CN208239583U - A kind of ageing tester and system of active light module - Google Patents
A kind of ageing tester and system of active light module Download PDFInfo
- Publication number
- CN208239583U CN208239583U CN201820913977.6U CN201820913977U CN208239583U CN 208239583 U CN208239583 U CN 208239583U CN 201820913977 U CN201820913977 U CN 201820913977U CN 208239583 U CN208239583 U CN 208239583U
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- CN
- China
- Prior art keywords
- light module
- active light
- axis track
- ageing tester
- socket
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Abstract
The utility model provides the ageing tester and system of a kind of active light module, the ageing tester of the active light module includes: bottom plate, rail assembly, optical detector and power-up socket, the rail assembly and power-up socket are respectively arranged on the bottom plate, and the optical detector is set to the top of the power-up socket by the rail assembly.The utility model can the burn-in board to active light module directly carry out automatic burn-in test, the optical power value size of direct detection to active light module so that test data is more authentic and valid, convenient for the analysis and screening after aging；And by the mutual cooperation between rail assembly, power-up socket and support component, so that position location and height and position are more accurate, VCSEL vertical-cavity surface-emitting diode array and its binding gold thread will not be damaged by pressure；The utility model can effectively improve production and testing efficiency, very well satisfy the needs of industrialized production.
Description
Technical field
It include the active light the utility model relates to a kind of ageing tester of active light module more particularly to one kind
The aging testing system of the ageing tester of module.
Background technique
In active light module, multi-mode optical module (single channel/multichannel) needs to complete after completing chip attachment and gold thread binding
Light emitting chip and high temperature are powered on aging process, and light emitting chip passes through aging, and photoelectric characteristic can tend to be steady, and are conducive to light and believe
Number stablize transmission.
Wherein, as shown in Figure 4 and Figure 5, concurrent multimode optical module includes PCBA supporting element 1000, the PCBA supporting element 1000
It is pasted with VCSEL vertical-cavity surface-emitting diode array 1010, PD photodiode array 1020, laser driver chip
1040 and amplifier chip 1030；This PCBA supporting element for being pasted with VCSEL vertical-cavity surface-emitting diode array 1010
1000, chip length is less than 1mm, is not easy to realize this process flow under bare chip state, therefore is not easy to add before supplied materials
Voltage ageing, i.e. VCSEL vertical-cavity surface-emitting diode array 1010 need to mounted with after gold thread binding, just be convenient for power-up aging,
So, how to realize that the burn-in test of automation just becomes one of the key for improving its production efficiency.
Summary of the invention
Technical problem to be solved in the utility model is to need to provide one kind to can be realized automatic burn-in test, in turn
Reach the ageing tester for improving Product Precision and active light module the purpose of production efficiency, and further provide for include
The aging testing system of the ageing tester of the active light module.
In this regard, the utility model provides a kind of ageing tester of active light module, comprising: bottom plate, rail assembly, light
Detector and power-up socket, the rail assembly and power-up socket are respectively arranged on the bottom plate, and the optical detector passes through
The rail assembly is set to the top of the power-up socket.
Further improvement of the utility model is, the rail assembly includes X-axis track, Y-axis track and Z axis track,
The Z axis track is slidably connected by X-axis track and the Y-axis track.
Further improvement of the utility model is that the optical detector is set to the lower end of the Z axis track.
Further improvement of the utility model is that the Z axis track passes through the first slide assemblies and the X-axis track phase
Connection.
Further improvement of the utility model is that the X-axis track passes through the second slide assemblies and the Y-axis track phase
Connection.
Further improvement of the utility model is that the Y-axis track is set to the side of the bottom plate, the bottom plate
The other side is provided with sliding guide column；One end of the X-axis track is slidably connected with the Y-axis track, the X-axis track it is another
End cap is set in the sliding guide column.
Further improvement of the utility model is, is symmetrically arranged on the bottom plate for fixing the old of active light module
Change the support component of plate.
Further improvement of the utility model is, is provided with slot in the support component.
Further improvement of the utility model is that the two sides of the optical detector are provided with optical inductor.
The utility model also provides a kind of aging testing system of active light module, includes active optical mode as described above
The ageing tester of block.
