CN209182443U - A kind of inverted light-emitting diode (LED) test equipment - Google Patents
A kind of inverted light-emitting diode (LED) test equipment Download PDFInfo
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- CN209182443U CN209182443U CN201821476314.9U CN201821476314U CN209182443U CN 209182443 U CN209182443 U CN 209182443U CN 201821476314 U CN201821476314 U CN 201821476314U CN 209182443 U CN209182443 U CN 209182443U
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- guide rail
- mounting portion
- mounting
- led
- emitting diode
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Abstract
The utility model discloses a kind of inverted light-emitting diode (LED) test equipments.The inverted light-emitting diode (LED) test equipment includes test department, and the test department includes that the first mounting portion is provided with the first guide rail and the second guide rail；First guide rail is parallel to the second guide rail；The first mounting hole is provided between first guide rail and the second guide rail；Bearing material portion, while it being connected to the first guide rail and the second guide rail, so that bearing material portion is moved relative to the first mounting portion along first direction；Ball component is integrated, first mounting hole is installed on；Replace the conventional mode that cantilever beam is set in the first mounting portion in such a way that the first mounting hole is arranged in the first mounting portion, cantilever beam structure is susceptible to the interference of vibration equipment, to influence the optical parameter test of LED grain；Bearing material portion can move to the position of positive corresponding integrating sphere component along first direction.
Description
Technical field
The utility model relates to a kind of inverted light-emitting diode (LED) test equipments.
Background technique
The LED grain of upside-down mounting, electrode tip deviate from luminous end, in order to which convenient test needs for probe to be mounted above and electrode
Contact, so that luminous end is downward, in order to test the optical parameter of LED grain, needs for integrating sphere to be mounted on the lower section of wafer-supporting platform.
Existing technical solution is one cantilever mechanism of installation, installs integrating sphere relative to the side of wafer-supporting platform；Due to being
Cantilever design, integrating sphere easily change receipts optical position because of vibration equipment.
Utility model content
Cantilever mechanism influence optical parameter test is installed to solve the problem of that existing flip LED crystal grain tests integrating sphere；This reality
A kind of inverted light-emitting diode (LED) test equipment is proposed with novel.
The technical solution of the utility model are as follows: a kind of 1. inverted light-emitting diode (LED) test equipments, including test department, the survey
Examination portion includes,
First mounting portion is provided with the first guide rail and the second guide rail；First guide rail is parallel to the second guide rail；Described
The first mounting hole is provided between one guide rail and the second guide rail；
Bearing material portion, while it being connected to the first guide rail and the second guide rail, enable bearing material portion relative to the first mounting portion along
The movement of one direction；
Ball component is integrated, first mounting hole is installed on.
Further, the integral ball component includes,
Integrating sphere, for collecting light；
First adjustment portion across first mounting hole and is connected to first mounting portion；
The integrating sphere is connected to first adjustment portion；By adjusting first adjustment portion, integrating sphere is made to pass through institute
The first mounting hole is stated to move relative to bearing material portion.
Further, first adjustment portion includes,
Second mounting portion, for installing integrating sphere；
Third mounting portion is installed on the first mounting portion；Third mounting portion and the second mounting portion pass through simultaneously third guide rail and
Cylinder connection is driven, in the case where driving cylinder action, second mounting portion is transported relative to the third mounting portion along third guide rail
It is dynamic.
Further, the driving cylinder is substituted for electric motor driven screw mechanism.
Further, first mounting hole is "convex" shaped；
The third mounting portion includes guide portion and fitting mounting portion, and the guide portion vertically connects relative to fitting mounting portion
It connects；
The guide portion is bonded first inner wall of the hole installing, and the fitting mounting portion is bonded and is connected to first peace
Dress portion.
Further, reinforcement part is connected to the guide portion and fitting mounting portion simultaneously.
Further, first mounting hole includes small hole portion and big hole portion；
The guide portion passes through the small hole portion of the first mounting hole；
The integrating sphere passes through the big hole portion of the first mounting hole.
Further, the test department includes the first driving portion, while being connected to first mounting portion and bearing material portion, is used
It is moved in the driving bearing material portion relative to first mounting portion.
Further, first driving part is between the first guide rail and the second guide rail.
Further, the bearing material portion includes,
4th mounting portion is connected to the first guide rail and the second guide rail；
Admittedly platform is expected, for fixing material；Admittedly the material platform is connected to the 4th mounting portion by screw rod sliding rail, described to expect platform admittedly
It can be moved in a second direction relative to the 4th mounting portion.
