CN206223924U - A kind of circuit board testing frock - Google Patents
A kind of circuit board testing frock Download PDFInfo
- Publication number
- CN206223924U CN206223924U CN201621144720.6U CN201621144720U CN206223924U CN 206223924 U CN206223924 U CN 206223924U CN 201621144720 U CN201621144720 U CN 201621144720U CN 206223924 U CN206223924 U CN 206223924U
- Authority
- CN
- China
- Prior art keywords
- probe
- objective table
- pressing plate
- circuit board
- base plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The utility model provides a kind of circuit board testing frock, including：Base plate, objective table, support frame, handle, connecting rod, pressing plate, the first guide post and probe assembly, the probe of probe assembly are coated by telescopic insulating set, are effectively isolated the contact with the external world, are played a protective role.During point survey operation, telescopic insulating set is first contradicted on circuit boards, plays initial buffer effect, continues to push rear telescopic insulating and cover to shrink, and probe stretches out and makes electrical contact with and then detected with the test point of circuit board.Buffer Unit is also provided between base plate and objective table, cushioning effect is further functioned as, probe and circuit board is protected.It has simple structure, probe long lifespan, with buffering effect the features such as.
Description
Technical field
The utility model is related to circuit board detecting field, and in particular to a kind of simple structure, probe long lifespan, with buffering
The circuit board testing frock of effect.
Background technology
The title of circuit board has：Wiring board, PCB（Printed Circuit Board）Plate, aluminium base, high frequency plate, thick copper
Plate, impedance plate, ultra-thin wiring board, ultrathin circuit board, printing (copper lithographic technique) circuit board etc..Circuit board make circuit miniaturization,
Directly perceivedization, batch production and optimization electrical appliance layout for permanent circuit play an important role.Circuit board can be described as printed wire
Plate or printed circuit board (PCB).
, it is necessary to carry out basic functional test to circuit board after circuit board making is completed, such as start, short circuit and open circuit
Deng, the originally production of small lot, its test mode is：With the test point of the probe manual alignment circuit board of universal meter, this survey
Method for testing is extremely inefficient, is not suitable for batch testing.Follow-up people are developed such as Chinese utility model patent Application No.：
, can be fixed on circuit board on the locating slot of base by the circuit board testing frock of CN201410692579.2, used rotary handle
Drive probe close to circuit board direction and then accurately docked with test point, contraposition is accurate and conveniently operates.But this kind of frock
Probe is contacted firmly with circuit board, and the test point for being easily caused probe or circuit board is damaged, and causes defective products or probe to scrap.And visit
Pin is exposed in atmosphere, if being placed under moister rugged environment for a long time, probe also occurs the situation got rusty.Furthermore, if work
The multiple probes for being provided with comparatively dense are loaded onto, extraneous electric conductor can be stained with unavoidably and then be made short circuit between probe, influence test data.
Utility model content
Therefore, the utility model provides a kind of simple structure, probe long lifespan, the circuit board testing work with buffering effect
Dress.
To reach above-mentioned purpose, a kind of circuit board testing frock that the utility model is provided, including：Base plate, objective table, branch
Support, handle, connecting rod, pressing plate, the first guide post and probe assembly, support frame as described above, objective table are arranged on base plate, hand
Handle is hinged on support frame, and one end of connecting rod is hinged on handle, its other end connection pressing plate, and pressing plate is provided with leads with first
The pressing plate pilot hole matched to bar, the first guide post is set and through pressing plate pilot hole perpendicular to base plate, and the handle is relative
Rotated in support frame and then drive pressing plate to objective table direction closer or far from the probe assembly is arranged on pressing plate and direction
Objective table is set, and the probe assembly includes：Probe, telescopic insulating set and the first spring with two end openings, the one of probe
End is fixed on pressing plate and is electrically connected with detection means, and length is not less than probe under the telescopic insulating is enclosed within the fully extended state
Length, the telescopic insulating set is set on probe, and its one end is fixed on pressing plate, and the first both ends of the spring is separately fixed at pressure
Between plate and telescopic insulating set, its elastic force make telescopic insulating be enclosed within not by the presence of other external force under the fully extended state simultaneously
Probe is coated completely.
Further, also including at least three Buffer Units, the Buffer Unit distribution be arranged on base plate and objective table it
Between, the objective table is arranged on base plate by Buffer Unit and realized and the buffering between base plate.
