power line is disposed between two adjacent rows/columns of positioning holes.

Drawings

The accompanying drawings, which are included to provide a further understanding of the disclosure and are incorporated in and constitute a part of this specification, illustrate exemplary embodiments of the disclosure and together with the description serve to explain the principles of the disclosure.

Fig. 1 is a schematic structural view of a circuit board testing device according to an embodiment of the present disclosure.

Fig. 2 is a schematic structural view of a vibration plate of a circuit board testing device according to an embodiment of the present disclosure.

Fig. 3 is a schematic structural view of a circuit board testing device according to still another embodiment of the present disclosure.

Fig. 4 is a schematic structural view of a toaster test board of a circuit board testing device according to an embodiment of the present disclosure.

Description of the reference numerals

100. Circuit board testing device

101. Vibrating table

102. Vibrating plate

103. Test board of baking machine

110. Base seat

1021. Base plate part

1022. Positioning and mounting column

1023. Screw mounting hole

1031. Power line

1032. Electric connection terminal

1033. And positioning holes.

Detailed Description

The present disclosure is described in further detail below with reference to the drawings and the embodiments. It is to be understood that the specific embodiments described herein are merely illustrative of the relevant content and not limiting of the present disclosure. It should be further noted that, for convenience of description, only a portion relevant to the present disclosure is shown in the drawings.

In addition, embodiments of the present disclosure and features of the embodiments may be combined with each other without conflict. The technical aspects of the present disclosure will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.

Unless otherwise indicated, the exemplary implementations/embodiments shown are to be understood as providing exemplary features of various details of some ways in which the technical concepts of the present disclosure may be practiced. Thus, unless otherwise indicated, features of the various implementations/embodiments may be additionally combined, separated, interchanged, and/or rearranged without departing from the technical concepts of the present disclosure.

The use of cross-hatching and/or shading in the drawings is typically used to clarify the boundaries between adjacent components. As such, the presence or absence of cross-hatching or shading does not convey or represent any preference or requirement for a particular material, material property, dimension, proportion, commonality between illustrated components, and/or any other characteristic, attribute, property, etc. of a component, unless indicated. In addition, in the drawings, the size and relative sizes of elements may be exaggerated for clarity and/or descriptive purposes. While the exemplary embodiments may be variously implemented, the specific process sequences may be performed in a different order than that described. For example, two consecutively described processes may be performed substantially simultaneously or in reverse order from that described. Moreover, like reference numerals designate like parts.

When an element is referred to as being "on" or "over", "connected to" or "coupled to" another element, it can be directly on, connected or coupled to the other element or intervening elements may be present. However, when an element is referred to as being "directly on," "directly connected to," or "directly coupled to" another element, there are no intervening elements present. For this reason, the term "connected" may refer to physical connections, electrical connections, and the like, with or without intermediate components.

For descriptive purposes, the present disclosure may use spatially relative terms such as "under … …," under … …, "" under … …, "" lower, "" above … …, "" upper, "" above … …, "" higher "and" side (e.g., in "sidewall") to describe one component's relationship to another (other) component as illustrated in the figures. In addition to the orientations depicted in the drawings, the spatially relative terms are intended to encompass different orientations of the device in use, operation, and/or manufacture. For example, if the device in the figures is turned over, elements described as "under" or "beneath" other elements or features would then be oriented "over" the other elements or features. Thus, the exemplary term "below" … … can encompass both an orientation of "above" and "below". Furthermore, the device may be otherwise positioned (e.g., rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. Furthermore, when the terms "comprises" and/or "comprising," and variations thereof, are used in the present specification, the presence of stated features, integers, steps, operations, elements, components, and/or groups thereof is described, but the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof is not precluded. It is also noted that, as used herein, the terms "substantially," "about," and other similar terms are used as approximation terms and not as degree terms, and as such, are used to explain the inherent deviations of measured, calculated, and/or provided values that would be recognized by one of ordinary skill in the art.

Fig. 1 is a schematic structural view of a circuit board testing device according to an embodiment of the present disclosure. Fig. 2 is a schematic structural view of a vibration plate of a circuit board testing device according to an embodiment of the present disclosure. Fig. 3 is a schematic structural view of a circuit board testing device according to still another embodiment of the present disclosure. Fig. 4 is a schematic structural view of a toaster test board of a circuit board testing device according to an embodiment of the present disclosure.

The circuit board testing device 100 of the present disclosure is described in detail below with reference to fig. 1 to 4.

