CN207779913U - The detection device of function test fixture thimble - Google Patents
The detection device of function test fixture thimble Download PDFInfo
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- CN207779913U CN207779913U CN201820182479.9U CN201820182479U CN207779913U CN 207779913 U CN207779913 U CN 207779913U CN 201820182479 U CN201820182479 U CN 201820182479U CN 207779913 U CN207779913 U CN 207779913U
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- lower die
- thimble
- test fixture
- function test
- connecting rod
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Abstract
The utility model discloses a kind of detection devices of function test fixture thimble, including：Detect microscope carrier；Lower die, multiple through-holes are formed in lower die, the upper surface of each lower die is equipped with multiple transmitters and multiple receivers, transmitter is suitable for communicating with corresponding receiver, the both sides of each through-hole are respectively equipped with a transmitter and a receiver, the conduct piece of LED light is electrically connected in each through-hole equipped with bottom, lower die is transparent or semitransparent and nonconducting component；Laminating mechanism, laminating mechanism includes upper mold, ejector pin component is mounted on the lower section of upper mold, when USB interface powers on and upper mold moves down, it is inserted into thimble and separates communication between transmitter and receiver between corresponding transmitter and receiver and thimble extends down into corresponding through-hole and to light then thimble qualified for LED light when being contacted with conduct piece.Detection device according to the present utility model realizes standardization detection, avoids the inspection defect of Manual Visual Inspection.
Description
Technical field
The utility model is related to electronic equipment manufacturing technical fields, more particularly, to a kind of inspection of function test fixture thimble
Survey device.
Background technology
In cell phone mainboard or the production of the electronic product of same type, high-volume is needed to use the functional test with thimble
Jig, the minimum 0.7mm of thimble diameter of the function test fixture, or even accomplished minimum 0.4mm.However, so minor diameter
Thimble so that function test fixture production, storage and transport in often because outer force effect cause thimble occur bending,
Crooked phenomenon, so as to cause occurring the case where accidentally surveying and can not use during follow-up test use.
It, can not effective handle to thimble precision currently, the mode of generally use visual inspection is checked that it is low that there are recall rates
Control impacts to the production quality and production efficiency of the electronic product to cell phone mainboard or same type.
Utility model content
The utility model aims to solve at least one of the technical problems existing in the prior art.For this purpose, the utility model carries
Go out a kind of detection device of function test fixture thimble, whether the detection device can intuitively and effectively detect the thimble
It is bent, is crooked.
According to the detection device of the function test fixture thimble of the utility model embodiment, the function test fixture includes
Ejector pin component, the ejector pin component include having the ejector pin component ontology of USB interface and being located on the downside of the ejector pin component ontology
Multiple thimbles, multiple thimbles are connected by the USB interface and power supply, and the detection device includes：Detect microscope carrier；Under
Mould, the lower die be mounted on it is described detection microscope carrier upper surface on, be formed in the lower die vertically penetrate through it is multiple
The upper surface of through-hole, each lower die is equipped with multiple transmitters and multiple receivers, multiple transmitters and multiple institutes
Receiver one-to-one correspondence is stated, the transmitter is suitable for communicating with the corresponding receiver, and the both sides of each through-hole are respectively equipped with
One transmitter and a receiver, each through-hole is interior to be equipped with conduct piece, and the bottom of the conduct piece is electrically connected
It is connected to LED light, the lower die is transparent or semitransparent and nonconducting component；Laminating mechanism, the laminating mechanism are located at described
It detects on microscope carrier, the laminating mechanism includes laminating mechanism ontology and is located on the laminating mechanism ontology and is located at the lower die
The upper mold of top, the upper mold can be moved up and down relative to the lower die, wherein the ejector pin component is adapted to mount on described
The lower section of mould, when the USB interface connection power supply and the upper mold moves down, and corresponding institute is inserted into the thimble
It states and separates communication between the transmitter and the receiver between transmitter and the receiver and the thimble is stretched downwards
It is qualified to light the then thimble for the LED light when entering into the corresponding through-hole and being contacted with the conduct piece.
