CN207779330U - The detection device of function test fixture thimble - Google Patents
The detection device of function test fixture thimble Download PDFInfo
- Publication number
- CN207779330U CN207779330U CN201820175957.3U CN201820175957U CN207779330U CN 207779330 U CN207779330 U CN 207779330U CN 201820175957 U CN201820175957 U CN 201820175957U CN 207779330 U CN207779330 U CN 207779330U
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- lower die
- thimble
- test fixture
- function test
- detection device
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- 229910000838 Al alloy Inorganic materials 0.000 claims description 3
- 229920001342 Bakelite® Polymers 0.000 claims description 3
- 239000004637 bakelite Substances 0.000 claims description 3
- 239000004575 stone Substances 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 claims description 2
- 239000011521 glass Substances 0.000 claims description 2
- 238000011179 visual inspection Methods 0.000 abstract description 4
- 230000007547 defect Effects 0.000 abstract description 3
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- 238000007689 inspection Methods 0.000 abstract description 3
- 230000006870 function Effects 0.000 description 36
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- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 4
- 239000004926 polymethyl methacrylate Substances 0.000 description 4
- 238000011990 functional testing Methods 0.000 description 3
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- CERQOIWHTDAKMF-UHFFFAOYSA-M methacrylate group Chemical group C(C(=C)C)(=O)[O-] CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
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- 229920002972 Acrylic fiber Polymers 0.000 description 1
- 241000208340 Araliaceae Species 0.000 description 1
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 description 1
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Abstract
The utility model discloses a kind of detection device of function test fixture thimble, the detection device includes:Detect microscope carrier;Lower die, lower die is mounted on the upper surface of detection microscope carrier, and the multiple through-holes vertically penetrated through, the interior conducting sleeve unlimited equipped with top and bottom end closure of each through-hole are formed in lower die, the bottom of conducting sleeve is electrically connected with LED light, and lower die is transparent or semitransparent and nonconducting component;Laminating mechanism, laminating mechanism includes laminating mechanism ontology and upper mold, upper mold can be moved up and down with respect to lower die, ejector pin component is mounted on the lower section of upper mold, when USB interface powers on and upper mold moves down, when thimble is inserted into corresponding conducting sleeve and is contacted with conducting sleeve to light corresponding LED light, then thimble is qualified.The detection device of function test fixture thimble according to the present utility model, realize standardization detection, avoid the inspection defect of Manual Visual Inspection, reduce function test fixture reach the standard grade fraction defective and therefore caused by false failure rate.
Description
Technical field
The utility model is related to electronic equipment manufacturing technical fields, more particularly, to a kind of inspection of function test fixture thimble
Survey device.
Background technology
In cell phone mainboard or the production of the electronic product of same type, high-volume is needed to use the functional test with thimble
Jig, the minimum 0.7mm of thimble diameter of the function test fixture, or even accomplished minimum 0.4mm.However, so minor diameter
Thimble so that function test fixture production, storage and transport in often because outer force effect cause thimble occur bending,
Crooked phenomenon, so as to cause occurring the case where accidentally surveying and can not use during follow-up test use.
It, can not effective handle to thimble precision currently, the mode of generally use visual inspection is checked that it is low that there are recall rates
Control impacts to the production quality and production efficiency of the electronic product to cell phone mainboard or same type.
Utility model content
The utility model aims to solve at least one of the technical problems existing in the prior art.For this purpose, the utility model carries
Go out a kind of detection device of function test fixture thimble, whether the detection device can intuitively and effectively detect the thimble
It is bent, is crooked.
