CN208705869U - A kind of IC test and classification device based on serial communication - Google Patents
A kind of IC test and classification device based on serial communication Download PDFInfo
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- CN208705869U CN208705869U CN201821440729.0U CN201821440729U CN208705869U CN 208705869 U CN208705869 U CN 208705869U CN 201821440729 U CN201821440729 U CN 201821440729U CN 208705869 U CN208705869 U CN 208705869U
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Abstract
The utility model discloses a kind of IC test and classification device based on serial communication, including testboard and control equipment, testing host, communication module and robot assemblies are installed on testboard, testing host is equipped with Socket socket and at least one debugging serial ports for being used to be connected with the core of tested IC for installing tested IC, each debugging serial ports passes through serial communication modular respectively and is connected with control equipment, and the control output end for controlling equipment is connected with robot assemblies.The utility model utilizes the debugging serial ports testing classification on testing host, it can be accurately positioned and power on the problem of being accomplished between system, be substantially not present does not cause largely accidentally to divide erroneous judgement problem because interface capability is not good enough, it can be realized the IC chip batch testing of multi-core, automatic plug and classification are realized using robot assemblies, have the advantages that testing classification is accurate, testing efficiency is high.
Description
Technical field
The utility model relates to IC testing classification equipment, and in particular to a kind of IC testing classification dress based on serial communication
It sets.
Background technique
A few days ago, domestic IC technology rapid development, domestic IC produces in enormous quantities, welding equipment is also following.In order to ensure being used for
The IC of high-volume welding equipment is stable and reliable in work, must just select in advance to IC.IC testing, sorting machine is existing mature technology.At present
Have a kind of automatic testing classification system of IC, IC testing, sorting machine is applied in IC testing classification demand by network connection.
Be made of two big modules: a module is connected using testing service device as core, by the network switch with sieve mainboard；One with
Testing sorter is core, is connected by the network switch with testing service device.Assorting process is to first pass through testing service device warp
The network switch initiates test command, starting test to each testing host, then test result is transmitted to survey through the network switch
It tries classifier and realizes IC screening.This mode, on the one hand must wait enter system after can carry out, can not position after powering on into
The problem of entering before operating system；On the other hand, dependent on good network interface performance on testing host, if testing host
On there is the case where network interface poor performance, then the accuracy that will lead to testing classification substantially reduces, and eventually leads to a large amount of IC
By accidentally point erroneous judgement.Moreover, the IC chip for multi-core (Die) is tested, current IC testing, sorting machine can only single core
(Die) manual operation is tested and relied on one by one, leads to testing, sorting inefficiency.
Utility model content
The technical problems to be solved in the utility model: it in view of the above problems in the prior art, provides a kind of logical based on serial ports
The IC test and classification device of letter, the utility model realizes the testing classification of IC using the debugging serial ports on testing host, due to string
Mouth initialization is early to power on the problem of being accomplished between system so can be accurately positioned；And by serial ports low-speed stable institute
Do not cause largely accidentally to divide erroneous judgement problem because interface capability is not good enough to be substantially not present, and multicore can be realized by testing host
The IC chip batch testing of the heart realizes automatic plug and classification using robot assemblies, has the advantages that testing efficiency is high.
In order to solve the above-mentioned technical problem, the technical solution adopted in the utility model are as follows:
A kind of IC test and classification device based on serial communication, including testboard and control equipment, pacify on the testboard
Equipped with testing host, communication module and robot assemblies, the testing host is equipped with the Socket for installing tested IC
Socket and at least one debugging serial ports for being used to be connected with the core of tested IC, each debugging serial ports are logical by serial ports respectively
Letter module is connected with control equipment, and the control output end of the control equipment is connected with robot assemblies.
Preferably, the robot assemblies include pedestal and mechanical arm body, and the mechanical arm body is installed by pedestal
On testboard, the mechanical arm body is connected with control equipment, and the end of the mechanical arm body is equipped with tested for grabbing
Try the sucker of IC.
Preferably, it is equipped with positioned at the operation overlay area of robot assemblies for placing sorted IC on the testboard
Multiple classification pallets.