Further, the Buffer Unit includes：Second guide post and second spring, the second spring are sheathed on second
Guide post periphery, the objective table is provided with objective table pilot hole, and the second guide post passes through objective table pilot hole, second spring set
Two ends contradict respectively on base plate and objective table.
Further, the objective table is provided with locating slot.
The technical scheme provided by the utility model, is had the advantages that：
The probe of probe assembly is coated by telescopic insulating set, is effectively isolated the contact with the external world, is played a protective role.Point
When surveying operation, telescopic insulating set is first contradicted on circuit boards, plays initial buffer effect, continues to push rear telescopic insulating set receipts
Contracting, probe stretches out and makes electrical contact with and then detected with the test point of circuit board.Buffering is also provided between base plate and objective table
Component, further functions as cushioning effect, protects probe and circuit board.It has simple structure, probe long lifespan, is imitated with buffering
The features such as fruit.
Brief description of the drawings
Fig. 1 show the lateral cross schematic diagram of circuit board testing frock in the present embodiment；
Fig. 2 show the enlarged diagram of a-quadrant in Fig. 1；
Fig. 3 show view of the probe assembly when probe is stretched out.
Specific embodiment
To further illustrate each embodiment, the utility model is provided with accompanying drawing.These accompanying drawings are in the utility model is disclosed
A part for appearance, it is mainly used to illustrate embodiment, and running of the associated description of specification to explain embodiment can be coordinated former
Reason.Coordinate and refer to these contents, those of ordinary skill in the art will be understood that other possible implementation methods and this practicality are new
The advantage of type.Component in figure is not necessarily to scale, and similar element numbers are conventionally used to indicate similar component.
The utility model is further illustrated in conjunction with the drawings and specific embodiments.
Shown in reference picture 1, Fig. 2, Fig. 3, a kind of circuit board testing frock that the present embodiment is provided, including：Base plate 10, loading
Platform 70, support frame 20, handle 30, connecting rod 40, pressing plate 50,90, three groups of probe assemblies 60 of the first guide post and four groups of buffering groups
Part（Two groups are shown in figure）, support frame as described above 20 is arranged on base plate 10, and handle 30 is hinged on support frame 20, connecting rod 40
One end is hinged on handle 30, and its other end connection pressing plate 50, pressing plate 50 is provided with the pressing plate matched with the first guide post 90
Pilot hole 501, the first guide post 90 is set perpendicular to base plate 10 and through pressing plate pilot hole 501, the handle 30 is relative to branch
Support 20 rotates and then drives pressing plate 50 to move up and down, and the probe assembly 60 is arranged on pressing plate 50 and sets down, institute
Stating probe assembly 60 includes：Probe 602, telescopic insulating set 601 and the first spring 603 with two end openings, the one of probe 602
End is fixed on pressing plate 50 and is electrically connected with detection means, and the length under the fully extended state of telescopic insulating set 601 is not small
In the length of probe 602, the telescopic insulating set 601 is set on probe 602, and its one end is fixed on pressing plate 50, the first bullet
The two ends of spring 603 are separately fixed between pressing plate 50 and telescopic insulating set 601, and its elastic force makes telescopic insulating cover 601 not by other
In under the fully extended state and completely cladding probe 602 in the presence of external force, as shown in Figure 2.Objective table 70 passes through four groups of bufferings
Component is fixedly installed on the base of the lower section of probe 602, and Buffer Unit includes：Second guide post 801 and second spring 802, institute
State second spring 802 and be sheathed on the periphery of the second guide post 801, the objective table 70 is provided with objective table pilot hole 702, and second leads
The two ends for passing through objective table pilot hole 702, second spring set 802 to bar 801 contradict on base plate 10 and objective table 70 respectively, carry
The surface of thing platform 70 is additionally provided with the locating slot 701 for fixing circuit board.
Its operation principle is as follows：Circuit board under test is placed in the locating slot 701 of objective table 70 and is positioned, rotate handle
30, handle 30 declines with dynamic pressure plate 50, and after declining to a certain degree, telescopic insulating covers 601 and circuit board contacts, is further continued for declining,
The forced contraction of second spring 802 of Buffer Unit, objective table buffer falling, meanwhile, the reaction force that telescopic insulating set 601 is subject to
Shunk under the fully extended state, the forced contraction of the first spring 603 of probe assembly 60, probe 602 is exposed in telescopic insulating set
601 outer and with circuit board test points make electrical contact with and then are tested, as shown in Figure 3.After the completion of, turn back handle 30, band dynamic pressure
Plate 50 rises, and probe assembly 60 is separated with circuit board, and the second spring 802 of Buffer Unit recovers deformation causes objective table 70 to be back to
It is in situ.First spring 603 of probe assembly 60 recovers deformation simultaneously, and the stretching, extension of telescopic insulating set 601 is covered probe again
602。
In the present embodiment, telescopic insulating set 601 is retractable and flexible plastic bushing.Telescopic insulating set as shown in Figure 2
601 pipe shaft has two outer male structures, and in stress, outer male structure extrudes or upholds and then telescopic insulating is covered 601 stretches.
