CN210647355U

CN210647355U - Radio frequency chip test system

Info

Publication number: CN210647355U
Application number: CN201921240367.5U
Authority: CN
Inventors: 李茂�; 谢凯; 谢晓昆; 张亦锋; 辜诗涛
Original assignee: Guangdong Leadyo Ic Testing Co ltd
Current assignee: Guangdong Leadyo Ic Testing Co ltd
Priority date: 2019-07-31
Filing date: 2019-07-31
Publication date: 2020-06-02
Anticipated expiration: 2029-07-31

Abstract

The utility model provides a radio frequency chip test system, including controlgear, radio frequency power tester and automatic separation machine are connected to controlgear electricity respectively, automatic separation machine includes that the chip places the platform and a plurality of chip gets puts the head, the chip is placed the bench and is equipped with a plurality of chips and places the position, and each chip gets and puts a one-to-one corresponding each chip and places the position. Because automatic separation machine is equipped with a plurality of chips and gets and put the head, and the chip is placed and is equipped with a plurality of chips on the platform and places the position, and controlgear can test a plurality of radio frequency chips simultaneously, therefore radio frequency chip test system is efficient.

Description

Radio frequency chip test system

Technical Field

The utility model relates to a chip test technical field, in particular to radio frequency chip test system.

Background

With the progress of 5G construction, the domestic requirements for related radio frequency devices and chips are increasing day by day, and because the 5G communication precision is greatly improved compared with the prior art, the requirements for LNA radio frequency chips are higher, and therefore a series of current and radio frequency power tests need to be carried out on the radio frequency chips. However, the conventional automatic integrated circuit test system can only test a single radio frequency chip at the same time, which results in low test efficiency of the radio frequency chip and cannot well meet the test requirements of the radio frequency chip.

SUMMERY OF THE UTILITY MODEL

The to-be-solved technical problem of the utility model is to provide a chip test system's hardware architecture for software engineer to make software engineer program the back to the controlgear in this hardware architecture, chip test system can test a plurality of radio frequency chip with high efficiency.

In order to solve the technical problem, the utility model provides a radio frequency chip test system, including controlgear, radio frequency power tester and automatic separation machine are connected to controlgear electricity respectively, automatic separation machine includes that the chip places the platform and a plurality of chip and gets the putting head, the chip is placed the bench and is equipped with a plurality of chips and places the position, and each chip gets a first one-to-one corresponding each chip and places the position.

Preferably, the chip placing table is circular, and the plurality of chip picking and placing heads encircle the circular chip placing table.

Preferably, the chip placing position is arranged around the center of the circular chip placing table.

Preferably, the chip picking and placing head is a mechanical arm with a suction head at the tail end.

Preferably, the control device is an ATE automated test equipment.

The utility model provides a hardware structure has following beneficial effect: after a software engineer programs control equipment in a hardware structure, the automatic sorting machine is provided with a plurality of chip placing heads, the chips are placed on the table and provided with a plurality of chip placing positions, and the control equipment can test a plurality of radio frequency chips simultaneously, so that the radio frequency chip testing system is high in efficiency.

Drawings

FIG. 1 is a block diagram of the circuit connections of a radio frequency chip test system;

FIG. 2 is a schematic view of the structure of an automatic sorting machine;

fig. 3 is a schematic structural view showing the mutual cooperation of the chip placing table and the chip taking and placing device of the automatic sorting machine.

Description of reference numerals: 1-ATE automated test equipment; 2-radio frequency power tester; 3-automatic sorting machine; 4-chip placing table; and 5, a chip taking and placing head.

Detailed Description

Exemplary embodiments of the present application will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present application are shown in the drawings, it should be understood that the present application may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

As shown in fig. 1, the chip testing system includes an ATE automatic testing device 1, a radio frequency power tester 2, and an automatic handler 3, where the ATE automatic testing device 1 is electrically connected to the radio frequency power tester 2 and the automatic handler 3, respectively.

The automatic sorting machine 3 is constructed as shown in fig. 2, and includes a chip placement table (not shown in fig. 2) and a plurality of chip pick-and-place heads 5, wherein the chip pick-and-place heads 5 are specifically manipulators with suction heads at their tail ends, and the manipulators are preferably micro manipulators of model FHJD-1, and can implement three-axis movement, specifically, the manipulators can drive the suction heads to rotate respectively in the vertical direction and the horizontal direction, and can drive the suction heads to accompany each other in the vertical direction and the horizontal direction for tilting movement. As can be seen from fig. 3, the chip placement stage 4 is formed in a circular shape, and the surface thereof is provided with a plurality of chip placement sites which are arranged around the center of the circular chip placement stage 4. After the radio frequency chip is placed on the chip placing position on the chip placing table 4, the radio frequency chip is electrically connected with the automatic ATE test equipment 1, so that the automatic ATE test equipment 1 can receive chip data conveniently. A plurality of chips get and put head 5 and enclose to place platform 4 setting around the chip after enclosing into circular, and each chip gets and puts head 5 one-to-one and places each chip of platform 4 and place the position, just so can get through a plurality of chips and put head 5 and get respectively and put a plurality of radio frequency chip. Because the chip placing positions are enclosed into a circle, and the chip taking and placing heads 5 are also enclosed into a circle to align the chip placing positions, the sizes of the chip taking and placing heads 5 are the same, and the occupied space of the chip taking and placing heads 5 is smaller than that of the chip taking and placing heads 5 which are enclosed into other shapes.

