CN114441591A - Device and method for testing thermal radiation cooling rate of high-temperature object - Google Patents
Device and method for testing thermal radiation cooling rate of high-temperature object Download PDFInfo
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- CN114441591A CN114441591A CN202210004693.6A CN202210004693A CN114441591A CN 114441591 A CN114441591 A CN 114441591A CN 202210004693 A CN202210004693 A CN 202210004693A CN 114441591 A CN114441591 A CN 114441591A
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- 230000005855 radiation Effects 0.000 title claims abstract description 78
- 238000012360 testing method Methods 0.000 title claims abstract description 65
- 238000001816 cooling Methods 0.000 title claims abstract description 48
- 238000000034 method Methods 0.000 title claims abstract description 16
- 239000000463 material Substances 0.000 claims abstract description 29
- 238000007789 sealing Methods 0.000 claims abstract description 23
- 238000009413 insulation Methods 0.000 claims abstract description 18
- 239000011521 glass Substances 0.000 claims description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 6
- 239000000377 silicon dioxide Substances 0.000 claims description 4
- 239000011494 foam glass Substances 0.000 claims description 3
- 238000010438 heat treatment Methods 0.000 claims description 3
- 239000011810 insulating material Substances 0.000 claims description 3
- 239000004964 aerogel Substances 0.000 claims description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 2
- 229910001632 barium fluoride Inorganic materials 0.000 claims description 2
- 229910001634 calcium fluoride Inorganic materials 0.000 claims description 2
- 229910052681 coesite Inorganic materials 0.000 claims description 2
- 229910052906 cristobalite Inorganic materials 0.000 claims description 2
- KZHJGOXRZJKJNY-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Si]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O.O=[Al]O[Al]=O KZHJGOXRZJKJNY-UHFFFAOYSA-N 0.000 claims description 2
- 238000002844 melting Methods 0.000 claims description 2
- 230000008018 melting Effects 0.000 claims description 2
- 229910052863 mullite Inorganic materials 0.000 claims description 2
- 229910052682 stishovite Inorganic materials 0.000 claims description 2
- 238000002834 transmittance Methods 0.000 claims description 2
- 229910052905 tridymite Inorganic materials 0.000 claims description 2
- 238000001073 sample cooling Methods 0.000 abstract description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 239000004793 Polystyrene Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229920002223 polystyrene Polymers 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 206010061218 Inflammation Diseases 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004134 energy conservation Methods 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 230000004054 inflammatory process Effects 0.000 description 1
- 230000002401 inhibitory effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
- G01J5/046—Materials; Selection of thermal materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
- G01J5/041—Mountings in enclosures or in a particular environment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J2005/065—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by shielding
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
A device and a method for testing the thermal radiation cooling rate of a high-temperature object belong to the technical field of infrared thermal radiation testing. The testing device comprises a low infrared emissivity shell; the center of the sealing cover plate is provided with a through hole for installing a thermal radiation wave-transparent window material; filling a heat insulation lining in the low infrared emissivity shell to form a first cavity; filling a high-temperature-resistant heat-insulating lining in the first cavity to form a second cavity; and a testing hole is formed in one side of the low infrared emissivity shell, and the temperature measuring thermocouple passes through the heat insulation lining and the high temperature resistant heat insulation lining through the testing hole and then detects the temperature of the surface of the sample to be detected in real time. The testing device is provided with the thermal radiation wave-transparent window above the sample to be tested, so that the thermal radiation generated by the high-temperature sample can be radiated outwards through the window material at high efficiency, the thermal radiation of the high-temperature sample can be conveniently radiated, and the influence of the radiated radiation heat accumulated in the testing environment on the testing accuracy of the sample cooling rate can be effectively prevented.
Description
Technical Field
The invention belongs to the technical field of infrared thermal radiation testing, and particularly relates to a thermal radiation testing device and method for testing the thermal radiation cooling rate of a high-temperature object (200 ℃).
