CN206369789U - A kind of multifunctional digital wafer prober - Google Patents

Abstract

The utility model is related to a kind of multifunctional digital wafer prober, including the first control module, the second control module, and first control module is connected with level switch module, Keysheet module, LCD display module, memory module, energy supply control module；Second control module is connected with IC test jacks, analog switch, and the analog switch is connected with the IC test jacks；The energy supply control module is connected with first control module, the second control module, analog switch, IC test jacks；The serial ports of first control module is connected to PC by the level switch module.The utility model can be manually entered test chip model, improve testing efficiency, energy off line or on-line working, be convenient for carrying, man-machine interface is friendly, easy to operate.

Description

A kind of multifunctional digital wafer prober

Technical field

The utility model is related to IC chip test field, particularly a kind of multifunctional digital wafer prober.

Background technology

Since 1940s computer comes out, the test problem of digital display circuit is just proposed, early stage is people Work test and the complete inspection based on exhaustive testing be difficult to satisfaction and be actually needed, thus gradually by automatically test replace.But The time complexity of automatic testing generation is a uncertain multinomial complete problem.The test of integrated circuit is one regular Work, it is badly that can't see from surface that circuit, which is well, in a collection of circuit.Simple approach is such as used, use is powered up to circuit Universal meter is surveyed, then is a very troublesome thing, this not only has very high requirement, and fault diagnosis to the quality of technical staff Speed it is slow, it is of poor quality.Because one piece of circuit there are a lot of pin, survey is clapped according to truth table one, be a difficult thing. Special digital IC tester in the market, it is not only bulky and expensive, it is impossible in laboratory Middle popularization.Prior art also mostly includes controller unit, processor unit, IC pin sockets on digit chip tester Deng.But the core components such as single-chip microcomputer used and designed circuit are different.

Prior art is as follows：

1st, single-chip microcomputer is connected with test chip pin, and the reality output of gate circuit is measured by I/O mouthfuls of simulation input, The actual logic function of IC-components is tested with this.

The 2nd, the standard logic menu storage of conventional TTL series, COMS series digit integrated circuits is arrived to the expansion of single-chip microcomputer Open up in memory.

3rd, the standard logic in the actual logic function and memory obtained by test is compared, both unanimously prove quilt Survey device intact, on the contrary device failure.

4th, test result passes through LCD liquid crystal displays.

5th, single-chip microcomputer is connected by level conversion with PC serial ports, realizes data communication.

In the prior art, digit chip tester is used for two aspects, and one is chip model identification, and two be chip quality Detection.Whether type identifier or functional test, single-chip microcomputer is both needed to store substantial amounts of conventional chip model function, so as to right Than.But the data of storage are more, the time of identification is longer needed for single-chip microcomputer, is not easy to quick measurement.And some are tested Chip not can not identification type number, if two functions of tester can be separated, for the clear and definite chip of model, be manually entered type Number matching, will can greatly reduce single-chip microcomputer operation time, improve detection efficiency.

In addition, patent A（Application number CN201520277932.0）In, the logic function data of standard digital chip are deposited Single-chip microcomputer internal storage is put in, is compared with digit chip data to be measured, temperature circuit is added, operating temperature is measured, with Just chip temperature to be measured is monitored, prevents from burning out；Existing patent B（CN201521045753.0）In, carried out using FPGA at data Reason, speed, and row data communication can be entered with PC.

But, for patent A, using single-chip microcomputer internal storage, it is impossible to store the chip data of a large amount of different models, Chip compares aspect and had some limitations.And no independent current source is powered, it is not easy to carry with.For patent B, adopt Data processing is carried out with external memory storage, and by FPGA, the chip testing of different model can be met.But can not be by outer Portion（Such as keyboard）Input model and carry out Rapid matching, and powered also without independent current source, not Portable belt.

This programme proposes a multifunctional digital wafer prober, and control keyboard input module can be manually entered test core Piece model, improves testing efficiency.The tester is also powered using independent current source, energy off-line working, is convenient for carrying.In addition, utilizing VB development environments add the online function with PC by serial communication, the power of test of instrument is strengthened.Man-machine boundary Friend is good, easy to operate.

The content of the invention

In view of this, the purpose of this utility model is to provide a kind of multifunctional digital wafer prober, can be manually entered Test chip model, and can off-line working, be convenient for carrying.

The utility model is realized using following scheme：Including the first control module, the second control module, first control Module is connected with level switch module, Keysheet module, LCD display module, memory module, energy supply control module；Described second Control module is connected with IC test jacks, analog switch, and the analog switch is connected with the IC test jacks；The power supply control Molding block is connected with first control module, the second control module, analog switch, IC test jacks；The first control mould The serial ports of block is connected to PC by the level switch module;First control module is respectively connected with multiple with the second control module Position circuit and clock circuit;The energy supply control module includes lithium battery, chip TPS60110 and its peripheral circuit；The chip TPS60110 IN pin are connected with SKIP with the positive pole of the lithium battery, the PGND pin of the chip TPS60110, SYNC pin, GND pin connect the cathode of lithium battery or ground connection, and the Vout pin of the chip TPS60110 are as output pin, to separately provide 5V Voltage is used to the multifunctional digital wafer prober.