According to the detection device of the function test fixture thimble of the utility model embodiment, can intuitively and effectively examine very much
The thimble of function test fixture is measured with the presence or absence of exception and can not be connected, the specification to the thimble of function test fixture is realized
Change detection, avoid that Manual Visual Inspection is existing to check defect, reduce function test fixture reach the standard grade fraction defective and therefore caused by
False failure rate.
Some embodiments according to the present utility model, the transmitter and the corresponding receiver are about the through-hole
Diametrically.
The bottom of some embodiments according to the present utility model, the lower die is formed with upwardly recessed groove, wherein more
A through-hole and face above and below the groove, and the roof of the groove, the LED light are run through in the lower end of each through-hole
In the groove.
Some embodiments according to the present utility model, the bottom surface of LED light are higher than the lower surface of the lower die.
Some embodiments according to the present utility model, the conduct piece are located at the lower part in the through-hole.
Some embodiments according to the present utility model, the conduct piece are electroconductive elastic sheet or conductive column.
Some embodiments according to the present utility model, the top of the upper mold have the mobile bar extended straight up；Institute
Stating laminating mechanism ontology includes：Holder, the branch are erected on the detection microscope carrier and positioned at the rear of the lower die；Installation
Plate, mounting plate connection on the bracket, the mounting plate be equipped with the first installing arm set gradually from top to bottom and
The rear end of second installing arm, first installing arm and second installing arm is connected with the mounting plate, second peace
The front end of dress arm has the slide opening vertically penetrated through, wherein the mobile bar can be threaded through the slide opening up or down
In；First connecting rod, the first connecting rod include one end be fixedly connected and angle less than 180 ° first connecting rod section and second connecting rod
Section, the other end of the first connecting rod section are pivotly connected with the front end of first installing arm, the second connecting rod section
The other end has handle；Second connecting rod, one end of the second connecting rod are connected with the top of the mobile bar, the second connecting rod
The other end be pivotly connected with the junction of the first connecting rod section and the second connecting rod section.
Some embodiments according to the present utility model, the lower die are polymethyl methacrylate part.
Some embodiments according to the present utility model, the conduct piece are metalwork.
Some embodiments according to the present utility model, the detection microscope carrier and the laminating mechanism are respectively bakelite part or conjunction
At stone part, Al-alloy parts.
The additional aspect and advantage of the utility model will be set forth in part in the description, partly will be from following description
In become apparent, or recognized by the practice of the utility model.
Description of the drawings
The above-mentioned and/or additional aspect and advantage of the utility model will in the description from combination following accompanying drawings to embodiment
Become apparent and is readily appreciated that, wherein：
Fig. 1 is the stereogram according to the detection device of the function test fixture thimble of the utility model embodiment；
Fig. 2 is the schematic diagram of lower die shown in Fig. 1；
Fig. 3 is the explosive view of lower die shown in Fig. 2；
Fig. 4 is the schematic diagram of another angle of lower die shown in Fig. 2.
Reference numeral：
100：Detection device；
1：Detect microscope carrier；
2：Lower die；21：Through-hole；22：Conduct piece；23：LED light；24：Groove；
25：Transmitter；26：Receiver；
311：Holder；312：Mounting plate；3121：First installing arm；3122：Second installing arm；
3123：Slide opening；
3131：First connecting rod section；3132：Second connecting rod section；3133：Handle；
314：Second connecting rod；315：Slide bar；316：Connecting plate；
32：Upper mold；321：Mobile bar；
201：Ejector pin component ontology；2011：USB interface；202：Thimble.
Specific implementation mode
The embodiments of the present invention are described below in detail, examples of the embodiments are shown in the accompanying drawings, wherein from beginning
Same or similar element or element with the same or similar functions are indicated to same or similar label eventually.Below by ginseng
The embodiment for examining attached drawing description is exemplary, and is only used for explaining the utility model, and should not be understood as to the utility model
Limitation.
