CN203950781U - A kind of microscope test sample stage - Google Patents
A kind of microscope test sample stage Download PDFInfo
- Publication number
- CN203950781U CN203950781U CN201420384780.XU CN201420384780U CN203950781U CN 203950781 U CN203950781 U CN 203950781U CN 201420384780 U CN201420384780 U CN 201420384780U CN 203950781 U CN203950781 U CN 203950781U
- Authority
- CN
- China
- Prior art keywords
- female socket
- test sample
- sample stage
- microscope
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 81
- 238000001514 detection method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000002657 fibrous material Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Sampling And Sample Adjustment (AREA)
Abstract
A kind of microscope test sample stage provided by the utility model, be particularly useful for the fracture of sheet type test sample to detect, it is by setting up a sidewall with female socket on test example platform in the prior art, thereby sheet type can be tested to sample is inserted in described female socket, make the breach of sheet type test sample be horizontal positioned, thereby can to the breach of sheet type test sample, test easily, having avoided must testing sample to sheet type when using microscope test sample stage of the prior art inlays, make the breach of sheet type test sample lie in a horizontal plane in the trouble on objective table, for tester provides convenience.
Description
Technical field
The utility model relates to field of test instrument, relates in particular to a kind of microscope test sample stage.
Background technology
Due to high-resolution, the large depth of field, electronic scanner microscope (SEM) is widely used in material analysis field.
The sample stage that SEM is used is at present generally the planar structure that structure is single, in prior art, SEM sample stage is only provided with the objective table of horizontal positioned, structure is single, and the fracture that can not meet the observation requirements of dissimilar sample, particularly sheet, fiber-like sample is observed.
In actual use, when observing the fracture apperance of sheet, fiber-like sample, sample cannot be inlayed, therefore cannot observe its fracture on sample stage in the prior art.
Therefore, prior art awaits further improving and development.
Utility model content
The purpose of this utility model is, for user provides a kind of microscope test sample stage, to solve in prior art, can not directly to the fracture of sheet, carry out the problem of observation test.
The technical scheme that the utility model technical solution problem adopts is as follows:
A microscope test sample stage, wherein, comprises the first article carrying platform and second article carrying platform of vertical setting, described the first article carrying platform horizontal positioned, and be provided with the cross-hair icon that proofread and correct the position for test sample is placed;
Described the second article carrying platform is vertically arranged on the outward flange of the first article carrying platform, and comprises the first test object carrying area and the second test object carrying area;
Described the first test object carrying area and the second test object carrying area are respectively arranged with for carrying the first female socket and second female socket of testing sample;
The recess width of described the first female socket be described the second female socket recess width 3-4 doubly.
Described microscope test sample stage, wherein, the upper surface of described the first article carrying platform is circular configuration.
Described microscope test sample stage, wherein, described the second article carrying platform is long strip type structure.
Described microscope test sample stage, wherein, the first female socket of described the first test object carrying area is at least one, and the second female socket number of described the second test object carrying area is at least three.
Described microscope test sample stage, wherein, the recess width of described the first female socket is 0.04 cm-0.2cm, the recess width of described the second female socket is 0.01 cm-0.02cm.
Beneficial effect, a kind of microscope test sample stage provided by the utility model, by setting up a sidewall with female socket on test example platform in the prior art, thereby sheet type can be tested to sample is inserted in described female socket, make the breach of sheet type test sample be horizontal positioned, thereby can to the breach of sheet type test sample, test easily, having avoided must testing sample to sheet type when using microscope test sample stage of the prior art inlays, make the breach of sheet type test sample lie in a horizontal plane in the trouble on objective table, for tester provides convenience.
Accompanying drawing explanation
Fig. 1 is the structural representation of test example platform of the present utility model.
Fig. 2 is the structural representation of test example platform of the present utility model while specifically applying.
Embodiment
For making the purpose of this utility model, technical scheme and advantage clearer, clear and definite, referring to the accompanying drawing embodiment that develops simultaneously, the utility model is further described.Should be appreciated that specific embodiment described herein is only in order to explain the utility model, and be not used in restriction the utility model.