According to the detection device of the function test fixture thimble of the utility model embodiment, the function test fixture includes
Ejector pin component, the ejector pin component include having the ejector pin component ontology of USB interface and being located on the downside of the ejector pin component ontology
Multiple thimbles, multiple thimbles are connected by the USB interface and power supply, and the detection device includes:Detect microscope carrier;Under
Mould, the lower die be mounted on it is described detection microscope carrier upper surface on, be formed in the lower die vertically penetrate through it is multiple
Through-hole, the interior conducting sleeve unlimited equipped with top and bottom end closure of each through-hole, the bottom electrical connection of the conducting sleeve
It is transparent or semitransparent and nonconducting component to have LED light, the lower die;Laminating mechanism, the laminating mechanism are located at the inspection
It surveys on microscope carrier, the laminating mechanism includes laminating mechanism ontology and is located on the laminating mechanism ontology and is located in the lower die
The upper mold of side, the upper mold can be moved up and down relative to the lower die, wherein the ejector pin component is adapted to mount to the upper mold
Lower section, connect the power supply and the upper mold when the USB interface and move down, be inserted into the thimble corresponding described
Then the thimble is qualified when in conducting sleeve and being contacted with the conducting sleeve to light the corresponding LED light.
According to the detection device of the function test fixture thimble of the utility model embodiment, can intuitively and effectively examine very much
The thimble of function test fixture is measured with the presence or absence of exception and can not be connected, the specification to the thimble of function test fixture is realized
Change detection, avoid that Manual Visual Inspection is existing to check defect, reduce function test fixture reach the standard grade fraction defective and therefore caused by
False failure rate.
The bottom of some embodiments according to the present utility model, the lower die is formed with upwardly recessed groove, wherein more
A through-hole and face above and below the groove, and the roof of the groove, the LED light are run through in the lower end of each through-hole
In the groove.
Some embodiments according to the present utility model, the through-hole include the first through hole section that is sequentially connected from top to bottom and
Second through hole section, wherein the conducting sleeve is mounted in second through hole section, and the internal perisporium of the conducting sleeve and institute
State first through hole section internal perisporium is concordant or the cross-sectional area of the first through hole section be less than the conducting sleeve inner circumferential it is transversal
Area, the thimble are contacted with the side wall of the conducting sleeve or bottom wall to light the corresponding LED light.
The height of some embodiments according to the present utility model, the first through hole section is h, wherein the h meets:h≥
0.3mm。
Some embodiments according to the present utility model, the h further meet:h≥0.5mm.
Some embodiments according to the present utility model, the top of the upper mold have the mobile bar extended straight up;Institute
Stating laminating mechanism ontology includes:Holder, the branch are erected on the detection microscope carrier and positioned at the rear of the lower die;Installation
Plate, mounting plate connection on the bracket, the mounting plate be equipped with the first installing arm set gradually from top to bottom and
The rear end of second installing arm, first installing arm and second installing arm is connected with the mounting plate, second peace
The front end of dress arm has the slide opening vertically penetrated through, wherein the mobile bar can be threaded through the slide opening up or down
In;First connecting rod, the first connecting rod include one end be fixedly connected and angle less than 180 ° first connecting rod section and second connecting rod
Section, the other end of the first connecting rod section are pivotly connected with the front end of first installing arm, the second connecting rod section
The other end has handle;Second connecting rod, one end of the second connecting rod are connected with the top of the mobile bar, the second connecting rod
The other end be pivotly connected with the junction of the first connecting rod section and the second connecting rod section.
Some embodiments according to the present utility model, the lower die are polymethyl methacrylate part.
Some embodiments according to the present utility model, the conducting sleeve are metalwork.
Some embodiments according to the present utility model, the detection microscope carrier and the laminating mechanism are respectively bakelite part or conjunction
At stone part, Al-alloy parts.
Some embodiments according to the present utility model, the power supply are 5V power supplys.
The additional aspect and advantage of the utility model will be set forth in part in the description, partly will be from following description
In become apparent, or recognized by the practice of the utility model.
Description of the drawings
The above-mentioned and/or additional aspect and advantage of the utility model will in the description from combination following accompanying drawings to embodiment
Become apparent and is readily appreciated that, wherein:
Fig. 1 is the stereogram according to the detection device of the function test fixture thimble of the utility model embodiment;
Fig. 2 is according to the vertical of another angle of the detection device of the function test fixture thimble of the utility model embodiment
Body figure;
Fig. 3 is the schematic diagram of the lower die and ejector pin component according to the utility model embodiment;
Fig. 4 is the schematic diagram of lower die shown in Fig. 3;
Fig. 5 is the explosive view of lower die shown in Fig. 4;
Fig. 6 is the diagrammatic cross-section of the lower die and conducting sleeve according to the utility model embodiment;
Fig. 7 is the detection device according to the function test fixture thimble of the utility model embodiment to function test fixture top
The flow chart for the detection method that needle is detected.