In the description of the present invention, it should be understood that term "center", " longitudinal direction ", " transverse direction ", " length ", " width
Degree ", " thickness ", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom" "inner", "outside", " suitable
The orientation or positional relationship of the instructions such as hour hands ", " counterclockwise ", " axial direction ", " radial direction ", " circumferential direction " is orientation based on ... shown in the drawings
Or position relationship, be merely for convenience of describing the present invention and simplifying the description, do not indicate or imply the indicated device or
Element must have a particular orientation, with specific azimuth configuration and operation, therefore should not be understood as the limit to the utility model
System.In addition, defining " first ", the feature of " second " can explicitly or implicitly include one or more this feature.
In the description of the present invention, unless otherwise indicated, the meaning of " plurality " is two or more.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " is pacified
Dress ", " connected ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integrally
Connection；It can be mechanical connection, can also be electrical connection；Can be directly connected, can also indirectly connected through an intermediary,
It can be the connection inside two elements.For the ordinary skill in the art, it can understand above-mentioned art with concrete condition
The concrete meaning of language in the present invention.
It is filled according to the detection of the function test fixture thimble 202 of the utility model embodiment below with reference to Fig. 1-Fig. 4 descriptions
Set 100.The detection device 100 can be used for being detected the thimble 202 of function test fixture, so that it is determined that the functional test
Whether jig can well use.
Wherein, referring to Fig.1, function test fixture includes ejector pin component, and ejector pin component includes having the top of USB interface 2011
Needle assemblies ontology 201 and the multiple thimbles 202 for being located at 201 downside of ejector pin component ontology, multiple thimbles 202 pass through USB interface
2011 connect with power supply.Optionally, power supply is 5V power supplys.But not limited to this.
It is understood that USB (English：Universal Serial Bus, universal serial bus) it is connection computer
A kind of serial bus standard and a kind of technical specification of input/output interface of system and external equipment, are widely used
In the information communications product such as PC and mobile device, and extend to photographic goods, DTV (set-top box), game machine etc.
Other related fields.Latest generation is USB 3.1, transmission speed 10Gbit/s, three-stage voltage 5V/12V/20V, and maximum supplies
The slotting type of electric 100W, novel Type C no longer divides positive and negative.
As Figure 1-Figure 4, according to the detection device 100 of the function test fixture thimble 202 of the utility model embodiment,
Including detection microscope carrier 1, lower die 2 and laminating mechanism.
Specifically, lower die 2 is mounted on the upper surface of detection microscope carrier 1, it is formed in lower die 2 and vertically penetrates through
Multiple through-holes 21, the upper surface of each lower die 2 are equipped with multiple transmitters 25 and multiple receivers 26, multiple transmitters 25 and more
A receiver 26 corresponds, and transmitter 25 is suitable for communicating with corresponding receiver 26, and the both sides of each through-hole 21 are respectively equipped with
One transmitter 25 and a receiver 26, each through-hole 21 is interior to be equipped with conduct piece 22, and the bottom of conduct piece 22 is electrically connected with LED
(Light Emitting Diode, light emitting diode) lamp, lower die 2 are transparent or semitransparent and nonconducting component.
Laminating mechanism is located on detection microscope carrier 1, and laminating mechanism includes laminating mechanism ontology and is located on laminating mechanism ontology
And positioned at the upper mold 32 of 2 top of lower die, upper mold 32 can be moved up and down relative to lower die 2, and wherein ejector pin component is adapted to mount to
The lower section of mould 32 is inserted into corresponding transmitter when USB interface 2011 powers on and upper mold 32 is moved down in thimble 202
The communication and thimble 202 separated between 25 and receiver 26 between transmitter 25 and receiver 26 extends down into corresponding lead to
It is qualified to light then thimble 202 for LED light 23 when contacting in hole 21 and with conduct piece 22.
For example, when needing the thimble 202 to the ejector pin component of function test fixture to be detected, it can first make upper mold 32
It is moved up relative to lower die 2, in order to which ejector pin component to be mounted on to the lower section of upper mold 32, after installing, multiple thimbles 202
Positioned at the downside (as shown in Figure 1) of ejector pin component ontology 201；Ejector pin component is accessed into power supply by USB interface 2011 again；Then
Upper mold 32 is set to be moved down relative to lower die 2.Optionally, power supply is 5V power supplys, but not limited to this.