When testing a plurality of radio frequency chips, ATE automatic test equipment 1 controls a plurality of chips of automatic separation machine 3 earlier and gets first 5 and absorb a plurality of radio frequency chips respectively, and control chip is got first 5 and is placed each radio frequency chip respectively on the chip is placed the position of placing of platform 4, and radio frequency chip has just so realized the electricity with ATE automatic test equipment 1 and has been connected, and ATE automatic test equipment 1 carries out conventional current parameter test to the radio frequency chip. Meanwhile, the ATE automatic test equipment 1 controls the radio frequency chips on the chip placing positions to send out radio frequency signals with marked serial numbers and send test instructions to the radio frequency power tester 2, the radio frequency power tester 2 receives the radio frequency signals with the marked serial numbers sent by the radio frequency chips after receiving the test instructions, then whether the power of the radio frequency signals meets the standard index is tested, then the radio frequency test results are fed back to the ATE automatic test equipment 1, and the ATE automatic test equipment 1 can judge which radio frequency chip each radio frequency test result specifically corresponds to according to the marked serial numbers carried by the radio frequency signals. Finally, the ATE automated testing equipment 1 judges whether the chip is good according to the measured current parameter and the radio frequency test result, specifically:

if the current parameter and the radio frequency test result of a certain radio frequency chip both accord with the standard index, the ATE automatic test equipment 1 judges that the radio frequency chip is a good product, and controls a chip suction head 5 corresponding to the radio frequency chip on an automatic sorting machine 3 to suck the radio frequency chip, then vertically sucks up the radio frequency chip, and then horizontally drives the radio frequency chip to a good product area to put down; if the current parameter of a certain radio frequency chip does not accord with the standard index and the radio frequency test result accords with the standard index, the ATE automatic test equipment 1 judges that the radio frequency chip is a current defective product, and controls a chip suction head 5 corresponding to the radio frequency chip on an automatic sorting machine 3 to suck the radio frequency chip according to the current parameter, firstly vertically suck the radio frequency chip, and then horizontally drive the radio frequency chip to a current defective area to put down; if the current parameter of a certain radio frequency chip meets the standard index and the radio frequency test result does not meet the standard index, the ATE automatic test equipment 1 judges that the radio frequency chip is a radio frequency defective product, and controls a chip suction head 5 corresponding to the radio frequency chip on an automatic sorting machine 3 to suck the radio frequency chip according to the radio frequency defective product, firstly vertically suck the radio frequency chip, and then horizontally drive the radio frequency chip to a radio frequency defective area to put down; if the current parameter and the radio frequency test result of a certain radio frequency chip do not meet the standard index, the ATE automatic test equipment 1 judges that the radio frequency chip is a completely defective product, and controls a chip suction head 5 corresponding to the radio frequency chip on an automatic sorting machine 3 to suck the radio frequency chip, then vertically sucks up the radio frequency chip, and horizontally drives the radio frequency chip to a completely defective area to be put down.

In the above-mentioned test process, because automatic separation machine 3 is equipped with a plurality of chips and gets and put head 5, and the chip is placed and is equipped with a plurality of chips on the platform 4 and places the position, ATE automatic test equipment 1 can carry out electric current and radio frequency test to a plurality of radio frequency chips simultaneously, therefore the radio frequency chip test system that this embodiment provided is efficient.

Finally, it should be noted that the above embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the protection scope of the present application, and although the present application is described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that modifications or equivalent substitutions can be made on the technical solutions of the present application without departing from the spirit and scope of the technical solutions of the present application.

Claims

1. A radio frequency chip test system is characterized in that: including controlgear, radio frequency power tester and automatic separation machine are connected respectively to the controlgear electricity, automatic separation machine includes that the chip places the platform and a plurality of chips get and put the head, the chip is placed the bench and is equipped with a plurality of chips and places the position, and each chip gets and puts a head one-to-one and corresponds each chip and places the position.

2. The radio frequency chip test system of claim 1, wherein: the chip placing table is circular, and the plurality of chip taking and placing heads encircle the circular chip placing table.

3. The radio frequency chip test system of claim 2, wherein: the chip placing position is arranged around the circle center of the circular chip placing table.

4. The radio frequency chip test system of claim 1, wherein: the chip taking and placing head is a universal mechanical arm with a suction head at the tail end.

5. The radio frequency chip test system of claim 1, wherein: the control equipment is ATE automated test equipment.