Further, first control module and the second control module are model HT46RU24 single-chip microcomputers.

Further, the Keysheet module be by 4 × 4 keyboard that constitutes of button, including numerical key 0 to 9, reset key, Known models acknowledgement key, automatic feeler switch.

Further, the LCD display module uses DM12232F.

Further, the level switch module uses chip MAX232.

Further, the memory module includes AT24C256 memories.

Further, the analog switch uses CD4052.

Compared with prior art, the utility model possesses keyboard, can be manually entered test chip model, improves test effect Rate；The utility model includes energy supply control module, is powered using independent current source, energy off-line working, is convenient for carrying；In addition, this reality It can be connected with new utilization using level switch module with PC communications, with on-line working function.

Brief description of the drawings

Fig. 1 is the HT46RU24 system framework figures that the utility model embodiment is used.

Fig. 2 is multifunctional digital wafer prober hardware block diagram in the utility model embodiment.

Fig. 3 is LCD display module DM12232F hardware module figures in the utility model embodiment.

Fig. 4 is DM12232F, keyboard and HT46RU24 connection figures in the utility model embodiment.

Fig. 5 is test interface hardware chart in the utility model embodiment.

Fig. 6 is 5V power circuit diagrams in the utility model embodiment.

Fig. 7 is the test software surface chart in the utility model embodiment.

Fig. 8 is system serial communication circuit figure in the utility model embodiment.

Embodiment

Below in conjunction with the accompanying drawings and embodiment is described further to the utility model.

As shown in Fig. 2 present embodiments providing including the first control module, the second control module, the first control mould Block is connected with level switch module, Keysheet module, LCD display module, memory module, energy supply control module；Second control Molding block is connected with IC test jacks, analog switch, and the analog switch is connected with the IC test jacks；The power supply Module is connected with first control module, the second control module, analog switch, IC test jacks；First control module Serial ports PC is connected to by the level switch module;First control module is respectively connected with reset with the second control module Circuit and clock circuit;The energy supply control module includes lithium battery, chip TPS60110 and its peripheral circuit；The chip TPS60110 IN pin are connected with SKIP with the positive pole of the lithium battery, the PGND pin of the chip TPS60110, SYNC pin, GND pin connect the cathode of lithium battery or ground connection, and the Vout pin of the chip TPS60110 are as output pin, to separately provide 5V Voltage is used to the multifunctional digital wafer prober.

In the present embodiment, first control module and the second control module are model HT46RU24 monolithics Machine.

In the present embodiment, the Keysheet module is by 4 × 4 keyboard that constitute of button, including numerical key 0 to 9, clearing Key, known models acknowledgement key, automatic feeler switch.

In the present embodiment, state LCD display module and use DM12232F.

In the present embodiment, the level switch module uses chip MAX232.

In the present embodiment, the memory module includes AT24C256 memories.

In the present embodiment, the analog switch uses CD4052.

Preferably, in the present embodiment, Fig. 1 is HT46RU24 system framework figures, and HT46RU24 is a kind of A/D types monolithic Machine, its structure is 8 high-performance, the risc architecture of high benefit, for directly handling analog signal, in addition to one integrated many Passage analog-to-digital conversion device, and one or more pulse width modulations output.Using HT46RU24 I/O pins, software side is used Method realizes UART functions, realizes and PC mutual data transmissions.The system sets the data format of a frame for a stop position, no Tape parity check position, 8 data bit, baud rate are set to 9600bps.

In the present embodiment, Fig. 2 is multifunctional digital wafer prober hardware block diagram, including Keysheet module, power supply Module, LCD display module, level switch module, memory module, analog switch module, IC test jacks, human-computer interaction interface Deng.The general principle of the tester is by the standard logic work(in the actual logic function of tested IC-components and memory Can table compare, both unanimously prove measured device be it is good, it is inconsistent to be proved to be bad.

In the present embodiment, Fig. 3 show LCD display module DM12232F hardware module figures, can complete 16 × 2 (16 × 8 dot matrix) ASCII character shows, can also show 7.5 × 2 (16 × 16 dot matrix) Chinese characters.Can be using simultaneously with outer CPU interface Line mode is controlled, and is powered using 5V.When off line test chip, test result is shown by LCD.