Background
The infrared radiation is the intrinsic energy radiation property of all objects higher than the absolute zero degree, heat can be effectively transferred between the objects with temperature difference through the thermal radiation, the temperature of the objects is reduced due to the heat output generated by the objects with relatively high temperature, namely, the thermal radiation is used for cooling, and the cooling rate is closely related to the infrared emissivity of the surface of the object and the temperature of the object. The heat radiation cooling is widely applied in civil production and life, for example, in summer with burning sun inflammation, objects such as clothes, doors, windows, walls, vehicles and the like covered or coated with high-emissivity materials in the atmospheric environment can efficiently radiate heat to the outer space through a wave band of 3-5 mu m or 8-14 mu m of an atmospheric infrared radiation window, and no extra energy is consumed while the heat radiation cooling is carried out independently. Therefore, the application of the large-scale heat radiation cooling technology can effectively reduce energy consumption and pollution emission in the production and life processes, and has great significance for the current human energy conservation and emission reduction requirements. On the other hand, thermal radiation cooling technology and materials are very critical to inhibit the infrared target characteristics of weaponry. For example, compared with the traditional low-emissivity material, the high-temperature object adopting the infrared selective emissivity material has low emissivity in an infrared detection band (3-5 μm/8-14 μm), and can continuously radiate heat outwards through the 5-8 μm band to achieve the effect of reducing the temperature of the high-temperature object. Therefore, the infrared camouflage performance of the equipment is ensured, the temperature of the equipment can be effectively reduced, the infrared radiation characteristic of the equipment is further inhibited, and a safe working environment is provided for the electronic equipment in the equipment at a relatively low temperature.
The accurate measurement of the thermal radiation cooling performance of the material requires opening a thermal radiation window and inhibiting the heat transmission of the measured object through heat conduction and heat convection. However, on the one hand, no device for testing the heat radiation cooling performance of high-temperature objects (more than 200 ℃) is disclosed; on the other hand, in the current thermal radiation cooling test device, the window of the sample cavity is usually sealed by adopting a transparent material so as to prevent the influence of heat conduction on the thermal radiation cooling test, and the infrared wave-transmitting performance of the window material directly determines the thermal radiation cooling effect of the sample to be tested, which is not mentioned in the current thermal radiation cooling test.
Disclosure of Invention
The invention aims to provide a device and a method for testing the radiation cooling rate of a high-temperature object (200 ℃) aiming at the defects in the background art, so as to solve the problem that the radiation cooling rate of the high-temperature object is not accurately measured due to improper selection of materials of a heat radiation window.
In order to achieve the purpose, the technical scheme adopted by the invention is as follows:
the utility model provides a high temperature object thermal radiation cooling rate testing arrangement which characterized in that includes:
the low infrared emissivity casing 1 is a rectangular cavity;
the center of the sealing cover plate 7 is provided with a through hole for installing a thermal radiation wave-transparent window material; the sealing cover plate is placed on the low infrared emissivity shell to form a sealed space;
filling a heat-insulating lining 6 in the low-infrared-emissivity shell to form a first cavity;
filling a high-temperature-resistant heat-insulating lining 4 in the first cavity to form a second cavity, wherein the second cavity is used for placing a sample to be detected; the sample to be tested is positioned right below the thermal radiation wave-transparent window material;
a test hole is formed in one side of the low infrared emissivity shell, and a temperature thermocouple penetrates through the heat insulation lining and the high temperature resistant heat insulation lining through the test hole to detect the temperature of the surface of a sample to be detected in real time, so that the test of the heat radiation cooling rate of a high-temperature object can be realized.
Further, the low infrared emissivity casing 1 is made of a material with an emissivity less than 0.1, specifically, aluminum, copper, stainless steel, and the like.
Furthermore, the through hole formed in the center of the sealing cover plate 7 is square, circular or the like.
Furthermore, the thermal radiation wave-transparent window material has a melting point higher than 600 ℃ and is prepared atMaterials with infrared transmittance of more than 90% and reflectivity of less than 10% in the wavelength band of 3-15 μm, specifically KBr glass and BaF2Glass, CaF2Glass, etc. the window material is embedded in the through hole of the sealing cover plate and forms a whole with the sealing cover plate.
Further, the heat insulating liner 6 is a heat insulating material, specifically, a material such as polystyrene.
