Summary of the invention
In order to overcome above deficiency, the invention provides a kind of automatic test approach and instrument of supervisory circuit plate, the process of manual test is finished by software and hardware, improved the efficient and the precision of test.
The automatic test approach of supervisory circuit plate of the present invention may further comprise the steps:
(1). read the model of supervisory circuit plate and test event, test parameter and test index are set according to the model of supervisory circuit plate;
(2). generate the voltage signal corresponding and voltage signal is exported to the corresponding voltage acquisition port of supervisory circuit plate with described test event and test parameter;
(3). gather voltage signal from the voltage output end mouth of supervisory circuit plate correspondence, whether judge the performance of supervisory circuit plate according to the absolute value of the difference of the voltage signal of the voltage signal of described collection and generation less than described test index.
Preferably, described step (1) comprising:
A. read the model of supervisory circuit plate;
B., whether the test cases of current model supervisory circuit plate is arranged, in the Query Database if having then enter step c, if not then enter steps d;
C. with test event, test parameter and test index in the current model supervisory circuit board test case in the database test event, test parameter and test index as current model supervisory circuit plate;
D. remind test event, test parameter and the test index of first test cases in the user's modification database, with test event, test parameter and the test index of first test cases after the user's modification as test event, test parameter and the test index of current model supervisory circuit plate and be kept in the database test cases as current model supervisory circuit plate.
The automatic testing instrument of supervisory circuit plate of the present invention, comprise the PC main frame, testing instrument unit and testing mould unit, described PC main frame, testing instrument unit links to each other in twos with the testing mould unit, described testing mould unit links to each other with the supervisory circuit plate, described PC main frame reads the model of supervisory circuit plate by described testing mould unit, the test event of supervisory circuit plate model correspondence is set, test parameter and test index, the voltage signal that generates described test event and test parameter correspondence also is transferred to the voltage acquisition port of supervisory circuit plate correspondence successively by described testing instrument unit and testing mould unit, the voltage signal of the voltage output end mouth of acquisition monitoring circuit board correspondence, whether judge the performance of supervisory circuit plate less than described test index according to the absolute value of the difference between the voltage signal of the voltage signal of described collection and described generation, described testing instrument unit is carried out modulus or digital-to-analog conversion to the voltage signal that transmits between described PC main frame and the described testing mould unit, described testing mould unit between described PC main frame and the supervisory circuit plate be connected and described testing instrument unit and supervisory circuit plate between be connected the function that interface conversion is provided.
Preferably, described PC main frame comprises configuration module, communication module, instrument control module and data processing module, described communication module reads the model of current supervisory circuit plate by described testing mould unit, described configuration module is judged the test cases of whether having preserved current model supervisory circuit plate in the described data processing module, if then with the test event in this test cases, test parameter and test index are as the test event of current model supervisory circuit plate, test parameter and test index, then remind the test event of first test cases of the described data processing module preservation of user's modification if not, test parameter and test index, with the test event after the user's modification, test parameter and test index are as the test event of current model supervisory circuit plate, test parameter and test index, described instrument control module generates test event and the corresponding voltage signal of test parameter with current model supervisory circuit plate, voltage signal is sent to successively the voltage signal of the voltage output end mouth of the voltage acquisition port of supervisory circuit plate correspondence and acquisition monitoring circuit board correspondence by described testing instrument unit and described testing mould unit, described data processing module is with described test event, test parameter and test index save as the test cases of current model supervisory circuit plate, whether judge the performance of supervisory circuit plate less than described test index according to the absolute value of the difference between the voltage signal of voltage signal of gathering and generation.
The automatic test approach of supervisory circuit plate of the present invention and instrument, the voltage signal that simulation electronic product input voltage signal returns for supervisory circuit plate and acquisition monitoring circuit board, the voltage signal that the voltage signal of input monitoring circuit board is returned with it is made comparisons and is judged the performance of supervisory circuit plate, owing to preserved the substantive test case, make and directly to adopt the test parameter in the case or can generate and the corresponding voltage signal of supervisory circuit plate model with reference to test parameter in the case, again because test index is set, make to the accuracy of judgement of supervisory circuit plate performance and flexibly, generate signal, the process of acquired signal and comparison signal is all finished by automatic testing instrument, compares manual test and has improved testing efficiency and precision.
