CN111352009B - Diode breakdown voltage detection equipment - Google Patents
Diode breakdown voltage detection equipment Download PDFInfo
- Publication number
- CN111352009B CN111352009B CN202010312765.4A CN202010312765A CN111352009B CN 111352009 B CN111352009 B CN 111352009B CN 202010312765 A CN202010312765 A CN 202010312765A CN 111352009 B CN111352009 B CN 111352009B
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- China
- Prior art keywords
- cavity
- end wall
- fixedly arranged
- diode
- motor
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/129—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of components or parts made of semiconducting materials; of LV components or parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Abstract
Description
Claims (5)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010312765.4A CN111352009B (en) | 2020-04-20 | 2020-04-20 | Diode breakdown voltage detection equipment |
JP2020121003A JP2021173741A (en) | 2020-04-20 | 2020-07-15 | Device for measuring diode breakdown voltage |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010312765.4A CN111352009B (en) | 2020-04-20 | 2020-04-20 | Diode breakdown voltage detection equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
CN111352009A CN111352009A (en) | 2020-06-30 |
CN111352009B true CN111352009B (en) | 2020-11-27 |
Family
ID=71193302
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010312765.4A Active CN111352009B (en) | 2020-04-20 | 2020-04-20 | Diode breakdown voltage detection equipment |
Country Status (2)
Country | Link |
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JP (1) | JP2021173741A (en) |
CN (1) | CN111352009B (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112611948B (en) * | 2020-12-29 | 2022-06-21 | 深圳市丰颜光电有限公司 | Light-emitting diode product inspection device |
CN112578256B (en) * | 2021-01-12 | 2022-05-24 | 广东宝元通检测设备有限公司 | Diode high temperature environment operating condition check out test set |
CN112904168B (en) * | 2021-01-13 | 2021-10-29 | 深圳市灿升实业发展有限公司 | Semiconductor breakdown voltage detection device |
CN114325191B (en) * | 2021-12-30 | 2023-07-14 | 江苏商贸职业学院 | Electrical interface detection and maintenance device and detection and maintenance method thereof |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2746794A1 (en) * | 2011-09-22 | 2014-06-25 | Tokyo Electron Limited | Probe apparatus |
CN109713857A (en) * | 2018-12-29 | 2019-05-03 | 浙江方德机器人系统技术有限公司 | A kind of small motor rotor automatic assembling and test macro, method and storage medium |
CN109932628A (en) * | 2019-04-10 | 2019-06-25 | 益阳市开元电子有限公司 | A kind of capacitor performance automatic testing equipment |
CN209182443U (en) * | 2018-09-10 | 2019-07-30 | 深圳市矽电半导体设备有限公司 | A kind of inverted light-emitting diode (LED) test equipment |
CN210323263U (en) * | 2020-01-08 | 2020-04-14 | 深圳市顺达宏基电子有限公司 | SMD (surface mounted device) light-emitting diode and full-automatic accurate material detection equipment |
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2020
- 2020-04-20 CN CN202010312765.4A patent/CN111352009B/en active Active
- 2020-07-15 JP JP2020121003A patent/JP2021173741A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2746794A1 (en) * | 2011-09-22 | 2014-06-25 | Tokyo Electron Limited | Probe apparatus |
CN209182443U (en) * | 2018-09-10 | 2019-07-30 | 深圳市矽电半导体设备有限公司 | A kind of inverted light-emitting diode (LED) test equipment |
CN109713857A (en) * | 2018-12-29 | 2019-05-03 | 浙江方德机器人系统技术有限公司 | A kind of small motor rotor automatic assembling and test macro, method and storage medium |
CN109932628A (en) * | 2019-04-10 | 2019-06-25 | 益阳市开元电子有限公司 | A kind of capacitor performance automatic testing equipment |
CN210323263U (en) * | 2020-01-08 | 2020-04-14 | 深圳市顺达宏基电子有限公司 | SMD (surface mounted device) light-emitting diode and full-automatic accurate material detection equipment |
Also Published As
Publication number | Publication date |
---|---|
JP2021173741A (en) | 2021-11-01 |
CN111352009A (en) | 2020-06-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Fang Xi Inventor after: Zhang Yuhong Inventor after: Yu Qun Inventor after: Xie Zifang Inventor after: Yang Yang Inventor after: Zheng Wen Inventor after: Liao Yi Inventor after: Zhao Yun Inventor before: Zhao Yun |
|
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20201109 Address after: 550002 17 Binhe Road, Nanming District, Guiyang City, Guizhou Province Applicant after: GUIZHOU POWER GRID Corp. Address before: 318000 No. 391 Huangjiao Village, Zhang'an Street, Jiaojiang District, Taizhou City, Zhejiang Province Applicant before: Taizhou Jiaojiang Nantun Electronics Co.,Ltd. |
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GR01 | Patent grant | ||
GR01 | Patent grant |