CN207752045U - A kind of Hall block sample clamping structure - Google Patents
A kind of Hall block sample clamping structure Download PDFInfo
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- CN207752045U CN207752045U CN201820052242.9U CN201820052242U CN207752045U CN 207752045 U CN207752045 U CN 207752045U CN 201820052242 U CN201820052242 U CN 201820052242U CN 207752045 U CN207752045 U CN 207752045U
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Abstract
The utility model provides a kind of Hall block sample clamping structure, including PCB sample panels, sample pressing plate, sample base, four spring probes and golden finger slot, the sample base is placed in the upper surface of PCB sample panels one end, the other end of the PCB sample panels is connect with the golden finger slot, four spring probes are placed in the sample base, and spring probe is connect with the PCB sample panels, one end of the sample pressing plate is connect with the PCB sample panels, and the other end of the sample pressing plate is in contact with the spring probe.The Hall block sample clamping structure ensures that sample is not damaged by using spring probe, while by the way that sample pressing plate is arranged so that sample is in close contact in spring probe, ensure that the precision and stability of measurement, and easy to use.
Description
Technical field
The utility model belongs to semiconductor test technical field, and in particular to a kind of Hall block sample clamping structure.
Background technology
In the Hall effect measurement of semiconductor, the good contact of sample clamping keeps test data more precise and stable.
It is higher to Hall sample clamping design method difficulty since to get over large sample clamping space smaller for Hall permanent magnet field intensity.
Currently, in the hall measurement instrument used, sample is usually by four probes by spring compression, and sample stage
Probe is sharper, is easy to scratch sample without elasticity, while four probes of clamping sample need to constitute a rectangle clamping not
Too convenient, clamping does not with great difficulty influence measurement accuracy and stability, therefore need to design a kind of new Hall sample installation way.
Utility model content
The purpose of the utility model is to overcome existing Hall sample clamping inconvenience, the fragile sample of probe, measurement accuracy
With the problem of stability difference.
For this purpose, the utility model provides a kind of Hall block sample clamping structure, including PCB sample panels, sample pressing plate,
Sample base, four spring probes and golden finger slot, the sample base are placed in the upper surface of PCB sample panels one end,
The other end of the PCB sample panels is connect with the golden finger slot, and four spring probes are placed in the sample base,
And spring probe is connect with the PCB sample panels, one end of the sample pressing plate is connect with the PCB sample panels, the sample
The other end of pressing plate is in contact with the spring probe.
As one of embodiment, the sample base is the square frame-shaped pedestal of openings at one side, and its open side is towards institute
State sample pressing plate side.
As one of embodiment, the sample pressing plate includes movable plate and fixed plate, the movable plate and the spring
Probe is in contact, and the inside of size and the sample base is in the same size, leads between the fixed plate and the PCB sample panels
Brass screw locking connection is crossed, and the width of the fixed plate is consistent with the opening width of the sample base.
As one of embodiment, it is arranged on the two sides of the sample base upper open end for compressing the sample
The tabletting of product pressing plate.
As one of embodiment, one end of the tabletting is movably connected in by brass screw in the sample base,
The other end can be rotated around brass screw.
As one of embodiment, spring is embedded on the brass screw.
As one of embodiment, four spring probes are located at the sample base center and constitute rectangle, and four
The spring probe bottom end is welded in the PCB sample panels, and the spring probe upper end is higher by the sample base upper surface.
As one of embodiment, the sample pressing plate is transparent material.
As one of embodiment, removable plug is fixed between the PCB sample panels and the golden finger slot.
Compared with prior art, the beneficial effects of the utility model：This Hall block sample provided by the utility model
Clamping structure ensures that sample is not damaged by using spring probe, while by the way that sample pressing plate is arranged so that sample is in spring
Probe is in close contact, and ensure that the precision and stability of measurement.
The utility model is described in further details below with reference to attached drawing.
Description of the drawings
Fig. 1 is the schematic diagram of the utility model Hall block sample clamping structure.
Reference sign：1, PCB sample panels；2, sample pressing plate；3, tabletting；4, sample base；5, Hall block sample；
6, spring probe；7, spring；8, brass screw；9, golden finger slot；21, movable plate；22, fixed plate.
