CN108253879A - The detection device and detection method of function test fixture thimble - Google Patents
The detection device and detection method of function test fixture thimble Download PDFInfo
- Publication number
- CN108253879A CN108253879A CN201810095032.2A CN201810095032A CN108253879A CN 108253879 A CN108253879 A CN 108253879A CN 201810095032 A CN201810095032 A CN 201810095032A CN 108253879 A CN108253879 A CN 108253879A
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- Prior art keywords
- thimble
- lower die
- test fixture
- function test
- conducting sleeve
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- 238000001514 detection method Methods 0.000 title claims abstract description 75
- 238000012360 testing method Methods 0.000 title claims abstract description 55
- 238000010030 laminating Methods 0.000 claims abstract description 26
- 229910000838 Al alloy Inorganic materials 0.000 claims description 3
- 229920001342 Bakelite® Polymers 0.000 claims description 3
- 239000004637 bakelite Substances 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 claims description 3
- 239000004575 stone Substances 0.000 claims description 3
- 239000011521 glass Substances 0.000 claims description 2
- 238000011179 visual inspection Methods 0.000 abstract description 4
- 230000007547 defect Effects 0.000 abstract description 3
- 230000002950 deficient Effects 0.000 abstract description 3
- 238000007689 inspection Methods 0.000 abstract description 2
- 238000004519 manufacturing process Methods 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 238000005452 bending Methods 0.000 description 5
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 4
- 239000004926 polymethyl methacrylate Substances 0.000 description 4
- 238000011990 functional testing Methods 0.000 description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- CERQOIWHTDAKMF-UHFFFAOYSA-M methacrylate group Chemical group C(C(=C)C)(=O)[O-] CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229920002972 Acrylic fiber Polymers 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000000994 depressogenic effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses a kind of detection device and detection method of function test fixture thimble, the detection device includes：Detect microscope carrier；Lower die, lower die is mounted on the upper surface of detection microscope carrier, is formed with the multiple through-holes vertically penetrated through in lower die, is opened wide in each through-hole equipped with top and the conducting sleeve of bottom end closure, the bottom of conducting sleeve is electrically connected with LED light, and lower die is transparent or semitransparent and nonconducting component；Laminating mechanism, laminating mechanism includes laminating mechanism ontology and upper mold, upper mold can be moved up and down with respect to lower die, ejector pin component is mounted on the lower section of upper mold, when USB interface powers on and upper mold moves down, when thimble is inserted into corresponding conducting sleeve and is contacted with conducting sleeve to light corresponding LED light, then thimble is qualified.The detection device of function test fixture thimble according to the present invention realizes standardization detection, avoids the inspection defect of Manual Visual Inspection, reduce function test fixture reach the standard grade fraction defective and therefore caused by false failure rate.
Description
Technical field
The present invention relates to electronic equipment manufacturing technical field, the detection more particularly, to a kind of function test fixture thimble fills
It puts and detection method.
Background technology
In cell phone mainboard or the production of the electronic product of same type, high-volume is needed to use the functional test with thimble
Jig, the minimum 0.7mm of thimble diameter of the function test fixture or even has accomplished minimum 0.4mm.However, so minor diameter
Thimble so that function test fixture production, storage and transport in often because external force effect causes thimble occur bending,
The phenomenon that crooked, so as to cause occurring the situation accidentally surveyed and can not used during follow-up test use.
At present, the mode of generally use visual inspection is checked, low there are recall rate, can not effective handle to thimble precision
Control impacts so as to the production quality and production efficiency of the electronic product to cell phone mainboard or same type.
Invention content
The present invention is directed at least solve one of technical problem in the prior art.For this purpose, the present invention proposes a kind of work(
The detection device of energy measurement jig thimble, the detection device can intuitively and effectively detect whether the thimble is bent, is askew
Tiltedly.
The present invention also proposes a kind of detection device using above-mentioned function test fixture thimble to function test fixture thimble
The detection method being detected.