Embodiment
Supervisory circuit plate automatic test method of the present invention, the result's who returns according to the test parameter that is provided with and supervisory circuit plate size is judged the performance of supervisory circuit plate.
Further explain the present invention below in conjunction with accompanying drawing.
Embodiment one:
Shown in Figure 1 is the process flow diagram of supervisory circuit plate automatic test approach embodiment one of the present invention, and the automatic test approach of supervisory circuit plate of the present invention may further comprise the steps:
101. read the model of supervisory circuit plate and test event, test parameter and test index be set according to the model of supervisory circuit plate;
102. the voltage signal that generation is corresponding with test event and test parameter is also exported to the corresponding voltage acquisition port of supervisory circuit plate with voltage signal;
103. gather voltage signal from the voltage output end mouth of supervisory circuit plate correspondence, whether judge the performance of supervisory circuit plate according to the absolute value of the difference of the voltage signal of voltage signal of gathering and generation less than test index.
Its performance of supervisory circuit plate of different model is perhaps different, therefore before test, need test event be set at the model of supervisory circuit plate, test parameter and test index that each test event is corresponding different, wherein test index is to weigh the index of supervisory circuit plate performance, if then this supervisory circuit plate performance is qualified less than test index for the absolute value of the difference of the voltage signal of input monitoring circuit board and output monitoring circuit board, otherwise defective.
Embodiment two:
The difference of present embodiment and embodiment one is that the step 101 of embodiment one is come specific implementation by the step a in the present embodiment~d, and the automatic test approach of supervisory circuit plate of the present invention may further comprise the steps:
A. read the model of supervisory circuit plate;
B., whether the test cases of current model supervisory circuit plate is arranged, in the Query Database if having then enter step c, if not then enter steps d;
C. with test event, test parameter and test index in the current model supervisory circuit board test case in the database test event, test parameter and test index as current model supervisory circuit plate;
D. remind test event, test parameter and the test index of first test cases in the user's modification database, with test event, test parameter and the test index of first test cases after the user's modification as test event, test parameter and the test index of current model supervisory circuit plate and be kept in the database test cases as current model supervisory circuit plate.
In the present embodiment test event, test parameter and the test index of supervisory circuit plate be kept in the database test cases as this model supervisory circuit plate, when next time the supervisory circuit plate of same model being tested, directly adopt test event, test parameter and the test index of the test cases of the supervisory circuit plate that model is identical in the database, avoided the setting that repeats, improved testing efficiency same model supervisory circuit plate.
Identical among other technical characterictic among the embodiment two and the embodiment one do not repeat them here.
Embodiment three:
The difference of present embodiment and embodiment two is, present embodiment has increased from the step of supervisory circuit plate reading of data, be the process flow diagram of supervisory circuit plate automatic test approach embodiment three of the present invention as shown in Figure 2, the automatic test approach of supervisory circuit plate of the present invention may further comprise the steps:
201. read the model of supervisory circuit plate;
202. whether the test cases of current model supervisory circuit plate is arranged, in the Query Database if having then enter step 203,205, if not then enter step 204,205;
203. with test event, test parameter and test index in the current model supervisory circuit board test case in the database test event, test parameter and test index as current model supervisory circuit plate;
204. remind test event, test parameter and the test index of first test cases in the user's modification database, with test event, test parameter and the test index of first test cases after the user's modification as test event, test parameter and the test index of current model supervisory circuit plate and be kept in the database test cases as current model supervisory circuit plate.
Whether need data on the supervisory circuit plate 205. judge to generate the voltage signal of test event and test parameter correspondence, then enter step 206,207 if desired, if do not need then enter step 207;
206. read the data that need from the supervisory circuit plate;
207. generate the voltage signal of test event and test parameter correspondence;
208. the voltage signal that generates is transferred to the voltage signal of the voltage output end mouth of the voltage acquisition port of supervisory circuit plate correspondence and acquisition monitoring circuit board correspondence;
209. the difference of the voltage signal that calculating is gathered and the voltage signal of generation, whether the absolute value of judging difference is less than test index, if the performance less than current model supervisory circuit plate then is qualified, if be not less than test index, the performance inconsistency lattice of then current model supervisory circuit plate.
Be example with the temperature detecting function test below, further specify the flow process of this supervisory circuit plate automatic test approach.
