CN209829618U - Integrated circuit chip defect detection device - Google Patents
Integrated circuit chip defect detection device Download PDFInfo
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- CN209829618U CN209829618U CN201920326841.XU CN201920326841U CN209829618U CN 209829618 U CN209829618 U CN 209829618U CN 201920326841 U CN201920326841 U CN 201920326841U CN 209829618 U CN209829618 U CN 209829618U
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Abstract
The utility model discloses a defect detection device for an integrated circuit chip, which comprises a base, a sorting station and a detection station, the sorting station and the detection station are sequentially arranged on the upper end surface of the base, the sorting station comprises a fixed conveyor belt and a sorting conveyor belt, a code scanner for reading chip bar code information is arranged above the fixed conveyor belt, the sorting conveyor belt is positioned between the fixed conveyor belt and the detection station and is flush with the fixed conveyor belt, a sorting platform is fixed at the bottom of the sorting conveyor belt and is rotatably arranged on the base, the base is provided with a sorting cylinder, the end part of a telescopic rod of the sorting cylinder is movably connected with one side of the sorting platform, and the sorting platform is driven to switch back and forth in the horizontal and inclined processes, and the detection station comprises a detection platform arranged on the base and a CCD camera arranged above the detection platform. The utility model discloses can reject the non-integrated circuit chip that detects, guarantee the accuracy and the stability of detecting the structure.
Description
Technical Field
The utility model relates to an integrated circuit chip defect detecting device.
Background
With the development of computer software, hardware technology and precision manufacturing technology, an integrated circuit board becomes one of indispensable essential basic elements in electronic products, the chip pin welding quality on the integrated circuit board is an important factor for evaluating the quality of the integrated circuit board, and the quality of the chip pin welding quality directly determines the quality of the integrated circuit board and the electronic products. Therefore, the integrated circuit board needs to perform a plurality of times of chip pin welding quality detection procedures in the production process. At present, the welding quality of the chip pins of the integrated circuit board is mainly detected by manual visual inspection. Firstly, whether products of other types exist in a batch or not needs to be checked, if other integrated circuit chips are mixed in the batch detection process, detection personnel cannot immediately distinguish the products, and detection waste is caused. The currently used method is to manually check the bar code on the chip, which can cause visual fatigue of the inspector. In addition, the detection personnel also observe the welding condition of the chip pins on the integrated circuit board by using a magnifying glass or a microscope to check whether welding defects such as tin welding scraps, tin beads, missing welding, continuous welding and the like exist, the method not only easily causes visual fatigue of the detection personnel, but also directly influences the accuracy and stability of the detection result due to a plurality of human factors in the detection process.
SUMMERY OF THE UTILITY MODEL
In order to overcome the defects, the utility model aims to provide an integrated circuit chip defect detecting device which can reject the non-detection integrated circuit chip, guarantee the accuracy and the stability of the detection structure.
In order to achieve the above purpose, the utility model discloses a technical scheme is: a defect detection device for an integrated circuit chip comprises a base, a sorting station and a detection station, wherein the sorting station and the detection station are sequentially arranged on the upper end surface of the base, the sorting station comprises a fixed conveyor belt and a sorting conveyor belt, a code scanner for reading chip bar code information is arranged above the fixed conveyor belt, the sorting conveyor belt is positioned between the fixed conveyor belt and the detection station and is flush with the fixed conveyor belt, a sorting platform is fixed at the bottom of the sorting conveyor belt and is rotatably arranged on the base, the base is provided with a sorting cylinder, the end part of a telescopic rod of the sorting cylinder is movably connected with one side of the sorting platform, and the sorting platform is driven to switch back and forth in the horizontal and inclined processes, and the detection station comprises a detection platform arranged on the base and a CCD camera arranged above the detection platform.
The utility model discloses integrated circuit chip defect detection device's beneficial effect is, whether utilize bar code collector to be used for detecting this batch of integrated circuit chip, letter sorting cylinder drive letter sorting conveyer belt is at the level, or to a lopsidedness, then be used for transmitting integrated circuit chip to the detection station or reject this integrated circuit chip, utilize bar code collector to replace the measurement personnel to detect whether this integrated circuit chip is to wait to detect batch, the measurement personnel work load has been reduced, whether there is the tin welding bits in the pin inspection that utilizes the CCD camera to come the chip, the tin pearl, lack to weld, even weld etc. have improved efficiency, and can not influence the accuracy and the stability of testing result because of the human factor in the testing process.
