CN210743908U - Sample table for scanning electron microscope for observing loose massive samples - Google Patents
Sample table for scanning electron microscope for observing loose massive samples Download PDFInfo
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- CN210743908U CN210743908U CN201922118163.0U CN201922118163U CN210743908U CN 210743908 U CN210743908 U CN 210743908U CN 201922118163 U CN201922118163 U CN 201922118163U CN 210743908 U CN210743908 U CN 210743908U
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- sample
- copper mesh
- electron microscope
- scanning electron
- positioning bolt
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Abstract
The utility model belongs to the technical field of sample platform for the scanning electron microscope, specifically be a sample platform for the scanning electron microscope of observing loose cubic sample, including round platform, copper mesh enclosure, positioning bolt and magnetism ring. The round platform includes main station, sample hole, copper mesh cover mounting groove and positioning bolt hole, and the copper mesh cover includes annulus, copper mesh and magnetism cylinder, and the copper mesh cover inserts in the mounting groove, relies on the magnetism cylinder of inlaying at annulus tip and inlays the suction between the magnetism ring of mounting groove bottom, links together copper mesh cover and round platform, and positioning bolt can adjust the height of sample. The utility model discloses guaranteed the stability of placing of loose cubic sample and effectively protected the sample, the tiny particle that breaks away from the block can not pollute scanning electron microscope, and the sample appearance that utilizes the net space of copper mesh to observe is true clear, need not use conductive adhesive tape, has practiced thrift the scientific research cost, has enlarged the application range of sample platform, is the innovation in the aspect of the sample platform for the scanning electron microscope.
Description
Technical Field
The utility model belongs to the technical field of the sample platform for the scanning electron microscope, especially a sample platform for the scanning electron microscope of observing loose cubic sample.
Background
The scanning electron microscope (scanning electron microscope) is an important instrument in modern material analysis, has the characteristics of wide adjustable range of magnification, high imaging resolution, large depth of field and the like, is widely applied to the fields of metallurgy, materials science, biology, medicine and the like, and promotes the rapid development of various related subjects. An important feature of a scanning electron microscope is that the depth of field is large, and the depth of focus of a scanning electron microscope is tens of times greater than that of a transmission electron microscope and hundreds of times greater than that of an optical microscope. Because the depth of field of the image is large, the obtained scanning electronic image has stereoscopic impression and three-dimensional form, can provide more information than other microscopes, and has great use value. The appearance of a sample displayed by a scanning electron microscope plays an irreplaceable role in teaching, scientific research and production of other electron microscopes.
The sample stage is one of the key parts of the scanning electron microscope, and is used for bearing a sample and characterizing the characteristics of the sample through electronic system imaging. Due to the structural characteristics of the scanning electron microscope, a sample to be observed needs to be stably arranged on the sample table, and the observed surface needs to be perpendicular to the incident direction of the electron beam.
When observing loose, lumpy samples during research and production, the following problems are commonly encountered by technicians:
the method has the following defects that ① when the sample is wrapped by the wide conductive adhesive tape, the blocky sample is easy to break and damage the sample and cannot be observed and tested, ② wrapped sample is easy to fall off when placed on the sample table and pollutes an observation bin of a scanning electron microscope, frequent maintenance is needed, the working efficiency is low, when the surface of the sample is observed by ③, particles on the upper surface of the loose blocky sample can be separated from the whole sample due to the fact that the sample table needs to be moved continuously, the separated particles can splash and fly out in the moving process of the sample table, the objective lens and the observation bin of the scanning electron microscope are polluted, the observation and testing work is affected, ④ more conductive adhesive tapes are needed, and the scientific research cost is high.
The patent of application No. 201220633393.6 discloses a scanning electron microscope sample stage for testing samples with different thicknesses on the same plane, which can adjust the height of the sample to enable the upper surface of the sample to be in the same horizontal plane, but has the problems that the ① sample placing hole is small in size, only a sheet sample or a compact block sample can be installed, and a loose block sample cannot be installed, ② has no any protection measure on the upper surface of the sample, and small particles scattered in the moving process of the sample stage can pollute the objective lens and the observation bin of the scanning electron microscope.
How to solve the above problems is a matter of urgency for those skilled in the art to work.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing an observe sample platform for scanning electron microscope of loose massive sample, solve following technical problem ① how place loose massive sample on the sample platform steadily, make it can not drop in the in-process of observing, ② when guaranteeing to observe smoothly, in the sample platform removal in-process, the small particle that breaks away from loose massive sample can not pollute scanning electron microscope's objective and observation storehouse because of dropping, ③ how makes the not sample upper surface of equidimension be in same horizontal plane, enlarges sample platform's application range.
