CN101699240B - Device and method for testing radiation performance of semiconductor lighting product - Google Patents
Device and method for testing radiation performance of semiconductor lighting product Download PDFInfo
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- CN101699240B CN101699240B CN 200910193517 CN200910193517A CN101699240B CN 101699240 B CN101699240 B CN 101699240B CN 200910193517 CN200910193517 CN 200910193517 CN 200910193517 A CN200910193517 A CN 200910193517A CN 101699240 B CN101699240 B CN 101699240B
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Abstract
The invention discloses a device for testing the radiation performance of a semiconductor lighting product, which comprises: a physical property parameter input module which collects the physical property parameters of the semiconductor lighting product; a quick radiation power tester which collects the radiation quantity data of the semiconductor lighting product; an electrical parameter generating and measuring apparatus which inputs power to the semiconductor lighting product and measures the output electrical signal of the semiconductor lighting product; a temperature tester which tests the temperature signals of the internal and external test points of the semiconductor lighting product; a variable-environment test integrating sphere which sets environmental parameters of the semiconductor lighting product; a central monitoring and processing computer which performs computing processing after receiving the parameters; and a parameter analysis and equivalent transform module which performs the uniformized conversion of optical and electrical properties and physical properties of the semiconductor lighting product and calculates the working parameters in an equivalent and standard model state. The central monitoring and processing computer output test data, curves and comprehensive analysis report according to the working parameters. In the invention, the test results can basically restore original use environment and reduce errors caused by difference in test environment.
Description
Technical field
The invention belongs to the illuminating product detection range, relate in particular to a kind of radiation performance of semiconductor lighting product pick-up unit and detection method thereof.
Background technology
White light LEDs (Light Emitting Diode), white light emitting diode is called for short white light LEDs, is a kind of semiconductor devices that electric energy can be converted into white light.The characteristics of white LED light source are: LED uses low-tension supply, and supply voltage is 6-24v, can obtain sufficiently high brightness; The energy that LED consumes reduces 80% with the incandescent lamp of light efficiency, and luminous corresponding speed is fast, and high frequency characteristics is good, can show pulse information; Volume is little, and the light-emitting area shape is divided into circle, rectangle etc., and plurality of specifications is arranged, so can make the device of different shape; Against shock and shock resistance are good, and be low in energy consumption, and thermal value is few, and power consumption is little, and the life-span is long.Because the PN junction of LED is operated in the forward conduction state, itself is low in energy consumption, as long as in addition necessary current limiting measures can be used for a long time; Environmental pollution is little, no poisonous metal mercury.
Since eighties of last century LED sixties birth, LED is from red-light LED, green light LED, and one the tunnel develops blue light, white light LEDs.By feat of advantages such as power saving, long-life, switching speed be fast are arranged, be that the semiconductor lighting technology of light source is widely used in every field with LED.It is to have one of emerging high-tech sector of development prospect this century most.As new and effective solid state light emitter, significant advantages such as that semiconductor illuminating light source has is energy-conservation, safety, environmental protection, long-life, rich color and microminiaturization, this will become the significant leap again after incandescent lamp, fluorescent light, be the new revolution of world's lighting industry.
Semiconductor lighting mainly refers to the LED illuminating product of the photochromic illumination (Landscape Lighting and decorative lighting) of LED, special-purpose general lighting, safety lighting, special lighting and general lighting light source and applied solar energy, and its market potential is huge.
Semiconductor lighting and traditional incandescent lamp, fluorescent light, high-pressure mercury lamp etc. on the principle, on the structure, the difference that has essence in the combination, therefore, on the problem of the design of semiconductor lighting product, standard formulation, to take into full account the characteristics such as foundation structure, packing forms, radiating mode, reliability of semiconductor lighting product, by formulating or revised standard carries out standard to product design and engineering proposal, thus the guiding semiconductor lighting product in order, standard, study plot come into the market.
An outstanding problem of semiconductor lighting product is a heat dissipation problem, the heat dissipation problem of special multicore sheet encapsulation or the integrated light fixture of light source module.According to the interrelated data statistics, about 70% fault is owing to heat dissipation problem causes.According to the fail-safe analysis experience of electronic system, 10 ℃ of the every risings of working temperature, reliability will be reduced to original half, this shows, and heat dissipation problem is serious is restricting the semiconductor lighting product quality.Therefore, radiation performance of semiconductor lighting product detects becomes the semiconductor lighting product quality analysis, product screening, and research and development design improvement and Standardization System are set up the important step in the process.