Preferably, the fixed first spliced pole that is provided with of base up end, the top of first spliced pole is provided with the draw-in groove, the draw-in groove sets up along letter sorting conveyer belt both sides extending direction, the fixed second spliced pole that is provided with in bottom of letter sorting platform, the second spliced pole inserts in the draw-in groove of first spliced pole, and both rotate through the pivot and connect. Through the cooperation of draw-in groove and pivot, realized rotating, its simple structure, simple to operate.
Preferably, the top setting of first spliced pole is circular-arc structure, does benefit to the rotation of letter sorting platform to one side for the rotation of letter sorting platform is more smooth.
Preferably, the upper end face of the sorting platform is provided with a collecting box which is positioned on the upper end face of the lower end of the inclined sorting platform, the inlet of the collecting box is positioned at the top of one side of the collecting box close to the sorting conveyor belt, and the collecting box is lower than the sorting conveyor belt. The above-mentioned structural arrangement of collecting box does benefit to the non-integrated circuit chip that waits that the collection is rejected, has reduced detection personnel's work load.
Preferably, in order to further ensure the stability of the sorting platform when the sorting platform is horizontal or inclined to one side, a plurality of springs are arranged between the sorting platform and the base, and the springs are distributed on two sides of the first connecting column.
Preferably, the telescopic link tip of letter sorting cylinder passes through movable assembly swing joint with one side of letter sorting platform, the movable assembly including set up in the slide rail of letter sorting platform bottom, with slide rail sliding fit's slider, one end and the slider rotate the connecting plate of being connected, the other end of connecting plate and the telescopic link tip of letter sorting cylinder rotate to be connected. The sorting cylinder reciprocates through the effect telescopic link, and the connecting plate rotates, and the slider makes a round trip to slide on the slide rail simultaneously, and the direction that finally acts on the sorting platform and makes a round trip to switch at level/to the lopsidedness.
Preferably, a servo motor is arranged on the base, and an output shaft of the servo motor faces upwards and is fixedly connected with the bottom of the detection platform. The servo motor controls the detection platform to rotate, and can detect the pins of a plurality of directions of the integrated circuit chip to be detected on the detection conveyor belt.
Preferably, the upper end face of the detection platform is fixedly provided with a detection conveyor belt, so that the detected integrated circuit chip can be conveyed to the next station conveniently.
Preferably, the detection platform is provided with stop blocks, and the stop blocks are distributed on two sides of the detection conveyor belt. The phenomenon that the integrated circuit chip to be detected is separated from the conveyor belt to be detected due to the fact that the detection conveyor belt rotates too violently when the detection platform drives the detection conveyor belt to rotate is avoided.
Drawings
The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description serve to explain the invention and not to limit the invention.
In the drawings:
FIG. 1 is a schematic structural view of the present embodiment;
FIG. 2 is an enlarged view of the sorting station of FIG. 1;
fig. 3 is a schematic structural view of the sorting platform in this embodiment after being tilted to one side.
Detailed Description
The following detailed description of the preferred embodiments of the present invention, taken in conjunction with the accompanying drawings, will make the advantages and features of the present embodiments more readily understandable to those skilled in the art, and thus will more clearly define the scope of the present embodiments.
As shown in fig. 1-3, the present embodiment provides a defect detection apparatus for an integrated circuit chip, which comprises a base 1, a sorting station, and a detection station, wherein the sorting station and the detection station are sequentially disposed on an upper end surface of the base 1, the integrated circuit chip to be detected is sequentially sorted and defect-detected, the sorting station comprises a fixed conveyor 2 and a sorting conveyor 3, a code scanner 4 for reading bar code information of the chip is disposed above the fixed conveyor 2, the code scanner 4 is fixed above the fixed conveyor 2 through a bracket, the sorting conveyor 3 is disposed between the fixed conveyor 2 and the detection station and is flush with the fixed conveyor 2, the integrated circuit chip to be detected is conveyed to the sorting conveyor 3 along with the fixed conveyor 2, a sorting platform 5 is fixed at the bottom of the sorting conveyor 3, the sorting platform 5 is rotatably disposed on the base 1, a sorting cylinder 6 is disposed on the base 1, 15 tip of telescopic link of letter sorting cylinder 6 and one side swing joint of letter sorting platform 5, and drive letter sorting platform 5 is at the level, the switching back and forth of slope in-process, the detection station is including setting up testing platform 7 on base 1 and setting up the CCD camera 8 of passing through the support fixed in testing platform 7 top, detect the batch that the integrated circuit chip was waited to detect when bar code scanner 4, then 15 drive letter sorting platforms 5 of telescopic link of letter sorting cylinder 6 are at the horizontality, letter sorting conveyer belt 3 will wait to detect the integrated circuit chip transmission to testing platform 7, utilize CCD camera 8 to carry out the defect detection to it. When the code scanner 4 detects that the integrated circuit chips are not to be detected in batches, the telescopic rod 15 of the sorting cylinder 6 drives the sorting platform 5 to incline to one side, and the integrated circuit chips are removed by the sorting conveyor belt 3.