The circuit board testing device 100 of the present disclosure may test circuit boards such as a main control board, a motor drive board, a remote control board, a power conversion board, an LED control board, and the like.

Referring first to fig. 1, in some embodiments of the present disclosure, a circuit board testing apparatus 100 of the present disclosure includes: a vibration table 101, the vibration table 101 for providing vibration; and a vibration plate 102 fixedly mounted on the vibration table 101 such that vibration provided by the vibration table 101 can be transmitted to the vibration plate 102; wherein the vibration plate 102 includes a base plate portion 1021 and a plurality of positioning mounting posts 1022 fixedly mounted on the base plate portion 1021, the positioning mounting posts 1022 being capable of cooperating with positioning mounting holes provided on the circuit board to be tested to hold the circuit board to be tested on the vibration plate 102, such that the vibration plate 102 transmits vibrations to the circuit board to be tested for vibration testing.

The circuit board testing device 100 of the present disclosure tests whether the soldering process of the circuit board to be tested has bad phenomena such as cold soldering, continuous soldering, etc. based on the vibrating table.

In some embodiments of the present disclosure, the vibration plate 102 of the present disclosure is fixedly mounted on the vibration table 101 in a detachable manner.

The vibration table 101 of the circuit board testing apparatus 100 of the present disclosure may employ an existing vibration table (i.e., vibration test table), and the present disclosure is not particularly limited to a specific model of the vibration table or the like.

In some embodiments of the present disclosure, the vibration plate 102 is mounted on the vibration table 101 by fastening screws, and preferably, a plurality of screw mounting holes 1023 may be provided on the vibration plate 102, a plurality of screw mounting holes (not shown) may be provided on the vibration table 101, and the vibration plate 102 is fixedly mounted on the vibration table 101 by the fastening screws engaged with the screw mounting holes.

Those skilled in the art, in light of the technical solution of the present disclosure, may adjust the fixed connection manner of the vibration plate 102 and the vibration table 101, which all fall within the protection scope of the present disclosure.

The circuit board testing apparatus 100 of the present disclosure enables a circuit board (not shown) to be tested to be positionally held on the vibration plate 102 to receive vibrations transmitted by the vibration plate 102 by configuring the vibration plate 102 with a plurality of positioning mounting posts 1022.

The vibration plate 102 of the circuit board testing device 100 of the present disclosure includes a substrate portion 1021 and a plurality of positioning mounting posts 1022, fig. 2 illustrates a structure of the vibration plate 102 of the circuit board testing device 100 of one embodiment of the present disclosure, and referring to fig. 2, the substrate portion 1021 of the vibration plate 102 may have a rectangular plate shape, and the plurality of positioning mounting posts 1022 described above are disposed on a first surface of the substrate portion 1021.

Referring again to fig. 1, a second surface of the substrate portion 1021 opposite to the first surface is supported by the vibration table 101.

In some embodiments of the present disclosure, the positioning mounting posts 1022 are fixedly mounted on the base plate portion 1021 in a detachable manner, and the positioning mounting posts 1022 may be in the form of positioning screws that may be fixedly mounted on the first surface of the base plate portion 1021 (i.e., the upper surface of the base plate portion 1021 shown in fig. 1 and 2) based on engagement with positioning screw holes provided on the first surface of the base plate portion 1021.

Based on the above-described detachable connection manner, the number of the positioning mounting posts 1022 on the base plate portion 1021 of the vibration plate 102 of the present disclosure can be adjusted to cope with vibration testing of different sizes/different numbers of circuit boards to be tested.

In some embodiments of the present disclosure, a positioning copper nut (the specification of the positioning copper nut may be M3 x 8) is disposed in the positioning threaded hole of the substrate portion 1021, and the positioning mounting hole of the circuit board to be tested may be a positioning threaded hole (for example, M3 x 8 specification) matching the type of the positioning copper nut disposed in the positioning threaded hole of the substrate portion 1021.

Positioning mounting posts 1022 in the form of set screws may positionally secure the circuit board to be tested to the vibration plate 102 based on engagement with the positioning threaded holes.

In some embodiments of the present disclosure, the plurality of positioning mounting posts 1022 of the circuit board testing device 100 of the present disclosure can be configured on the substrate portion 1021 in a row-column array.

Fig. 2 schematically illustrates a plurality of positioning mounting posts 1022 arranged in a row and column array, preferably with each row/column of positioning mounting posts 1022 disposed at equal spacing.

In some embodiments of the present disclosure, the plurality of positioning mounting posts 1022 are configured in a row-column array with the same row spacing as the column spacing.

