CN207866970U - A kind of 100G opto-electronic devices test device - Google Patents

Abstract

The utility model discloses a kind of 100G opto-electronic devices test devices, including conveyer belt and slide, the central upper portion of the conveyer belt is fixedly connected with placing groove, and the top both sides of conveyer belt are fixedly connected with guide post, the slide is arranged in the top of conveyer belt, the lower surface of the slide is slidably fitted with sliding block, the lower part of the sliding block is installed with cylinder, the lower end of the cylinder is fixedly connected with fixed plate, the lower part of the fixed plate is fixedly connected with guide sleeve and fixed column, and the lower central of fixed plate is installed with test probe, the upper socket of the fixed column has spring, and the lower slide of fixed column is socketed with pressing sleeve.By the way that guide post is arranged on the conveyor belt, while in the guide sleeve of the setting of the both sides of fixed plate and guide post cooperation so that test probe pin is accurate；By the way that placing groove is arranged on the conveyor belt, opto-electronic device is accurately placed in placing groove, is easy to implement automatic online test.

Description

A kind of 100G opto-electronic devices test device

Technical field

The utility model is related to opto-electronic device technical field of measurement and test, specially a kind of 100G opto-electronic devices test dress It sets.

Background technology

Opto-electronic device is to utilize various functions device made of the sub- transition effects of electrical-optical.As semiconductor photo detector, Photomultiplier, gleam image intensifier, vacuum pick-up tube, CCD and cmos imaging device, refrigeration and not refrigerant infrared imaging device Part, UV. Image Devices and x-ray imaging device etc..

In recent years, Chinese opto-electronic device manufacturing realizes very fast development.The application fields such as show in optic communication, light Under the ever-expanding stimulation of demand, product has the breakthrough of bigger.The especially appearance of 100G opto-electronic devices, in production, Due to the integrated higher of 100G opto-electronic devices, socket is more intensive, and common online testing device can not carry out accurately fixed Position, existing to mostly use manual testing, heavy workload, efficiency is low, wastes a large amount of manpowers, cannot achieve automatic online test.

Utility model content

It is accurate to needle the purpose of this utility model is to provide a kind of 100G opto-electronic devices test device, it can convey It is tested on line, is easy to implement automation, to solve the problems mentioned in the above background technology.

To achieve the above object, the utility model provides the following technical solutions：A kind of 100G opto-electronic devices test device, Including conveyer belt and slide, the central upper portion of the conveyer belt is fixedly connected with placing groove, and the top both sides of conveyer belt are fixed It is connected with guide post, the slide is arranged in the top of conveyer belt, and the lower surface of the slide is slidably fitted with sliding block, the sliding block Lower part be installed with cylinder, the lower end of the cylinder is fixedly connected with fixed plate, and the lower part of the fixed plate is fixedly connected There are guide sleeve and fixed column, and the lower central of fixed plate is installed with test probe, the upper socket of the fixed column has bullet Spring, and the lower slide of fixed column is socketed with pressing sleeve.

Preferably, the upper end of the spring is fixedly connected on the lower part of fixed plate, and the lower end of spring is fixedly connected on pressure The top of set.

Preferably, the lower part of the guide sleeve offers the horn mouth convenient for being slidably socketed with guide post.

Preferably, the lower surface of the slide is fixedly connected with the limited block for being useful for limitation sliding block sliding distance.

Preferably, the test probe is connected by the signal acquisition end signal of cable signal line and test platform.

Preferably, the automatically controlled end of the cylinder and drive conveyer belt stepper motor automatically controlled end respectively with dsp controller Control output end be electrically connected.

Compared with prior art, the utility model has the beneficial effects that：

1, by the way that guide post is arranged on the conveyor belt, while in the guide sleeve of the setting of the both sides of fixed plate and guide post cooperation so that It is accurate to test probe pin；

2, by the way that placing groove is arranged on the conveyor belt, opto-electronic device is accurately placed in placing groove, is easy to implement certainly Dynamicization on-line testing.

Description of the drawings

Fig. 1 is the structural schematic diagram of the utility model；

Fig. 2 is the overlooking structure diagram of the utility model conveyer belt；

Fig. 3 is the test structure schematic diagram of the utility model fixed plate；

Fig. 4 is the electric connection block diagram of the utility model.

In figure：1 stepper motor, 2 conveyer belts, 3 guide posts, 4 placing grooves, 5 support plates, 6 guide sleeves, 7 fixed plates, 8 cylinders, 9 are slided Block, 10 limited blocks, 11 slides, 12 fixed columns, 13 springs, 14 test probes, 15 pressing sleeves, 16 dsp controllers.

Specific implementation mode

The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work The every other embodiment obtained, shall fall within the protection scope of the present invention.

- 4 are please referred to Fig.1, the utility model provides a kind of technical solution：The 100G opto-electronic device test devices, including The central upper portion of conveyer belt 2 and slide 11, the conveyer belt 2 is fixedly connected with placing groove 4, and the top both sides of conveyer belt 2 are solid Surely it is connected with guide post 3, the slide 11 is arranged in the top of conveyer belt 2, and the lower surface of the slide 11 is slidably fitted with sliding block 9, the lower part of the sliding block 9 is installed with cylinder 8, and the lower end of the cylinder 8 is fixedly connected with fixed plate 7, the fixed plate 7 Lower part be fixedly connected with guide sleeve 6 and fixed column 12, and the lower central of fixed plate 7 is installed with test probe 14, described The upper socket of fixed column 12 has spring 13, and the lower slide of fixed column 12 is socketed with pressing sleeve 15.