As shown in Figure 1, the utility model provides a kind of microscope test sample stage, Figure 1 shows that the end view of described test sample stage, as shown in Figure 1, wherein, the first article carrying platform 1 and the second article carrying platform 2 that comprise vertical setting, described the first article carrying platform 1 horizontal positioned, its upper surface is circular configuration, and be provided with the cross-hair icon that proofread and correct the position for test sample is placed, (think that Fig. 1 is end view, and the first article carrying platform is horizontal positioned, therefore in Fig. 1, fail to demonstrate the upper surface of the first article carrying platform) be convenient to the placement location of test sample to proofread and correct.
Described the second article carrying platform 2 is vertically arranged on the outward flange of the first article carrying platform 1, and comprises the first test object carrying area 21 and the second test object carrying area 23.
Described the first test object carrying area 21 and the second test object carrying area 22 are respectively arranged with for carrying the first female socket and second female socket of testing sample.
The recess width of described the first female socket be described the second female socket recess width 3-4 doubly.
Described the first female socket is for placing the thin slice that width is larger, and described the second female socket is less for placing width, the testing sample of fiber material class.
Described microscope test sample stage, on test sample stage in the prior art, set up second article carrying platform of vertically placing, on the second article carrying platform, be provided with female socket, facilitated sheet type test sample to be fixed on sample stage, and the fracture of thin slice is level, tester can detect the fracture of thin slice sample easily.
Further, because the first test object carrying area is different with the width of the female socket of the second test object carrying area setting, can according to the thickness of thin slice, select different slots to insert test sample for testing staff, also can insert different test samples simultaneously and detect, therefore to testing staff, bring convenience.
Be illustrated in figure 2 the schematic diagram of microscope test sample stage described in the utility model when concrete application, by the second article carrying platform just like its sidewall is set on the first article carrying platform, and be provided with female socket on the surface of the second article carrying platform, thereby can be when the fracture that carries out sheet type sample detects, directly thin slice sample is inserted to described female socket (described in figure 31,32), thereby make described fracture in horizontal direction, facilitate detection person to detect fracture, thereby provide convenience for the sample detection of fracture class.
On the basis of technique scheme, described microscope test sample stage can also have following improvement:
For the ease of placing sheets class testing sample, preferred, described the second article carrying platform is long strip type structure.
Further, in order to meet variety classes, the needs of different-thickness test sample, the first female socket of described the first test object carrying area is at least one, the second female socket number of described the second test object carrying area is at least three, and the recess width of each female socket is different, preferred, the width of the described female socket on the second article carrying platform can be arranged to equidistant increase and arrange.
The recess width of described the first female socket is 0.04-0.2cm, and the recess width of described the second female socket is 0.01-0.02cm.
A kind of microscope test sample stage provided by the utility model, be particularly useful for the fracture of sheet type test sample to detect, it is by setting up a sidewall with female socket on test example platform in the prior art, thereby sheet type can be tested to sample is inserted in described female socket, make the breach of sheet type test sample be horizontal positioned, thereby can to the breach of sheet type test sample, test easily, having avoided must testing sample to sheet type when using microscope test sample stage of the prior art inlays, make the breach of sheet type test sample lie in a horizontal plane in the trouble on objective table, for tester provides convenience.
Should be understood that; application of the present utility model is not limited to above-mentioned giving an example; for those of ordinary skills, can be improved according to the above description or convert, all these improvement and conversion all should belong to the protection range of the utility model claims.
Claims (5)
1. a microscope test sample stage, is characterized in that, comprises vertically disposed the first article carrying platform and the second article carrying platform, described the first article carrying platform horizontal positioned, and be provided with the cross-hair icon that proofread and correct the position for test sample is placed;
Described the second article carrying platform is arranged on the outward flange of the first article carrying platform, and comprises the first test object carrying area and the second test object carrying area;
Described the first test object carrying area and the second test object carrying area are respectively arranged with for carrying the first female socket and second female socket of testing sample;
The groove length of described the first female socket be described the second female socket groove length 3-4 doubly.
2. microscope is tested sample stage according to claim 1, it is characterized in that, the upper surface of described the first article carrying platform is circular configuration.
3. microscope is tested sample stage according to claim 1, it is characterized in that, described the second article carrying platform is long strip type structure.
4. microscope is tested sample stage according to claim 1, it is characterized in that, the first female socket of described the first test object carrying area is at least one, and the second female socket number of described the second test object carrying area is at least three.