The detection device of the function test fixture thimble of embodiment according to a first aspect of the present invention, the function test fixture
Including ejector pin component, the ejector pin component includes the ejector pin component ontology with USB interface and is located at the ejector pin component ontology
Multiple thimbles of downside, multiple thimbles are connected by the USB interface and power supply, and the detection device includes：Detection carries
Platform；Lower die, the lower die are mounted on the upper surface of the detection microscope carrier, are formed with what is vertically penetrated through in the lower die
Multiple through-holes each open wide equipped with top in the through-hole and the conducting sleeve of bottom end closure, the bottom of the conducting sleeve are electric
LED light is connected with, the lower die is transparent or semitransparent and nonconducting component；Laminating mechanism, the laminating mechanism are located at institute
It states on detection microscope carrier, the laminating mechanism includes laminating mechanism ontology and is located on the laminating mechanism ontology and under described
Upper mold above mould, the upper mold can be moved up and down relative to the lower die, wherein the ejector pin component be adapted to mount to it is described
The lower section of upper mold, when the USB interface connection power supply and the upper mold moves down, and is inserted into the thimble corresponding
Then the thimble is qualified when in the conducting sleeve and being contacted with the conducting sleeve to light the corresponding LED light.
The detection device of function test fixture thimble according to embodiments of the present invention can be detected intuitively and effectively very much
The thimble of function test fixture is with the presence or absence of exception and can not be connected, and realizes the inspection of the standardization to the thimble of function test fixture
Survey, avoid that Manual Visual Inspection is existing to check defect, reduce function test fixture reach the standard grade fraction defective and therefore caused by accidentally survey
Rate.
According to some embodiments of the present invention, the bottom of the lower die is formed with upwardly recessed groove, plurality of institute
Through-hole and groove face, and the roof of the groove is run through in the lower end of each through-hole up and down are stated, the LED light is located at
In the groove.
According to some embodiments of the present invention, the through-hole includes the first through hole section and second being sequentially connected from top to bottom
Through hole section, wherein the conducting sleeve is mounted in second through hole section, and the internal perisporium of the conducting sleeve and described the
The internal perisporium of one through hole section is concordant or the cross-sectional area of the first through hole section is less than the inner circumferential cross section of the conducting sleeve
Product, the thimble contact to light the corresponding LED light with the side wall or bottom wall of the conducting sleeve.
According to some embodiments of the present invention, the height of the first through hole section is h, wherein, the h meets：h≥
0.3mm。
According to some embodiments of the present invention, the h further meets：h≥0.5mm.
According to some embodiments of the present invention, the top of the upper mold has the mobile bar extended straight up；The pressure
Mechanism body is closed to include：Stent, the branch are erected on the detection microscope carrier and positioned at the rear of the lower die；Installing plate, institute
State installing plate connection on the bracket, the installing plate is equipped with the first installing arm set gradually from top to bottom and the second peace
The rear end of dress arm, first installing arm and second installing arm is connected with the installing plate, second installing arm
Front end has the slide opening vertically penetrated through, wherein the mobile bar can be up or down threaded through in the slide opening；First
Connecting rod, the first connecting rod is fixedly connected including one end and first connecting rod section and second connecting rod section of the angle less than 180 °, described
The other end of first connecting rod section is pivotly connected with the front end of first installing arm, the other end tool of the second connecting rod section
There is handle；Second connecting rod, one end of the second connecting rod are connected with the top of the mobile bar, the other end of the second connecting rod
Pivotly it is connected with the junction of the first connecting rod section and the second connecting rod section.
According to some embodiments of the present invention, the lower die is polymethyl methacrylate part.
According to some embodiments of the present invention, the conducting sleeve is metalwork.
According to some embodiments of the present invention, the detection microscope carrier and the laminating mechanism are respectively bakelite part or compound stone
Part, Al-alloy parts.
The detection method of embodiment according to a second aspect of the present invention, the detection method are used according to the present invention above-mentioned first
The detection device of the function test fixture thimble of aspect embodiment is detected function test fixture thimble, the detection method
Include the following steps：Ejector pin component to be detected is installed to the upper mold；The USB interface is accessed into the power supply；Make peace
The upper mold equipped with the ejector pin component moves down；When the thimble of the ejector pin component is inserted into corresponding described lead
It contacts in electric sleeve and with the conducting sleeve and lights the corresponding LED light, then prove that the thimble is qualified, otherwise do not conform to
Lattice.