Specifically, the upper end of the spring 13 is fixedly connected on the lower part of fixed plate 7, and the lower end of spring 13 is fixedly connected On the top of pressing sleeve 15, spring 13 plays the role of buffering, at the same can oppress pressing sleeve 15 so that test probe 14 extract when, pressure Set 15 pushes down opto-electronic device, so that opto-electronic device is not tested probe 14 and takes placing groove 4 out of.

Specifically, the lower part of the guide sleeve 6 offers convenient for the horn mouth that is slidably socketed with guide post 3, bell-mouthed design, It is inserted into guide sleeve 6 convenient for guide post 3, while passing through the grafting of guide post 3 and guide sleeve 6 so that test probe 14 is directed at opto-electronic device Testing jack.

Specifically, the lower surface of the slide 11 is fixedly connected with the limited block 10 for being useful for limitation 9 sliding distance of sliding block, The effect of slide 11 and sliding block 9, the accurate positionin convenient for test probe 14 are passing through 3 He of guide post even if there is the deviation on position It, can self calibration when the grafting of guide sleeve 6（Sliding block 9 is removable）.

Specifically, the test probe 14 is connected by the signal acquisition end signal of cable signal line and test platform, survey The socket that needle 14 is connected to opto-electronic device is soundd out, is connected, is then tested, gathered data.

Specifically, the automatically controlled end of the stepper motor 1 at the automatically controlled end and driving conveyer belt 2 of the cylinder 8 is controlled with DSP respectively The control output end of device 16 is electrically connected, and connects cylinder 8 and stepper motor 1 by dsp controller 16, stepper motor 1 is per stepping Once, about 8 circulation primary of cylinder carries out the test of a device.

Operation principle：When in use, opto-electronic device is put into placing groove 4（Placing groove 4 is micro-elasticity rubber box or plastics Box, the notch shape of placing groove 4 is identical as the shape of opto-electronic device, and the notch of placing groove 4 is more than opto-electronic device, between There are clearance fits, convenient for positioning）It is interior, then by the effect of conveyer belt 2, opto-electronic device is transported to test probe 14 Lower section；At this point, control cylinder 8 pushes, guide sleeve 6 is sleeved on guide post 3（Guide post 3 and guide sleeve 6 are made of wear-resisting rigid plastics）On, it is accurate It determines that opto-electronic device is pushed down in position, pressing sleeve 15, and tests probe 14 and be inserted into the test mouth of opto-electronic device（At this point, gas 8 pressurize of cylinder for a period of time, keeps elongation state）, tested；After test, cylinder 8 bounces back, and when retraction, tests probe 14 It extracts, due to the design of spring 13, pressing sleeve 15 pushes down opto-electronic device, is extracted convenient for test probe 14；Then stepper motor 1 is again Stepping is primary, carries out the test of next opto-electronic device, and loop test produces according to this.

While there has been shown and described that the embodiments of the present invention, for the ordinary skill in the art, It is appreciated that can these embodiments be carried out with a variety of variations in the case where not departing from the principles of the present invention and spirit, repaiied Change, replace and modification, the scope of the utility model are defined by the appended claims and the equivalents thereof.

Claims (6)

1. a kind of 100G opto-electronic devices test device, including conveyer belt（2）And slide（11）, it is characterised in that：The conveying Band（2）Central upper portion be fixedly connected with placing groove（4）, and conveyer belt（2）Top both sides be fixedly connected with guide post（3）, institute State slide（11）It is arranged in conveyer belt（2）Top, the slide（11）Lower surface be slidably fitted with sliding block（9）, the cunning Block（9）Lower part be installed with cylinder（8）, the cylinder（8）Lower end be fixedly connected with fixed plate（7）, the fixed plate （7）Lower part be fixedly connected with guide sleeve（6）And fixed column（12）, and fixed plate（7）Lower central be installed with test visit Needle（14）, the fixed column（12）Upper socket have spring（13）, and fixed column（12）Lower slide be socketed with pressing sleeve （15）.

2. a kind of 100G opto-electronic devices test device according to claim 1, it is characterised in that：The spring（13）'s Upper end is fixedly connected on fixed plate（7）Lower part, and spring（13）Lower end be fixedly connected on pressing sleeve（15）Top.

3. a kind of 100G opto-electronic devices test device according to claim 1, it is characterised in that：The guide sleeve（6）'s Lower part, which offers, to be convenient for and guide post（3）The horn mouth being slidably socketed.

4. a kind of 100G opto-electronic devices test device according to claim 1, it is characterised in that：The slide（11）'s Lower surface, which is fixedly connected, is useful for limitation sliding block（9）The limited block of sliding distance（10）.

5. a kind of 100G opto-electronic devices test device according to claim 1, it is characterised in that：The test probe （14）It is connected by the signal acquisition end signal of cable signal line and test platform.

6. a kind of 100G opto-electronic devices test device according to claim 1, it is characterised in that：The cylinder（8）'s Automatically controlled end and driving conveyer belt（2）Stepper motor（1）Automatically controlled end respectively with dsp controller（16）Control output end it is electrical Connection.