Compared to the prior art, the utility model has an advantage that
1, the utility model realizes the testing classification of IC using the debugging serial ports on testing host, on the one hand as at the beginning of serial ports
Beginningization is early to power on the problem of being accomplished between system so can be accurately positioned；On the other hand, due to serial ports low-speed stable
So be substantially not present does not cause largely accidentally to divide erroneous judgement problem because interface capability is not good enough, have the advantages that test accuracy is high.
2, the utility model testing host is equipped with Socket socket and at least one use for installing tested IC
In the debugging serial ports being connected with the core of tested IC, by arranging that the batch to multi-core IC may be implemented in multiple debugging serial ports
Test, can once complete the test of multiple cores, additionally it is possible to realize automatic plug and classification using robot assemblies, have
The high advantage of testing efficiency.
Detailed description of the invention
Fig. 1 is the schematic illustration of the utility model embodiment.
Fig. 2 is the structural schematic diagram of the utility model embodiment.
Marginal data: 1, testboard；2, equipment is controlled；3, testing host；31, Socket socket；32, serial ports is debugged；4,
Serial communication modular；5, robot assemblies；51, pedestal；52, mechanical arm body；53, sucker；6, classification pallet.
Specific embodiment
As depicted in figs. 1 and 2, IC test and classification device of the present embodiment based on serial communication includes testboard 1 and control
Equipment 2, testing host 3, communication module 4 and robot assemblies 5 are equipped on testboard 1, and testing host 3 is equipped with for installing
The Socket socket 31 of tested IC and at least one debugging serial ports 32 for being used to be connected with the core of tested IC, each tune
Examination serial ports 32 is connected by serial communication modular 4 with control equipment 2 respectively, controls control output end and the mechanical arm group of equipment 2
Part 5 is connected.The present embodiment realizes the testing classification of IC using the debugging serial ports on testing host, on the one hand due to initialization of (a) serial ports
It is early to power on the problem of being accomplished between system so be accurately positioned；On the other hand, due to serial ports low-speed stable so
Be substantially not present does not cause largely accidentally to divide erroneous judgement problem because interface capability is not good enough, has the advantages that test accuracy is high.This implementation
Example testing host 3 be equipped with Socket socket 31 for installing tested IC and at least one for core with tested IC
The connected debugging serial ports 32 of the heart, can be realized the IC chip batch testing of multi-core by testing host 3, utilizes mechanical arm group
Part realizes automatic plug and classification, has the advantages that testing efficiency is high.
As depicted in figs. 1 and 2, robot assemblies 5 include pedestal 51 and mechanical arm body 52, and mechanical arm body 52 passes through base
Seat 51 is mounted on testboard 1, and mechanical arm body 52 is connected with control equipment 2, and the end of mechanical arm body 52 is equipped with for grabbing
The sucker 53 of tested IC is taken, mechanical arm body 52 is specially common industrial machinery arm, has tri- axis freedom degree of XYZ, can
Realize the accurate positionin to Socket socket 31, sucker 53 can be realized the accurate pick-and-place to IC, and operating reliability is high.
In the present embodiment, positioned at the operation overlay area of robot assemblies 5 equipped with sorted for placing on testboard 1
Multiple classification pallets 6 of IC.The quantity of classification pallet 6 is specially 4 in the present embodiment, can also be according to the core number of tested IC
The quantity of amount modification debugging serial ports 32 and the quantity for pallet 6 of classifying.
IC test and classification device of the present embodiment based on serial communication use process is as follows:
1) robot assemblies 5 are sucked out one from IC pallet to be measured with sucker 53 under the control of testing sorter console
IC to be measured is put into the Socket socket 31 of testing host 3.
2) robot assemblies 5 are downwardly against the IC to be measured being put on testing host 3 in Socket socket 31.