Reference numeral:
100:Detection device;
1:Detect microscope carrier;
2:Lower die;21:Through-hole;211:First through hole section;212:Second through hole section;
22:Conducting sleeve;23:LED light;24:Groove;
311:Holder;312:Mounting plate;3121:First installing arm;3122:Second installing arm;
3123:Slide opening;
3131:First connecting rod section;3132:Second connecting rod section;3133:Handle;
314:Second connecting rod;315:Slide bar;316:Connecting plate;
32:Upper mold;321:Mobile bar;
201:Ejector pin component ontology;2011:USB interface;202:Thimble.
Specific implementation mode
The embodiments of the present invention are described below in detail, examples of the embodiments are shown in the accompanying drawings, wherein from beginning
Same or similar element or element with the same or similar functions are indicated to same or similar label eventually.Below by ginseng
The embodiment for examining attached drawing description is exemplary, and is only used for explaining the utility model, and should not be understood as to the utility model
Limitation.
In the description of the present invention, it should be understood that term "center", " longitudinal direction ", " transverse direction ", " length ", " width
Degree ", " thickness ", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom" "inner", "outside", " suitable
The orientation or positional relationship of the instructions such as hour hands ", " counterclockwise ", " axial direction ", " radial direction ", " circumferential direction " is orientation based on ... shown in the drawings
Or position relationship, be merely for convenience of describing the present invention and simplifying the description, do not indicate or imply the indicated device or
Element must have a particular orientation, with specific azimuth configuration and operation, therefore should not be understood as the limit to the utility model
System.In addition, defining " first ", the feature of " second " can explicitly or implicitly include one or more this feature.
In the description of the present invention, unless otherwise indicated, the meaning of " plurality " is two or more.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " is pacified
Dress ", " connected ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integrally
Connection;It can be mechanical connection, can also be electrical connection;Can be directly connected, can also indirectly connected through an intermediary,
It can be the connection inside two elements.For the ordinary skill in the art, it can understand above-mentioned art with concrete condition
The concrete meaning of language in the present invention.
It is filled according to the detection of the function test fixture thimble 202 of the utility model embodiment below with reference to Fig. 1-Fig. 7 descriptions
Set 100.The detection device 100 can be used for being detected the thimble 202 of function test fixture, so that it is determined that the functional test
Whether jig can well use.
Wherein, referring to Figures 1 and 2 and in conjunction with Fig. 3, function test fixture includes ejector pin component, and ejector pin component includes having
The ejector pin component ontology 201 of USB interface 2011 and the multiple thimbles 202 for being located at 201 downside of ejector pin component ontology, multiple thimbles
202 are connected by USB interface 2011 and power supply.Optionally, power supply is 5V power supplys.But not limited to this.
It is understood that USB (English:Universal Serial Bus, universal serial bus) it is connection computer
A kind of serial bus standard and a kind of technical specification of input/output interface of system and external equipment, are widely used
In the information communications product such as PC and mobile device, and extend to photographic goods, DTV (set-top box), game machine etc.
Other related fields.Latest generation is USB 3.1, transmission speed 10Gbit/s, three-stage voltage 5V/12V/20V, and maximum supplies
The slotting type of electric 100W, novel Type C no longer divides positive and negative.
As shown in figs 1 to 6, according to the detection of the function test fixture thimble 202 of the utility model first aspect embodiment
Device 100, including detection microscope carrier 1, lower die 2 and laminating mechanism.