In the face of above problem, current not system, standard, generally acknowledged detection method.At present, do not have the semiconductor lighting product thermal behavior examination criteria and the pick-up unit of system both at home and abroad, the patent of this aspect is almost nil both at home and abroad.The patent of invention " lamp fault detection device " delivered of the people such as Ou Lege V Sai Leibuliannuofu of incorporated company of Applied Materials has for example proposed to be used for to detect the method for the lamp failure of the heat treated lamp group of Semiconductor substrate; The patent of invention that people such as Zhu Dezhong deliver " heat testing method of new LED car light luminous intensity distribution plate ", the relation of give chapter and verse LED junction temperature and forward voltage are measured luminous intensity distribution plate thermal behavior.
It more than is the present situation that present semiconductor lighting product thermal behavior detects, can not system effectively obtain radiation performance of semiconductor lighting product by present method and patent, and can't carry out thermal behavior relatively between the different structure product, these have all seriously limited research and development, manufacturing and the industrialized development of semiconductor lighting product.
Summary of the invention
At the shortcoming of prior art, the purpose of this invention is to provide a kind of radiation performance of semiconductor lighting product pick-up unit and detection method thereof, the analysis that device proposed by the invention can solve different size illuminating product thermal characteristics relatively reaches comprehensive evaluation.Formation thinking of the present invention is to serve as to measure basic point to carry out the thermal behavior parameter measurement at a plurality of links of lamp radiator for the semiconductor lighting product of different structure with the light source module, again test parameter is carried out standard light fixture model normalization equivalent transformation, carry out the thermal characteristics analysis.
For achieving the above object, technical scheme of the present invention is: a kind of radiation performance of semiconductor lighting product pick-up unit, and it comprises CSRC and process computer and the quick radiation power tester, electrical quantity generation and the measuring instrument that are connected with CSRC and process computer respectively, hygrosensor, changing environment test integrating sphere, parameter analysis and equivalent transformation module;
Physical property parameter input module is used to gather the physical characteristics parameter of conductor illuminating product;
The radiant quantity data that quick radiation power tester is used to gather semiconductor lighting product;
Electrical quantity takes place and measuring instrument is used for providing required electric power to semiconductor lighting product, measures interchange and DC parameter in the course of work of semiconductor lighting product simultaneously;
Hygrosensor is used for the temperature of inside and outside test of probing semiconductor illuminating product basic point;
Changing environment test integrating sphere is used to produce the temperature of the required environment of semiconductor lighting product;
CSRC and process computer receive above-mentioned power data, electric signal, temperature signal and environmental parameter;
Parameter analysis and equivalent transformation module are used for semiconductor lighting product photoelectric characteristic and physical characteristics are carried out the normalization conversion, extrapolate the running parameter under the equivalent mathematical model state, CSRC and process computer according to this running parameter output test data, the report of curve and analysis-by-synthesis.
This electrical quantity takes place and measuring instrument comprises input electric power, electric signal generation module, input and output voltage, current module, Feedback of Power value retaking of a year or grade module and power factor test module.
Temperature test basic point in the semiconductor lighting product is the semiconductor illuminating light source module group substrates.
This CSRC and process computer also connect a light fixture photoelectric characteristic and physical characteristics correcting module, are used for the photoelectric characteristic and the physical characteristics of the semiconductor lighting product that collects are revised.