3) it carries out existing IC test: being powered on using control equipment 2 to mainboard 3 to be tested.Testing host 3 powers on completion
Afterwards, result judgement device sends test opening flag to control equipment 2 by serial ports；Control equipment 2 receives test opening flag
Afterwards, result judgement device is replied by serial ports and has been received by test opening flag；Test macro end, into operating system automatic running
Test script.Test carries out stage by stage, and test script is in the start node of each test phase, end node, error node
Relevant information, which is sent, by serial ports gives result judgement device (result judgement device whole band in entire test and screening process
Electricity, not power down.).Result judgement device is in addition to receiving the start node that test macro is sent, end node, error node information
Outside, timeout mechanism is set at each test phase start node.If not receiving corresponding node in specific time
Ending message or error message then determine current generation test time-out.It is complete for the script in each core of tested IC
Equally, independent operating.(to the end of including, mistake, overtime three kinds of situations) is completed when all test phases, result judgement device is then
The test case for summarizing all cores on tested IC determines that global test passes through or fails to each core, as needed
Current tested IC is sorted out, while categorizing information is notified by serial ports to give control equipment 2.It should be noted that the present embodiment
In be not related to improvement to IC test method, which is complete existing IC test method.
4) after control equipment 2 receives categorizing information, control robot assemblies 5 are lifted, with sucker 53 from testing host 3
Socket socket 31 is inner to be sucked out tested IC, is put into corresponding classification pallet 6.
The above is only the preferred embodiment of the utility model, and the protection scope of the utility model is not limited merely to
Above-described embodiment, technical solution belonging to the idea of the present invention belong to the protection scope of the utility model.It should refer to
Out, for those skilled in the art, it is without departing from the principle of the utility model it is several improvement and
Retouching, these improvements and modifications also should be regarded as the protection scope of the utility model.
Claims (3)
1. a kind of IC test and classification device based on serial communication, it is characterised in that: including testboard (1) and equipment (2) are controlled,
Testing host (3), communication module (4) and robot assemblies (5) are installed, on the testing host (3) on the testboard (1)
Equipped with the Socket socket (31) and at least one tune for being used to be connected with the core of tested IC for installing tested IC
It tries serial ports (32), each debugging serial ports (32) is connected by serial communication modular (4) with control equipment (2) respectively, the control
The control output end of equipment (2) is connected with robot assemblies (5).
2. the IC test and classification device according to claim 1 based on serial communication, it is characterised in that: the mechanical arm group
Part (5) includes pedestal (51) and mechanical arm body (52), and the mechanical arm body (52) is mounted on testboard by pedestal (51)
(1) on, the mechanical arm body (52) is connected with control equipment (2), and the end of the mechanical arm body (52) is equipped with for grabbing
Take the sucker (53) of tested IC.
3. the IC test and classification device according to claim 1 or 2 based on serial communication, it is characterised in that: the test
Operation overlay area on platform (1) positioned at robot assemblies (5) is equipped with multiple classification pallets for placing sorted IC
(6).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821440729.0U CN208705869U (en) | 2018-09-04 | 2018-09-04 | A kind of IC test and classification device based on serial communication |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821440729.0U CN208705869U (en) | 2018-09-04 | 2018-09-04 | A kind of IC test and classification device based on serial communication |
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| Publication Number | Publication Date |
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| CN208705869U true CN208705869U (en) | 2019-04-05 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201821440729.0U Active CN208705869U (en) | 2018-09-04 | 2018-09-04 | A kind of IC test and classification device based on serial communication |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112181754A (en) * | 2020-09-29 | 2021-01-05 | 京东方科技集团股份有限公司 | Test equipment and test method |
| CN112379244A (en) * | 2020-11-03 | 2021-02-19 | 上海华岭集成电路技术股份有限公司 | Automatic control test method for integrated circuit |
-
2018
- 2018-09-04 CN CN201821440729.0U patent/CN208705869U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112181754A (en) * | 2020-09-29 | 2021-01-05 | 京东方科技集团股份有限公司 | Test equipment and test method |
| CN112379244A (en) * | 2020-11-03 | 2021-02-19 | 上海华岭集成电路技术股份有限公司 | Automatic control test method for integrated circuit |
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Address after: 300452 Building 5, Xin'an pioneer Plaza, Binhai New Area marine high tech Development Zone, Tianjin Patentee after: Feiteng Information Technology Co.,Ltd. Address before: 300452 Building 5, Xin'an pioneer Plaza, Binhai New Area marine high tech Development Zone, Tianjin Patentee before: TIANJIN FEITENG INFORMATION TECHNOLOGY Co.,Ltd. |
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