Specifically, lower die 2 is mounted on the upper surface of detection microscope carrier 1, it is formed in lower die 2 and vertically penetrates through
Multiple through-holes 21, the interior conducting sleeve 22 unlimited equipped with top and bottom end closure of each through-hole 21, the bottom electricity of conducting sleeve 22
It is connected with LED (Light Emitting Diode, light emitting diode) lamp, lower die 2 is transparent or semitransparent and nonconducting portion
Part.
Laminating mechanism is located on detection microscope carrier 1, and laminating mechanism includes laminating mechanism ontology and is located on laminating mechanism ontology
And positioned at the upper mold 32 of 2 top of lower die, upper mold 32 can be moved up and down relative to lower die 2, and wherein ejector pin component is adapted to mount to
The lower section of mould 32 is inserted into corresponding conductive sleeve when USB interface 2011 powers on and upper mold 32 is moved down in thimble 202
Then thimble 202 is qualified when in cylinder 22 and being contacted with conducting sleeve 22 to light corresponding LED light 23.
For example, when needing the thimble 202 to the ejector pin component of function test fixture to be detected, it can first make upper mold 32
It is moved up relative to lower die 2, in order to which ejector pin component to be mounted on to the lower section of upper mold 32, after installing, multiple thimbles 202
Positioned at the downside (as shown in Figure 1-Figure 3) of ejector pin component ontology 201;Ejector pin component is accessed into power supply by USB interface 2011 again;
Then upper mold 32 is made to be moved down relative to lower die 2.
If thimble 202 can normally be inserted into and without interference, the no bending or crooked of the thimble 202 is proved.Specifically, when
Thimble 202 is inserted into conducting sleeve 22, and is contacted with conducting sleeve 22, and LED light corresponding with the thimble 202 23 will point
It is bright, to prove that 202 beam conduction of thimble, access are normal.In the case of confirming that access is normal, so that it may to confirm the function
The thimble 202 of measurement jig is normal, no bending or crooked.
It cannot be lighted if there is LED light 23 or thimble 202 cannot normally be inserted into the conducting sleeve 22 of corresponding position
In, then it is assumed that the thimble 202 is unqualified.
As a result, by using lower die 2 made of transparent or semitransparent material, greatly facilitates tester and check lower die 2
The state of bottom LED light 23;Moreover, by selecting nonconducting lower die 2, can prevent thimble 202 due to bending, crooked etc. with
The contact of lower die 2 causes LED light 23 to light and the phenomenon that accidentally surveying occur.It is understood that the transparency of lower die 2 can be according to reality
Border demand is specifically arranged, as long as can meet the state of the convenient LED light 23 of 2 bottom of lower die from outside of tester.
According to the detection device 100 of the function test fixture thimble 202 of the utility model embodiment, can intuitively have very much
The thimble 202 of function test fixture is detected to effect with the presence or absence of exception and can not be connected, is realized to function test fixture
The standardization of thimble 202 detects, and avoids that Manual Visual Inspection is existing to check defect, reduces function test fixture and reaches the standard grade fraction defective
And therefore caused by false failure rate.
Some embodiments according to the present utility model simultaneously combine Fig. 4 and Fig. 5, the bottom of lower die 2 to be formed oriented with reference to Fig. 3
Upper recessed groove 24, plurality of through-hole 21 and about 24 face of groove, and the lower end through-going recess 24 of each through-hole 21
Roof, LED light 23 are located in groove 24.For example, in the example of Fig. 3-Fig. 5, groove 24 from a part for the bottom surface of lower die 2 to
Upper recessed formation, groove 24 are preferably formed in the center of 2 bottom surface of lower die, and multiple through-holes 21 are both formed in position corresponding with groove 24
Place is set, to which the LED light 23 of 22 bottom of conducting sleeve in through-hole 21 can be accommodated in groove 24, prevents lower die 2
Occurs the phenomenon that interfering with detection microscope carrier 1 when mounted.Wherein, the bottom surface of LED light 23 is higher than the bottom surface of lower die 2, alternatively, LED
It the bottom surface of lamp 23 can also be concordant with the holding of the bottom surface of lower die 2.Moreover, the setting of groove 24, it is possible to reduce the materials of lower die 2,
To reduce cost.