According to some embodiments of the present invention, the power supply is 5V power supplys.
The additional aspect and advantage of the present invention will be set forth in part in the description, and will partly become from the following description
It obtains significantly or is recognized by the practice of the present invention.
Description of the drawings
The above-mentioned and/or additional aspect and advantage of the present invention will become in the description from combination accompanying drawings below to embodiment
Significantly and it is readily appreciated that, wherein：
Fig. 1 is the stereogram of the detection device of function test fixture thimble according to embodiments of the present invention；
Fig. 2 is the solid of another angle of the detection device of function test fixture thimble according to embodiments of the present invention
Figure；
Fig. 3 is the schematic diagram of lower die according to embodiments of the present invention and ejector pin component；
Fig. 4 is the schematic diagram of the lower die shown in Fig. 3；
Fig. 5 is the explosive view of the lower die shown in Fig. 4；
Fig. 6 is lower die according to embodiments of the present invention and the diagrammatic cross-section of conducting sleeve；
Fig. 7 be function test fixture thimble according to embodiments of the present invention detection device to function test fixture thimble into
The flow chart of the detection method of row detection.
Reference numeral：
100：Detection device；
1：Detect microscope carrier；
2：Lower die；21：Through-hole；211：First through hole section；212：Second through hole section；
22：Conducting sleeve；23：LED light；24：Groove；
311：Stent；312：Installing plate；3121：First installing arm；3122：Second installing arm；
3123：Slide opening；
3131：First connecting rod section；3132：Second connecting rod section；3133：Handle；
314：Second connecting rod；315：Slide bar；316：Connecting plate；
32：Upper mold；321：Mobile bar；
201：Ejector pin component ontology；2011：USB interface；202：Thimble.
Specific embodiment
The embodiment of the present invention is described below in detail, the example of the embodiment is shown in the drawings, wherein from beginning to end
Same or similar label represents same or similar element or the element with same or like function.Below with reference to attached
The embodiment of figure description is exemplary, and is only used for explaining the present invention, and is not considered as limiting the invention.
In the description of the present invention, it is to be understood that term " " center ", " longitudinal direction ", " transverse direction ", " length ", " width ",
" thickness ", " on ", " under ", "front", "rear", "left", "right", " vertical ", " level ", " top ", " bottom " " interior ", " outer ", " up time
The orientation or position relationship of the instructions such as needle ", " counterclockwise ", " axial direction ", " radial direction ", " circumferential direction " be based on orientation shown in the drawings or
Position relationship is for only for ease of the description present invention and simplifies description rather than instruction or imply that signified device or element must
There must be specific orientation, with specific azimuth configuration and operation, therefore be not considered as limiting the invention.In addition, limit
Surely there is " first ", one or more this feature can be expressed or be implicitly included to the feature of " second ".The present invention's
In description, unless otherwise indicated, " multiple " are meant that two or more.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " installation ", " phase
Even ", " connection " should be interpreted broadly, for example, it may be being fixedly connected or being detachably connected or be integrally connected；It can
To be mechanical connection or be electrically connected；It can be directly connected, can also be indirectly connected by intermediary, Ke Yishi
Connection inside two elements.For the ordinary skill in the art, above-mentioned term can be understood at this with concrete condition
Concrete meaning in invention.
The detection device of function test fixture thimble 202 according to embodiments of the present invention is described below with reference to Fig. 1-Fig. 7
100.The detection device 100 can be used for being detected the thimble 202 of function test fixture, so that it is determined that the functional test is controlled
Whether tool can well use.
Wherein, referring to Figures 1 and 2 and with reference to Fig. 3, function test fixture includes ejector pin component, and ejector pin component includes having
The ejector pin component ontology 201 of USB interface 2011 and the multiple thimbles 202 for being located at 201 downside of ejector pin component ontology, multiple thimbles
202 are connected by USB interface 2011 and power supply.Optionally, power supply is 5V power supplys.But not limited to this.
It is understood that USB (English：Universal Serial Bus, universal serial bus) it is connection computer
A kind of serial bus standard and a kind of technical specification of input/output interface of system and external equipment, are widely used
In the information communications product such as PC and mobile equipment, and extend to photographic goods, DTV (set-top box), game machine etc.