The utility model adopts the following technical scheme: the utility model provides an observe sample platform for scanning electron microscope of loose cubic sample, includes round platform, copper mesh cover, positioning bolt and magnetism ring, the round platform be cylindrical, including main platform, sample hole, copper mesh cover mounting groove and positioning bolt hole, the sample hole be located the first half of main platform, positioning bolt hole be located the lower half of main platform, sample hole upper end circumference outer along being equipped with copper mesh cover mounting groove, copper mesh cover mounting groove bottom mosaic have the magnetism ring.
The copper mesh cover comprises an annular sleeve, a copper mesh and magnetic cylinders, one end of the annular sleeve is connected with the copper mesh, the magnetic cylinders are embedded at the other end of the annular sleeve, and each annular sleeve is provided with two magnetic cylinders.
The position adjusting bolt is arranged in the position adjusting bolt hole of the circular truncated cone.
The copper mesh cover is inserted into the copper mesh cover mounting groove, and the copper mesh cover and the circular truncated cone are connected together by means of the attraction of the magnetic cylinder and the magnetic ring.
The positioning bolt consists of a rod body and a circular cap, wherein the rod body is a full thread, and the end head of the rod body is provided with a straight groove.
The utility model discloses following beneficial technological effect has:
1) the loose massive sample is arranged in the sample hole, so that the placing stability of the loose massive sample is ensured, the loose massive sample cannot fall off in the observation process, and the sample with larger volume can be placed.
2) The upper surface of a loose massive sample can be effectively protected by using the copper mesh enclosure, small particles separated from the block in the moving process of the sample table cannot splash and fly out to enter an observation bin of a scanning electron microscope, and the observation bin and an objective lens of the scanning electron microscope cannot be polluted; the sample shape observed by utilizing the grid gaps of the copper mesh is real and clear, and the purpose of observation and test can be completely realized.
3) And a conductive adhesive tape is not needed, so that scientific research cost is saved.
4) The horizontal screwdriver is used for rotating the positioning bolt, so that the positioning bolt moves up and down, the surface height of the sample can be adjusted, the upper surface of the sample is close to the copper mesh, observation is facilitated, the application range of the sample platform is expanded, and the difficulty of scientific research is reduced.
Drawings
FIG. 1 is a main sectional view of a sample stage for a scanning electron microscope for observing a bulk sample according to the present invention;
FIG. 2 is an enlarged view of a portion A of FIG. 1;
FIG. 3 is a top view of a sample stage for a scanning electron microscope for observing a bulk sample according to the present invention;
FIG. 4 is a main sectional view of a sample stage for a scanning electron microscope for observing a bulk sample according to the present invention;
FIG. 5 is a partial enlarged view of FIG. 4 at B;
fig. 6 is a circular truncated cone top view of a sample stage for a scanning electron microscope for observing a loose block-shaped sample according to the present invention;
FIG. 7 is a main sectional view of a copper mesh cover of a sample stage for a scanning electron microscope for observing a bulk sample according to the present invention;
FIG. 8 is an enlarged view of a portion of FIG. 7 at C;
FIG. 9 is a top view of a copper mesh cover of a sample stage for a scanning electron microscope for observing a bulk sample according to the present invention;
fig. 10 is a bottom view of the copper mesh cover of the sample stage for a scanning electron microscope for observing a loose block-shaped sample according to the present invention.
Description of reference numerals: 1. the device comprises a round table, 1-1 parts of a main table, 1-2 parts of sample holes, 1-3 parts of copper mesh cover mounting grooves, 1-4 parts of positioning bolt holes, 2 parts of copper mesh covers, 2-1 parts of annular sleeves, 2-2 parts of copper meshes, 2-3 parts of magnetic cylinders, 3 parts of positioning bolts, 4 parts of magnetic rings, 5 parts of loose block samples.
Detailed Description
The technical solution of the present invention is described in further detail below with reference to the accompanying drawings, but the scope of the present invention is not limited to the following description.
As shown in fig. 1 to 10, a sample stage for a scanning electron microscope for observing a loose massive sample comprises a circular truncated cone 1, a copper mesh enclosure 2, a positioning bolt 3 and a magnetic ring 4, wherein the circular truncated cone 1 is cylindrical and comprises a main stage 1-1, a sample hole 1-2, a copper mesh enclosure installation groove 1-3 and a positioning bolt hole 1-4, the sample hole 1-2 is located at the upper half part of the main stage 1-1, the positioning bolt hole 1-4 is located at the lower half part of the main stage 1-1, the copper mesh enclosure installation groove 1-3 is arranged on the outer edge of the upper end circumference of the sample hole 1-2, and the magnetic ring 4 is embedded at the bottom of the copper mesh enclosure installation groove 1-3.