Those skilled in the art may adjust the number, spacing, arrangement, etc. of the positioning and mounting posts 1022 in the light of the present disclosure, which fall within the scope of the present disclosure.

In some embodiments of the present disclosure, the base plate portion 1021 of the vibration plate 102 of the circuit board testing device 100 of the present disclosure includes a plurality of positioning screw holes arranged in a row-column array, wherein the arrangement positions of the positioning screw holes, i.e., the positions in fig. 2 where the positioning mounting posts 1022 are arranged, based on the positioning screw holes, the number of positioning mounting posts 1022 arranged at the base plate portion 1021 can be adjusted.

In some embodiments of the present disclosure, the circuit board testing apparatus 100 of the present disclosure further includes: a base 110, the base 110 being for supporting the vibrating table 101.

Referring to fig. 1, a base 110 of a circuit board testing apparatus 100 is used to support a vibration table 101.

Fig. 3 is a circuit board testing apparatus 100 according to still another embodiment of the present disclosure, and the circuit board testing apparatus 100 shown in fig. 3 further includes a bake machine testing board 103 for testing electrical properties of a circuit board to be tested, based on the circuit board testing apparatus 100 shown in fig. 1.

In some embodiments of the present disclosure, referring to fig. 3, the circuit board testing apparatus 100 of the present disclosure further includes: the baking machine test board 103, the baking machine test board 103 is used for testing the electrical performance of the circuit board to be tested; the toaster test board 103 can be positioned on the base plate portion 1021 based on the positioning mounting posts 1022 of the vibration plate 102.

Fig. 4 shows a schematic structural view of a toaster test plate according to an embodiment of the present disclosure.

Referring to fig. 4, in some embodiments of the present disclosure, a plurality of positioning holes 1033 for cooperation with the positioning mounting posts 1022 of the vibration plate 102 are configured on the toaster test plate 103 of the circuit board test device 100 of the present disclosure, the positioning holes 1033 being capable of being penetrated by the positioning mounting posts 1022 described above such that the toaster test plate 103 is positioned by the positioning mounting posts 1022.

Preferably, in some embodiments of the present disclosure, the plurality of positioning holes 1033 of the toaster test plate 103 of the present disclosure are arranged in a row-column array on the toaster test plate 103 to correspond to the plurality of positioning screw holes arranged in a row-column array on the base plate portion 1021.

Preferably, the aperture size of the positioning hole 1033 of the toaster test plate 103 of the present disclosure is larger than the radial size of the positioning mounting post 1022, such that there is a gap between the positioning hole 1033 and the positioning mounting post 1022 after the positioning mounting post 1022 passes through the positioning hole 1033.

Among them, the shape of the positioning hole 1033 is preferably a circular shape.

The aperture size of the positioning hole 1033 of the baking machine test board 103 is set to be larger than the radial size of the positioning mounting column 1022, so that after the baking machine test board 103 is overlapped on the substrate 1021 of the vibration board 102, the positioning mounting column 1022 sequentially penetrates through the circuit board to be tested and the baking machine test board 103, and the setting of the gap is beneficial to fixing the circuit board to be tested on the vibration board 102 through the positioning mounting column 1022.

In some embodiments of the present disclosure, referring to fig. 4, a plurality of power lines 1031 are configured on the bake machine test board 103 of the circuit board test device 100 of the present disclosure to enable the bake machine test board 103 to perform electrical performance tests on a plurality of circuit boards to be tested.

Referring to fig. 4, a plurality of electrical connection terminals 1032 may be disposed on each power line 1031, and the electrical connection terminals 1032 may be plugged onto a circuit board to be tested.

Those skilled in the art, with the benefit of this disclosure, may adjust the number of power lines 1031, which all fall within the scope of this disclosure.

In some embodiments of the present disclosure, it is preferable that the plurality of power lines 1031 of the toaster test board 103 of the circuit board test device 100 of the present disclosure are arranged in a row/column form, and each power line 1031 is disposed between two adjacent row/column positioning holes 1033.

The following describes an exemplary test procedure for a circuit board to be tested.

1. Vibration test

The vibration test may be performed based on the following steps:

and step 1, fixing the circuit board to be tested on a positioning copper nut at a designated position of the vibrating plate.

And step 2, after the power supply is plugged into the vibrating table, a power supply button and a scram switch are turned on.

And 3, clicking the screen to enter a mode selection interface after the screen of the vibrating table is lightened.

