CN206546812U - One kind is used for the irregular sample platform of scanning electronic microscope of sample stationary plane - Google Patents
One kind is used for the irregular sample platform of scanning electronic microscope of sample stationary plane Download PDFInfo
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- CN206546812U CN206546812U CN201720327057.1U CN201720327057U CN206546812U CN 206546812 U CN206546812 U CN 206546812U CN 201720327057 U CN201720327057 U CN 201720327057U CN 206546812 U CN206546812 U CN 206546812U
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- China
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- sample
- irregular
- stage body
- electronic microscope
- scanning electronic
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Abstract
The utility model is related to for the irregular sample platform of scanning electronic microscope of sample stationary plane, the irregular sample of end face, which can effectively be solved, to be placed, or place and unstable cause image blur, the problem of can not even observing, its solve technical scheme be, including stage body, the rib crossed one another in " well " font is provided with stage body, stage body is divided into several interval by rib, irregular groove is provided with each interval, plasticine is filled with groove, the utility model structure novel and unique, advantages of simple, easy processing, cost is low, suitable for a variety of ESEMs, it is easy to fix the sample fixation irregular sample of end face, it is easy for installation simple, sample fixation and imaging effect is good, reduce the preparation difficulty of sample, substantially increase the operating efficiency of ESEM, it is the innovation on sample platform of scanning electronic microscope.
Description
Technical field
The utility model is related to sample platform of scanning electronic microscope, particularly a kind of to be used for the irregular ESEM of sample stationary plane
Sample stage.
Background technology
ESEM is a kind of new electronic optical instrument, and it has, and sample preparation is simple, multiplication factor adjustable extent is wide, figure
The high resolution of picture, the features such as the depth of field is big.For decades, ESEM has been widely used in biology, medical science, metallurgy etc.
In the field of subject, each development about subject is promoted.Another important feature of ESEM is that the depth of field is big, and image richness is vertical
Body-sensing, the depth of focus of ESEM is bigger than transmission electron microscope 10 times, hundred times bigger than light microscope.Due to image depth
Greatly, thus gained scanning electron picture is rich in third dimension, with three-dimensional configuration, using the teaching of the invention it is possible to provide the information more much more than other microscopes,
This feature is very valuable to user.
Sample stage is one of critical component of SEM, it to carry sample, and by optical system into
Local feature as characterizing sample.However, because the end face of some samples is irregular, so that can not be stably placed common
Sample stage on, therefore, the innovation and improvement of sample platform of scanning electronic microscope are urgent problems.
The content of the invention
For above-mentioned situation, to solve the defect of prior art, the purpose of the utility model, which is just to provide one kind, is used for sample
The irregular sample platform of scanning electronic microscope of product stationary plane, can effectively solve the irregular sample of end face can not place, or place not
Image blur steadily is caused, the problem of can not even observing.
The technical scheme that the utility model is solved is, including stage body, is provided with and is crossed one another in " well " font on stage body
Stage body is divided into several interval by rib, rib, is provided with each interval in irregular groove, groove and is filled with rubber
Mud.
The utility model structure novel and unique, advantages of simple, easy processing, cost is low, it is adaptable to a variety of ESEMs, is easy to
Fixed sample fixes the irregular sample of end face, easy for installation simple, sample fixation and imaging effect is good, reduces sample
Preparation difficulty, substantially increase the operating efficiency of ESEM, be the innovation on sample platform of scanning electronic microscope.
Brief description of the drawings
Fig. 1 is structure top view of the present utility model.
Fig. 2 for the utility model Fig. 1 A-A to sectional view.
Embodiment
Embodiment of the present utility model is described in further detail below in conjunction with accompanying drawing.
Provided by Fig. 1-2, the utility model includes being provided with the rib crossed one another in " well " font on stage body, stage body 1
3, stage body 1 is divided into several interval by rib 3, is provided with each interval in irregular groove 2, groove 2 and is filled with rubber
Skin mud 4.
In order to ensure using effect, described stage body is circular or square.
The described quantity of groove 2 has 9, is split to form according to the rib 3 on stage body 1 in " well " font.
Described groove 2 has certain depth, and thickness of the depth less than stage body 1 of groove.
The described depth of groove 2 is the 1/4 to 3/4 of the thickness of stage body 1.