Read the supervisory circuit plate model and with database in the test cases preserved relatively, the test cases of learning current model exists, then adopt the test event in the test cases, test parameter and test index, comprise that with the test event in this test cases the temperature detecting function test is that example describes, read test parameters of temperature higher limit Tmax from this test cases, lowest temperature value Tmin and temperature test index Tm, in the bound scope, choose one group of number as test parameter, as minimum value, random value between minimum value and the intermediate value, intermediate value, random value between intermediate value and the maximal value, maximal value is the array S of totally 5 numbers composition, the many more test results of data number are accurate more, but overabundance of data will influence testing efficiency, therefore generally get 5 numbers, when generating the voltage signal of test parameter correspondence, the temperature detecting function test need be converted into magnitude of voltage with temperature value, therefore read temperature slope T1 from the supervisory circuit plate, temperature intercept parameter T2, then can get magnitude of voltage array V=S*T1+T2, the voltage signal of formation voltage value array V correspondence also outputs to voltage signal the temperature detection port of supervisory circuit plate voltage acquisition port, read the voltage signal of the temperature output port of the voltage output end mouth on the supervisory circuit plate, be that the voltage signal of input monitoring circuit board is when comparing with the voltage signal that reads from the supervisory circuit plate at the voltage signal that will generate, the voltage signal that reads is sampled, according to array S, choose the minimum value of the above-mentioned voltage signal amplitude that reads, random value between minimum value and the intermediate value, intermediate value, random value between intermediate value and the maximal value, maximal value totally 5 numbers is formed temperature value array T, test result array R=|S-T| then, with the temperature test index Tm in test result and the test cases relatively, when the numerical value among the array R during all less than Tm, supervisory circuit plate performance is qualified, and the performance of the more little supervisory circuit plate of the numerical value among the array R is good more, and the performance of the big more explanation supervisory circuit of the numerical value among array R plate is poor more.
The automatic testing instrument of supervisory circuit plate of the present invention, be the device corresponding with the automatic test approach of supervisory circuit plate of the present invention, it adopts PC main frame simulation electronic product and host computer input/output signal to give the supervisory circuit plate, the result that the supervisory circuit plate is returned compares with theoretical value, judge the quality of supervisory circuit plate performance with the size of error, explain the present invention in detail below in conjunction with accompanying drawing.
Embodiment one:
As shown in Figure 3, the automatic testing instrument of supervisory circuit plate of the present invention, comprise the PC main frame, testing instrument unit and testing mould unit, the PC main frame, testing instrument unit links to each other in twos with the testing mould unit, the testing mould unit links to each other with the supervisory circuit plate, the PC main frame reads the model of supervisory circuit plate and sets test event according to the model of supervisory circuit plate, test parameter and test index also generate test event and the voltage signal of test parameter correspondence, this voltage signal is transferred to the voltage acquisition port of supervisory circuit plate correspondence, the voltage signal of the voltage output end mouth of acquisition monitoring circuit board correspondence, whether judge the performance of supervisory circuit plate less than test index according to the absolute value of the difference of the voltage signal of voltage signal of gathering and generation, the signal that transmits between PC main frame and the supervisory circuit plate, if voltage signal, then signal transmits between the voltage port of the PCI of PC main frame slot and supervisory circuit plate through testing instrument unit and testing mould unit, if be non-voltage signal, then signal only transmits between the RS485 port of the PORT COM of PC main frame and supervisory circuit plate through the testing mould unit, any change is not made to signal in the testing mould unit, only between PC main frame and the supervisory circuit plate be connected and testing instrument unit and supervisory circuit plate between be connected the function that interface conversion is provided, the testing mould unit can independently-poweredly also can be powered by testing instrument unit, in order to allow the supervisory circuit plate better work, the testing mould unit is the power supply of supervisory circuit plate after with the voltage voltage stabilizing again, testing instrument unit is finished the analog to digital conversion of the different voltage signal that transmits between PC main frame and the testing mould unit, and (simulating signal is to the conversion of digital signal, or digital signal is to the conversion of simulating signal), in temperature detecting function test and power detection test, after testing instrument unit is carried out digital-to-analog conversion to the corresponding voltage signal of temperature detecting function test, with the signal after the conversion after tested die unit export to the temperature detection port of supervisory circuit plate voltage acquisition port, after testing instrument unit is carried out digital-to-analog conversion to the corresponding voltage signal of power detection test, with the signal after the conversion after tested die unit export to the power detection port of supervisory circuit plate voltage acquisition port.