Specific implementation mode
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
Clearly and completely describe, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole
Embodiment.Based on the embodiments of the present invention, those of ordinary skill in the art are without making creative work
The all other embodiment obtained, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be understood that term "center", "upper", "lower", "front", "rear",
The orientation or positional relationship of the instructions such as "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside" is based on attached drawing institute
The orientation or positional relationship shown, is merely for convenience of describing the present invention and simplifying the description, rather than indicates or imply and is signified
Device or element must have a particular orientation, with specific azimuth configuration and operation, therefore should not be understood as to this practicality
Novel limitation；In the description of the present invention, unless otherwise indicated, the meaning of " plurality " is two or more.
As shown in Figure 1, present embodiments providing a kind of Hall block sample clamping structure, including PCB sample panels 1, sample
Pressing plate 2,4, four spring probes 6 of sample base and golden finger slot 9, the sample base 4 are placed in the PCB sample panels 1 one
The upper surface at end, the other end of the PCB sample panels 1 are connect with the golden finger slot 9, and four spring probes 6 are placed in
In the sample base 4, and spring probe 6 is connect with the PCB sample panels 1, one end and the PCB of the sample pressing plate 2
Sample panel 1 connects, and the other end of the sample pressing plate 2 is in contact with the spring probe 6.Using the clamping structure to Hall block
When body sample 5 carries out clamping, sample base 4 is fixed on one end of PCB sample panels 1 first and is locked by brass screw 8, four
A spring probe 6 is fixed in PCB sample panels 1 and passes through sample base 4, Hall block sample 5 to be measured tiling to be placed on
On four spring probes 6, sample pressing plate 2 is pressed in the upper surface of Hall block sample 5 to be measured so that Hall to be measured
Block sample 5 can be in close contact with spring probe 6, to which 5 information data of Hall block sample for ensureing to be measured can be precise and stable
Transmission, and preferred embodiment, four spring probes 6 are located at 4 center of the sample base and constitute rectangle, and four
6 bottom end of the spring probe is welded in the PCB sample panels 1, and 6 upper end of the spring probe is higher by the sample base 4
Surface is further ensured that the stability contacted between spring probe 6 and Hall block sample 5 to be measured, improves the essence of measurement
Accuracy and stability；And since the spring probe of use 6 has certain elasticity in the present embodiment, pressed in sample pressing plate 2
When Hall block sample 5 to be measured, spring probe 6 will produce certain elastic deformation, to ensure Hall block sample to be measured
Spring probe 6 will not damage Hall block sample 5 to be measured while product 5 are in close contact with spring probe 6, improve measurement
Precision and stability.
The embodiment of refinement, the sample base 4 is the square frame-shaped pedestal of openings at one side, and its open side is described in
2 side of sample pressing plate, four spring probes 6 are arranged in the centre of the box；The sample pressing plate 2 includes 21 He of movable plate
Fixed plate 22, the movable plate 21 are in contact with 6 upper end of the spring probe, size (the i.e. length of movable plate 21 of movable plate 21
With width), the fixed plate 22 and PCB consistent with inside size (length and width i.e. on the inside of box) of the sample base 4
It is locked and is connected by brass screw 8 between sample panel 1, and the width of the fixed plate 22 and the opening of the sample base 4 are wide
Degree is consistent, and when Hall block sample 5 to be measured on to spring probe 6 compresses, the sample pressing plate 2 is around brass screw 8
Rotation is to the surface of Hall block sample 5 to be measured and compresses Hall block sample 5 downwards, and then brass screw 8 locks institute
State the fixed plate 22 and the PCB sample panels 1 of sample pressing plate 2 so that the sample pressing plate 2 and Hall block sample 5 to be measured
Between do not generate relative displacement.Preferably, the sample pressing plate 2 is transparent material, so as to facilitate observation sample pressing plate 2 to treat
The measuring phase of the Hall block sample 5 of survey, avoid pressing excessively and damage Hall block sample 5 to be measured, or pressing kick the beam and
Influence the contact between Hall block sample 5 and spring probe 6 to be measured.Further, in order to avoid sample pressing plate 2 with it is to be measured suddenly
It relatively moves between your block sample 5, is arranged on the two sides of 4 upper open end of the sample base for compressing
The tabletting 3 of the sample pressing plate 2；Specifically, one end of the tabletting 3 is movably connected in the sample bottom by brass screw 8
On seat 4, the other end can be rotated around brass screw 8, after the sample pressing plate 2 compresses Hall block sample 5 to be measured, by sample pressure
Two tablettings 3 of 2 both sides of plate are rotated inward around the brass screw 8 being respectively correspondingly connected with, and press the activity in the sample pressing plate 2
V-arrangement is formed on plate 21, while locking the brass screw 8 of 3 end of the tabletting, to further compress sample pressure by tabletting 3
Plate 2 improves the stability of measurement.Further, the brass screw 8 for fixing the sample pressing plate 2 and for fixing
It states and is embedded with spring 7 on the brass screw 8 of tabletting 3, the intermolecular forces of two rigidly connected parts are played by spring 7 slow
Punching acts on, and extends its service life.
