CN209894912U - Novel thermal resistance testing device - Google Patents
Novel thermal resistance testing device Download PDFInfo
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- CN209894912U CN209894912U CN201822174142.6U CN201822174142U CN209894912U CN 209894912 U CN209894912 U CN 209894912U CN 201822174142 U CN201822174142 U CN 201822174142U CN 209894912 U CN209894912 U CN 209894912U
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Abstract
The utility model discloses a novel thermal resistance test device, including data control unit, power output unit, measuring unit, data control unit is responsible for control power output unit and measuring unit to carry out data transmission between through USB interface and the computer, power output unit is including programmable voltage source and programmable current source, programmable voltage source switches wantonly between two voltage value of setting for, programmable current source switches wantonly between setting for current value and zero, measuring unit includes sensor current source, power switching module, power amplifier control module, measurement channel module, and the channel module of measuring is provided with the measurement channel port, measuring unit is provided with the USB interface with computer transmission data. The utility model provides a technical scheme can overcome the time delay error that current pulse testing technique exists, realizes the real-time recording to temperature change with time's transient temperature response curve.
Description
Technical Field
The utility model relates to a semiconductor device tests technical field, specifically is a novel thermal resistance test device.
Background
The visible light communication technology based on semiconductor illumination has the advantages of high efficiency, energy conservation, environmental protection, easy maintenance and the like, the characteristics of energy conservation and environmental protection are in line with the national sustainable development strategy, and the visible light communication technology has wide application prospect. The thermal characteristic measurement is a key input parameter of later reliability tests such as power cycle and the like in the production process of the semiconductor device, and has very important guiding significance for quality and service life evaluation of products. The excellent thermal performance of the device can improve the reliability of product packaging, reduce quality defects, reduce production cost and provide necessary data for the size design of a heat sink applied to a later product.
The test of the thermal characteristics comprises the test of the performances of thermal resistance, heat capacity, thermal conductivity, contact thermal resistance and the like of the semiconductor device. The thermal characteristic analysis of the semiconductor device can measure the thermal resistance and thermal capacity parameters of each layer in the package of the device, and quickly determine the structure and the part of the defect in the package. Therefore, thermal characteristic inspection is an essential part of quality inspection of semiconductor devices. Therefore, the design of the equipment capable of quickly and accurately measuring the thermal characteristics of the semiconductor device has very important significance and value.
The traditional electronic device thermal characteristic test mainly adopts a pulse method, and because the pulse is discontinuous and the measurement has time delay, the measured temperature transient curve has low precision, longer waiting time and poorer signal-to-noise ratio. And the pulse method can not record data in real time when measuring transient temperature response, but simulates the transient process by artificially constructing pulse heating power, which is not the actual transient temperature response of the device, and has poor data accuracy.
SUMMERY OF THE UTILITY MODEL
The utility model discloses to the problem that above-mentioned prior art exists, provide a novel thermal resistance test device.
In order to achieve the purpose, the utility model discloses a novel thermal resistance testing device is realized through following technical scheme, including data control unit, power output unit, measuring unit, data control unit is responsible for controlling power output unit and measuring unit, and carries out data transmission through USB interface and computer;
the power supply output unit comprises a programmable voltage source and a programmable current source, the programmable voltage source is switched between two set voltage values at will, the programmable current source is switched between a set current value and zero at will, the programmable voltage source is provided with a voltage source output port, and the programmable current source is provided with a current source output port;
the measuring unit comprises a sensor current source, a power switching module, a power amplifier control module and a measuring channel module, wherein the sensor current source is provided with a sensor current source port, the power switching module is provided with a power switching module port, the measuring channel module is provided with a measuring channel port, and the measuring unit is provided with a USB interface for transmitting data with a computer.
Further: the programmable current source includes a first programmable current source and a second programmable current source.
Further: the current source output ports include a first current source output port and a second current source output port.
Further: the first programmable current source is coupled to a first current source output port and the second current source output port is coupled to a second current source output port.
Further: the voltage source output port is in the same column as the first and second current source output ports.
Further: the sensor current source ports include a first sensor current source port, a second sensor current source port, a third sensor current source port, and a fourth sensor current source port, which are in the same column.