Embodiment two:
The difference of present embodiment and embodiment one is, PC main frame among the embodiment one is by the configuration module in the present embodiment, communication module, instrument control module and data processing module come specific implementation, as shown in Figure 4, the PC main frame of the automatic testing instrument of supervisory circuit plate of the present invention comprises configuration module, communication module, instrument control module and data processing module, communication module reads the model of current supervisory circuit plate by the testing mould unit, whether preserved the test cases of current model supervisory circuit plate in the configuration module judgment data processing module, if then with the test event in this test cases, test parameter and test index are as the test event of current model supervisory circuit plate, test parameter and test index, then remind the test event of first test cases of user's modification data processing module preservation if not, test parameter and test index, with the test event after the user's modification, test parameter and test index are as the test event of current model supervisory circuit plate, test parameter and test index, the instrument control module generates test event and the corresponding voltage signal of test parameter with current model supervisory circuit plate, voltage signal is sent to successively the voltage signal of the voltage output end mouth of the voltage acquisition port of supervisory circuit plate correspondence and acquisition monitoring circuit board correspondence by testing instrument unit and testing mould unit, data processing module is with described test event, test parameter and test index save as the test cases of current model supervisory circuit plate, whether judge the performance of supervisory circuit plate less than test index according to the absolute value of difference between the voltage signal of voltage signal of gathering and generation.
Data processing module in the present embodiment is also preserved the test cases of each model supervisory circuit plate, module is set if in the test cases that data processing module is preserved, find the test cases of current model supervisory circuit plate, then need not again current model supervisory circuit plate to be provided with, directly adopt test event, test parameter and test index in the test cases to get final product, saved the trouble that is provided with once more, test cases has been preserved also be convenient to the later stage and check.
Identical among other technical characterictic among the embodiment two and the embodiment one do not repeat them here.
Embodiment three:
The difference of present embodiment and embodiment two is, the automatic test job of supervisory circuit plate of present embodiment has increased from supervisory circuit plate function of reading data, the instrument control module judged before the formation voltage signal whether the formation voltage signal needs the data of supervisory circuit plate, if do not need then direct formation voltage signal, then send the reading of data instruction if need to communication module, communication module is received the instruction back and is read the corresponding data of supervisory circuit plate and send to the instrument control module by the testing mould unit, the instrument control module is according to test event, test parameter and corresponding data formation voltage signal, data processing module also is saved to this corresponding data in the test cases of current model supervisory circuit plate.
In the example as the test of automatic test approach embodiment three temperature detecting functions of supervisory circuit plate of the present invention, when converting temperature value to magnitude of voltage, need read temperature slope and temperature intercept parameter from the supervisory circuit plate, when present embodiment runs into this kind situation, the judgement of instrument control module learns that the formation voltage signal also needs the data on the supervisory circuit plate except that test parameter, then obtain corresponding data on the supervisory circuit plate and then formation voltage signal by communication module.
Identical among other technical characterictic among the embodiment three and the embodiment two do not repeat them here.
Embodiment four:
The difference of present embodiment and embodiment three is, testing instrument unit among the embodiment three is come specific implementation by A/D capture card in the present embodiment and D/A output card, as shown in Figure 4, testing instrument unit comprises A/D capture card and D/A output card, the A/D capture card is inserted on the PCI slot of PC main frame, the different voltage signal that the voltage output end mouth of supervisory circuit plate is returned is transferred to the instrument control module of PC main frame after analog to digital conversion (simulating signal is to the conversion of digital signal), the D/A output card is inserted on the PCI slot of PC main frame, with the different voltage signal of the instrument control module of PC main frame output through digital-to-analog conversion (digital signal is to the conversion of simulating signal) after the testing mould unit is transferred to the voltage acquisition port of supervisory circuit plate, the power supply of testing mould unit can be provided by the A/D capture card, perhaps provide, also can provide jointly by the two by the D/A output card.
Other technical characterictic among the embodiment four is identical with embodiment three, does not repeat them here.
The automatic test approach of supervisory circuit plate of the present invention is applied on the automatic testing instrument of supervisory circuit plate of the present invention, can finishes every test the supervisory circuit plate.
Above-described embodiment of the present invention does not constitute the qualification to protection domain of the present invention.Any modification of being done within the spirit and principles in the present invention, be equal to and replace and improvement etc., all should be included within the claim protection domain of the present invention.