In addition, removable plug is fixed between the PCB sample panels 1 and the golden finger slot 9, facilitate installation and maintenance
It replaces.
In conclusion this Hall block sample clamping structure provided by the utility model ensures by using spring probe
Sample is not damaged, while by the way that sample pressing plate is arranged so that sample is in close contact in spring probe, ensure that the precision of measurement
And stability, and it is easy to use.
It is exemplified as above be only to the utility model for example, not constituting to the scope of protection of the utility model
Limitation, within every design same or analogous with the utility model all belongs to the scope of protection of the present invention.
Claims (9)
1. a kind of Hall block sample clamping structure, it is characterised in that：Including PCB sample panels (1), sample pressing plate (2), sample bottom
Seat (4), four spring probes (6) and golden finger slot (9), the sample base (4) are placed in described PCB sample panels (1) one end
Upper surface, the other end of the PCB sample panels (1) connect with the golden finger slot (9), four spring probes (6)
It is placed in the sample base (4), and spring probe (6) is connect with the PCB sample panels (1), the one of the sample pressing plate (2)
End is connect with the PCB sample panels (1), and the other end of the sample pressing plate (2) is in contact with the spring probe (6).
2. Hall block sample clamping structure as described in claim 1, it is characterised in that：The sample base (4) is one side
The square frame-shaped pedestal of opening, and its open side is towards sample pressing plate (2) side.
3. Hall block sample clamping structure as claimed in claim 2, it is characterised in that：The sample pressing plate (2) includes living
Movable plate (21) and fixed plate (22), the movable plate (21) are in contact with the spring probe (6), size and the sample bottom
The inside of seat (4) is in the same size, is locked and is connected by brass screw (8) between the fixed plate (22) and the PCB sample panels (1)
It connects, and the width of the fixed plate (22) is consistent with the opening width of the sample base (4).
4. Hall block sample clamping structure as claimed in claim 2, it is characterised in that：It is open on the sample base (4)
The tabletting (3) for compressing the sample pressing plate (2) is arranged on the two sides at end.
5. Hall block sample clamping structure as claimed in claim 4, it is characterised in that：One end of the tabletting (3) passes through
Brass screw (8) is movably connected in the sample base (4), and the other end can be rotated around brass screw (8).
6. the Hall block sample clamping structure as described in claim 3 or 5, it is characterised in that：It is embedding on the brass screw (8)
There is spring (7).
7. Hall block sample clamping structure as described in claim 1, it is characterised in that：Four spring probe (6) positions
Rectangle is constituted in the sample base (4) center, and four spring probe (6) bottom ends are welded on the PCB sample panels (1)
On, spring probe (6) upper end is higher by the sample base (4) upper surface.
8. Hall block sample clamping structure as described in claim 1, it is characterised in that：The sample pressing plate (2) is transparent
Material.
9. Hall block sample clamping structure as described in claim 1, it is characterised in that：The PCB sample panels (1) with it is described
Removable plug is fixed between golden finger slot (9).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820052242.9U CN207752045U (en) | 2018-01-12 | 2018-01-12 | A kind of Hall block sample clamping structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820052242.9U CN207752045U (en) | 2018-01-12 | 2018-01-12 | A kind of Hall block sample clamping structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207752045U true CN207752045U (en) | 2018-08-21 |
Family
ID=63153121
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820052242.9U Active CN207752045U (en) | 2018-01-12 | 2018-01-12 | A kind of Hall block sample clamping structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207752045U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110068712A (en) * | 2019-04-28 | 2019-07-30 | 昆明理工大学 | A kind of four probe tester of buckle-type |
| CN112255528A (en) * | 2020-09-25 | 2021-01-22 | 杭州加速科技有限公司 | Probe station for wafer test |
-
2018
- 2018-01-12 CN CN201820052242.9U patent/CN207752045U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110068712A (en) * | 2019-04-28 | 2019-07-30 | 昆明理工大学 | A kind of four probe tester of buckle-type |
| CN112255528A (en) * | 2020-09-25 | 2021-01-22 | 杭州加速科技有限公司 | Probe station for wafer test |
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