CN210719419U - Surface emissivity measuring device - Google Patents

Surface emissivity measuring device Download PDF

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Publication number
CN210719419U
CN210719419U CN201921823028.XU CN201921823028U CN210719419U CN 210719419 U CN210719419 U CN 210719419U CN 201921823028 U CN201921823028 U CN 201921823028U CN 210719419 U CN210719419 U CN 210719419U
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heating
infrared camera
temperature
heating chamber
vacuum chamber
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CN201921823028.XU
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许铁军
姚达毛
韩乐
田焜
张斌
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Hefei Institutes of Physical Science of CAS
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Hefei Institutes of Physical Science of CAS
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Abstract

The utility model discloses a surface emissivity measuring device, which comprises a vacuum chamber (1), a vacuum extractor (2), a heating chamber (3), an infrared camera (4) and a sapphire observation window (5); evacuating device (2) and vacuum chamber (1) intercommunication, inside vacuum chamber (1) is placed in heating chamber (3), outside vacuum chamber (1) is placed in infrared camera (4), sapphire observation window (5) are seted up on the stove outer shell casing of vacuum chamber (1), infrared camera (4) aim at sapphire observation window (5) and observe inside heating chamber (3). Because the utility model adopts the radiation heating test sample piece, the temperature of the heating zone is uniform, the temperature gradient generated in the material is reduced, and the accurate temperature acquisition of the thermocouple is ensured; the heating chamber adopts totally closed structure, only remains infrared camera observation passageway, and infrared camera measuring face is located the heat exchanger that separates inside and invisible with the heating chamber, avoids background radiation to infrared camera temperature measurement interference.