In addition, the present invention also provides a kind of radiation performance of semiconductor lighting product detection method, and it may further comprise the steps:
(1) the physical characteristics parameter of measuring semiconductor illuminating product, gather the radiant quantity data of semiconductor lighting product by quick radiation power tester, the place mounts hygrosensor at semiconductor lighting product temperature inside test basic point, test basic point place in the semiconductor lighting product outside mounts another hygrosensor, semiconductor lighting product is connected with electrical quantity generation and measuring instrument, be used for providing required electric power, measure interchange and DC parameter in the course of work of semiconductor lighting product simultaneously to semiconductor lighting product;
(2) semiconductor lighting product is put into changing environment test integrating sphere, and made the inside and outside environment temperature stabilization of semiconductor lighting product;
(3) electrical parameter values, radiant quantity data, physical characteristics parameter value and the ambient temperature value by CSRC and process computer read semiconductor illuminating product;
(4) by CSRC and process computer triggering synchronous signal, carry out the steady state thermal characteristic test, the steady state thermal characteristic test is tested the steady temperature of respectively testing basic point by the each point hygrosensor under the environment temperature stable condition;
(5) repeating step 4～5, change the power input value, change ambient temperature conditions test multi-group data by changing environment test integrating sphere by electrical quantity generation and measuring instrument, and test specification is no more than the ultimate value under the operate as normal attitude enabled condition;
(6) set up equivalent mathematical model semiconductor lighting product photoelectric characteristic and physical characteristics are carried out the normalization conversion;
(7) according to above step test and analysis, the output semiconductor illuminating product is reported with the normalized basic point temperature data of basic point temperature value, equivalent mathematical model, curve and analysis-by-synthesis under the different input electric power conditions in the varying environment temperature.
The temperature sampling frequency of the measurement sample frequency of radiation power tester sample frequency, electrical quantity generation and measuring instrument and hygrosensor keeps synchronously fast, by CSRC and process computer synchronous triggering.
Compared with prior art, the present invention has following advantage:
The present invention has remedied the deficiency of radiation performance of semiconductor lighting product detection technique, and the detection of different structure semiconductor lighting product thermal behavior has been proposed a cover total solution.The device that the present invention proposes can not be subjected to the influence of illuminating product structure, parameter difference, under the situation that does not change the illuminating product structure, carry out the thermal characteristics test, test result can be restored environment for use substantially, thereby the error that reduces test environment difference and cause, test result has general comparability in like product simultaneously.
The pattern that the present invention adopts actual measurement, model correction and parameter equivalent to be transformed to one realizes above-mentioned novelty, compare the thermal characteristics that this device can more fully reflect semiconductor lighting product with existing method of testing, between products of different specifications, set up simultaneously the communication bridge of an assay, be beneficial to carrying out of work such as research and development, quality management, procurement of commodities, common detection, thereby embody its advance.
The radiation performance of semiconductor lighting product pick-up unit and the method for testing thereof that adopt the present invention to propose can be carried out the heat dispersion analysis to the different structure semiconductor lighting product, for the heat dissipation characteristics research of semiconductor lighting product provides effective means of testing; This device can detect according to optimize properties of product for semiconductor lighting product design provides, and can also provide effective quality analysis means with standard market for semiconductor lighting product market simultaneously.
Pick-up unit provided by the invention and detection method thereof, the heat dispersion that is suitable for all light fixtures detects, and it is more obvious to detect effect for radiation performance of semiconductor lighting product.
Description of drawings
Fig. 1 is a radiation performance of semiconductor lighting product pick-up unit synoptic diagram of the present invention;
Among the last figure, 1 is CSRC and process computer, and 2 are changing environment test integrating sphere, 3 is quick radiation power tester, and 4 for electrical quantity takes place and measuring instrument, and 5 is hygrosensor, 6 is physical property parameter input module, and 7 is parameter analysis and equivalent transformation module.
Fig. 2 is a radiation performance of semiconductor lighting product detection method schematic flow sheet of the present invention.
Embodiment
Below in conjunction with accompanying drawing the present invention is described in detail.
As shown in Figure 1, the invention provides a kind of radiation performance of semiconductor lighting product pick-up unit, it comprises CSRC and process computer 1 and the quick radiation power tester 3 that is connected with CSRC and process computer 1 respectively, electrical quantity generation and measuring instrument 4, hygrosensor 5, changing environment test integrating sphere 2, parameter analysis and equivalent transformation module 7;
Physical property parameter input module 6 is used to gather the physical characteristics parameter of conductor illuminating product; This quick radiation power tester is used to gather the radiation dose rate data of semiconductor lighting product; This electrical quantity takes place and measuring instrument is used for input electric power to semiconductor lighting product, and measures the output electric signal of semiconductor lighting product; This hygrosensor is used for the temperature signal of inside and outside test point of probing semiconductor illuminating product; This changing environment test integrating sphere is used to set the residing environment temperature of semiconductor lighting product; This CSRC and process computer receive above-mentioned power data, electric signal, temperature signal and environment temperature and physical characteristics parameter; This parameter analysis and equivalent transformation module are used for semiconductor lighting product photoelectric characteristic and physical characteristics are carried out the normalization conversion, extrapolate the normalized parameter of equivalent mathematical model, CSRC and process computer according to this running parameter output test data, the report of curve and analysis-by-synthesis.