The sorting platform 5 of the present embodiment is rotatably disposed on the base 1 and has the following specific structure: the fixed first spliced pole 9 that is provided with of base 1 up end, the top of first spliced pole 9 is provided with the draw-in groove, the draw-in groove sets up along 3 both sides extending direction of letter sorting conveyer belt, the fixed second spliced pole 10 that is provided with in bottom of letter sorting platform 5, second spliced pole 10 inserts in the draw-in groove of first spliced pole 9, and both rotate through pivot 11 and connect, the draw-in groove can supply second spliced pole 10 to revolute 11 axles and rotate 40-90, then drive letter sorting platform 5 and revolute 11 axles and rotate, in order to do benefit to the rotation, the top setting of first spliced pole 9 is circular-arc structure.
The upper end face of the sorting platform 5 may be provided with a collecting bin 12, the collecting bin 12 being located at the upper end face of the lower end of the inclined sorting platform 5, the inlet 13 of the collecting bin 12 being located at the top of the side of the collecting bin 12 close to the sorting conveyor 3, the collecting bin 12 being lower than the sorting conveyor 3. The rejected integrated circuit chips slide down from the sorting conveyor belt 3 into the collection box 12 to play a role in collection.
In order to ensure the stability of the sorting platform 4, a plurality of springs 14 are arranged between the sorting platform 5 and the base 1, and the springs 14 are distributed on two sides of the first connecting column 9.
Wherein, the 15 tip of telescopic link of letter sorting cylinder 6 passes through movable assembly swing joint with one side of letter sorting platform 5, and the movable assembly is including setting up at the slide rail 16 of letter sorting platform 5 bottom, with slide rail 16 sliding fit's slider 17, one end and slider 17 rotate the connecting plate 18 of being connected, and the other end of connecting plate 18 rotates with the 15 tip of telescopic link of letter sorting cylinder 6 to be connected.
In order to detect all directions of the pins of the integrated circuit chip, a servo motor 19 is arranged on the base 1, and an output shaft of the servo motor 19 faces upwards and is fixedly connected with the bottom of the detection platform 7. The CCD camera 8 is fixed, and the servo motor 19 controls the detection platform 7 to rotate back and forth, so that the integrated circuit chip on the detection platform 7 can carry out multi-directional detection.
In order to facilitate the collection of the detected integrated circuit chips, the upper end face of the detection platform 7 in the embodiment is fixed with the detection conveyor belt 20, the detection conveyor belt 20 is flush with the sorting conveyor belt 3, and the integrated circuit chips can be transported to the upper surface of the detection conveyor belt 20 from the detection conveyor belt 20. In order to prevent the ic chip from sliding to the two sides of the detection conveyor 20 during the rotation of the detection platform 7, the detection platform 7 is provided with stoppers 21, and the stoppers 21 are distributed on the two sides of the detection conveyor 20.
The above embodiments are provided only for illustrating the technical concepts and features of the present invention, and the purpose of the present invention is to enable those skilled in the art to understand the content of the present embodiment and implement the same, so that the scope of the present embodiment should not be limited thereby, and all equivalent changes and modifications made according to the spirit of the present embodiment should be covered by the scope of the present embodiment.