Furthermore, the first cavity is in the shape of a cuboid, a cylinder and the like, and the size of the first cavity is smaller than that of the shell with low infrared emissivity.
Further, the high-temperature-resistant heat-insulating lining 4 is a heat-insulating material capable of resisting temperature higher than 800 ℃, and specifically is SiO2Aerogel, mullite, alumina, foam glass and the like.
Furthermore, the second cavity is in the shape of a cuboid, a cylinder and the like, and the size of the second cavity is smaller than that of the first cavity.
Furthermore, the distance between the surface of the sample to be detected and the thermal radiation wave-transparent window material is 5-10 mm.
A method for testing the heat radiation cooling rate of a high-temperature object is characterized by comprising the following steps:
step 1, heating a sample to be tested to a preset temperature, opening a sealing cover plate above a testing device, placing the heated sample to be tested in a second cavity, and covering the sealing cover plate to ensure that the device is in a closed state in the testing process;
and 3, recording the surface temperature of the sample to be detected in real time until the temperature is reduced to the room temperature, and stopping recording to obtain a thermal radiation cooling curve of the high-temperature object.
Compared with the prior art, the invention has the beneficial effects that:
1. the invention provides a device for testing the thermal radiation cooling rate of a high-temperature object, which comprises a shell with low infrared emissivity, a sealing cover plate, a heat insulation lining and a high-temperature-resistant heat insulation lining.
2. According to the device for testing the thermal radiation cooling rate of the high-temperature object, the thermal radiation wave-transparent window is arranged above the sample to be tested, so that thermal radiation generated by the high-temperature sample can be radiated outwards through the window material at high efficiency, the thermal radiation of the high-temperature sample can be conveniently emitted, and the influence of the emitted radiation heat accumulated in a testing environment on the testing accuracy of the sample cooling rate can be effectively prevented.
3. According to the device for testing the thermal radiation cooling rate of the high-temperature object, the sealing cover plate is placed on the shell to form a closed testing space, so that the sample cooling process is not influenced by air convection; by adopting the heat-insulating lining and the high-temperature-resistant heat-insulating lining, the heat loss caused by heat conduction of the sample to be tested is effectively inhibited, and the accuracy of the test of the heat radiation cooling rate of the sample to be tested is improved.
Drawings
FIG. 1 is a schematic structural diagram of a device for testing a thermal radiation cooling rate of a high-temperature object according to the present invention;
FIG. 2 is a top view of a thermal radiation cooling rate testing apparatus for a high-temperature object according to the present invention;
FIG. 3 is a side view of a thermal radiation cooling rate testing device for a high-temperature object according to the present invention;
FIG. 4 shows the cooling rate test results of the embodiment;
in the figure: 1. a low infrared emissivity housing; 2. a temperature thermocouple; 3. a thermal radiation wave-transparent window material; 4. a high temperature resistant, thermally insulating liner; 5. a second cavity; 6. a thermally insulating liner; 7. and sealing the cover plate.
Detailed Description
The technical scheme of the invention is detailed below by combining the accompanying drawings and the embodiment.
Examples
The embodiment provides a high temperature object thermal radiation cooling rate testing arrangement, as shown in fig. 1-3, includes:
the low infrared emissivity casing 1 is made of an aluminum plate with the thickness of 0.4mm, and forms a rectangular cavity with the length of 98mm, the width of 98mm and the height of 48 mm;
the device comprises a sealing cover plate 7, wherein a square through hole is formed in the center of the sealing cover plate 7, the length of the through hole is 2mm, the width of the through hole is 2mm, and the thickness of the through hole is 0.4mm, the sealing cover plate is used for installing heat radiation wave-transparent window material KBr glass, the window material is embedded in the through hole formed in the sealing cover plate and forms a whole with the sealing cover plate, and a sample to be tested penetrates through the window to radiate heat outwards during a heat radiation cooling test; the sealing cover plate is placed on the low infrared emissivity shell to form a sealed space;
a heat-insulating lining 6 of polystyrene is filled in the low-infrared-emissivity shell to form a first cavity with the width of 90mm and the height of 40 mm;
filling foam glass serving as a high-temperature-resistant heat-insulating lining 4 into the first cavity to form a second cavity with the length of 50mm, the width of 50mm and the height of 10mm, wherein the second cavity is used for placing a sample to be detected; the top of the high-temperature resistant heat-insulating lining 4 is tightly attached to the low-infrared-emissivity shell, and the distance between the surface of the sample to be measured and the thermal radiation wave-transparent window material is 10 mm; the sample to be tested is positioned right below the thermal radiation wave-transparent window material;
a test hole with the diameter of 0.2mm is formed in one side of the low infrared emissivity shell, and a temperature thermocouple with the length of 500mm penetrates through the heat insulation lining and the high temperature resistant heat insulation lining through the test hole, then reaches the second cavity 5 and is in good contact with the upper surface of a sample to be tested, the temperature of the surface of the sample to be tested is detected in real time, and the test of the heat radiation cooling rate of a high-temperature object can be realized.