Further: the measurement channel ports include a first measurement channel port and a second measurement channel port, which are located at the same height.
Further: the USB interface is connected with one end of a USB data line, and the other end of the USB data line is connected with a computer.
Further: and a heat dissipation port is formed in the side edge of the power output unit.
The utility model has the advantages that:
compared with the prior art, the utility model provides a pair of novel thermal resistance testing arrangement according to JEDEC51-1 static measurement principle, through the input power who changes semiconductor device, makes semiconductor device temperature change, records the transient response curve of temperature change with time in real time, has overcome traditional pulse measurement method time delay measurement's shortcoming. And thermal characteristic parameters such as K coefficient, thermal resistance, heat capacity and the like can be analyzed and calculated through software, so that the thermal characteristic of the semiconductor device can be rapidly and accurately measured.
Drawings
FIG. 1 is a schematic structural view of the present invention;
fig. 2 is a control schematic diagram of the present invention.
In the figure: 10-programmable voltage source, 11-voltage source output port, 20-programmable current source, 21-first current source output port, 22-second current source output port, 30-heat sink, 40-sensor current source, 41-first sensor current source port, 42-second sensor current source port, 43-third sensor current source port, 44-fourth sensor current source port, 50-power amplifier control module, 60-power switching module, 61-power switching module port, 70-measurement channel module, 71-first measurement channel port, 72-second measurement channel port, 80-USB interface.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
A novel thermal resistance testing device comprises a data control unit, a power output unit and a measuring unit, wherein the data control unit is responsible for controlling the power output unit and the measuring unit and carrying out data transmission with a computer through a USB interface 80;
the power output unit comprises a programmable voltage source 10 and a programmable current source 20, the programmable voltage source 10 is switched between two set voltage values at will, the programmable current source 20 is switched between a set current value and zero at will, the programmable voltage source 10 is provided with a voltage source output port 11, and the programmable current source 20 is provided with a current source output port;
the measuring unit comprises a sensor current source 40, a power switching module 60, a power amplifier control module 50 and a measuring channel module 70, wherein the sensor current source 40 is provided with a sensor current source port, the power switching module 60 is provided with a power switching module port 61, the measuring channel module 70 is provided with a measuring channel port, and the measuring unit is provided with a USB interface 80 for transmitting data with a computer.
Wherein the programmable current source 20 comprises a first programmable current source and a second programmable current source.
Wherein the current source output ports comprise a first current source output port 21 and a second current source output port 22.
Wherein the first programmable current source is connected to a first current source output port 21 and the second programmable current source is connected to a second current source output port 22.
Wherein the voltage source output port 11 is located in the same column as the first current source output port 21 and the second current source output port 22.
Wherein the sensor current source ports include a first sensor current source port 41, a second sensor current source port 42, a third sensor current source port 43, and a fourth sensor current source port 44, the first sensor current source port 41, the second sensor current source port 42, the third sensor current source port 43, and the fourth sensor current source port 44 being in the same column.
Wherein the measurement channel ports include a first measurement channel port 71 and a second measurement channel port 72, and the first measurement channel port 71 and the second measurement channel port 72 are located at the same height.
The USB interface 80 is connected to one end of a USB data line, and the other end of the USB data line is connected to a computer.
Wherein, the side of the power output unit is provided with a heat dissipation opening 30.
Preferably, the selected semiconductor device is a light emitting diode, the light emitting diode is firstly adhered to a card slot of a refrigerator by using a heat conducting adhesive, a first current source output port 21, a second current source output port 22, a first sensor current source port 41, a second sensor current source port 42, a third sensor current source port 43, a fourth sensor current source port 44, a power switching module port 61, a first measuring channel port 71, a second measuring channel port 72 and the refrigerator of the novel thermal resistance testing device are respectively connected by using wires, and a power supply is plugged to supply power to the novel thermal resistance testing device. Connecting a USB interface of the novel thermal resistance testing device with a computer, selecting a wiring mode of an LED as DIODE C-GND, then determining testing parameters, setting the sizes of sensor current and luminous current according to the rated current of the light-emitting DIODE, selecting a smaller sensor current value to ensure that the light-emitting DIODE can be lightened and the heat of the light-emitting DIODE is not generated, and setting the resolution as 1mA according to the resolution of the novel thermal resistance testing device; the luminous current value is set as the rated power of the light emitting diode, during measurement, the initial temperature, the final temperature and the stepping temperature are set on a computer measurement interface, a heating or cooling mode is selected, and a start is clicked to start testing.