Description

Surface emissivity measuring device
Technical Field
The utility model belongs to the technical field of the energy measurement, concretely relates to surface emissivity measuring device.
Background
With the continuous increase of heating power of EAST superconducting Tokamak plasma, the energy injected into the plasma is greatly increased, and the energy is finally deposited on the first wall facing the plasma and is taken out of the device through the water cooling system of the first wall. The surface of the first wall material is subjected to a high heat flux density, so that the surface temperature of the first wall is high even in the presence of water cooling, in particular in the divertor region, the heat flux density of the surface of which can exceed 10MW/m2Under the condition, the surface temperature of the material can reach over 1200 ℃. The method has important significance for timely and accurately measuring the surface temperature of the material to judge the sputtering rate of the material and evaluate the heat removal capability and the material performance of the first wall. Measuring the surface temperature of the first wall material by means of an infrared camera is an effective method, which can measure the material surface temperature distribution without the disadvantages of time delay and damage to the workpiece as compared to thermocouple measurements. The surface emissivity of the material is one of important parameters influencing the temperature measurement result of the infrared camera. The divertor area of the EAST device is made of a tungsten material, and due to the fact that the surface emissivity of the tungsten metal material in the infrared band is low, the surface emissivity of the metal is greatly changed along with temperature change, and the specific form of the tungsten surface of the EAST device is added, in order to obtain a first accurate wall temperature through a thermal infrared imager, the surface emissivity of the specific tungsten material at different temperatures needs to be calibrated.
By adjusting the surface emissivity of the infrared camera, the temperature of the temperature measured by the infrared camera is compared with the temperature of the actual surface of the object, and when the temperature of the infrared camera is consistent with the temperature of the actual surface of the object, the set surface emissivity is considered as the surface emissivity of the object material at the temperature. Therefore, the key to accurately calibrating the surface emissivity is how to correctly measure the surface temperature of an object and ensure the accuracy of the temperature measurement result of the infrared camera. The current common way of measuring the temperature of an object is to use a thermocouple to measure, usually, the thermocouple is closely attached to the surface area of the object to be measured or the thermocouple is put into the object to be measured through punching and is as close to the surface as possible, and the temperature of the point is considered to be the temperature of the surface to be measured approximately. However, in the conventional heating method, the measuring object is heated by a heat conduction method, and the temperature measured by the thermocouple is only the temperature near the region to be measured because of the temperature gradient between the two. In addition, the conventional heating chamber is not closed enough, and the background radiation causes a larger deviation between the temperature measurement result of the infrared camera and the actual temperature measurement result, so that the accuracy of the test result is influenced.
SUMMERY OF THE UTILITY MODEL
In order to solve the problem, the utility model provides a surface emissivity measuring device, measuring device includes real empty room, evacuating device, heating chamber, infrared camera, sapphire observation window. The vacuum-pumping device is communicated with the vacuum chamber, the heating chamber is arranged in the vacuum chamber, the infrared camera is arranged outside the vacuum chamber, the sapphire observation window is arranged on the vacuum chamber, and the infrared camera observes the heating chamber through the sapphire observation window.
Furthermore, the furnace shell of the vacuum chamber is of a double-layer water-cooling sleeve structure, so that the wall temperature of the vacuum chamber is not more than 50 ℃.
Furthermore, the vacuum pumping device comprises a mechanical pump and a molecular pump, and ensures that the vacuum degree of the vacuum chamber is less than 10-3Pa。
Furthermore, the heating chamber comprises a heat insulation layer, a test sample piece, a temperature thermocouple, a support molybdenum plate, a ceramic plate, a heat insulation cover, a ceramic sleeve, a molybdenum heating body and a monitoring thermocouple. The test sample piece is placed above the ceramic plate, the measuring surface of the test sample piece is located inside the heating chamber channel, the heat insulation cover is fixed on the heating chamber channel and envelops the measuring surface, the temperature measuring thermocouple stretches into the test sample piece, the supporting molybdenum plate is fixed in the middle of the ceramic sleeves, the ceramic plate is fixed above the supporting molybdenum plate, and the monitoring thermocouple is tightly attached to the outer surface of the test sample piece.
Furthermore, the fixed end of the molybdenum heating element is inserted into the heat insulation layer and is uniformly arranged, the heating end extends out of the heat insulation layer and is positioned in the inner space of the heating chamber, and the ceramic sleeve is sleeved outside the heating end of the molybdenum heating element extending out of the heat insulation layer.
Furthermore, the heat insulation layer adopts a heat insulation structure of an all-metal screen (3 layers of high-temperature molybdenum screen and 3 layers of stainless steel screen), and adopts an anti-deformation treatment process to ensure the heat insulation effect of the heating chamber for long-term use.
Further, the size of the effective temperature equalizing zone in the heat insulation layer is larger than 150mm multiplied by 150 mm.
Furthermore, a blind hole is processed on the test sample piece and used for extending into the temperature thermocouple.
Compared with the prior art, the utility model has the advantages that:
(1) the sample piece is heated by radiation, so that the temperature of a heating area is uniform, the temperature gradient generated in the material is reduced, and the accurate temperature acquisition of a thermocouple is ensured;
(2) the heating chamber adopts totally closed structure, only remains infrared camera observation passageway, and infrared camera measuring face is located the heat exchanger that separates inside and invisible with the heating chamber, avoids background radiation to infrared camera temperature measurement interference.