A method for testing the thermal radiation cooling rate of a high-temperature object by using the device specifically comprises the following steps:
step 1, heating a sample to be tested to a preset temperature, opening a sealing cover plate above a testing device, placing the heated sample to be tested in a second cavity, and covering the sealing cover plate to ensure that the device is in a closed state in the testing process;
and 3, recording the surface temperature of the sample to be detected in real time until the temperature is reduced to the room temperature, and stopping recording to obtain a thermal radiation cooling curve of the high-temperature object.
The device and the method of the embodiment are adopted to test the thermal radiation cooling rate of the silicon dioxide sheet and the aluminum sheet in the same environment, the initial temperature of two samples to be tested (the silicon dioxide sheet and the aluminum sheet) is set to be 300 ℃, and the curve of the thermal radiation cooling rate obtained by the test is shown in figure 4. As can be seen from FIG. 4, the method can be used for rapidly testing the heat radiation cooling rate of the high-temperature object, the testing process is convenient, and the testing cost is low.
The above description is only exemplary of the present invention, and should not be taken as limiting the scope of the invention, which is defined by the appended claims.
Claims (8)
1. The utility model provides a high temperature object thermal radiation cooling rate testing arrangement which characterized in that includes:
the low-infrared-emissivity shell (1) is a rectangular cavity;
the center of the sealing cover plate is provided with a through hole for installing a thermal radiation wave-transparent window material; the sealing cover plate is placed on the low infrared emissivity shell to form a sealed space;
filling a heat insulation lining (6) in the low infrared emissivity shell to form a first cavity;
filling a high-temperature-resistant heat-insulating lining (4) in the first cavity to form a second cavity, wherein the second cavity is used for placing a sample to be detected; the sample to be tested is positioned right below the thermal radiation wave-transparent window material;
a test hole is formed in one side of the low infrared emissivity shell, and a temperature thermocouple penetrates through the heat insulation lining and the high temperature resistant heat insulation lining through the test hole to detect the temperature of the surface of a sample to be detected in real time, so that the test of the heat radiation cooling rate of a high-temperature object can be realized.
2. The device for testing the rate of thermal radiation cooling of a high-temperature object according to claim 1, wherein the low-emissivity housing is made of a material having an emissivity of less than 0.1.
3. The device for testing the thermal radiation cooling rate of the high-temperature object according to claim 1, wherein the thermal radiation wave-transparent window material is a material with a melting point higher than 600 ℃, an infrared transmittance of more than 90% and a reflectance of less than 10% in a wave band of 3-15 μm.
4. The device for testing the thermal radiation cooling rate of a high-temperature object according to claim 1, wherein the thermal radiation wave-transparent window material is KBr glass or BaF2Glass or CaF2And (3) glass.
5. The apparatus for testing the rate of thermal radiation cooling of a high-temperature object according to claim 1, wherein the thermally insulating liner is a thermally insulating material.
6. The device for testing the rate of thermal radiation cooling of a high-temperature object according to claim 1, wherein the high-temperature-resistant and heat-insulating lining is SiO2Aerogel, mullite, alumina, or foam glass.
7. The device for testing the thermal radiation cooling rate of the high-temperature object according to claim 1, wherein the distance between the surface of the sample to be tested and the thermal radiation wave-transparent window material is 5-10 mm.