Compared with prior art, the utility model has the beneficial effects that: can burn-in board to active light module it is direct
Carry out automatic burn-in test, the optical power value size of direct detection to active light module, so that test data more really has
Effect, convenient for the analysis and screening after aging；And pass through the mutual cooperation between rail assembly, power-up socket and support component,
So that position location and height and position are more accurate, VCSEL vertical-cavity surface-emitting diode array and its binding gold will not be damaged by pressure
Line；The utility model can effectively improve production and testing efficiency, improve production capacity, pollution in the case where not causing bare chip state and
It solves production problems on the basis of damage, very well satisfies the needs of industrialized production.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram of embodiment of the utility model；
Fig. 2 is a kind of configuration schematic diagram of embodiment of the utility model；
Fig. 3 is a kind of schematic perspective view of embodiment of the utility model；
Fig. 4 is a kind of structural schematic diagram of the PCBA supporting element of embodiment of the utility model；
Fig. 5 is the enlarged structure schematic diagram of A in Fig. 4.
Specific embodiment
With reference to the accompanying drawing, the preferably embodiment of the utility model is described in further detail.
As shown in Figure 1 to Figure 3, this example provides a kind of ageing tester of active light module, comprising: bottom plate 2000, rail
Road component, optical detector 2040 and power-up socket 2060, the rail assembly and power-up socket 2060 are respectively arranged at the bottom
On plate 2000, the optical detector 2040 is set to the top of the power-up socket 2060 by the rail assembly.This example institute
The two sides for stating optical detector 2040 are preferably provided with optical inductor, for realizing the detection and induction to active light module.
As shown in Figure 1 to Figure 3, rail assembly described in this example includes X-axis track 2020, Y-axis track 2010 and Z axis track
2030, the Z axis track 2030 is slidably connected by X-axis track 2020 with the Y-axis track 2010.Preferably, the light is visited
Survey the lower end that device 2040 is set to the Z axis track 2030；The Z axis track 2030 by the first slide assemblies 2070 with it is described
X-axis track 2020 is connected；The X-axis track 2020 is connected by the second slide assemblies 2080 with the Y-axis track 2010.
As shown in Figure 1 to Figure 3, Y-axis track 2010 described in this example is set to the side of the bottom plate 2000, the bottom plate
2000 other side is provided with sliding guide column 2090；One end of the X-axis track 2020 and the Y-axis track 2010 sliding connect
It connects, the other end of the X-axis track 2020 is sheathed in the sliding guide column 2090；The sliding guide column 2090 passes through guide post bottom
Seat 2100 is set on the bottom plate 2000, and then guarantees the secured and reliability of its structure.More preferably, the guide post bottom
It is additionally provided with reinforcing rib on seat 2100, further to guarantee the secured and reliability of structure.
As shown in Fig. 2, being symmetrically arranged with the burn-in board 2050 for fixing active light module on bottom plate 2000 described in this example
Support component 2110；It is provided with slot 2120 in the support component 2110, be easy to implement the insertion of burn-in board 2050 and is consolidated
It is fixed.
This example also provides a kind of aging testing system of active light module, includes the old of active light module as described above
Change test device；The aging testing system of the active light module further includes main control module, for controlling the active light module
Ageing tester burn-in test process, and realize automatically recording and saving for data.
Active optical mode described in this example is preferably concurrent multimode optical module, as shown in Figure 4 and Figure 5.As shown in Figure 1 to Figure 3, originally
Example loads onto the burn-in board 2050 of multiple PCBA supporting elements 1000, and the ageing tester of the active light module is that optical power is automatic
Test device comprising X-axis track 2020, Y-axis track 2010, Z axis track 2030 and optical detector 2040 etc..Such as Fig. 3 institute
Show, burn-in board 2050 in burn-in board 2050, is inserted into the active light module by 1000 batch of PCBA supporting element by this example
Ageing tester, the optical power that the optical detector 2040 may be read into each PCBA supporting element 1000 in burn-in board 2050 are big
Small, and aging testing system is mating realizes that data automatically recording and save.
As shown in Figure 1 to Figure 3, this example will post 1000 surface of PCBA supporting element of chip array upward, be packed into burn-in board
In 2050 each PCBA slots, then burn-in board 2050 is inserted into the power-up socket of the ageing tester of the active light module
2060 and support component 2110 slot 2120 in, realize the power-up and fixation of PCBA supporting element 1000, then have by described
The ageing tester of source optical module starts burn-in test, passes through the X-axis track 2020, Y-axis track 2010, Z axis track
Cooperation between 2030 and optical detector 2040 just can realize that the optical power of each PCBA supporting element 1000 reads and adopts automatically
Collection, and finally home is arrived in playback, is convenient for changing next burn-in board 2050, continues to test.