Drawings
FIG. 1 is a structural diagram of the measuring device of the present invention;
fig. 2 is a detailed structural view of the heating chamber.
In the figure: the device comprises a vacuum chamber 1, a vacuumizing device 2, a heating chamber 3, an infrared camera 4, a sapphire observation window 5, a heat insulation layer 6, a test sample piece 7, a temperature thermocouple 8, a support molybdenum plate 9, a ceramic plate 10, a heat insulation cover 11, a ceramic sleeve 12, a molybdenum heating body 13 and a monitoring thermocouple 14.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. On the contrary, the invention is intended to cover alternatives, modifications, equivalents and alternatives which may be included within the spirit and scope of the invention as defined by the appended claims. Furthermore, in order to provide a better understanding of the present invention to the public, certain specific details are set forth in the following detailed description of the invention. It will be apparent to those skilled in the art that the present invention may be practiced without these specific details.
The present invention will be further described with reference to the accompanying drawings and specific examples, which are not intended to limit the present invention. The following are the best embodiments of the present invention:
as shown in fig. 1, the utility model provides a surface emissivity measuring device, measuring device includes real empty room 1, evacuating device 2, heating chamber 3, infrared camera 4, sapphire observation window 5. The vacuumizing device 2 is communicated with the vacuum chamber 1, the heating chamber 3 is arranged inside the vacuum chamber 1, the infrared camera 4 is arranged outside the vacuum chamber 1, the sapphire observation window 5 is arranged on the vacuum chamber 1, and the infrared camera 4 observes the heating chamber 3 through the sapphire observation window 5.
The furnace shell of the vacuum chamber is of a double-layer water-cooling sleeve structure, and the wall temperature of the vacuum chamber is not more than 50 ℃.
The vacuum pumping device comprises a mechanical pump and a molecular pump, and ensures that the vacuum degree of the vacuum chamber is less than 10-3Pa。
Referring to fig. 2, the heating chamber 3 includes a heat insulation layer 6, a test sample piece 7, a temperature thermocouple 8, a support molybdenum plate 9, a ceramic plate 10, a heat insulation cover 11, a ceramic sleeve 12, a molybdenum heating element 13, and a monitoring thermocouple 14, the monitoring thermocouple is mainly used for preventing the temperature of the heating chamber from being too high, and the monitoring thermocouple is placed above the test sample piece, and is different from the temperature thermocouple 8, so that the overall temperature difference of the test sample piece can be measured. A blind hole is processed on the test sample piece 7 and used for extending into the temperature thermocouple 8, the test sample piece 7 is placed above the ceramic plate 10, the measuring surface of the test sample piece 7 is located inside the heating chamber channel, and the heat insulation cover 11 is fixed on the heating chamber channel and envelops the measuring surface, so that the heat of the molybdenum heating body is prevented from being directly incident to the measuring surface. The measuring surface is arranged on the left end face of the sample piece to be measured, the supporting molybdenum plate is fixed in the middle of the ceramic sleeve, and the ceramic plate is fixed above the supporting molybdenum plate. The fixed end of the molybdenum heating body 13 is inserted into the heat insulation layer 6 and is uniformly arranged, and the heating end extends out of the heat insulation layer 6 and is positioned in the inner space of the heating chamber 3 and used for heating the heating chamber 3 and the material sample 7; a ceramic sleeve 12 is sleeved outside the heating end of the molybdenum heating element 13 extending out of the heat insulation layer 6; the heat insulation layer 6 is of a structure surrounding the periphery by one layer, the heat insulation layers 6 are arranged in the directions of the 6 faces of the cube, and the monitoring thermocouples are tightly attached to the outer surface of the test sample piece. The number of the molybdenum heating bodies 13 is at least 4, and 8 molybdenum heating bodies are arranged appropriately to ensure the heating uniformity and have selectable number.
The heat insulation layer adopts a heat insulation structure of an all-metal screen (3 layers of high-temperature molybdenum screen and 3 layers of stainless steel screen), and adopts an anti-deformation treatment process to ensure the heat insulation effect of the heating chamber for long-time use.
The size of the effective temperature equalizing zone in the heat insulation layer is larger than 150mm multiplied by 150 mm.
The utility model discloses put black body furnace in the sample position that awaits measuring when using, after maring the infrared camera parameter, take out black body furnace, the heating chamber is put into to the test sample spare of emissivity that will await measuring, closes heating chamber side sliding door, leads to the cooling water in the real empty room stove outer covering, guarantees that real empty room wall temperature is no longer than 50 ℃, and real empty room reaches vacuum through mechanical pump thick taking out, molecular pump thin taking out and is less than 10 ℃ of vacuum-3Pa, set up heating heat preservation curve through control program, molybdenum heating element heat is evenly transmitted for the test sample spare through the radiation, the appointed temperature heat preservation according to gathering needs, appointed temperature is according to the data of temperature measurement thermocouple and control thermocouple measurement, infrared camera passes through the sapphire observation window and measures object surface temperature, it is gathered by infrared camera to measure the face temperature, through the setting of adjustment infrared camera surface emissivity, compare infrared camera temperature measurement and appointed temperature, when both temperatures are unanimous, the surface emissivity who considers the setting promptly is the surface emissivity of this object material under this appointed temperature, accomplish the measurement.
The above-mentioned embodiments are only one of the preferred embodiments of the present invention, and the general changes and substitutions performed by those skilled in the art within the technical scope of the present invention should be included in the protection scope of the present invention.