In the present embodiment, the place is provided with the anchor clamps that are used to mount hygrosensor at the temperature test point.
Further, this electrical quantity generation and measuring instrument comprise input electrical signal generation module, input and output voltage, electric current, Feedback of Power value retaking of a year or grade module and power factor test module.
Further, the temperature test point in the semiconductor lighting product is the semiconductor illuminating light source module group substrates.
Detection method of the present invention: adopting the method for integration test and analysis to obtain the parameter testing result and the Comprehensive analysis results of product heat dispersion, is that example describes with the light fixture in the present embodiment, and its concrete testing process comprises the steps:
The physical characteristics parameter of step 1. measuring semiconductor illuminating product is as length, volume, quality etc.;
The electric input-output characteristic of step 6. CSRC and process computer read semiconductor illuminating product, light output characteristics, physical parameter characteristic and environmental characteristics parameter.
Step 8. repeating step 6～7 changes the power input value, changes ambient temperature conditions test multi-group data by changing environment test integrating sphere by electrical quantity generation and measuring instrument, and test specification is no more than the ultimate value under the operate as normal attitude enabled condition.
Step 9. is set up equivalent mathematical model semiconductor lighting product photoelectric characteristic and physical characteristics is carried out the normalization conversion, extrapolates the normalized parameter of equivalent mathematical model.
Step 10. is according to integration test and analysis, outputs test data, curve and analysis-by-synthesis report.
Can carry out the heat dispersion analysis to the different structure semiconductor lighting product by above step, for the research of the heat dissipation characteristics of semiconductor lighting product provides effective means of testing.
Pick-up unit provided by the invention and method of testing thereof, the heat dispersion that is suitable for all light fixtures detects, and it is more obvious to detect effect for radiation performance of semiconductor lighting product.
More than a kind of radiation performance of semiconductor lighting product pick-up unit provided by the present invention and method of testing thereof are described in detail, for one of ordinary skill in the art, thought according to the embodiment of the invention, part in specific embodiments and applications all can change, in sum, this description should not be construed as limitation of the present invention.
Claims (6)
1. a radiation performance of semiconductor lighting product pick-up unit is characterized in that: comprise CSRC and process computer and the quick radiation power tester, electrical quantity generation and the measuring instrument that are connected with CSRC and process computer respectively, hygrosensor, changing environment test integrating sphere, parameter analysis and equivalent transformation module;
Physical property parameter input module is used to gather the physical characteristics parameter of semiconductor lighting product;
The radiant quantity data that quick radiation power tester is used to gather semiconductor lighting product;
Electrical quantity takes place and measuring instrument is used for providing required electric power to semiconductor lighting product, measures interchange and DC parameter in the course of work of semiconductor lighting product simultaneously;
Hygrosensor is used for the temperature signal of inside and outside test of probing semiconductor illuminating product basic point;
Changing environment test integrating sphere is used to produce the required environment temperature of semiconductor lighting product;
CSRC and process computer receive above-mentioned radiant quantity data, interchange and DC parameter, temperature signal and environment temperature;
Parameter analysis and equivalent transformation module are used for semiconductor lighting product photoelectric characteristic and physical characteristics are carried out the normalization conversion, extrapolate the running parameter under the equivalent mathematical model state, CSRC and process computer according to this running parameter output test data, the report of curve and analysis-by-synthesis.
2. radiation performance of semiconductor lighting product pick-up unit according to claim 1, it is characterized in that: this electrical quantity takes place and measuring instrument comprises input electric power, electric signal generation module, input and output voltage, current module, Feedback of Power value retaking of a year or grade module and power factor test module.
3. radiation performance of semiconductor lighting product pick-up unit according to claim 1 is characterized in that: the temperature test basic point in the semiconductor lighting product is the semiconductor illuminating light source module group substrates.