Other related fields.Latest generation is USB 3.1, transmission speed 10Gbit/s, three-stage voltage 5V/12V/20V, and maximum supplies
Electric 100W, novel Type C insert type no longer divide it is positive and negative.
As shown in figs 1 to 6, the detection device of the function test fixture thimble 202 of embodiment according to a first aspect of the present invention
100, including detection microscope carrier 1, lower die 2 and laminating mechanism.
Specifically, lower die 2 is mounted on the upper surface of detection microscope carrier 1, it is formed with what is vertically penetrated through in lower die 2
Multiple through-holes 21, are opened wide equipped with top in each through-hole 21 and the conducting sleeve of bottom end closure 22, the bottom of conducting sleeve 22 are electric
LED (Light Emitting Diode, light emitting diode) lamp is connected with, lower die 2 is transparent or semitransparent and nonconducting portion
Part.
Laminating mechanism is located on detection microscope carrier 1, and laminating mechanism includes laminating mechanism ontology and is located on laminating mechanism ontology
And positioned at the upper mold 32 of 2 top of lower die, upper mold 32 can be moved up and down relative to lower die 2, and wherein ejector pin component is adapted to mount to
When USB interface 2011 powers on and upper mold 32 moves down, corresponding conductive sleeve is inserted into thimble 202 for the lower section of mould 32
Then thimble 202 is qualified when in cylinder 22 and being contacted with conducting sleeve 22 to light corresponding LED light 23.
For example, when the thimble 202 to the ejector pin component of function test fixture is needed to be detected, it can first make upper mold 32
It is moved up relative to lower die 2, in order to which ejector pin component to be mounted on to the lower section of upper mold 32, after installing, multiple thimbles 202
Positioned at the downside of ejector pin component ontology 201 (as shown in Figure 1-Figure 3)；Ejector pin component is accessed into power supply by USB interface 2011 again；
Then upper mold 32 is made to be moved down relative to lower die 2.
If thimble 202 can normally be inserted into and without interference, prove the no bending or crooked of the thimble 202.Specifically, when
Thimble 202 is inserted into conducting sleeve 22, and is contacted with conducting sleeve 22, will point with the 202 corresponding LED light 23 of thimble
Bright, so as to prove 202 beam conduction of thimble, access is normal.In the case of confirming that access is normal, it is possible to confirm the function
The thimble 202 of measurement jig is normal, no bending or crooked.
It cannot be lighted if there is LED light 23 or thimble 202 cannot normally be inserted into the conducting sleeve 22 of corresponding position
In, then it is assumed that the thimble 202 is unqualified.
As a result, by using lower die 2 made of transparent or semitransparent material, greatly facilitate tester and check lower die 2
The state of bottom LED light 23；Moreover, by selecting nonconducting lower die 2, can prevent thimble 202 due to bending, crooked etc. with
The contact of lower die 2 causes LED light 23 to light and the phenomenon that accidentally surveying occur.It is understood that the transparency of lower die 2 can be according to reality
Border demand is specifically set, as long as can meet the state of the convenient LED light 23 of 2 bottom of lower die from outside of tester.
The detection device 100 of function test fixture thimble 202 according to embodiments of the present invention, can very intuitively and effectively
The thimble 202 of function test fixture is detected with the presence or absence of exception and can not be connected, realizes the thimble to function test fixture
202 standardization detection, avoids that Manual Visual Inspection is existing to check defect, reduce function test fixture reach the standard grade fraction defective and because
False failure rate caused by this.
According to some embodiments of the present invention, with reference to Fig. 3 and Fig. 4 and Fig. 5 is combined, the bottom of lower die 2 is formed with concave up
The groove 24 entered, plurality of through-hole 21 and groove face about 24, and the roof of the lower end through-going recess 24 of each through-hole 21,
LED light 23 is located in groove 24.For example, in the example of Fig. 3-Fig. 5, groove 24 by lower die 2 bottom surface it is a part of concave up
Enter to be formed, groove 24 is preferably formed in the center of 2 bottom surface of lower die, and multiple through-holes 21 are both formed in and 24 corresponding position of groove
Place so as to which the LED light 23 of 22 bottom of conducting sleeve in through-hole 21 can be accommodated in groove 24, prevents lower die 2 from existing
Occurs the phenomenon that interfering with detection microscope carrier 1 during installation.Wherein, the bottom surface of LED light 23 is higher than the bottom surface of lower die 2, alternatively, LED light
It 23 bottom surface can also be concordant with the holding of the bottom surface of lower die 2.Moreover, the setting of groove 24, it is possible to reduce the materials of lower die 2, from
And reduce cost.
