CN203101425U - Sample stage for scanning various sample sections by using atomic force microscope - Google Patents
Sample stage for scanning various sample sections by using atomic force microscope Download PDFInfo
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- CN203101425U CN203101425U CN 201320072451 CN201320072451U CN203101425U CN 203101425 U CN203101425 U CN 203101425U CN 201320072451 CN201320072451 CN 201320072451 CN 201320072451 U CN201320072451 U CN 201320072451U CN 203101425 U CN203101425 U CN 203101425U
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- sample stage
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- sample
- clamp plate
- movable clamp
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Abstract
The utility model relates to a sample stage of a test instrument, particularly relates to a sample stage for scanning various sample sections by using an atomic force microscope, and belongs to the technical field of test instrument equipment. The sample stage comprises a base, a fixed baffle plate, a movable clamp plate, a square table, round grooves and a clip. The sample stage is characterized in that the square table is arranged in the middle of the upper surface of the base; the four round grooves are formed on the square table; the fixed baffle plate is arranged at the short side of the square table; the movable clamp plate is arranged at the long side; and the movable clamp plate is clamped by the clip. According to the sample stage for scanning various sample sections by using the atomic force microscope disclosed by the utility model, in use, two film samples are simultaneously fixed in the middle of the square table and the movable clamp plate, miniature particles are fixed in the round grooves, and then the atomic force microscope is utilized to scan the sample sections; and the sample stage can be used for scanning the sections of the film samples and miniature particle samples, and also can be used for scanning a part of irregular sample sections, thus the application range of the atomic force microscope is expanded. The sample stage is simple in structure, low in manufacture cost, easy to operate, and convenient to use.
Description
Technical field
The utility model relates to the sample stage of testing tool, especially uses the sample stage of afm scan sample section, belongs to the testing tool equipment technical field.
Background technology
The sample stage that present atomic force microscope carries is circular stainless steel thin slice, can only be used for the scanning of film surface, can't be used for the scanning of sample section, and usable range is limited.And need section sometimes with other samples such as afm scan film or molecules, so need a kind of particular sample platform.
Summary of the invention
The purpose of this utility model is for overcoming the above-mentioned deficiency that atomic force microscope carries sample stage, provide a kind of and can scan thin-membrane section, can scanning the sample stage of using of molecule sample section more again.
The technical scheme of adopting of the present utility model is as follows:
A kind of sample stage with afm scan several samples section comprises base, fixed dam, movable clamp plate, square, circular groove, clip.It is characterized in that: the middle is one square above the base, is four circular grooves above square, and square short brink is fixed dam, and long side is a movable clamp plate, and movable clamp plate is clamped with a clip.
Described base is circular stainless steel thin slice.
Described circular groove is positioned at above square, and the radius of four circular grooves is all different with the degree of depth.
Described fixed dam is fixed on the base of square short brink, and square of aspect ratio and movable clamp plate are low.
Described movable clamp plate is a rectangular shape, between two fixed dams, respectively has one in square director's avris both sides, and height is identical with square height, and vertical plane is vertical with base.
Preferably, described a kind of sample stage with afm scan several samples section both can scan the section of film sample, can scan the section of molecule sample and the section of other irregular samples again, simple structure, easy operating.
The beneficial effects of the utility model are:
A kind of sample stage with afm scan several samples section of the utility model can scan the section of film sample and molecule sample, also can be used for the scanning of the irregular sample section of part, can effectively increase the usable range of atomic force microscope.
The utility model is simple in structure, easy operating, convenient for cleaning, cost is low, not fragile, easy to use, help promoting.
Description of drawings
Fig. 1 is the utility model plan structure synoptic diagram, wherein, and 1, base, 2, fixed dam, 3, movable clamp plate, 4, square, 5, circular groove, 6, clip.
Fig. 2 is a utility model left side TV structure synoptic diagram, 1, base, 2, fixed dam, 3, movable clamp plate, 4, square, 5, circular groove.
Embodiment
Below in conjunction with accompanying drawing the utility model is described further.
As shown in Figure 1, 2, a kind of sample stage platform with afm scan several samples section comprises 1, base, 2, fixed dam, 3, movable clamp plate, 4, square, 5, circular groove, 6, clip.The middle is one square 4 above the base 1, is four circular grooves 5 that radius is different with the degree of depth above square 4, and square short brink is fixed dam 2, in the middle of two fixed dams 2 is movable clamp plate 3, movable baffle plate 3 has two, and with respect to square 4 symmetry, movable clamp plate 3 usefulness one clip 6 is clamped.
If the scanning film sample took off clip 6 earlier when the utility model used, film sample is vertically placed between square 4 and the movable baffle plate 3, promote movable baffle plate 3 then sample is clamped, fixing with clip 6 at last.If fixing not firmly can on square 4 or movable baffle plate, be stained with double faced adhesive tape, sample is fixed.Square 4 both sides can be placed two film samples simultaneously.If scanning molecule section, select a suitable circular groove 5 according to grain size, put into sticks such as quick-drying gelatin in circular groove 5 the insides, then the molecule section is put into circular groove 5 up, determine the available afm scan in the real back of sample bonding.
Claims (4)
1. sample stage with afm scan several samples section comprises base, fixed dam, movable clamp plate, square, circular groove, clip; It is characterized in that: the middle is one square above the base, is four circular grooves above square, and square short brink is fixed dam, and long side is a movable clamp plate, and movable clamp plate is clamped with a clip.
2. a kind of sample stage with afm scan several samples section according to claim 1, it is characterized in that: base is circular stainless steel thin slice.
3. a kind of sample stage with afm scan several samples section according to claim 1 is characterized in that: be four circular grooves that radius is different with the degree of depth above square.
4. a kind of sample stage according to claim 1 with afm scan several samples section, it is characterized in that: the base of described square short brink is provided with fixed dam, square of the aspect ratio of fixed dam is low, the monosymmetric movable clamp plate that is provided with in square director limit, movable clamp plate is between two fixed dams, its height is identical with square height, and vertical plane is vertical with base.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320072451 CN203101425U (en) | 2013-02-15 | 2013-02-15 | Sample stage for scanning various sample sections by using atomic force microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320072451 CN203101425U (en) | 2013-02-15 | 2013-02-15 | Sample stage for scanning various sample sections by using atomic force microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203101425U true CN203101425U (en) | 2013-07-31 |
Family
ID=48852815
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320072451 Expired - Fee Related CN203101425U (en) | 2013-02-15 | 2013-02-15 | Sample stage for scanning various sample sections by using atomic force microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203101425U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104198245A (en) * | 2014-09-01 | 2014-12-10 | 上海华力微电子有限公司 | Sample base |
| CN104392884A (en) * | 2014-11-03 | 2015-03-04 | 武汉新芯集成电路制造有限公司 | Bearing device and preparation method thereof |
-
2013
- 2013-02-15 CN CN 201320072451 patent/CN203101425U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104198245A (en) * | 2014-09-01 | 2014-12-10 | 上海华力微电子有限公司 | Sample base |
| CN104198245B (en) * | 2014-09-01 | 2017-01-11 | 上海华力微电子有限公司 | Sample base |
| CN104392884A (en) * | 2014-11-03 | 2015-03-04 | 武汉新芯集成电路制造有限公司 | Bearing device and preparation method thereof |
| CN104392884B (en) * | 2014-11-03 | 2017-08-04 | 武汉新芯集成电路制造有限公司 | A kind of bogey and preparation method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130731 Termination date: 20140215 |