The utility model has the beneficial effects that: replacing routine to exist in such a way that the first mounting hole is arranged in the first mounting portion
The mode of cantilever beam is arranged in first mounting portion, and cantilever beam structure is susceptible to the interference of vibration equipment, to influence LED grain
Optical parameter test；Bearing material portion can move to the position of positive corresponding integrating sphere component along first direction.
Detailed description of the invention
Fig. 1 is the utility model inverted light-emitting diode (LED) test equipment structural schematic diagram；
Fig. 2 is the first visual angle of test department schematic diagram；
Fig. 3 is the second visual angle of test department schematic diagram；
Fig. 4 is integrating sphere component structure diagram；
Fig. 5 is bearing material portion structural schematic diagram.
Specific embodiment
For convenient for those skilled in the art understand that the technical solution of the utility model, below by the technical side of the utility model
Case is described in further detail in conjunction with specific embodiments.
As shown in Figure 1, Figure 2, shown in Fig. 3, Fig. 4 and Fig. 5, a kind of inverted light-emitting diode (LED) test equipment 100, including test department
20, for realizing the optical parameter and electric parameters testing to LED grain, the test department 20 includes,
First mounting portion 21 is provided with the first guide rail 221 and the second guide rail 222；First guide rail 221 is parallel to second
Guide rail 222；The first mounting hole 211 is provided between first guide rail 221 and the second guide rail 222；
Bearing material portion 23, while it being connected to the first guide rail 221 and the second guide rail 222, enable bearing material portion 23 relative to first
Mounting portion 21 is moved along first direction a, limits first direction a jointly by the first guide rail 221 and the second guide rail 222, use is multiple
Guide rail (including the first guide rail 221 and second guide rail 222) is conducive to bearing material portion 23 and moves steadily；
Ball component 24 is integrated, first mounting hole 211 is installed on, the first mounting hole is arranged by the first mounting portion 21
211 mode replaces the conventional mode in the first mounting portion 21 setting cantilever beam, and cantilever beam structure is susceptible to vibration equipment
Interference, to influence the optical parameter test of LED grain；Bearing material portion 23 can move to positive corresponding integrating sphere group along first direction a
The position of part 24.
As shown in Figure 1, Figure 2, shown in Fig. 3, Fig. 4 and Fig. 5, the integral ball component 24 includes integrating sphere 241, for collecting light
Line, connection optical parameter test equipment realize the test to LED grain optical parameter；First adjustment portion 242 passes through first installation
Hole 211 is simultaneously connected to first mounting portion 21, makes to integrate ball component 24 from the installation of the bottom of the first mounting portion 21, to reduce
The space that indwelling is needed above first mounting portion 21 is easy to implement the miniaturization of inverted light-emitting diode (LED) test equipment 100；The product
Bulb separation 241 is connected to first adjustment portion 242；By adjusting first adjustment portion 242, pass through integrating sphere 241 described
First mounting hole 211 is moved relative to bearing material portion 23, convenient for installation, disassembly and the adjustment of the integrating sphere 241.
As shown in Figure 1, Figure 2, shown in Fig. 3, Fig. 4 and Fig. 5, first adjustment portion 242 includes that the second mounting portion 2421 is used for
Integrating sphere 241 is installed；Third mounting portion 2422 is installed on the first mounting portion 21；Third mounting portion 2422 and the second mounting portion
2421 are connected by third guide rail 2423 and driving cylinder 2424 simultaneously, in the case where driving cylinder 2424 acts on, second installation
Portion 2421 is moved relative to the third mounting portion 2422 along third guide rail 2423, to realize integrating sphere 241 relative to first
The controllable adjustment of mounting portion 21, it is easy to adjust, safe and reliable.
As shown in Figure 1, Figure 2, shown in Fig. 3, Fig. 4 and Fig. 5, the driving cylinder 2424 is substituted for electric motor driven screw mechanism；When
Right the present embodiment is not limited to above two scheme, for can be realized the energy such as the scheme of linear drives, such as linear motor
Enough technical solutions being equal with above scheme should also belong to the present embodiment disclosure.
As shown in Figure 1, Figure 2, shown in Fig. 3, Fig. 4 and Fig. 5, first mounting hole 211 is "convex" shaped；The third mounting portion
2422 include guide portion 24221 and fitting mounting portion 24222, and the guide portion 24221 is vertical relative to fitting mounting portion 24222
Connection meets limit and requires and fix to require；The guide portion 24221 is bonded 211 inner wall of the first mounting hole, realizes limit
Function；The fitting mounting portion 24222 is bonded and is connected to first mounting portion 21, realizes the fixation of the first adjustment portion 242；
By orthogonal limit and connection, it can more preferably guarantee the stability of 242 mounting structure of the first adjustment portion.