Some specific embodiments according to the present invention, through-hole 21 include the first through hole section 211 being sequentially connected from top to bottom
With the second through hole section 212, wherein conducting sleeve 22 is mounted in the second through hole section 212, and the internal perisporium of conducting sleeve 22 and the
The internal perisporium of one through hole section 211 concordant (as shown in Figure 6) or the cross-sectional area of first through hole section 211 are less than conducting sleeve 22
Inner circumferential cross-sectional area (not shown), thimble 202 contact to light corresponding LED light with the side wall or bottom wall of conducting sleeve 22
23.For example, in the example of fig. 6, through-hole 21 is formed as up-small and down-big stepped hole, and specifically, cross-sectional area smaller first
Through hole section 211 is connected to the top of the second larger through hole section 212 of cross-sectional area, and conducting sleeve 22 is mounted on the second through hole section
In 212, and the internal perisporium of conducting sleeve 22 is concordant with the internal perisporium of first through hole section 211, and the inner circumferential of conducting sleeve 22 is horizontal at this time
Sectional area is equal with the cross-sectional area of first through hole section 211.When needing to be detected thimble 202, upper mold 32 moves down, thimble
202 need to contact with the side wall or bottom wall of conducting sleeve 22 after being passed down through first through hole section 211, to light the conductive sleeve
The LED light 23 of 22 bottoms of cylinder, so as to improve the accuracy of detection result.As a result, by the way that second will be sunk under conducting sleeve 22
In through hole section 212, and make the internal perisporium of conducting sleeve 22 concordant with the internal perisporium of first through hole section 211 or make first through hole section
211 cross-sectional area is less than the inner circumferential cross-sectional area of conducting sleeve 22, it is therefore prevented that thimble 202, which does not extend into through-hole 21, to be occurred and conduction
Sleeve 22 contacts and the situation of lightening LED lamp 23, avoids and accidentally surveys, and further can carry out effective control to 202 precision of thimble.
According to a further embodiment of the invention, as shown in fig. 6, the height of first through hole section 211 is h, wherein, height h
Meet：h≥0.3mm.Show thus, it is possible to which the thimble 202 that device 100 detects after testing is effectively ensured without bending or crooked grade
As detection result is more accurate.
Further, h further meets：h≥0.5mm.
As shown in fig. 6, the bottom surface of conducting sleeve 22 is preferably concordant with the bottom surface of lower die 2, in this way so that entire lower die 2
Shape is more beautiful.Certainly, the present invention is not limited thereto, and the bottom surface of conducting sleeve 22 can also extend downwardly the bottom end of through-hole 21.
Wherein, (Printed Circuit Board, Chinese are print to the PCB that thimble 202 can be tested as required
Circuit board processed, also known as printed wiring board, are important electronic unit, are the supporters of electronic component, are electronic component electricity
The carrier of gas connection) pad size design.
Arrangement and specific size of the through-hole 21 in lower die 2 can be according to the thimble groups of function test fixture to be detected
The arrangement of thimble 202 on part and specific size specifically determine.It is understood that show that five lead in Fig. 3-Fig. 4
For illustration purposes, but those of ordinary skill can manage after following technical solution has been read, obviously in hole 21
The program is applied in two, three, four or technical solution more than five through-holes 21 by solution, this also falls into the present invention's
Within protection domain.