The optical detector 2040 is preferably PD detector, and two sides are mounted with optical inductor, when optical inductor detects
When the chip of PCBA supporting element 1000 reaches pre-set height threshold apart from the optical detector 2040, the optical detector
2040 can stop moving downward, it is ensured that be not exposed to bare chip VCSEL vertical-cavity surface-emitting diode array 1010.
To sum up, this example can the burn-in board 2050 to active light module directly carry out automatic burn-in test, direct detection
To the optical power value size of active light module, so that test data is more authentic and valid, convenient for the analysis and screening after aging；And
And by the mutual cooperation between rail assembly, power-up socket 2060 and support component, so that position location and height and position are more
Add precisely, VCSEL vertical-cavity surface-emitting diode array and its binding gold thread will not be damaged by pressure；This example can effectively improve production and
Testing efficiency improves production capacity, solves production problems on the basis of not causing the pollution and damage under bare chip state, very well
Ground meets the needs of industrialized production.
This example is easy to operate, and registration is convenient, can achieve the purpose that improve Product Precision and production efficiency.Described in this example
Optical detector 2040 preferably uses diameter 6mm large photosensistive surface PD detector.
The specific embodiment of the above is the better embodiment of the utility model, and it is practical new not to limit this with this
The specific implementation range of type, the scope of the utility model includes being not limited to present embodiment, all according to the utility model
Shape, structure made by equivalence changes it is within the protection scope of the present utility model.
Claims (10)
1. a kind of ageing tester of active light module characterized by comprising bottom plate, rail assembly, optical detector and add
Electrical socket, the rail assembly and power-up socket are respectively arranged on the bottom plate, and the optical detector passes through the track groups
Part is set to the top of the power-up socket.
2. the ageing tester of active light module according to claim 1, which is characterized in that the rail assembly includes
X-axis track, Y-axis track and Z axis track, the Z axis track are slidably connected by X-axis track and the Y-axis track.
3. the ageing tester of active light module according to claim 2, which is characterized in that the optical detector setting
In the lower end of the Z axis track.
4. the ageing tester of active light module according to claim 2, which is characterized in that the Z axis track passes through
First slide assemblies are connected with the X-axis track.
5. the ageing tester of active light module according to claim 2, which is characterized in that the X-axis track passes through
Second slide assemblies are connected with the Y-axis track.
6. the ageing tester of active light module according to claim 2, which is characterized in that the Y-axis track setting
The other side of the side of the bottom plate, the bottom plate is provided with sliding guide column；One end of the X-axis track and the Y-axis rail
Road is slidably connected, and the other end of the X-axis track is sheathed in the sliding guide column.
7. according to claim 1 to the ageing tester of active light module described in 6 any one, which is characterized in that described
The support component of the burn-in board for fixing active light module is symmetrically arranged on bottom plate.
8. the ageing tester of active light module according to claim 7, which is characterized in that set in the support component
It is equipped with slot.
9. according to claim 1 to the ageing tester of active light module described in 6 any one, which is characterized in that described
The two sides of optical detector are provided with optical inductor.
10. a kind of aging testing system of active light module, which is characterized in that include such as claim 1 to 9 any one institute
The ageing tester for the active light module stated.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820913977.6U CN208239583U (en) | 2018-06-13 | 2018-06-13 | A kind of ageing tester and system of active light module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820913977.6U CN208239583U (en) | 2018-06-13 | 2018-06-13 | A kind of ageing tester and system of active light module |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208239583U true CN208239583U (en) | 2018-12-14 |
Family
ID=64575691
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820913977.6U Expired - Fee Related CN208239583U (en) | 2018-06-13 | 2018-06-13 | A kind of ageing tester and system of active light module |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208239583U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114323596A (en) * | 2022-03-04 | 2022-04-12 | 武汉普赛斯电子技术有限公司 | Testing method and device for COB optical module before Lens coupling |
-
2018
- 2018-06-13 CN CN201820913977.6U patent/CN208239583U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114323596A (en) * | 2022-03-04 | 2022-04-12 | 武汉普赛斯电子技术有限公司 | Testing method and device for COB optical module before Lens coupling |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP02 | Change in the address of a patent holder | ||
| CP02 | Change in the address of a patent holder |
Address after: 518000 room a1101201 301 401 501, building 13, Junfeng Industrial Park, Chongqing Road, Heping community, Fuhai street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: XGIGA Communication Technology Co., Ltd. Address before: 518000 Nanshan District, Shenzhen, Guangdong, Guangdong Province, south Guangdong Road, 9680 Shennan Road, No. 1, building 9, 901, Patentee before: XGIGA Communication Technology Co., Ltd. |
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| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20181214 Termination date: 20210613 |