During thimble 202 moves down, when thimble 202 between transmitter 25 and receiver 26 and with transmitting
When 26 face of device 25 and receiver, thimble 202 can separate the communication between transmitter 25 and receiver 26, at this time receiver 26
The signal that transmitter 25 is sent out can not be received.It is understood that this can be observed by the naked eye：For example, normal condition
Under, the laser that transmitter 25 is sent out can be received by receiver 26, and it is in straight to have one between transmitter 25 and receiver 26 at this time
The laser of line；And in the case where thimble 202 blocks, since the laser sent out from transmitter 25 is blocked by thimble 202, to only
There is a linear laser between transmitter 25 and thimble 202.
When thimble 202 continues to move down, if thimble 202 extend into through-hole 21 and with the conduct piece in through-hole 21
22 contacts, LED light corresponding with the conduct piece 22 23 will be lighted, to prove that 202 beam conduction of thimble, access are normal.
In the case of confirming that access is normal, so that it may which the thimble 202 to confirm the function test fixture is normal, no bending or crooked.
Cannot be lighted if there is LED light 23 or thimble 202 cannot normally be inserted between transmitter 25 and receiver 26 with
Separate the communication between transmitter 25 and receiver 26, then it is assumed that the thimble 202 is unqualified.
As a result, by using lower die 2 made of transparent or semitransparent material, greatly facilitates tester and check lower die 2
The state of bottom LED light 23；Moreover, by selecting nonconducting lower die 2, can prevent thimble 202 due to bending, crooked etc. with
The contact of lower die 2 causes LED light 23 to light and the phenomenon that accidentally surveying occur.It is understood that the transparency of lower die 2 can be according to reality
Border demand is specifically arranged, as long as can meet the state of the convenient LED light 23 of 2 bottom of lower die from outside of tester.
According to the detection device 100 of the function test fixture thimble 202 of the utility model embodiment, can intuitively have very much
The thimble 202 of function test fixture is detected to effect with the presence or absence of exception and can not be connected, is realized to function test fixture
The standardization of thimble 202 detects, and avoids that Manual Visual Inspection is existing to check defect, reduces function test fixture and reaches the standard grade fraction defective
And therefore caused by false failure rate.
The radial phase of some embodiments according to the present utility model, transmitter 25 and corresponding receiver 26 about through-hole 21
It is right.The angle between transmitter 25 and corresponding receiver 26 is 180 ° at this time.The standard of detection result is further improved as a result,
True property.
The bottom of some embodiments according to the present utility model, lower die 2 is formed with upwardly recessed groove 24, plurality of
Through-hole 21 and about 24 face of groove, and the roof of the lower end through-going recess 24 of each through-hole 21, LED light 23 are located at groove 24
It is interior.For example, in the example of fig. 4, groove 24 by lower die 2 bottom surface a part of upwardly recessed formation, groove 24 is preferably formed as
Center in 2 bottom surface of lower die, multiple through-holes 21 are both formed at position corresponding with groove 24, in through-hole 21
The LED light 23 of 22 bottom of conduct piece can be accommodated in groove 24, prevent lower die 2 from occurring interfering with detection microscope carrier 1 when mounted
The phenomenon that.
Wherein, the bottom surface of LED light 23 is higher than the bottom surface of lower die 2, alternatively, the bottom surface of LED light 23 can also be with the bottom of lower die 2
Face keeps concordant.Moreover, the setting of groove 24, it is possible to reduce the materials of lower die 2, to reduce cost.
Some embodiments according to the present utility model, conduct piece 22 are located at the lower part in through-hole 21.In this way, thimble 202 needs
The lower part extending into through-hole 21 could be contacted with conduct piece 22 with lightening LED lamp 23.Detection knot is further improved as a result,
The accuracy of fruit.
Optionally, conduct piece 22 is electroconductive elastic sheet or conductive column.But not limited to this.It is understood that conduct piece 22
Specific constructive form can be specifically arranged according to actual requirement, preferably to meet practical application.
Wherein, (Printed Circuit Board, Chinese are print to the PCB that thimble 202 can be tested as required
Circuit board processed, also known as printed wiring board, are important electronic unit, are the supporters of electronic component, are electronic component electricity
The carrier of gas connection) pad size design.