And storing data, disconnecting the novel thermal resistance testing device from the refrigerator, turning off a power supply and turning off the computer.
According to the principle of a JEDEC51-1 static measurement method, the input power of a light emitting diode is changed, so that the temperature of a device is changed, and a transient response curve of the temperature changing along with time is recorded in real time, thereby overcoming the defect of time delay measurement of the traditional pulse measurement method. And thermal characteristic parameters such as K coefficient, thermal resistance, heat capacity and the like can be analyzed and calculated through software, so that the thermal characteristics of the light-emitting diode can be rapidly and accurately measured.
The foregoing is a more detailed description of the present invention, taken in conjunction with the specific preferred embodiments thereof, and it is not intended that the invention be limited to the specific embodiments shown and described. To the utility model belongs to the technical field of ordinary technical personnel, do not deviate from the utility model discloses under the prerequisite of design, can also make a plurality of simple deductions or replacement, all should regard as belonging to the utility model discloses a protection scope.
Claims (9)
1. The utility model provides a novel thermal resistance test device which characterized in that: the device comprises a data control unit, a power output unit and a measuring unit, wherein the data control unit is responsible for controlling the power output unit and the measuring unit and carrying out data transmission with a computer through a USB interface (80);
the power supply output unit comprises a programmable voltage source (10) and a programmable current source (20), the programmable voltage source (10) can be switched between two set voltage values at will, the programmable current source (20) can be switched between a set current value and zero at will, the programmable voltage source (10) is provided with a voltage source output port (11), and the programmable current source (20) is provided with a current source output port;
the measuring unit comprises a sensor current source (40), a power switching module (60), a power amplifier control module (50) and a measuring channel module (70), wherein the sensor current source (40) is provided with a sensor current source port, the power switching module (60) is provided with a power switching module port (61), the measuring channel module (70) is provided with a measuring channel port, and the measuring unit is provided with a USB interface (80) for transmitting data with a computer.
2. The novel thermal resistance testing device of claim 1, characterized in that: the programmable current source (20) comprises a first programmable current source and a second programmable current source.
3. The novel thermal resistance testing device of claim 1, characterized in that: the current source output ports include a first current source output port (21) and a second current source output port (22).
4. The novel thermal resistance testing device of claim 2, characterized in that: the first programmable current source is connected to a first current source output port (21) and the second programmable current source is connected to a second current source output port (22).
5. The novel thermal resistance testing device of claim 3, characterized in that: the voltage source output port (11) is in the same column as the first current source output port (21) and the second current source output port (22).
6. The novel thermal resistance testing device of claim 1, characterized in that: the sensor current source ports include a first sensor current source port (41), a second sensor current source port (42), a third sensor current source port (43), and a fourth sensor current source port (44), the first sensor current source port (41), the second sensor current source port (42), the third sensor current source port (43), and the fourth sensor current source port (44) being in a same column.
7. The novel thermal resistance testing device of claim 1, characterized in that: the measurement channel ports include a first measurement channel port (71) and a second measurement channel port (72), the first measurement channel port (71) and the second measurement channel port (72) being located at the same height.
8. The novel thermal resistance testing device of claim 1, characterized in that: the USB interface (80) is connected with one end of a USB data line, and the other end of the USB data line is connected with a computer.
9. The novel thermal resistance testing device of claim 1, characterized in that: and a heat dissipation port (30) is formed in the side edge of the power output unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822174142.6U CN209894912U (en) | 2018-12-24 | 2018-12-24 | Novel thermal resistance testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822174142.6U CN209894912U (en) | 2018-12-24 | 2018-12-24 | Novel thermal resistance testing device |
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| Publication Number | Publication Date |
|---|---|
| CN209894912U true CN209894912U (en) | 2020-01-03 |
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| CN201822174142.6U Active CN209894912U (en) | 2018-12-24 | 2018-12-24 | Novel thermal resistance testing device |
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| CN (1) | CN209894912U (en) |
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