CN211016547U - High-low temperature flash memory test system - Google Patents

High-low temperature flash memory test system Download PDF

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Publication number
CN211016547U
CN211016547U CN202020107790.4U CN202020107790U CN211016547U CN 211016547 U CN211016547 U CN 211016547U CN 202020107790 U CN202020107790 U CN 202020107790U CN 211016547 U CN211016547 U CN 211016547U
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China
Prior art keywords
tester body
seat
tester
fixedly arranged
test
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CN202020107790.4U
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Chinese (zh)
Inventor
张浩明
李四林
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Wuhan Zhifu Semiconductor Technology Co.,Ltd.
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Wuhan Recadata Storage Technology Co ltd
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Priority to CN202020107790.4U priority Critical patent/CN211016547U/en
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Abstract

The utility model discloses a high low temperature flash memory test system, including the tester body, the upper portion of tester body is equipped with the test seat, the one end of test seat is connected with through connecting the axle bed and covers the clamp plate, the other end of test seat is connected with the block seat, install heat dissipation fan in the tester body, install the hot plate through the mount pad on the tester body, install control module in the tester body, control module electric connection voltage regulating module, voltage regulating module electric connection city electric wire netting, control module electric connection display screen, pilot lamp, hot plate, heat dissipation fan and temperature measurement module; the utility model discloses this internal cooling fan that is equipped with of tester realizes detecting the flash memory card at low temperature or under the normal atmospheric temperature, is equipped with the hot plate at this internal tester for the flash memory card can detect under the high temperature, and is equipped with temperature measurement module, realizes detecting the parameter of environment.