Arrangement and specific size of the through-hole 21 in lower die 2 can be according to the thimble groups of function test fixture to be detected
The arrangement of thimble 202 on part and specific size specifically determine.It is understood that showing that five lead in Fig. 2-Fig. 4
For illustration purposes, but those of ordinary skill can manage after having read following technical solution, obviously in hole 21
The program is applied in two, three, four or technical solution more than five through-holes 21 by solution, and it is new that this also falls into this practicality
Within the protection domain of type.
Some specific embodiments according to the present utility model extend straight up as shown in Figure 1, the top of upper mold 32 has
Mobile bar 321；Laminating mechanism ontology includes：Holder 311, mounting plate 312, first connecting rod and second connecting rod 314, it is specific and
Speech, holder 311 are located on detection microscope carrier 1 and positioned at the rear of lower die 2, and mounting plate 312 is connected on holder 311, mounting plate 312
It is equipped with the first installing arm 3121 and the second installing arm 3122 set gradually from top to bottom, the second installing arm 3122 is located at this time
The rear end of the lower section of first installing arm 3121, the first installing arm 3121 and the second installing arm 3122 is connected with mounting plate 312, the
There is the slide opening 3123 vertically penetrated through, wherein mobile bar 321 can wear up or down for the front end of two installing arms 3122
In slide opening 3123, first connecting rod include one end be fixedly connected and angle less than 80 ° first connecting rod section 3131 and second connecting rod
Section 3132, the other end (for example, upper end in figure) of first connecting rod section 3131 and the front end of the first installing arm 3121 are pivotly
It is connected, the other end (for example, front end in Fig. 2) of second connecting rod section 3132 has handle 3133, one end of second connecting rod 314
(for example, lower end in Fig. 2) is connected with the top of mobile bar 321, the other end (for example, upper end in Fig. 2) of second connecting rod 314
Pivotly it is connected with the junction of first connecting rod section 3131 and second connecting rod section 3132.For example, when needing that upper mold 32 is upward
When mobile, handle 3133 can be moved upwards, and handle 3133 will drive mobile bar 321 to moving up by second connecting rod 314 at this time
It is dynamic, to drive upper mold 32 to move up.When needing to move down upper mold 32, handle 3133 can be moved downwards, at this time handle
3133 will drive mobile bar 321 to move down by second connecting rod 314, to drive upper mold 32 to move down.As a result, by using upper
The mobile bar 321 and laminating mechanism ontology stated, can conveniently realize moving up and down for upper mold 32, have the advantages of simple structure and easy realization.
Further, referring to Fig.1, holder 311 is equipped with vertical extension and spaced two slide bars 315 in left and right, moves
The bottom of lever 321 can be equipped with horizontal-extending connecting plate 316, and two slide bars 315 are threaded through on connecting plate 316, wherein
Upper mold 32 is connected to the downside of connecting plate 316.It, can be further as a result, by the cooperation of two slide bars 315 and connecting plate 316
Ensure that upper mold 32 is steady along the vertical direction mobile.
Referring to Fig.1, the angle between first connecting rod section 3131 and second connecting rod section 3132 is preferably 90 °.
Optionally, first connecting rod section 3131 and second connecting rod section 3132 are preferably integrally formed part, in order to first connecting rod
Processing, it is cost-effective.
Under normal conditions, lower die 2 is fixedly connected on detection microscope carrier 1, and lower die 2 is fixed relative to detection microscope carrier 1 at this time
Motionless.Since upper mold 32 is only capable of moving up and down relative to lower die 2, consequently facilitating the ejector pin component alignment in upper mold 32
Conduct piece 22 in lower die 2 can avoid the occurrence of the phenomenon that accidentally surveying in this way.
Further, for the ease of to different function test fixtures thimble 202 (for example, when thimble 202 quantity,
When arrangement mode difference) be detected, lower die 2 can be detachably connected to detection microscope carrier 1 on, in order to replace with it is corresponding
The lower die 2 that function test fixture matches.The versatility for improving detection device 100 as a result, extends detection device 100
Application range.