Some specific embodiments according to the present utility model, through-hole 21 include the first through hole section being sequentially connected from top to bottom
211 and second through hole section 212, wherein conducting sleeve 22 be mounted in the second through hole section 212, and the internal perisporium of conducting sleeve 22 with
The internal perisporium of first through hole section 211 concordant (as shown in Figure 6) or the cross-sectional area of first through hole section 211 are less than conducting sleeve 22
Inner circumferential cross-sectional area (not shown), thimble 202 contacts with the side wall of conducting sleeve 22 or bottom wall to light corresponding LED light
23.For example, in the example of fig. 6, through-hole 21 is formed as up-small and down-big stepped hole, specifically, cross-sectional area it is smaller first
Through hole section 211 is connected to the top of the second larger through hole section 212 of cross-sectional area, and conducting sleeve 22 is mounted on the second through hole section
In 212, and the internal perisporium of conducting sleeve 22 is concordant with the internal perisporium of first through hole section 211, and the inner circumferential of conducting sleeve 22 is horizontal at this time
Sectional area is equal with the cross-sectional area of first through hole section 211.When needing to be detected thimble 202, upper mold 32 moves down, thimble
202 need to contact with the side wall of conducting sleeve 22 or bottom wall after being passed down through first through hole section 211, to light the conductive sleeve
The LED light 23 of 22 bottoms of cylinder, to improve the accuracy of detection result.As a result, by the way that second will be sunk under conducting sleeve 22
In through hole section 212, and keep the internal perisporium of conducting sleeve 22 concordant with the internal perisporium of first through hole section 211, or makes first through hole section
211 cross-sectional area is less than the inner circumferential cross-sectional area of conducting sleeve 22, it is therefore prevented that thimble 202, which does not extend into through-hole 21, to be occurred and conduction
Sleeve 22 contacts the case where lightening LED lamp 23, avoids and accidentally surveys, and further can carry out effective control to 202 precision of thimble.
Further embodiment according to the present utility model, as shown in fig. 6, the height of first through hole section 211 is h, wherein high
H is spent to meet:h≥0.3mm.Thus, it is possible to which thimble 202 that device 100 after testing detects is effectively ensured without bending or crooked etc.
Phenomenon, detection result are more accurate.
Further, h further meets:h≥0.5mm.
As shown in fig. 6, the bottom surface of conducting sleeve 22 is preferably concordant with the bottom surface of lower die 2, in this way so that entire lower die 2
Shape is more beautiful.Certainly, the utility model is without being limited thereto, and the bottom surface of conducting sleeve 22 can also extend downwardly the bottom of through-hole 21
End.
Wherein, (Printed Circuit Board, Chinese are print to the PCB that thimble 202 can be tested as required
Circuit board processed, also known as printed wiring board, are important electronic unit, are the supporters of electronic component, are electronic component electricity
The carrier of gas connection) pad size design.
Arrangement and specific size of the through-hole 21 in lower die 2 can be according to the thimble groups of function test fixture to be detected
The arrangement of thimble 202 on part and specific size specifically determine.It is understood that showing that five lead in Fig. 3-Fig. 4
For illustration purposes, but those of ordinary skill can manage after having read following technical solution, obviously in hole 21
The program is applied in two, three, four or technical solution more than five through-holes 21 by solution, and it is new that this also falls into this practicality
Within the protection domain of type.