4. radiation performance of semiconductor lighting product pick-up unit according to claim 1, it is characterized in that: this CSRC and process computer also connect a light fixture photoelectric characteristic and physical characteristics correcting module, are used for the photoelectric characteristic and the physical characteristics of the semiconductor lighting product that collects are revised.
5. radiation performance of semiconductor lighting product detection method is characterized in that may further comprise the steps:
(1) the physical characteristics parameter of measuring semiconductor illuminating product, gather the radiant quantity data of semiconductor lighting product by quick radiation power tester, the place mounts hygrosensor at semiconductor lighting product temperature inside test basic point, test basic point place in the semiconductor lighting product outside mounts another hygrosensor, semiconductor lighting product is connected with electrical quantity generation and measuring instrument, be used for providing required electric power, measure interchange and DC parameter in the course of work of semiconductor lighting product simultaneously to semiconductor lighting product;
(2) semiconductor lighting product is put into changing environment test integrating sphere, and made the inside and outside environment temperature stabilization of semiconductor lighting product;
(3) electrical parameter values, radiant quantity data, physical characteristics parameter value and the ambient temperature value by CSRC and process computer read semiconductor illuminating product;
(4) by CSRC and process computer triggering synchronous signal, carry out the steady state thermal characteristic test, the steady state thermal characteristic test is tested the steady temperature of respectively testing basic point by the each point hygrosensor under the environment temperature stable condition;
(5) repeating step 3～4, change the power input value, change ambient temperature conditions test multi-group data by changing environment test integrating sphere by electrical quantity generation and measuring instrument, and test specification is no more than the ultimate value under the operate as normal attitude enabled condition;
(6) set up equivalent mathematical model semiconductor lighting product photoelectric characteristic and physical characteristics are carried out the normalization conversion;
(7) according to above step test and analysis, the output semiconductor illuminating product is reported with the normalized basic point temperature data of basic point temperature value, equivalent mathematical model, curve and analysis-by-synthesis under the different input electric power conditions in the varying environment temperature.
6. radiation performance of semiconductor lighting product detection method according to claim 5, it is characterized in that: the temperature sampling frequency of the measurement sample frequency of radiation power tester sample frequency, electrical quantity generation and measuring instrument and hygrosensor keeps synchronously fast, by CSRC and process computer synchronous triggering.
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| CN 200910193517 CN101699240B (en) | 2009-10-30 | 2009-10-30 | Device and method for testing radiation performance of semiconductor lighting product |
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| CN104931231B (en) * | 2015-05-15 | 2017-12-01 | 广东省标准化研究院 | A kind of device and method of testing for being used to test light engine radiation parameter |
| CN107202678B (en) * | 2017-06-23 | 2019-04-26 | 厦门多彩光电子科技有限公司 | Quickly judge the method and lamps and lanterns temp measuring system of lamps and lanterns heat-sinking capability |
| CN109212399B (en) * | 2018-08-10 | 2021-01-01 | 全球能源互联网研究院有限公司 | Device and method for testing high-temperature electrical characteristics of semiconductor device |
| CN110471006A (en) * | 2019-08-19 | 2019-11-19 | 厦门多彩光电子科技有限公司 | A method of judging LED heat-sinking capability |
| CN110567683A (en) * | 2019-10-15 | 2019-12-13 | 浙江顺希商品检测技术有限公司 | Thermal test method for lamp |
| CN116539285B (en) * | 2023-07-06 | 2023-09-01 | 深圳市海塞姆科技有限公司 | Light source detection method, device, equipment and storage medium based on artificial intelligence |
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| CN201218832Y (en) * | 2008-06-03 | 2009-04-08 | 张九六 | LED test device |
| CN101441237A (en) * | 2007-11-19 | 2009-05-27 | 杭州浙大三色仪器有限公司 | Heat performance measuring apparatus of semiconductor lighting device |
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|---|---|---|---|---|
| CN101441237A (en) * | 2007-11-19 | 2009-05-27 | 杭州浙大三色仪器有限公司 | Heat performance measuring apparatus of semiconductor lighting device |
| CN201218832Y (en) * | 2008-06-03 | 2009-04-08 | 张九六 | LED test device |
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