And 4, selecting a programmable sweep frequency, adjusting the frequency to 50HZ, and vibrating for 30 minutes, wherein the wave band is half-wave.

And step 5, clicking to start the test, and starting the vibration test.

And 6, completing vibration test, namely entering a circuit board programming program test to test whether the circuit board has bad phenomena of cold joint and continuous joint after vibration.

2. Test of baking machine

The ACDC module can be also configured on the testing board of the baking machine to convert 220V voltage into voltage required for testing the electrical performance of the circuit board.

The power lines are arranged on the test board of the baking machine, each circuit board to be tested is provided with a power line, and the power lines are connected in parallel.

The duration of the toaster verification may be 2 hours.

The baking machine test is performed based on the following steps:

and step 1, placing the circuit board to be tested after the burning program at the appointed position of the test board of the baking machine.

And step 2, connecting the power plug of the circuit board to be tested to the electric connection terminal of the baking machine test board.

And step 3, electrifying the test board of the baking machine and the circuit board to be tested, and observing the state of the circuit board indicator lamp, and judging whether the circuit board indicator lamp has the adverse phenomena of unlit, virtual bright and the like.

And step 4, after 2 hours (adjustable) of the baking machine, observing the state of the circuit board again, and judging whether the circuit board has the adverse phenomena of no brightness, virtual brightness and the like.

And 5, cutting off the power of the test board of the baking machine and the circuit board to be tested, placing the qualified circuit board in an electrostatic bag for warehousing, and returning and repairing the unqualified circuit board.

It should be noted that the above-described test procedure is merely an exemplary description of the test procedure of the circuit board to be tested by the circuit board test apparatus of the present disclosure, and should not be construed as limiting the configuration of the circuit board test apparatus of the present disclosure.

In the description of the present specification, reference to the terms "one embodiment/manner," "some embodiments/manner," "example," "a particular example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment/manner or example is included in at least one embodiment/manner or example of the present disclosure. In this specification, the schematic representations of the above terms are not necessarily for the same embodiment/manner or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments/modes or examples. Furthermore, the various embodiments/modes or examples described in this specification and the features of the various embodiments/modes or examples can be combined and combined by persons skilled in the art without contradiction.

Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present disclosure, the meaning of "a plurality" is at least two, such as two, three, etc., unless explicitly specified otherwise.

It will be appreciated by those skilled in the art that the above-described embodiments are merely for clarity of illustration of the disclosure, and are not intended to limit the scope of the disclosure. Other variations or modifications will be apparent to persons skilled in the art from the foregoing disclosure, and such variations or modifications are intended to be within the scope of the present disclosure.

Claims

1. A circuit board testing apparatus, comprising:

a vibrating table for providing vibration; and

2. The circuit board testing device of claim 1, wherein a plurality of said positioning mounting posts are configured in a row and column array on said base plate portion.

3. The circuit board testing device according to claim 2, wherein the base plate portion includes a plurality of positioning screw holes arranged in a row-column array, and the number of positioning mounting posts arranged on the base plate portion is adjustable based on the positioning screw holes.

4. A circuit board testing device according to any one of claims 1 to 3, further comprising:

and the base is used for supporting the vibrating table.

5. A circuit board testing device according to any one of claims 1 to 3, further comprising:

the baking machine test board is used for testing the electrical performance of the circuit board to be tested;

the toaster test plate can be positioned on the base plate portion based on positioning mounting posts of the vibration plate.

6. The circuit board testing device of claim 5, wherein the toaster test plate is provided with a plurality of positioning holes for mating with positioning mounting posts of the vibration plate, the positioning holes being capable of being penetrated by the positioning mounting posts such that the toaster test plate is positioned by the positioning mounting posts.

7. The circuit board testing device according to claim 6, wherein a plurality of the positioning holes are arranged in a row-column array on the bake machine test board so as to correspond to a plurality of the positioning screw holes arranged in a row-column array on the substrate portion.

8. The circuit board testing device of claim 6, wherein the positioning hole has a larger aperture size than the radial dimension of the positioning mounting post such that there is a gap between the positioning hole and the positioning mounting post after the positioning mounting post passes through the positioning hole.

9. The circuit board testing device of claim 5, wherein the burn-in board is configured with a plurality of power lines to enable the burn-in board to perform electrical performance testing on a plurality of circuit boards to be tested.

10. The circuit board testing device of claim 9, wherein a plurality of said power lines are arranged in rows/columns, each power line being disposed between two adjacent rows/columns of alignment holes.