Some specific embodiments according to the present utility model, as depicted in figs. 1 and 2, the top of upper mold 32 have vertically to
The mobile bar 321 of upper extension;Laminating mechanism ontology includes:Holder 311, mounting plate 312, first connecting rod and second connecting rod 314, tool
For body, holder 311 is located on detection microscope carrier 1 and positioned at the rear of lower die 2, and mounting plate 312 is connected on holder 311, is installed
Plate 312 is equipped with the first installing arm 3121 and the second installing arm 3122 set gradually from top to bottom, at this time the second installing arm
3122 are located at the lower section of the first installing arm 3121, and the rear end of the first installing arm 3121 and the second installing arm 3122 is and mounting plate
312 are connected, and the front end of the second installing arm 3122 has the slide opening 3123 vertically penetrated through, and wherein mobile bar 321 can be upper and lower
It is movably threaded through in slide opening 3123, first connecting rod includes that one end is fixedly connected and angle is less than 180 ° of first connecting rod section 3131
With second connecting rod section 3132, the other end (for example, upper end in Fig. 2) of first connecting rod section 3131 with before the first installing arm 3121
End is pivotly connected, and the other end (for example, front end in Fig. 2) of second connecting rod section 3132 has handle 3133, second connecting rod
314 one end (for example, lower end in Fig. 2) is connected with the top of mobile bar 321, and the other end of second connecting rod 314 is (for example, Fig. 2
In upper end) be pivotly connected with the junction of first connecting rod section 3131 and second connecting rod section 3132.For example, when needs will be upper
When mould 32 moves up, handle 3133 can be moved upwards, and handle 3133 will drive mobile bar by second connecting rod 314 at this time
321 move up, to drive upper mold 32 to move up.When needing to move down upper mold 32, handle 3133 can be moved downwards,
Handle 3133 will drive mobile bar 321 to move down by second connecting rod 314 at this time, to drive upper mold 32 to move down.Lead to as a result,
It crosses using above-mentioned mobile bar 321 and laminating mechanism ontology, moving up and down for upper mold 32 can be conveniently realized, it is simple in structure,
It is easily achieved.
Further, referring to Fig.1 and in conjunction with Fig. 2, holder 311 is equipped with vertical extension and spaced two cunnings in left and right
The bottom of bar 315, mobile bar 321 can be equipped with horizontal-extending connecting plate 316, and two slide bars 315 are threaded through connecting plate 316
On, wherein upper mold 32 is connected to the downside of connecting plate 316.It, can as a result, by the cooperation of two slide bars 315 and connecting plate 316
To be further ensured that upper mold 32 is steady along the vertical direction mobile.
Referring to Figures 1 and 2, the angle between first connecting rod section 3131 and second connecting rod section 3132 is preferably 90 °.
Optionally, first connecting rod section 3131 and second connecting rod section 3132 are preferably integrally formed part, in order to first connecting rod
Processing, it is cost-effective.
Under normal conditions, lower die 2 is fixedly connected on detection microscope carrier 1, and lower die 2 is fixed relative to detection microscope carrier 1 at this time
Motionless.Since upper mold 32 is only capable of moving up and down relative to lower die 2, consequently facilitating the ejector pin component alignment in upper mold 32
Conducting sleeve 22 in lower die 2 can avoid the occurrence of the phenomenon that accidentally surveying in this way.
Further, for the ease of to different function test fixtures thimble 202 (for example, when thimble 202 quantity,
When arrangement mode difference) be detected, lower die 2 can be detachably connected to detection microscope carrier 1 on, in order to replace with it is corresponding
The lower die 2 that function test fixture matches.The versatility for improving detection device 100 as a result, extends detection device 100
Application range.
Optionally, lower die 2 is polymethyl methacrylate part.For example, lower die 2 (is called PMMA or organic glass, is originated from using acrylic
English acrylic (acrylic plastics), chemical name is polymethyl methacrylate) plate or other transparent material materials make,
Conveniently check the state of the LED light 23 of 2 bottom of lower die.But not limited to this.
Optionally, conducting sleeve 22 is metalwork.But not limited to this.
Optionally, it is respectively bakelite part or compound stone part, Al-alloy parts to detect microscope carrier 1 and laminating mechanism.But not limited to this.
It is understood that lower die 2, conducting sleeve 22, detection microscope carrier 1 and the specific material of laminating mechanism can be according to realities
Border requires specific setting, preferably to meet practical application.
It is simple in structure according to the detection device 100 of the function test fixture thimble 202 of the utility model embodiment, design
It is ingenious, it is easy to operate, it can very intuitive, fast and effeciently detect that the thimble 202 of which function test fixture or function are surveyed
Which thimble 202 of examination jig exists abnormal and can not be connected, and recall rate is high, and can be carried out to the precision of thimble 202 effective
Control, to ensure that cell phone mainboard or same type electronic product production quality and production efficiency.