Some specific embodiments according to the present invention, as depicted in figs. 1 and 2, the top of upper mold 32 has prolongs straight up
The mobile bar 321 stretched；Laminating mechanism ontology includes：Stent 311, installing plate 312, first connecting rod and second connecting rod 314, it is specific and
Speech, stent 311 are located on detection microscope carrier 1 and positioned at the rear of lower die 2, and installing plate 312 is connected on stent 311, installing plate 312
The first installing arm 3121 and the second installing arm 3122 set gradually from top to bottom is equipped with, the second installing arm 3122 is located at this time
The rear end of the lower section of first installing arm 3121, the first installing arm 3121 and the second installing arm 3122 is connected with installing plate 312, the
The front end of two installing arms 3122 has the slide opening 3123 vertically penetrated through, and wherein mobile bar 321 can be worn up or down
In slide opening 3123, first connecting rod is fixedly connected including one end and first connecting rod section 3131 and second connecting rod of the angle less than 180 °
Section 3132, the other end (for example, upper end in Fig. 2) of first connecting rod section 3131 and the front end of the first installing arm 3121 are pivotly
It is connected, the other end (for example, front end in Fig. 2) of second connecting rod section 3132 has handle 3133, one end of second connecting rod 314
(for example, lower end in Fig. 2) is connected with the top of mobile bar 321, the other end (for example, upper end in Fig. 2) of second connecting rod 314
Pivotly it is connected with the junction of first connecting rod section 3131 and second connecting rod section 3132.It is for example, when needing that upper mold 32 is upward
When mobile, handle 3133 can be moved upwards, and handle 3133 will drive mobile bar 321 to moving up by second connecting rod 314 at this time
It is dynamic, so as to which upper mold 32 be driven to move up.When needing to move down upper mold 32, handle 3133 can be moved downwards, at this time handle
3133 will drive mobile bar 321 to move down by second connecting rod 314, so as to which upper mold 32 be driven to move down.As a result, by using upper
The mobile bar 321 and laminating mechanism ontology stated, can conveniently realize moving up and down for upper mold 32, have the advantages of simple structure and easy realization.
Further, with reference to Fig. 1 and with reference to Fig. 2, stent 311 is equipped with vertical extension and spaced two cunnings in left and right
Bar 315, the bottom of mobile bar 321 can be equipped with horizontal-extending connecting plate 316, and two slide bars 315 are threaded through connecting plate 316
On, wherein, upper mold 32 is connected to the downside of connecting plate 316.It, can as a result, by the cooperation of two slide bars 315 and connecting plate 316
To be further ensured that upper mold 32 is steady along the vertical direction mobile.
Referring to Figures 1 and 2, the angle between first connecting rod section 3131 and second connecting rod section 3132 is preferably 90 °.
Optionally, first connecting rod section 3131 and second connecting rod section 3132 are preferably integrally formed part, in order to first connecting rod
Processing, it is cost-effective.
Under normal conditions, lower die 2 is fixedly connected on detection microscope carrier 1, and lower die 2 is fixed relative to detection microscope carrier 1 at this time
Motionless.Since upper mold 32 relative to lower die 2 is only capable of moving up and down, consequently facilitating the ejector pin component alignment in upper mold 32
Conducting sleeve 22 in lower die 2 can avoid the occurrence of the phenomenon that accidentally surveying in this way.
Further, for the ease of to different function test fixtures thimble 202 (for example, quantity when thimble 202,
During arrangement mode difference) be detected, lower die 2 can be detachably connected to detection microscope carrier 1 on, in order to replace with it is corresponding
The lower die 2 that function test fixture matches.The versatility of detection device 100 is improved as a result, extends detection device 100
Application range.
Optionally, lower die 2 is polymethyl methacrylate part.For example, lower die 2 (is called PMMA or organic glass, is originated from using acrylic
English acrylic (acrylic plastics), chemical name is polymethyl methacrylate) plate or other transparent material materials make,
Conveniently check the state of the LED light 23 of 2 bottom of lower die.But not limited to this.
Optionally, conducting sleeve 22 is metalwork.But not limited to this.
Optionally, it is respectively bakelite part or compound stone part, Al-alloy parts to detect microscope carrier 1 and laminating mechanism.But not limited to this.
It is understood that lower die 2, conducting sleeve 22, detection microscope carrier 1 and the specific material of laminating mechanism can be according to realities
The specific setting of border requirement, preferably to meet practical application.