Description

High-low temperature flash memory test system
Technical Field
The utility model relates to a flash memory test technical field specifically is a high low temperature flash memory test system.
Background
After the flash memory card is produced, various data need to be tested, and then the flash memory card can be written with the data, but when the existing testing device is used, the characteristics of the flash memory card under different environments cannot be tested, so that the flash memory card cannot accurately test the accurate data under various environments when testing, and therefore, a high-low temperature flash memory testing system is provided.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a high low temperature flash memory test system has cooling fan and realizes the cooling of dispelling the heat to tester body inside to and be equipped with the hot plate and realize heating the tester body, realize the detection of different temperatures, and be equipped with temperature measurement module and can detect environmental parameter, be used for solving the problem that proposes among the above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides a high low temperature flash memory test system, includes the tester body, the front of tester body is fixed and is equipped with display screen, pilot lamp, button, switch, ethernet interface, USB interface and test interface that resets, the fixed test seat that is equipped with in upper portion of tester body, the one end fixed mounting of test seat has the connection axle bed, be connected with through the axostylus axostyle in the connection axle bed and cover the clamp plate, the other end fixed connection block seat of test seat, the inside rear end fixed mounting of tester body has cooling fan, the fixed mount pad that is equipped with in upper portion of tester body, the inside fixed mounting of mount pad has the hot plate, the inside fixed mounting of tester body has control module, control module electric connection pressure regulating module, pressure regulating module electric connection municipal power grid, control module electric connection display screen, test interface, Pilot lamp, hot plate, cooling blower and temperature measurement module.
Preferably, the bottom of the tester body is provided with at least four groups of supporting legs, and the four groups of supporting legs are respectively fixed at four corners of the bottom of the tester body.
Preferably, the voltage regulating module comprises a rectifying circuit, a voltage reducing circuit, a filter circuit and a voltage stabilizing circuit, and the rectifying circuit comprises four groups of resistors to form a bridge circuit.
Preferably, the clamping seat is provided with two groups of clamping grooves, the top end of the covering plate is provided with two groups of clamping blocks, and the two groups of clamping blocks are respectively clamped and connected in the clamping grooves.
Preferably, a heat dissipation window is fixedly arranged at the rear end of the tester body, and a heat dissipation fan is fixedly arranged on the inner side of the heat dissipation window.
Preferably, a handle is fixedly arranged at one end of the top of the pressing plate.
Compared with the prior art, the beneficial effects of the utility model are that:
the utility model discloses at the fixed cooling fan that is equipped with in inside of tester body, can realize dispelling the heat to tester body inside, and then make the test seat can realize detecting the flash memory card under the environment of low temperature or normal atmospheric temperature in the test to this internal hot plate that is equipped with of tester, realize heating the test seat, make the flash memory card can detect under the environment of high temperature, and be equipped with temperature measurement module, realize detecting the parameter of environment.
Drawings
FIG. 1 is a schematic cross-sectional view of the present invention;
FIG. 2 is a schematic structural view of the present invention;
FIG. 3 is a block diagram of the system of the present invention;
fig. 4 is a circuit diagram of the voltage regulating module of the present invention.
In the figure: 1. a tester body; 2. a support leg; 3. a display screen; 4. an indicator light; 5. resetting the key; 6. a power switch; 7. an Ethernet interface; 8. a USB interface; 9. a test interface; 10. a test seat; 11. connecting the shaft seat; 12. covering and pressing a plate; 13. a handle; 14. a clamping seat; 15. a heat dissipation window; 16. a heat radiation fan; 17. a control module; 18. a mounting seat; 19. heating the plate.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
The same reference numbers in different drawings identify the same or similar elements; it should be further understood that terms such as "first," "second," "third," "upper," "lower," "front," "rear," "inner," "outer," "end," "portion," "section," "width," "thickness," "zone," and the like, may be used solely for convenience in reference to the figures and to aid in describing the invention, and are not intended to limit the invention.
Referring to fig. 1-4, the present invention provides a technical solution: a high-low temperature flash memory test system comprises a tester body 1;
according to fig. 2, in order to keep the tester body 1 balanced, at least four sets of legs 2 are provided at the bottom of the tester body 1, the four sets of legs 2 are respectively fixed at four corners of the bottom of the tester body 1, in order to facilitate the operation and observation of the tester body 1 during use, a display screen 3, an indicator lamp 4, a reset key 5, a power switch 6, an ethernet interface 7, a USB interface 8 and a test interface 9 are fixedly provided on the front of the tester body 1, in order to implement the test installation of the flash memory card, a test socket 10 is fixedly provided on the upper portion of the tester body 1, in order to stabilize the installation of the flash memory card on the test socket 10 and prevent the phenomenon of poor contact, a connecting shaft seat 11 is fixedly installed at one end of the test socket 10, a pressing plate 12 is connected to the connecting shaft seat 11 through a shaft rod, in order to facilitate the opening and closing of the pressing plate 12, a handle 13 is fixedly arranged at one end of the top of the covering plate 12, in order to fixedly connect the covering plate 12, a clamping seat 14 is fixedly connected at the other end of the test seat 10, the clamping seat 14 is provided with two groups of clamping grooves, the top end of the covering plate 12 is provided with two groups of clamping blocks, and the two groups of clamping blocks are respectively clamped and connected in the clamping grooves;
according to fig. 1, in order to cool the inside of the tester body 1, a heat dissipation fan 16 is fixedly installed at the rear end of the inside of the tester body 1, in order to enable air to flow, a heat dissipation window 15 is fixedly installed at the rear end of the tester body 1, the heat dissipation fan 16 is fixedly installed at the inner side of the heat dissipation window 15, in order to fixedly install a heating plate 19, an installation seat 18 is fixedly installed at the upper part of the tester body 1, and the heating plate 19 is fixedly installed inside the installation seat 18;
according to fig. 3 and 4, in order to realize carrying out stable control to the system, there is control module 17 at the inside fixed mounting of tester body 1, in order to make the voltage can supply power to control module in accommodation, at control module electric connection voltage regulation module, the voltage regulation module is including rectifier circuit, voltage reduction circuit, filter circuit and voltage stabilizing circuit, rectifier circuit has four group's resistance to constitute bridge circuit, voltage regulation module electric connection city electric wire netting, in order to realize the operation of system, at control module electric connection display screen 3, pilot lamp 4, hot plate 19, cooling fan 16 and temperature measurement module.
The temperature sensor adopts a Pt100 temperature sensor which is a positive temperature coefficient thermistor sensor, the measurement range is-200 ℃ to +850 ℃, the allowable deviation value is △ ℃, the minimum insertion depth is more than or equal to 200mm of the minimum insertion depth of the thermal resistor, the allowable current is less than or equal to 5mA, the Pt100 temperature sensor also has the advantages of good vibration resistance, good stability, high accuracy, high voltage resistance and the like, the linearity of the Pt thermal resistor is better, and the maximum nonlinear deviation is less than 0.5 ℃ when the temperature is changed between 0 ℃ and 100 ℃.
The working principle is as follows: put the flash memory card on test seat 10 earlier, then will cover clamp plate 12 and cover on test seat 10 through connecting axle bed 11, make the contact that the flash memory card on test seat 10 can be stable when the test, prevent that the test from causing contact failure, then begin to test, and in the test, can realize the temperature to tester body 1 inside through cooling fan 16, make the flash memory card can realize the detection under low temperature or the normal atmospheric temperature when the test, then at start-up hot plate 19, the realization heats test seat 10, make the detection under the high temperature of flash memory card realization in test seat 10.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (6)