As shown in fig. 7, according to the detection method of the utility model second aspect embodiment, detection method is used according to this reality
With the detection device 100 of the function test fixture thimble 202 of novel above-mentioned first aspect embodiment to function test fixture thimble
202 are detected,
Detection method includes the following steps for this:
Ejector pin component to be detected is installed to upper mold 32;
USB interface 2011 is accessed into power supply;
The upper mold 32 for being equipped with ejector pin component is set to move down;
When the thimble 202 of ejector pin component is inserted into corresponding conducting sleeve 22 and is contacted with conducting sleeve 22 will be corresponding
LED light 23 is lighted, then proves that thimble 202 is qualified, otherwise unqualified.
Optionally, power supply is 5V power supplys.But not limited to this.
Specifically, for example, function test fixture uses 2011 external power supply of USB interface.Ejector pin component is being put into test
After the upper mold 32 of device, matching is packed into corresponding lower die 2 in 2 fixed part of lower die.Wherein, ejector pin component can pass through USB
Interface 2011 accesses 5V power supplys.
After accessing 5V power supplys, upper mold 32 is depressed by laminating mechanism ontology come the thimble 202 of ejector pin component can be worn
It is inserted into the conducting sleeve 22 of lower die 2, the thimble 202 is proved if it can normally be inserted into without interference without crooked, when thimble group
The thimble 202 of part is inserted into conducting sleeve 22, is contacted with 22 side wall of conducting sleeve or bottom, position corresponding with the conducting sleeve 22
The LED light 23 at the place of setting will be lighted, then prove that 202 beam conduction of thimble, access are normal.
In the case of confirming that access is normal, so that it may which this thimble 202 to confirm the function test fixture is normal, such as goes out
Existing LED light 23 cannot light or thimble 202 cannot be normally inserted into the conducting sleeve 22 of corresponding position, is considered as the thimble
202 is unqualified.
It is easy to operate according to the detection method of the utility model embodiment, convenient for tester to functional test to be detected
The thimble 202 of jig is detected.
In the description of this specification, reference term " one embodiment ", " some embodiments ", " illustrative examples ",
The description of " example ", " specific example " or " some examples " etc. means specific features described in conjunction with this embodiment or example, knot
Structure, material or feature are contained at least one embodiment or example of the utility model.In the present specification, to above-mentioned art
The schematic representation of language may not refer to the same embodiment or example.Moreover, description specific features, structure, material or
Person's feature can be combined in any suitable manner in any one or more of the embodiments or examples.
While there has been shown and described that the embodiments of the present invention, it will be understood by those skilled in the art that:
Can these embodiments be carried out with a variety of variations in the case where not departing from the principles of the present invention and objective, modification, replaced
And modification, the scope of the utility model are limited by claim and its equivalent.
Claims (10)
1. a kind of detection device of function test fixture thimble, which is characterized in that the function test fixture includes ejector pin component,
The ejector pin component includes the ejector pin component ontology with USB interface and the multiple tops being located on the downside of the ejector pin component ontology
Needle, multiple thimbles are connected by the USB interface and power supply, and the detection device includes:
Detect microscope carrier;
Lower die, the lower die are mounted on the upper surface of the detection microscope carrier, are formed in the lower die and vertically penetrate through
Multiple through-holes, opened wide equipped with top in each through-hole and the conducting sleeve of bottom end closure, the bottom of the conducting sleeve
It is electrically connected with LED light, the lower die is transparent or semitransparent and nonconducting component;
Laminating mechanism, the laminating mechanism are located on the detection microscope carrier, and the laminating mechanism includes laminating mechanism ontology and sets
Upper mold on the laminating mechanism ontology and above the lower die, the upper mold relative to the lower die can on move down
It is dynamic,
The wherein described ejector pin component is adapted to mount to the lower section of the upper mold, when the USB interface connects the power supply and described
Upper mold moves down, and is inserted into the corresponding conducting sleeve in the thimble and is contacted with the conducting sleeve to light pair
Then the thimble is qualified when the LED light answered.