The detection device 100 of function test fixture thimble 202 according to embodiments of the present invention, it is simple in sturcture, ingenious in design,
It is easy to operate, can it is very intuitive, fast and effeciently detect that the thimble 202 of which function test fixture or functional test are controlled
Which thimble 202 of tool exists abnormal and can not be connected, and recall rate is high, and can carry out effective control to the precision of thimble 202,
So as to ensure that the production quality of the electronic product of cell phone mainboard or same type and production efficiency.
As shown in fig. 7, the detection method of embodiment, detection method are used according in the present invention according to a second aspect of the present invention
The detection device 100 for stating the function test fixture thimble 202 of first aspect embodiment examines function test fixture thimble 202
It surveys,
Detection method includes the following steps for this：
Ejector pin component to be detected is installed to upper mold 32；
USB interface 2011 is accessed into power supply；
Move down the upper mold 32 for being equipped with ejector pin component；
When the thimble 202 of ejector pin component is inserted into corresponding conducting sleeve 22 and is contacted with conducting sleeve 22 will be corresponding
LED light 23 is lighted, then proves that thimble 202 is qualified, otherwise unqualified.
Optionally, power supply is 5V power supplys.But not limited to this.
Specifically, for example, function test fixture uses 2011 external power supply of USB interface.Ejector pin component is being put into test
After the upper mold 32 of device, match and be packed into corresponding lower die 2 in 2 fixed part of lower die.Wherein, ejector pin component can pass through USB
Interface 2011 accesses 5V power supplys.
After accessing 5V power supplys, upper mold 32 is depressed by laminating mechanism ontology come the thimble 202 of ejector pin component can be worn
It is inserted into the conducting sleeve 22 of lower die 2, the thimble 202 is proved if it can normally be inserted into without interference without crooked, when thimble group
The thimble 202 of part is inserted into conducting sleeve 22, is contacted with 22 side wall of conducting sleeve or bottom, with the 22 corresponding position of conducting sleeve
The LED light 23 at the place of putting will be lighted, then prove 202 beam conduction of thimble, and access is normal.
In the case of confirming that access is normal, it is possible to confirm that this thimble 202 of the function test fixture is normal, such as go out
Existing LED light 23 cannot light or thimble 202 cannot be normally inserted into the conducting sleeve 22 of corresponding position, is considered as the thimble
202 is unqualified.
Detection method according to embodiments of the present invention, it is easy to operate, convenient for tester to function test fixture to be detected
Thimble 202 be detected.
In the description of this specification, reference term " one embodiment ", " some embodiments ", " illustrative examples ",
The description of " example ", " specific example " or " some examples " etc. means to combine specific features, the knot that the embodiment or example describe
Structure, material or feature are contained at least one embodiment of the present invention or example.In the present specification, to above-mentioned term
Schematic representation may not refer to the same embodiment or example.Moreover, specific features, structure, material or the spy of description
Point can in an appropriate manner combine in any one or more embodiments or example.
Although an embodiment of the present invention has been shown and described, it will be understood by those skilled in the art that：Not
In the case of being detached from the principle of the present invention and objective a variety of change, modification, replacement and modification can be carried out to these embodiments, this
The range of invention is limited by claim and its equivalent.
Claims (11)
1. a kind of detection device of function test fixture thimble, which is characterized in that the function test fixture includes ejector pin component,
The ejector pin component includes the ejector pin component ontology with USB interface and the multiple tops being located on the downside of the ejector pin component ontology
Needle, multiple thimbles are connected by the USB interface and power supply, and the detection device includes：
Detect microscope carrier；
Lower die, the lower die are mounted on the upper surface of the detection microscope carrier, are formed in the lower die and vertically penetrate through
Multiple through-holes, opened wide equipped with top in each through-hole and the conducting sleeve of bottom end closure, the bottom of the conducting sleeve
LED light is electrically connected with, the lower die is transparent or semitransparent and nonconducting component；
Laminating mechanism, the laminating mechanism are located on the detection microscope carrier, and the laminating mechanism includes laminating mechanism ontology and sets
Upper mold on the laminating mechanism ontology and above the lower die, the upper mold relative to the lower die can on move down
It is dynamic,
Wherein described ejector pin component is adapted to mount to the lower section of the upper mold, when the USB interface connects the power supply and described
Upper mold moves down, and is inserted into the corresponding conducting sleeve and contacts with the conducting sleeve to light pair in the thimble
Then the thimble is qualified during the LED light answered.