Optionally, lower die 2 is polymethyl methacrylate part.For example, lower die 2 (is called PMMA or organic glass, is originated from using acrylic
English acrylic (acrylic plastics), chemical name is polymethyl methacrylate) plate or other transparent material materials make,
Conveniently check the state of the LED light 23 of 2 bottom of lower die.But not limited to this.
Optionally, conduct piece 22 is metalwork.But not limited to this.
Optionally, it is respectively bakelite part or compound stone part, Al-alloy parts to detect microscope carrier 1 and laminating mechanism.But not limited to this.
It is understood that lower die 2, conduct piece 22, detection microscope carrier 1 and the specific material of laminating mechanism can be according to reality
It is required that specific setting, preferably to meet practical application.
It is simple in structure according to the detection device 100 of the function test fixture thimble 202 of the utility model embodiment, design
It is ingenious, it is easy to operate, it can very intuitive, fast and effeciently detect that the thimble 202 of which function test fixture or function are surveyed
Which thimble 202 of examination jig exists abnormal and can not be connected, and recall rate is high, and can be carried out to the precision of thimble 202 effective
Control, to ensure that cell phone mainboard or same type electronic product production quality and production efficiency.
In the description of this specification, reference term " one embodiment ", " some embodiments ", " illustrative examples ",
The description of " example ", " specific example " or " some examples " etc. means specific features described in conjunction with this embodiment or example, knot
Structure, material or feature are contained at least one embodiment or example of the utility model.In the present specification, to above-mentioned art
The schematic representation of language may not refer to the same embodiment or example.Moreover, description specific features, structure, material or
Person's feature can be combined in any suitable manner in any one or more of the embodiments or examples.
While there has been shown and described that the embodiments of the present invention, it will be understood by those skilled in the art that：
Can these embodiments be carried out with a variety of variations in the case where not departing from the principles of the present invention and objective, modification, replaced
And modification, the scope of the utility model are limited by claim and its equivalent.
Claims (10)
1. a kind of detection device of function test fixture thimble, which is characterized in that the function test fixture includes ejector pin component,
The ejector pin component includes the ejector pin component ontology with USB interface and the multiple tops being located on the downside of the ejector pin component ontology
Needle, multiple thimbles are connected by the USB interface and power supply, and the detection device includes：
Detect microscope carrier；
Lower die, the lower die are mounted on the upper surface of the detection microscope carrier, are formed in the lower die and vertically penetrate through
Multiple through-holes, the upper surface of each lower die is equipped with multiple transmitters and multiple receivers, multiple transmitters and
Multiple receivers correspond, and the transmitter is suitable for communicating with the corresponding receiver, the both sides point of each through-hole
It does not set there are one the transmitter and a receiver, conduct piece, the bottom of the conduct piece is equipped in each through-hole
Portion is electrically connected with LED light, and the lower die is transparent or semitransparent and nonconducting component；
Laminating mechanism, the laminating mechanism are located on the detection microscope carrier, and the laminating mechanism includes laminating mechanism ontology and sets
Upper mold on the laminating mechanism ontology and above the lower die, the upper mold relative to the lower die can on move down
It is dynamic,
The wherein described ejector pin component is adapted to mount to the lower section of the upper mold, when the USB interface connects the power supply and described
Upper mold moves down, the thimble be inserted between the corresponding transmitter and the receiver separate the transmitter with
When communication and the thimble between the receiver are extended down into the corresponding through-hole and are contacted with the conduct piece
It is qualified that the LED light lights the then thimble.
2. the detection device of function test fixture thimble according to claim 1, which is characterized in that the transmitter and right
The receiver answered about the through-hole diametrically.
3. the detection device of function test fixture thimble according to claim 1, which is characterized in that the bottom of the lower die
It is formed with upwardly recessed groove, the plurality of through-hole and groove face, and the lower end of each through-hole up and down
Through the roof of the groove, the LED light is located in the groove.
4. the detection device of function test fixture thimble according to claim 3, which is characterized in that the bottom surface of LED light is high
In the lower surface of the lower die.