Claims (9)
1. An integrated circuit chip defect detection device, characterized by: the chip bar code sorting machine comprises a base (1), a sorting station and a detection station, wherein the sorting station and the detection station are sequentially arranged on the upper end face of the base (1), the sorting station comprises a fixed conveying belt (2) and a sorting conveying belt (3), a code scanner (4) for reading chip bar code information is arranged above the fixed conveying belt (2), the sorting conveying belt (3) is positioned between the fixed conveying belt (2) and the detection station and is flushed with the fixed conveying belt (2), a sorting platform (5) is fixed at the bottom of the sorting conveying belt (3), the sorting platform (5) is rotatably arranged on the base (1), a sorting cylinder (6) is arranged on the base (1), the end part of a telescopic rod of the sorting cylinder (6) is movably connected with one side of the sorting platform (5) and drives the sorting platform (5) to switch back and forth in the horizontal and inclined processes, the detection station comprises a detection platform (7) arranged on the base (1) and a CCD camera (8) arranged above the detection platform (7).
2. The integrated circuit chip defect detection device of claim 1, wherein: the fixed first spliced pole (9) that is provided with of base (1) up end, the top of first spliced pole (9) is provided with the draw-in groove, the draw-in groove sets up along letter sorting conveyer belt (3) both sides extending direction, the fixed second spliced pole (10) that is provided with in bottom of letter sorting platform (5), second spliced pole (10) insert in the draw-in groove of first spliced pole (9), and both rotate through pivot (11) and connect.
3. The integrated circuit chip defect detection device of claim 2, wherein: the top of the first connecting column (9) is arranged to be of an arc-shaped structure.
4. The integrated circuit chip defect detection device of claim 2, wherein: the sorting device is characterized in that a collecting box (12) is arranged on the upper end face of the sorting platform (5), the collecting box (12) is located on the upper end face of the lower end of the inclined sorting platform (5), an inlet (13) of the collecting box (12) is located on the top of one side of the collecting box (12) close to the sorting conveyor belt (3), and the collecting box (12) is lower than the sorting conveyor belt (3).
5. The integrated circuit chip defect detection device of claim 2, wherein: a plurality of springs (14) are arranged between the sorting platform (5) and the base (1), and the springs (14) are distributed on two sides of the first connecting column (9).
6. The integrated circuit chip defect detection device of claim 1, wherein: the utility model discloses a letter sorting machine, including letter sorting platform (5), movable assembly swing joint is passed through to one side of telescopic link (15) tip and letter sorting platform (5) of letter sorting cylinder (6), movable assembly including set up slide rail (16) in letter sorting platform (5) bottom, with slide rail (16) sliding fit's slider (17), connecting plate (18) that one end and slider (17) rotate to be connected, the other end of connecting plate (18) rotates with telescopic link (15) tip of letter sorting cylinder (6) to be connected.
7. The integrated circuit chip defect detection device of claim 1, wherein: be provided with servo motor (19) on base (1), servo motor (19)'s output shaft is up and is connected fixedly with the bottom of testing platform (7).
8. The integrated circuit chip defect detection device of claim 7, wherein: and a detection conveyor belt (20) is fixed on the upper end face of the detection platform (7).
9. The integrated circuit chip defect detection device of claim 8, wherein: the detection platform (7) is provided with stop blocks (21), and the stop blocks (21) are distributed on two sides of the detection conveyor belt (20).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920326841.XU CN209829618U (en) | 2019-03-14 | 2019-03-14 | Integrated circuit chip defect detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920326841.XU CN209829618U (en) | 2019-03-14 | 2019-03-14 | Integrated circuit chip defect detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209829618U true CN209829618U (en) | 2019-12-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920326841.XU Expired - Fee Related CN209829618U (en) | 2019-03-14 | 2019-03-14 | Integrated circuit chip defect detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209829618U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114405839A (en) * | 2021-12-22 | 2022-04-29 | 徐州盛科半导体科技有限公司 | Intelligent defect detection equipment for packaged chip |
-
2019
- 2019-03-14 CN CN201920326841.XU patent/CN209829618U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114405839A (en) * | 2021-12-22 | 2022-04-29 | 徐州盛科半导体科技有限公司 | Intelligent defect detection equipment for packaged chip |
| CN114405839B (en) * | 2021-12-22 | 2023-12-19 | 徐州盛科半导体科技有限公司 | Intelligent defect detection equipment for packaged chip |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20191224 Termination date: 20210314 |
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| CF01 | Termination of patent right due to non-payment of annual fee |