The copper mesh cover 2 comprises an annular sleeve 2-1, a copper mesh 2-2 and magnetic cylinders 2-3, one end of the annular sleeve 2-1 is connected with the copper mesh 2-2 in a brazing mode, the magnetic cylinders 2-3 are embedded in the other end of the annular sleeve 2-1, and each annular sleeve 2-1 is provided with two magnetic cylinders 2-3.
The copper net cover 2 is inserted into the copper net cover mounting grooves 1-3, and the copper net cover 2 and the circular table 1 are connected together by means of the attraction force of the magnetic cylinders 2-3 and the magnetic ring 4.
The positioning bolt 3 is arranged in the positioning bolt holes 1-4 of the circular truncated cone 1.
The positioning bolt 3 consists of a rod body and a circular cap, the rod body is full-thread, a straight-line groove is formed in the end of the rod body, the positioning bolt 3 can move up and down by rotating the positioning bolt with a straight-line screwdriver, and finally the purpose of adjusting the height of a sample is achieved.
The round table 1, the annular sleeve 2-1, the copper mesh 2-2 and the positioning bolt 3 are all made of brass, so that the mechanical property is guaranteed, and the heat conduction and the electric conductivity are good.
After the test is finished, the copper mesh cover 2 can be quickly and conveniently taken out from the copper mesh cover mounting grooves 1-3 of the circular truncated cone 1 by clamping the copper mesh 2-2 with the forceps.
The above embodiments are preferred embodiments of the present invention, but the embodiments of the present invention are not limited to the above embodiments, and any other changes, modifications, substitutions, combinations, and simplifications which do not depart from the spirit and principle of the present invention are all included in the scope of the present invention.
Claims (2)
1. The utility model provides an observe sample platform for scanning electron microscope of loose massive sample, includes round platform (1), copper mesh cover (2), positioning bolt (3) and magnetism ring (4), its characterized in that:
the round table (1) is cylindrical and comprises a main table (1-1), sample holes (1-2), copper mesh cover installation grooves (1-3) and positioning bolt holes (1-4), wherein the sample holes (1-2) are located in the upper half part of the main table (1-1), the positioning bolt holes (1-4) are located in the lower half part of the main table (1-1), the copper mesh cover installation grooves (1-3) are formed in the outer edge of the circumference of the upper end of the sample holes (1-2), and magnetic rings (4) are embedded in the bottoms of the copper mesh cover installation grooves (1-3);
the copper net cover (2) comprises annular sleeves (2-1), copper nets (2-2) and magnetic cylinders (2-3), one end of each annular sleeve (2-1) is connected with the copper net (2-2), the magnetic cylinders (2-3) are embedded in the other end of each annular sleeve (2-1), and each annular sleeve (2-1) is provided with two magnetic cylinders (2-3);
the positioning bolt (3) is arranged in a positioning bolt hole (1-4) of the circular truncated cone (1);
the copper net cover (2) is inserted into the copper net cover mounting grooves (1-3), and the copper net cover (2) is connected with the circular truncated cone (1) by means of the attraction of the magnetic cylinders (2-3) and the magnetic ring (4).
2. The sample stage for a scanning electron microscope for observing a loose bulk sample according to claim 1, characterized in that: the positioning bolt (3) is composed of a rod body and a circular cap, wherein the rod body is a full thread, and the end head of the rod body is provided with a straight groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922118163.0U CN210743908U (en) | 2019-12-02 | 2019-12-02 | Sample table for scanning electron microscope for observing loose massive samples |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922118163.0U CN210743908U (en) | 2019-12-02 | 2019-12-02 | Sample table for scanning electron microscope for observing loose massive samples |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210743908U true CN210743908U (en) | 2020-06-12 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201922118163.0U Expired - Fee Related CN210743908U (en) | 2019-12-02 | 2019-12-02 | Sample table for scanning electron microscope for observing loose massive samples |
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| CN (1) | CN210743908U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113192816A (en) * | 2021-04-26 | 2021-07-30 | 中国科学院物理研究所 | Electron microscope carrier net, preparation method thereof and microscope product |
-
2019
- 2019-12-02 CN CN201922118163.0U patent/CN210743908U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113192816A (en) * | 2021-04-26 | 2021-07-30 | 中国科学院物理研究所 | Electron microscope carrier net, preparation method thereof and microscope product |
| CN113192816B (en) * | 2021-04-26 | 2023-11-17 | 中国科学院物理研究所 | Electron microscope carrier net, preparation method thereof and microscope product |
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| Date | Code | Title | Description |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200612 Termination date: 20201202 |
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| CF01 | Termination of patent right due to non-payment of annual fee |