2. the detection device of function test fixture thimble according to claim 1, which is characterized in that the bottom of the lower die
It is formed with upwardly recessed groove, the plurality of through-hole and groove face, and the lower end of each through-hole up and down
Through the roof of the groove, the LED light is located in the groove.
3. the detection device of function test fixture thimble according to claim 1 or 2, which is characterized in that the through-hole packet
The first through hole section being sequentially connected from top to bottom and the second through hole section are included, wherein the conducting sleeve is mounted on second through-hole
Section in, and the internal perisporium of the conducting sleeve it is concordant with the internal perisporium of the first through hole section or
The cross-sectional area of the first through hole section is less than the inner circumferential cross-sectional area of the conducting sleeve,
The thimble contacts to light the corresponding LED light with the side wall or bottom wall of the conducting sleeve.
4. the detection device of function test fixture thimble according to claim 3, which is characterized in that the first through hole section
Height for h, wherein, the h meets：h≥0.3mm.
5. the detection device of function test fixture thimble according to claim 4, which is characterized in that the h is further full
Foot：h≥0.5mm.
6. the detection device of function test fixture thimble according to claim 1, which is characterized in that the top of the upper mold
With the mobile bar extended straight up；
The laminating mechanism ontology includes：
Stent, the branch are erected on the detection microscope carrier and positioned at the rear of the lower die；
Installing plate, on the bracket, the installing plate is equipped with first set gradually from top to bottom for the installing plate connection
The rear end of installing arm and the second installing arm, first installing arm and second installing arm is connected with the installing plate, institute
The front end for stating the second installing arm has the slide opening vertically penetrated through, wherein the mobile bar can be threaded through institute up or down
It states in slide opening；
First connecting rod, the first connecting rod is fixedly connected including one end and first connecting rod section and second connecting rod of the angle less than 180 °
Section, the other end of the first connecting rod section are pivotly connected with the front end of first installing arm, the second connecting rod section
The other end has handle；
Second connecting rod, one end of the second connecting rod are connected with the top of the mobile bar, the other end of the second connecting rod with
The first connecting rod section is pivotly connected with the junction of the second connecting rod section.
7. the detection device of function test fixture thimble according to claim 1, which is characterized in that the lower die is organic
Glass workpiece.
8. the detection device of function test fixture thimble according to claim 1, which is characterized in that the conducting sleeve is
Metalwork.
9. the detection device of function test fixture thimble according to claim 1, which is characterized in that it is described detection microscope carrier and
The laminating mechanism is respectively bakelite part or compound stone part, Al-alloy parts.
10. a kind of detection device using according to any one of the claim 1-9 function test fixture thimbles surveys function
The detection method that examination jig thimble is detected, which is characterized in that include the following steps：
Ejector pin component to be detected is installed to the upper mold；
The USB interface is accessed into the power supply；
Move down the upper mold for being equipped with the ejector pin component；
It is incited somebody to action when the thimble of the ejector pin component is inserted into the corresponding conducting sleeve and is contacted with the conducting sleeve
The corresponding LED light is lighted, then proves that the thimble is qualified, otherwise unqualified.
11. detection method according to claim 10, which is characterized in that the power supply is 5V power supplys.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810095032.2A CN108253879A (en) | 2018-01-31 | 2018-01-31 | The detection device and detection method of function test fixture thimble |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810095032.2A CN108253879A (en) | 2018-01-31 | 2018-01-31 | The detection device and detection method of function test fixture thimble |
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| CN201810095032.2A Pending CN108253879A (en) | 2018-01-31 | 2018-01-31 | The detection device and detection method of function test fixture thimble |
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| CN108957054A (en) * | 2018-08-21 | 2018-12-07 | 深圳市宇隆宏天科技有限公司 | TYPE C mould group detection device and its detection method |
| CN112710220A (en) * | 2020-12-18 | 2021-04-27 | 蔡佳明 | Detection equipment for ejector pin of function test fixture |
| CN114112143A (en) * | 2021-09-07 | 2022-03-01 | 凯盛光伏材料有限公司 | Instrument for measuring elasticity value of thimble of junction box in photovoltaic module |
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