In the present embodiment, Fig. 4 show DM12232F, keyboard and HT46RU24 connection figures, and keyboard hardware circuit is main The keyboard being made up of 4 × 4 button, wherein comprising 0 to 9, reset key, PC communicated with MCU key, known models acknowledgement key, from Dynamic feeler switch.In order to save I/O mouthfuls, data/address bus and 4 × 4 keyboard sharings of the present embodiment LCD.It will be swept by keyboard is bonded to The respective pin of chip is retouched, the four figures that keyboard scan is exported is connected to LCD according to output, corresponding button, LCD are pressed in observation Display whether correctly, after all going well, be connected to coding chip, then coding output is directly connected to coding chip, will decode Live end and four figures are connected to LED according to output, and when decoding effective, the LCD of decoding end can be lighted moment, by pressing accordingly Key, it is whether correct after observation decoding.

In the present embodiment, Fig. 5 show test interface hardware chart, passes through two I/ of second piece of HT46RU24 single-chip microcomputer O mouthfuls of four passages to control analog switch, so that the ground pin positions to select different chips.

In the present embodiment, Fig. 6 show 5V power circuit diagrams, using TPS60110 chips.Lithium battery voltage is exported After 3.7V or so voltages, by passing through electrochemical capacitor（15μF）One-level filtering is carried out, to remove the clutter inside direct current, is prevented Interference.Filtered direct current turns into stable 5V power supplys by TPS60110 voltage stabilizings again, and wherein TPS60110 IN, SKIP is Input pin, connects battery DC positive source, and PGND, SYNC, GND are grounding legs, connects battery DC power cathode, and Vout is output Pin, the voltage of it and grounding leg is exactly+5V.5V power supplys out pass through the secondary filter of electrochemical capacitor (33 μ F) again, make 5V electricity Source is more reliable and more stable.

In the present embodiment, Fig. 7 show test software surface chart, during online operation, can be by the survey in P C machine program libraries Trial vector is called in tester, and the result after test is shown on P C machine screens.Screen shows truth table all simultaneously in Hold and measured result.Newly-increased I C can also be programmed on P C machines, and data are stored in program library.

In the present embodiment, Fig. 8 show system serial communication circuit figure.To carry out serial communication with PC, use MAX232 carries out the mutual conversion of RS-232C level and Transistor-Transistor Logic level.HT46R24 clock frequencies select 4MHz crystal oscillators, and communicate baud Rate selects 9600, and serial communication is carried out using working method 1.Using the side of RS-232 serial bus interfaces and single chip communication Method.

The multifunctional digital wafer prober of the present embodiment, by test patterns control and tests the running situation of hardware, Test result is compared with right value, and the result of positive erroneous judgement is provided automatically.The instrument can complete TTL series and CMOS within 20 pin The test of series digit IC chip.

HT46RU24 provides I2C EBIs, and I2C buses are two-way two cable architectures, and data wire and clock line are respectively SDA and SCL.SDA and SCL are NMOS open-drain outputs, must external pull-up resistor when using.

Need to concatenate 470 Ω (or 510 Ω) resistance between HT46RU24 single-chip microcomputers and test chip.First, go here and there The purpose of connecting resistance is to play current-limiting protection to HT46RU24, it is assumed that PA0 exports high level, and now, test chip is again For NOT gate, then, sink current phenomenon will be caused, cause the electric current in PA0 mouth lines very big, HT46RU24 may be burnt. Secondly the correct of logic level can be ensured, the resistance in hundreds of Europe is concatenated on connecting line without connecing several kilo-ohms of resistance reason It is：Assuming that allowing PA0 to be logic low, such base stage will be high level, and it is 3K or so to have the pull-up resistor on PA mouths again, If the resistance on connecting line also takes 3K, then PA0 will be made to go out logic high, now logic level is wrong；If even The resistance connect is 470 Ω or so, and PA0 so can correctly export logic low, so ensure that the correct of logic level Property.

According to 20 pin test chip sockets of design, chip under test highest pin is corresponding with the pin of test jack 20, chip under test 1 Pin is corresponding with the pin of test jack 1, and center section is with pin（NC）Instead of.The following chip of 20 pin is all so regarded as 20 pin chips, if Meter test vector is tested.

The I/O control words rule for being wherein tested IC chip is as follows：

1. corresponded to " 1 " in tested IC power line and ground wire, selection word；

2. corresponded to " 1 " in tested IC each sky pin, selection word；

Corresponded to " 0 " in PIO input, selection word 3. tested IC output pin is regarded as；

4. tested IC input pin regards corresponding to " 1 " in PIO output, selection word as；

For the digital integrated electronic circuit of known models, after the model of chip is inputted, program can be gone according to different models The subprogram of different model is called, i.e., adds the high and low level signal of various combination in its input according to different chips.So Read the level signal of output end again afterwards, determine whether logic function is correct, so as to judge the quality of chip.