As shown in Figure 1, Figure 2, shown in Fig. 3, Fig. 4 and Fig. 5, reinforcement part 24223 is connected to the guide portion 24221 and fitting simultaneously
Mounting portion 24222 leads portion 24221 described in enhancing and is bonded the stability of self structure between mounting portion 24222, reinforcement part
24223 have the effect of reinforcing rib.
As shown in Figure 1, Figure 2, shown in Fig. 3, Fig. 4 and Fig. 5, first mounting hole 211 includes small hole portion and big hole portion, described big
Both hole portion and small hole portion mutually as reference, do not limit specific size；The guide portion 24221 passes through the first mounting hole
211 small hole portions；The integrating sphere 241 passes through the big hole portion of first mounting hole 211；In order under the premise of meeting requirement
The size and weight for reducing the first adjustment portion 242 are arranged to 24221 width of guide portion less than 241 diameter of integrating sphere；First is adjusted
Section portion 242 is connected across small hole portion, and integrating sphere 241 can be passed through by big hole portion, to guarantee that the first adjustment portion 242 has limit
Bit function, installation personnel also can judge installation direction by the simple structure, to prevent setup error.
As shown in Figure 1, Figure 2, shown in Fig. 3, Fig. 4 and Fig. 5, the test department 20 includes the first driving portion 25, while being connected to institute
The first mounting portion 21 and bearing material portion 23 are stated, for driving the bearing material portion 23 to move relative to first mounting portion 21；It realizes
Bearing material portion 23 is adjustable relative to 21 position of the first mounting portion, meets 23 position regulatory demand of bearing material portion.
As shown in Figure 1, Figure 2, shown in Fig. 3, Fig. 4 and Fig. 5, first driving portion 25 is located at the first guide rail 221 and the second guide rail
Between 222, steady adjusting is moved to bearing material portion 23 to realize, kinematic accuracy is high, improves inverted light-emitting diode (LED) test equipment
100 adjustability.
As shown in Figure 1, Figure 2, shown in Fig. 3, Fig. 4 and Fig. 5, the bearing material portion 23 includes that the 4th mounting portion 231 is connected to first
Guide rail 221 and the second guide rail 222；
Admittedly platform 232 is expected, for fixing material；Admittedly the material platform 232 is connected to the 4th mounting portion 231 by screw rod sliding rail,
Admittedly the material platform 232 can b be moved in a second direction relative to the 4th mounting portion 231；To which material platform 232 admittedly is relative to the
Four mounting portions 231 b in a second direction, and the 4th mounting portion 231 has the movement of first direction a relative to the first mounting portion 21, puts
The material being placed on solid material platform 232 can generate the conjunction fortune of the first direction a and second direction b relative to the first mounting portion 21
It is dynamic；The first direction a is perpendicular to second direction b, to realize that material is being parallel to the flat of first direction a and second direction b
In-plane moving；Admittedly the material platform 232 is provided with delineation device far from the side of the first mounting portion 21, so as to realize to upside-down mounting
The test of LED grain；Admittedly the material platform 232 is additionally provided with formal dress integrating sphere far from the side of the first mounting portion 21, so as to
Meet and the optical parameter of forward LED crystal grain is tested, expands the use scope of the inverted light-emitting diode (LED) test equipment 100.
It is the preferred embodiment of the utility model above, is not used in the restriction protection scope of the utility model.It should approve,
Those skilled in the art made non-creative deformation and change after understanding technical solutions of the utility model, should also belong to
The protection of the utility model and scope of disclosure.
Claims (10)
1. a kind of inverted light-emitting diode (LED) test equipment (100), including test department (20), it is characterised in that: the test department
(20) include,
First mounting portion (21) is provided with the first guide rail (221) and the second guide rail (222)；First guide rail (221) is parallel to
Second guide rail (222)；The first mounting hole (211) are provided between first guide rail (221) and the second guide rail (222)；
Bearing material portion (23), while being connected to the first guide rail (221) and the second guide rail (222) makes bearing material portion (23) can be relative to
First mounting portion (21) is moved along first direction (a)；
It integrates ball component (24), is installed on first mounting hole (211).