Described groove 2 is the gully shape for being uneven, crossing one another.
Applicant is it is noted that a kind of above-mentioned only embodiment provided of the application, is not meant to limit this Shen
Protection domain please, it is every to be made and being belonged to the application substantially identical technical scheme with equivalent or equivalent substitution means
The protection domain of the application.
Service condition of the present utility model is to place appropriate plasticine in groove 2 first, then fixes scanning sample
On plasticine, and with conductive gemel connection sample and stage body groove, rib, sample observation face is set to be in level.Groove 2 is due to being
The gully shape with certain depth be uneven, crossed one another, so for some irregular small samples, can directly press from both sides
Fixation is held, metal sample is then directly inserted into plasticine, it is no longer necessary to conducting resinl, can be with by said structure and working condition
Find out, the mode of irregular scanning sample end face can be fixed by using plasticine, is effectively saved in scanning process because of fixed sample
Time needed for product, improve the operating efficiency of ESEM and reduce the preparation difficulty of sample.
The utility model structure novel and unique, advantages of simple, easy processing, cost is low, it is adaptable to a variety of ESEMs, is used to
Sample is subjected to the sample to be observed rapidly and accurately to find of subregion proper alignment, and irregular small sample is pressed from both sides
Fixation is held, and conducting resinl is not needed for the observation of metal sample, easy to use, simple to operate, sample fixation and imaging
Effect is good, reduces the preparation difficulty of sample, substantially increases the operating efficiency of ESEM, is on sample platform of scanning electronic microscope
Innovation, with good economic and social benefit.
Claims (6)
1. one kind is used for the irregular sample platform of scanning electronic microscope of sample stationary plane, including stage body, it is characterised in that on stage body (1)
The rib (3) crossed one another in " well " font is provided with, stage body (1) is divided into several interval by rib (3), it is each interval interior
It is provided with irregular groove (2), groove (2) and is filled with plasticine (4).
2. according to claim 1 be used for the irregular sample platform of scanning electronic microscope of sample stationary plane, it is characterised in that described
Stage body to be circular or square.
3. according to claim 1 be used for the irregular sample platform of scanning electronic microscope of sample stationary plane, it is characterised in that described
Groove (2) quantity have 9, according to being split to form on stage body (1) in the rib (3) of " well " font.
4. according to claim 1 be used for the irregular sample platform of scanning electronic microscope of sample stationary plane, it is characterised in that described
Groove (2) have certain depth, and groove depth be less than stage body (1) thickness.
5. according to claim 1 be used for the irregular sample platform of scanning electronic microscope of sample stationary plane, it is characterised in that described
Groove (2) depth be stage body (1) thickness 1/4 to 3/4.
6. according to claim 1 be used for the irregular sample platform of scanning electronic microscope of sample stationary plane, it is characterised in that described
Groove (2) be the gully shape that is uneven, crosses one another.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720327057.1U CN206546812U (en) | 2017-03-30 | 2017-03-30 | One kind is used for the irregular sample platform of scanning electronic microscope of sample stationary plane |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720327057.1U CN206546812U (en) | 2017-03-30 | 2017-03-30 | One kind is used for the irregular sample platform of scanning electronic microscope of sample stationary plane |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206546812U true CN206546812U (en) | 2017-10-10 |
Family
ID=59996191
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720327057.1U Expired - Fee Related CN206546812U (en) | 2017-03-30 | 2017-03-30 | One kind is used for the irregular sample platform of scanning electronic microscope of sample stationary plane |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206546812U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108346552A (en) * | 2017-11-15 | 2018-07-31 | 华东师范大学 | Scanning electron microscope 3-D view reconstructs Special sample table storage device |
-
2017
- 2017-03-30 CN CN201720327057.1U patent/CN206546812U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108346552A (en) * | 2017-11-15 | 2018-07-31 | 华东师范大学 | Scanning electron microscope 3-D view reconstructs Special sample table storage device |
| CN108346552B (en) * | 2017-11-15 | 2019-07-19 | 华东师范大学 | Scanning electron microscope 3-D image reconstructs Special sample table storage device |
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|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20171010 Termination date: 20180330 |
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| CF01 | Termination of patent right due to non-payment of annual fee |