Because the number of pins and width of each I C blocks are inconsistent, and the position on power supply and ground is different because of piece, so chip to be measured The pin of socket must be selectively controlled by.According to TTL74,54 series and CMOS4000,4500 common more than 200 Plant the chip within the statistics of chip, 20 pins and account for more than 95%, 20 core locking sockets are devised for this, and be specified below：Will The first pin and last pin of chip to be measured insert the 1st pin and the 20th pin of 20 core locking sockets, because the upper right of regular chip Pin is all power supply (VCC), and lower left corner is all ground (GND).By the statistics to document and classification, regular chip within 20 pin is listed With the number of pins of irregular chip, VCC and GND situation.According to defined above, therefrom analyze and draw：VCC may socket Pin is 4,5 and 20 pin, and it is regular chip that VCC, which connects the chips of 20 pin, and the chip that VCC connects 4 and 5 pin is irregular chip； The possible socket pins of GND are 7,8,9,10.For the particular location for the GND sockets for correctly finding out chip, CD4052 chips have been selected. CD4052 is one double 4 select one multi-channel analog selecting switch.The 12 of its pin, 14,15,11 pin correspond respectively to socket Pin 7,8,9,10.Using when can by single-chip microcomputer to A/B control select input be which, for example：Need from 4 tunnels The second tunnel is selected to input in input, it is assumed that to use Y groups, then single-chip microcomputer only needs to send 1 and 0 i.e. to A and B respectively The road can be chosen, then handled accordingly, note the 6th pin for enable pin, only for 0 when, just have passage be selected Output.

Chip to be measured is put into after chip testing socket tightens and be electrified, after the model that keyboard keys in chip, point Hit " it is determined that " key, the meeting that as a result chip has been shows " GOOD ", if bad just display " FAIL ".For the core not having in storehouse Piece then shows " ERROR " that the model of input error can click on " clearing " key.

In order to detect the reliability of the tester, choose conventional CMOS, TTL family chip and carry out test and validation, its Middle CMOS family chips 5, TTL family chips 5.It is previously provided with power failure, earth fault, input pin failure, output pin A variety of situations such as failure, normal, carry out actual tests by this tester, can accurately detect the whether normal of chip, and The fault pin of inoperable chip can be accurately pointed out, the test sample accuracy of selection is specific as shown in table 1 up to 100%.Therefore, This tester has important application value in the test of chip.

The tester reliability testing table of table 1

Compared with general same type tester, the present embodiment uses lithium battery power supply, conveniently moving, stable work in work, Output result is accurate.Meanwhile, the online function with PC is realized by serial communication using VB development environments, makes the survey of instrument Examination ability is strengthened.Man-machine interface is friendly, easy to operate.

It is noted that the utility model protection is hardware configuration, it is not claimed as design method of testing.With Upper is only a preferably embodiment in the utility model embodiment.But, the utility model is not limited to above-mentioned embodiment party Case, all any equivalent changes done by the utility model scheme and modification, produced function is without departing from this programme During scope, protection domain of the present utility model is belonged to.

Claims (7)

1. a kind of multifunctional digital wafer prober, it is characterised in that：It is described including the first control module, the second control module First control module is connected with level switch module, Keysheet module, LCD display module, memory module, energy supply control module； Second control module is connected with IC test jacks, analog switch, and the analog switch is connected with the IC test jacks；Institute Energy supply control module is stated with first control module, the second control module, analog switch, IC test jacks to be connected；Described The serial ports of one control module is connected to PC by the level switch module;First control module and the second control module are equal It is connected with reset circuit and clock circuit;The energy supply control module includes lithium battery, chip TPS60110 and its peripheral circuit； The IN pin of the chip TPS60110 are connected with SKIP with the positive pole of the lithium battery, the PGND pin of the chip TPS60110, SYNC pin, GND pin connect the cathode of lithium battery or ground connection, and the Vout pin of the chip TPS60110 are as output pin, to only The vertical 5V voltages that provide are used to the multifunctional digital wafer prober.

2. a kind of multifunctional digital wafer prober according to claim 1, it is characterised in that：First control module It is model HT46RU24 single-chip microcomputer with the second control module.

3. a kind of multifunctional digital wafer prober according to claim 1, it is characterised in that：The Keysheet module is served as reasons The keyboard of 4 × 4 button composition, including numerical key 0 to 9, reset key, known models acknowledgement key, automatic feeler switch.

4. a kind of multifunctional digital wafer prober according to claim 1, it is characterised in that：The LCD display module Using DM12232F.

5. a kind of multifunctional digital wafer prober according to claim 1, it is characterised in that：The level switch module Using chip MAX232.

6. a kind of multifunctional digital wafer prober according to claim 1, it is characterised in that：The memory module bag Include AT24C256 memories.

7. a kind of multifunctional digital wafer prober according to claim 1, it is characterised in that：The analog switch is used CD4052。