2. inverted light-emitting diode (LED) test equipment (100) according to claim 1, it is characterised in that:
The integral ball component (24) includes,
Integrating sphere (241), for collecting light；
First adjustment portion (242) passes through first mounting hole (211) and is connected to first mounting portion (21)；
The integrating sphere (241) is connected to first adjustment portion (242)；By adjusting first adjustment portion (242), make to accumulate
Bulb separation (241) passes through first mounting hole (211) and moves relative to bearing material portion (23).
3. inverted light-emitting diode (LED) test equipment (100) according to claim 2, it is characterised in that: described first is adjusted
Portion (242) includes,
Second mounting portion (2421), for installing integrating sphere (241)；
Third mounting portion (2422) is installed on the first mounting portion (21)；Third mounting portion (2422) and the second mounting portion (2421)
Simultaneously by third guide rail (2423) and driving cylinder (2424) connection, under driving cylinder (2424) effect, second peace
Dress portion (2421) is moved relative to the third mounting portion (2422) along third guide rail (2423).
4. inverted light-emitting diode (LED) test equipment (100) according to claim 3, it is characterised in that: the driving cylinder
(2424) it is substituted for electric motor driven screw mechanism.
5. inverted light-emitting diode (LED) test equipment (100) according to claim 3, it is characterised in that: first installation
Hole (211) is "convex" shaped；
The third mounting portion (2422) includes guide portion (24221) and fitting mounting portion (24222), the guide portion
(24221) it is vertically connected relative to fitting mounting portion (24222)；
The guide portion (24221) is bonded the first mounting hole (211) inner wall, and fitting mounting portion (24222) fitting is simultaneously
It is connected to first mounting portion (21).
6. inverted light-emitting diode (LED) test equipment (100) according to claim 5, it is characterised in that: reinforcement part (24223)
It is connected to the guide portion (24221) and fitting mounting portion (24222) simultaneously.
7. inverted light-emitting diode (LED) test equipment (100) according to claim 5 or 6, it is characterised in that:
First mounting hole (211) includes small hole portion and big hole portion；
The guide portion (24221) passes through the first mounting hole (211) small hole portion；
The integrating sphere (241) passes through the big hole portion of first mounting hole (211).
8. inverted light-emitting diode (LED) test equipment (100) according to claim 1, it is characterised in that:
The test department (20) includes the first driving portion (25), while being connected to first mounting portion (21) and bearing material portion
(23), for driving the bearing material portion (23) to move relative to first mounting portion (21).
9. inverted light-emitting diode (LED) test equipment (100) according to claim 8, it is characterised in that: first driving
Portion (25) is between the first guide rail (221) and the second guide rail (222).
10. inverted light-emitting diode (LED) test equipment (100) according to claim 1, it is characterised in that: the bearing material portion
(23) include,
4th mounting portion (231) is connected to the first guide rail (221) and the second guide rail (222)；
Admittedly expecting platform (232), for fixing material；Admittedly material platform (232) is connected to the 4th mounting portion by screw rod sliding rail
(231), material platform (232) admittedly can move in a second direction (b) relative to the 4th mounting portion (231).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821476314.9U CN209182443U (en) | 2018-09-10 | 2018-09-10 | A kind of inverted light-emitting diode (LED) test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821476314.9U CN209182443U (en) | 2018-09-10 | 2018-09-10 | A kind of inverted light-emitting diode (LED) test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209182443U true CN209182443U (en) | 2019-07-30 |
Family
ID=67359418
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821476314.9U Active CN209182443U (en) | 2018-09-10 | 2018-09-10 | A kind of inverted light-emitting diode (LED) test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209182443U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111352009A (en) * | 2020-04-20 | 2020-06-30 | 台州市椒江南屯电子有限公司 | Diode breakdown voltage detection equipment |
| CN113639859A (en) * | 2021-08-25 | 2021-11-12 | 扬州和铵半导体有限公司 | Photoelectric testing device for LED packaging |
-
2018
- 2018-09-10 CN CN201821476314.9U patent/CN209182443U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111352009A (en) * | 2020-04-20 | 2020-06-30 | 台州市椒江南屯电子有限公司 | Diode breakdown voltage detection equipment |
| CN111352009B (en) * | 2020-04-20 | 2020-11-27 | 贵州电网有限责任公司 | Diode breakdown voltage detection equipment |
| CN113639859A (en) * | 2021-08-25 | 2021-11-12 | 扬州和铵半导体有限公司 | Photoelectric testing device for LED packaging |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 518172 Longgang District, Shenzhen City, Guangdong Province Patentee after: Silicon electric semiconductor equipment (Shenzhen) Co., Ltd Address before: 518172 Longgang District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN SIDEA SEMICONDUCTOR EQUIPMENT Co.,Ltd. |