1. The utility model provides a high low temperature flash memory test system, includes tester body (1), its characterized in that: the tester comprises a tester body (1), wherein a display screen (3), an indicator lamp (4), a reset key (5), a power switch (6), an Ethernet interface (7), a USB interface (8) and a test interface (9) are fixedly arranged on the front side of the tester body (1), a test seat (10) is fixedly arranged on the upper portion of the tester body (1), a connecting shaft seat (11) is fixedly arranged at one end of the test seat (10), a covering plate (12) is connected in the connecting shaft seat (11) through a shaft rod, a clamping seat (14) is fixedly connected at the other end of the test seat (10), a heat dissipation fan (16) is fixedly arranged at the rear end inside the tester body (1), a mounting seat (18) is fixedly arranged on the upper portion of the tester body (1), a heating plate (19) is fixedly arranged inside the mounting seat (18), and a control module (17) is fixedly arranged inside the tester body (1), the control module electric connection pressure regulating module, pressure regulating module electric connection municipal power grids, control module electric connection display screen (3), pilot lamp (4), hot plate (19), cooling fan (16) and temperature measurement module.
2. The system of claim 1, wherein: the tester is characterized in that at least four groups of supporting legs (2) are arranged at the bottom of the tester body (1), and the four groups of supporting legs (2) are respectively fixed at four corners of the bottom of the tester body (1).
3. The system of claim 1, wherein: the voltage regulating module comprises a rectifying circuit, a voltage reducing circuit, a filter circuit and a voltage stabilizing circuit, wherein the rectifying circuit is provided with four groups of resistors to form a bridge circuit.
4. The system of claim 1, wherein: the clamping seat (14) is provided with two groups of clamping grooves, the top end of the covering plate (12) is provided with two groups of clamping blocks, and the two groups of clamping blocks are respectively clamped and connected in the clamping grooves.
5. The system of claim 1, wherein: the tester comprises a tester body (1), and is characterized in that a heat dissipation window (15) is fixedly arranged at the rear end of the tester body (1), and a heat dissipation fan (16) is fixedly arranged on the inner side of the heat dissipation window (15).
6. The system of claim 1, wherein: and a handle (13) is fixedly arranged at one end of the top of the covering and pressing plate (12).
CN202020107790.4U 2020-01-18 2020-01-18 High-low temperature flash memory test system Active CN211016547U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202020107790.4U CN211016547U (en) 2020-01-18 2020-01-18 High-low temperature flash memory test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202020107790.4U CN211016547U (en) 2020-01-18 2020-01-18 High-low temperature flash memory test system

Publications (1)

Publication Number Publication Date
CN211016547U true CN211016547U (en) 2020-07-14

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Application Number Title Priority Date Filing Date
CN202020107790.4U Active CN211016547U (en) 2020-01-18 2020-01-18 High-low temperature flash memory test system

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Country Link
CN (1) CN211016547U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112180125A (en) * 2020-08-25 2021-01-05 南京远宁电气科技有限公司 High-voltage power equipment partial discharge live line detection ultrasonic intelligent identification comprehensive tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112180125A (en) * 2020-08-25 2021-01-05 南京远宁电气科技有限公司 High-voltage power equipment partial discharge live line detection ultrasonic intelligent identification comprehensive tester

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Address after: 430000 room 806-807, 8 / F, high tech building, 6-12 / F, scientific research building, No. 11, Jiayuan Road, Wuhan East Lake New Technology Development Zone, Wuhan, Hubei Province

Patentee after: Wuhan Zhifu Semiconductor Technology Co.,Ltd.

Address before: Room 306, building C, Huazhong Shuguang Software Park, 1 Guanshan 1st Road, Donghu New Technology Development Zone, Wuhan City, Hubei Province, 430000

Patentee before: WUHAN RECADATA STORAGE TECHNOLOGY CO.,LTD.