2. the detection device of function test fixture thimble according to claim 1, which is characterized in that the bottom of the lower die
It is formed with upwardly recessed groove, the plurality of through-hole and groove face, and the lower end of each through-hole up and down
Through the roof of the groove, the LED light is located in the groove.
3. the detection device of function test fixture thimble according to claim 1 or 2, which is characterized in that the through-hole packet
The first through hole section being sequentially connected from top to bottom and the second through hole section are included, wherein the conducting sleeve is mounted on second through-hole
In section, and the internal perisporium of the conducting sleeve is concordant with the internal perisporium of the first through hole section, or
The cross-sectional area of the first through hole section is less than the inner circumferential cross-sectional area of the conducting sleeve,
The thimble is contacted with the side wall of the conducting sleeve or bottom wall to light the corresponding LED light.
4. the detection device of function test fixture thimble according to claim 3, which is characterized in that the first through hole section
Height be h, wherein the h meets:h≥0.3mm.
5. the detection device of function test fixture thimble according to claim 4, which is characterized in that the h is further full
Foot:h≥0.5mm.
6. the detection device of function test fixture thimble according to claim 1, which is characterized in that the top of the upper mold
With the mobile bar extended straight up;
The laminating mechanism ontology includes:
Holder, the branch are erected on the detection microscope carrier and positioned at the rear of the lower die;
Mounting plate, on the bracket, the mounting plate is equipped with first set gradually from top to bottom for the mounting plate connection
The rear end of installing arm and the second installing arm, first installing arm and second installing arm is connected with the mounting plate, institute
The front end for stating the second installing arm has the slide opening vertically penetrated through, wherein the mobile bar can be threaded through institute up or down
It states in slide opening;
First connecting rod, the first connecting rod include one end be fixedly connected and angle less than 180 ° first connecting rod section and second connecting rod
Section, the other end of the first connecting rod section are pivotly connected with the front end of first installing arm, the second connecting rod section
The other end has handle;
Second connecting rod, one end of the second connecting rod are connected with the top of the mobile bar, the other end of the second connecting rod with
The first connecting rod section is pivotly connected with the junction of the second connecting rod section.
7. the detection device of function test fixture thimble according to claim 1, which is characterized in that the lower die is organic
Glass workpiece.
8. the detection device of function test fixture thimble according to claim 1, which is characterized in that the conducting sleeve is
Metalwork.
9. the detection device of function test fixture thimble according to claim 1, which is characterized in that the detection microscope carrier and
The laminating mechanism is respectively bakelite part or compound stone part, Al-alloy parts.
10. the detection device of function test fixture thimble according to claim 1, which is characterized in that the power supply is 5V
Power supply.
Priority Applications (1)
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CN201820175957.3U CN207779330U (en) | 2018-01-31 | 2018-01-31 | The detection device of function test fixture thimble |
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CN201820175957.3U CN207779330U (en) | 2018-01-31 | 2018-01-31 | The detection device of function test fixture thimble |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111638082A (en) * | 2020-06-29 | 2020-09-08 | 深圳至峰精密制造有限公司 | Test method and test equipment |
CN113125813A (en) * | 2021-04-20 | 2021-07-16 | 深圳市成蝶科技有限公司 | PCB function test fixture and test method |
-
2018
- 2018-01-31 CN CN201820175957.3U patent/CN207779330U/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111638082A (en) * | 2020-06-29 | 2020-09-08 | 深圳至峰精密制造有限公司 | Test method and test equipment |
CN113125813A (en) * | 2021-04-20 | 2021-07-16 | 深圳市成蝶科技有限公司 | PCB function test fixture and test method |
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Address after: Changan town in Guangdong province Dongguan 523860 usha Beach Road No. 18 Patentee after: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS Corp.,Ltd. Address before: Changan town in Guangdong province Dongguan 523860 usha Beach Road No. 18 Patentee before: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS Corp.,Ltd. |
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