CN210007709U - 集成电路测试系统 - Google Patents
集成电路测试系统 Download PDFInfo
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- CN210007709U CN210007709U CN201921060390.6U CN201921060390U CN210007709U CN 210007709 U CN210007709 U CN 210007709U CN 201921060390 U CN201921060390 U CN 201921060390U CN 210007709 U CN210007709 U CN 210007709U
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CN201921060390.6U CN210007709U (zh) | 2019-07-08 | 2019-07-08 | 集成电路测试系统 |
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Address after: 230000 Building 1, Tianmen Lake Industrial Park, west of Tianmen Road and south of Jinxiu Avenue, Hefei Economic Zone, Anhui Province Patentee after: Hefei Yuexin Semiconductor Technology Co.,Ltd. Address before: 230000 Building 1, Tianmen Lake Industrial Park, west of Tianmen Road and south of Jinxiu Avenue, Hefei Economic Zone, Anhui Province Patentee before: Hefei Yuexin Semiconductor Technology Co.,Ltd. |
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CP01 | Change in the name or title of a patent holder | ||
CP03 | Change of name, title or address |
Address after: 230000 2 / F, east side of building D1, intelligent equipment science and Technology Park, 3963 Susong Road, Hefei Economic and Technological Development Zone, Anhui Province Patentee after: Yuexin Technology Co.,Ltd. Address before: 230000 Building 1, Tianmen Lake Industrial Park, west of Tianmen Road and south of Jinxiu Avenue, Hefei Economic Zone, Anhui Province Patentee before: Hefei Yuexin Semiconductor Technology Co.,Ltd. |
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CP03 | Change of name, title or address |