Claims (9)

1. A surface emissivity measuring device, comprising: the measuring device comprises a vacuum chamber (1), a vacuumizing device (2), a heating chamber (3), an infrared camera (4) and a sapphire observation window (5); evacuating device (2) and vacuum chamber (1) intercommunication, inside vacuum chamber (1) is placed in heating chamber (3), outside vacuum chamber (1) is placed in infrared camera (4), sapphire observation window (5) are seted up on the stove outer shell casing of vacuum chamber (1), infrared camera (4) aim at sapphire observation window (5) and observe inside heating chamber (3).
2. The measurement device of claim 1, wherein: the furnace shell of the vacuum chamber (1) is of a double-layer water-cooling sleeve structure.
3. A surface emissivity measurement device as claimed in claim 1, wherein: the vacuum-pumping device (2) is a mechanical pump and a molecular pump.
4. A surface emissivity measurement device as claimed in claim 1, wherein: the heating chamber (3) comprises a heat insulation layer (6), a test sample piece (7), a temperature thermocouple (8), a support molybdenum plate (9), a ceramic plate (10), a heat insulation cover (11), a ceramic sleeve (12), a molybdenum heating body (13) and a monitoring thermocouple (14);
the test sample piece (7) is placed above the ceramic plate (10), the measuring surface of the test sample piece (7) is positioned in the heating chamber channel, the heat insulation cover (11) is fixed in the heating chamber channel and envelops the measuring surface, the temperature thermocouple (8) extends into the test sample piece (7), and the supporting molybdenum plate (9) is fixed among the ceramic sleeves (12); the ceramic plate (10) is fixed above the supporting molybdenum plate (9), and the monitoring thermocouple (14) is tightly attached to the outer surface of the test sample piece (7).
5. A surface emissivity measurement device according to claim 4, wherein: the fixed end of the molybdenum heating body (13) is inserted into the heat-insulating layer (6) and is uniformly arranged, the heating end extends out of the heat-insulating layer (6) and is positioned in the inner space of the heating chamber (3), and the ceramic sleeve (12) is sleeved outside the heating end, which extends out of the heat-insulating layer (6), of the molybdenum heating body (13).
6. A surface emissivity measurement device according to claim 4, wherein: the size of the effective temperature equalizing zone in the heat insulation layer is larger than 150mm multiplied by 150 mm.
7. A surface emissivity measurement device according to claim 4, wherein: a blind hole is processed on the test sample piece (7) and used for extending into the temperature thermocouple (8).
8. A surface emissivity measuring device according to claim 4, wherein the number of molybdenum heaters (13) is at least 4.
9. A surface emissivity measurement device according to claim 4, wherein: the heat insulation layer adopts a heat insulation structure of an all-metal screen and comprises 3 layers of high-temperature molybdenum screens and 3 layers of stainless steel screens.
CN201921823028.XU 2019-10-28 2019-10-28 Surface emissivity measuring device Active CN210719419U (en)

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CN201921823028.XU CN210719419U (en) 2019-10-28 2019-10-28 Surface emissivity measuring device

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Application Number Priority Date Filing Date Title
CN201921823028.XU CN210719419U (en) 2019-10-28 2019-10-28 Surface emissivity measuring device

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114184281A (en) * 2021-12-17 2022-03-15 矿冶科技集团有限公司 Accurate temperature control method for unknown surface under gas medium
CN114441591A (en) * 2022-01-05 2022-05-06 电子科技大学 Device and method for testing thermal radiation cooling rate of high-temperature object

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114184281A (en) * 2021-12-17 2022-03-15 矿冶科技集团有限公司 Accurate temperature control method for unknown surface under gas medium
CN114441591A (en) * 2022-01-05 2022-05-06 电子科技大学 Device and method for testing thermal radiation cooling rate of high-temperature object

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