8. A method for testing the cooling rate of heat radiation of a high-temperature object based on the device of any one of claims 1 to 7, which is characterized by comprising the following steps:
step 1, heating a sample to be tested to a preset temperature, opening a sealing cover plate above a testing device, placing the heated sample to be tested in a second cavity, and covering the sealing cover plate to ensure that the device is in a closed state in the testing process;
step 2, the temperature thermocouple penetrates through the heat insulation lining and the high temperature resistant heat insulation lining through a testing hole formed in one side of the low infrared emissivity shell, then reaches the surface of a sample to be tested, and the temperature of the surface of the sample to be tested is detected in real time;
and 3, recording the surface temperature of the sample to be detected in real time until the temperature is reduced to the room temperature, and stopping recording to obtain a thermal radiation cooling curve of the high-temperature object.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210004693.6A CN114441591A (en) | 2022-01-05 | 2022-01-05 | Device and method for testing thermal radiation cooling rate of high-temperature object |
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| CN202210004693.6A CN114441591A (en) | 2022-01-05 | 2022-01-05 | Device and method for testing thermal radiation cooling rate of high-temperature object |
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Citations (8)
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|---|---|---|---|---|
| JPH11153488A (en) * | 1997-11-25 | 1999-06-08 | Hitachi Ltd | Observation equipment |
| WO2000058701A1 (en) * | 1999-03-30 | 2000-10-05 | Tokyo Electron Limited | Temperature measurement system |
| CN105223229A (en) * | 2015-09-29 | 2016-01-06 | 北京航天自动控制研究所 | A kind of infrared wave transparent window radiation measurement of transmission characterist platform |
| CN106840411A (en) * | 2017-02-06 | 2017-06-13 | 中国科学院上海光学精密机械研究所 | Infrared-transparent material Normal Spectral Emittance test device |
| CN206892011U (en) * | 2017-07-08 | 2018-01-16 | 南京林业大学 | A kind of wooden material surface heat-radiating properties test device |
| CN109856178A (en) * | 2018-12-14 | 2019-06-07 | 南京理工大学 | Opaque material high temperature multizone spectral emissivity measuring system |
| CN210719419U (en) * | 2019-10-28 | 2020-06-09 | 中国科学院合肥物质科学研究院 | Surface emissivity measuring device |
| CN113834851A (en) * | 2021-09-18 | 2021-12-24 | 中国科学院工程热物理研究所 | Near-field thermal radiation measuring device and method based on transient plane heat source |
-
2022
- 2022-01-05 CN CN202210004693.6A patent/CN114441591A/en active Pending
Patent Citations (8)
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|---|---|---|---|---|
| JPH11153488A (en) * | 1997-11-25 | 1999-06-08 | Hitachi Ltd | Observation equipment |
| WO2000058701A1 (en) * | 1999-03-30 | 2000-10-05 | Tokyo Electron Limited | Temperature measurement system |
| CN105223229A (en) * | 2015-09-29 | 2016-01-06 | 北京航天自动控制研究所 | A kind of infrared wave transparent window radiation measurement of transmission characterist platform |
| CN106840411A (en) * | 2017-02-06 | 2017-06-13 | 中国科学院上海光学精密机械研究所 | Infrared-transparent material Normal Spectral Emittance test device |
| CN206892011U (en) * | 2017-07-08 | 2018-01-16 | 南京林业大学 | A kind of wooden material surface heat-radiating properties test device |
| CN109856178A (en) * | 2018-12-14 | 2019-06-07 | 南京理工大学 | Opaque material high temperature multizone spectral emissivity measuring system |
| CN210719419U (en) * | 2019-10-28 | 2020-06-09 | 中国科学院合肥物质科学研究院 | Surface emissivity measuring device |
| CN113834851A (en) * | 2021-09-18 | 2021-12-24 | 中国科学院工程热物理研究所 | Near-field thermal radiation measuring device and method based on transient plane heat source |
Non-Patent Citations (1)
| Title |
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| S.N. BATHGATE 等: "A robust convection cover material for selective radiative cooling applications" * |
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