5. the detection device of function test fixture thimble according to claim 1, which is characterized in that the conduct piece is located at
Lower part in the through-hole.
6. the detection device of function test fixture thimble according to claim 1, which is characterized in that the conduct piece is to lead
Electric shrapnel or conductive column.
7. the detection device of function test fixture thimble according to claim 1, which is characterized in that the top of the upper mold
With the mobile bar extended straight up；
The laminating mechanism ontology includes：
Holder, the branch are erected on the detection microscope carrier and positioned at the rear of the lower die；
Mounting plate, on the bracket, the mounting plate is equipped with first set gradually from top to bottom for the mounting plate connection
The rear end of installing arm and the second installing arm, first installing arm and second installing arm is connected with the mounting plate, institute
The front end for stating the second installing arm has the slide opening vertically penetrated through, wherein the mobile bar can be threaded through institute up or down
It states in slide opening；
First connecting rod, the first connecting rod include one end be fixedly connected and angle less than 180 ° first connecting rod section and second connecting rod
Section, the other end of the first connecting rod section are pivotly connected with the front end of first installing arm, the second connecting rod section
The other end has handle；
Second connecting rod, one end of the second connecting rod are connected with the top of the mobile bar, the other end of the second connecting rod with
The first connecting rod section is pivotly connected with the junction of the second connecting rod section.
8. the detection device of function test fixture thimble according to claim 1, which is characterized in that the lower die is organic
Glass workpiece.
9. the detection device of function test fixture thimble according to claim 1, which is characterized in that the conduct piece is gold
Belong to part.
10. the detection device of function test fixture thimble according to claim 1, which is characterized in that the detection microscope carrier
It is respectively bakelite part or compound stone part, Al-alloy parts with the laminating mechanism.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201820182479.9U CN207779913U (en) | 2018-01-31 | 2018-01-31 | The detection device of function test fixture thimble |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201820182479.9U CN207779913U (en) | 2018-01-31 | 2018-01-31 | The detection device of function test fixture thimble |
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| CN207779913U true CN207779913U (en) | 2018-08-28 |
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| CN201820182479.9U Expired - Fee Related CN207779913U (en) | 2018-01-31 | 2018-01-31 | The detection device of function test fixture thimble |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109738734A (en) * | 2018-12-28 | 2019-05-10 | 南通同洲电子有限责任公司 | A kind of multifunctional set top box automatic testing tool jig |
| CN110596197A (en) * | 2019-09-18 | 2019-12-20 | 日立电梯（中国）有限公司 | Connecting device for detecting steel rope in steel belt |
| CN111880071A (en) * | 2020-08-24 | 2020-11-03 | 武汉博畅通信设备有限责任公司 | Detect detection frock of PIN diode reverse bias current |
| CN117491831A (en) * | 2023-10-09 | 2024-02-02 | 旭显未来(北京)科技有限公司 | Test fixture and huge transfer system |
-
2018
- 2018-01-31 CN CN201820182479.9U patent/CN207779913U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109738734A (en) * | 2018-12-28 | 2019-05-10 | 南通同洲电子有限责任公司 | A kind of multifunctional set top box automatic testing tool jig |
| CN110596197A (en) * | 2019-09-18 | 2019-12-20 | 日立电梯（中国）有限公司 | Connecting device for detecting steel rope in steel belt |
| CN111880071A (en) * | 2020-08-24 | 2020-11-03 | 武汉博畅通信设备有限责任公司 | Detect detection frock of PIN diode reverse bias current |
| CN117491831A (en) * | 2023-10-09 | 2024-02-02 | 旭显未来(北京)科技有限公司 | Test fixture and huge transfer system |
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| GR01 | Patent grant | ||
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| CP01 | Change in the name or title of a patent holder |
Address after: Changan town in Guangdong province Dongguan 523860 usha Beach Road No. 18 Patentee after: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS Corp.,Ltd. Address before: Changan town in Guangdong province Dongguan 523860 usha Beach Road No. 18 Patentee before: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS Corp.,Ltd. |
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| CF01 | Termination of patent right due to non-payment of annual fee | ||
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Granted publication date: 20180828 |