5. microscope is tested sample stage according to claim 4, it is characterized in that, the recess width of described the first female socket is 0.04 cm-0.2cm, and the recess width of described the second female socket is 0.01 cm-0.02cm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420384780.XU CN203950781U (en) | 2014-07-11 | 2014-07-11 | A kind of microscope test sample stage |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420384780.XU CN203950781U (en) | 2014-07-11 | 2014-07-11 | A kind of microscope test sample stage |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203950781U true CN203950781U (en) | 2014-11-19 |
Family
ID=51892803
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420384780.XU Expired - Lifetime CN203950781U (en) | 2014-07-11 | 2014-07-11 | A kind of microscope test sample stage |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203950781U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106449340A (en) * | 2016-08-26 | 2017-02-22 | 深圳市华星光电技术有限公司 | Sample bearing table and dual-beam system electron microscope |
| CN108942745A (en) * | 2018-07-30 | 2018-12-07 | 住华科技股份有限公司 | Jig for observing side surface of sheet sample and method thereof |
| TWI727631B (en) * | 2018-07-30 | 2021-05-11 | 住華科技股份有限公司 | Jig for the observation of a side of a thin flat sample and method using the same for assistance to the observation of a side of a thin flat sample |
-
2014
- 2014-07-11 CN CN201420384780.XU patent/CN203950781U/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106449340A (en) * | 2016-08-26 | 2017-02-22 | 深圳市华星光电技术有限公司 | Sample bearing table and dual-beam system electron microscope |
| CN106449340B (en) * | 2016-08-26 | 2018-06-15 | 深圳市华星光电技术有限公司 | A kind of sample plummer and double-beam system electron microscope |
| CN108942745A (en) * | 2018-07-30 | 2018-12-07 | 住华科技股份有限公司 | Jig for observing side surface of sheet sample and method thereof |
| TWI727631B (en) * | 2018-07-30 | 2021-05-11 | 住華科技股份有限公司 | Jig for the observation of a side of a thin flat sample and method using the same for assistance to the observation of a side of a thin flat sample |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN203950781U (en) | A kind of microscope test sample stage | |
| CN207408581U (en) | A kind of meter circuit board test gauge | |
| CN207066835U (en) | HDPE geomembranes detection experiment sample preparation instrument | |
| CN203490165U (en) | Colorimetric tube support and colorimetric device comprising same | |
| CN203312251U (en) | Sample holder device used in observing ultrathin wafer under scanning electron microscope | |
| CN104152341B (en) | Fluorescent quantitative poly chain reaction 384 hole PCR plate coordinate application of sample box | |
| CN203323681U (en) | Practical fast angle detector | |
| CN203688598U (en) | Sensor for measuring electrical parameters of plant leaf | |
| CN204489604U (en) | A kind of sanitary inspection vasculum | |
| CN203324379U (en) | Sample fixing device of DC resistance tester | |
| CN204789565U (en) | Portable liquid plastic limit testing arrangement | |
| CN204613016U (en) | Film stretching and puncture strength proving installation | |
| CN203610155U (en) | Multifunctional sample stand | |
| CN206074467U (en) | The wood nondestructive testing system of three-dimensional imaging | |
| CN204128473U (en) | A kind of simple type groove depth measurement mechanism | |
| CN205643394U (en) | False piece device | |
| CN102707214B (en) | Method for detecting positive and saturation voltage drop of transistor chip of discrete device | |
| CN204666518U (en) | A kind of Uropaper pack case | |
| CN202631501U (en) | Detection box for testing liquid samples | |
| CN203786986U (en) | Equipotential line drawing experimental instrument | |
| CN204666517U (en) | A kind of test paper packing box | |
| CN204503623U (en) | A kind of insect sorting stage apparatus | |
| CN203324271U (en) | Detection kit | |
| CN203674157U (en) | Objective table structure in machine of scanning electron microscope | |
| CN202216897U (en) | Quantifying board |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 1108 research and development building, fangzheng science and Technology Industrial Park, north of Bai Bai highway, Shiyan street, Shiyan City, Guangdong, Baoan District 518108, China, Shenzhen Patentee after: MEIXIN TESTING TECHNOLOGY CO., LTD. Address before: 1108 research and development building, fangzheng science and Technology Industrial Park, north of Bai Bai highway, Shiyan street, Shiyan City, Guangdong, Baoan District 518108, China, Shenzhen Patentee before: MEIXIN TESTING TECHNOLOGY CO., LTD. |