In the present embodiment, the two ends of the first spring 603 are separately fixed between pressing plate 50 and telescopic insulating set 601, and its is specific
Mode is：The lower end exit of telescopic insulating set 601 is provided with limiting section 6011, and the one end of the first spring 603 is contradicted in pressing plate 50
Lower surface, its other end is contradicted on limiting section 6011.
The technical scheme that the utility model is provided, the probe 603 of probe assembly 60 is coated by telescopic insulating set 601, is had
Effect isolation and extraneous contact, play a protective role.When point surveys operation, telescopic insulating set 601 is first contradicted on circuit boards, is played
Initial buffer is acted on, and continues to push the contraction of rear telescopic insulating set 601, and probe 603 stretches out and made electrical contact with the test point of circuit board
And then detected.Buffer Unit is also provided between base plate 10 and objective table 70, cushioning effect is further functioned as, probe is protected
603 and circuit board.It has simple structure, the long lifespan of probe 603, with buffering effect the features such as.
Although specifically showing and describing the utility model with reference to preferred embodiment, those skilled in the art should
This is understood, not departing from the spirit and scope of the present utility model that appended claims are limited, in form and details
On the utility model can be made a variety of changes, be protection domain of the present utility model.
Claims (4)
1. a kind of circuit board testing frock, it is characterised in that including：Base plate, objective table, support frame, handle, connecting rod, pressing plate,
First guide post and probe assembly, support frame as described above, objective table are arranged on base plate, and handle is hinged on support frame, connection
One end of bar is hinged on handle, and its other end connection pressing plate, pressing plate is provided with the pressing plate matched with the first guide post and is oriented to
Hole, the first guide post is set and through pressing plate pilot hole perpendicular to base plate, and the handle rotates and then drive relative to support frame
Pressing plate is to objective table direction closer or far from the probe assembly is arranged on pressing plate and is set towards objective table, the probe
Component includes：Probe, with two end openings telescopic insulating set and the first spring, one end of probe be fixed on pressing plate and with inspection
Survey device electrical connection, the telescopic insulating is enclosed within the length of length under the fully extended state not less than probe, the telescopic insulating
It is set on probe, its one end is fixed on pressing plate, the first both ends of the spring is separately fixed between pressing plate and telescopic insulating set,
Its elastic force makes telescopic insulating cover in the fully extended state and coat probe.
2. circuit board testing frock according to claim 1, it is characterised in that：Also include at least three Buffer Units, institute
State Buffer Unit distribution to be arranged between base plate and objective table, the objective table is arranged on base plate and is realized by Buffer Unit
Buffering between base plate.
3. circuit board testing frock according to claim 2, it is characterised in that：The Buffer Unit includes：Second is oriented to
Bar and second spring, the second spring are sheathed on the second guide post periphery, and the objective table is provided with objective table pilot hole, the
Two guide posts pass through the two ends of objective table pilot hole, second spring set to contradict respectively on base plate and objective table.
4. the circuit board testing frock according to claim 1 or 2 or 3, it is characterised in that：The objective table is provided with positioning
Groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621144720.6U CN206223924U (en) | 2016-10-21 | 2016-10-21 | A kind of circuit board testing frock |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621144720.6U CN206223924U (en) | 2016-10-21 | 2016-10-21 | A kind of circuit board testing frock |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206223924U true CN206223924U (en) | 2017-06-06 |
Family
ID=58788325
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621144720.6U Expired - Fee Related CN206223924U (en) | 2016-10-21 | 2016-10-21 | A kind of circuit board testing frock |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206223924U (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107478968A (en) * | 2017-08-07 | 2017-12-15 | 纳恩博（天津）科技有限公司 | detecting tool |
| CN107861054A (en) * | 2017-12-08 | 2018-03-30 | 张家港市得道电子有限公司 | A kind of quick test fixture of circuit board |
| CN108303634A (en) * | 2017-12-28 | 2018-07-20 | 重庆市中光电显示技术有限公司 | The two-sided rapid detection tool of circuit board |
| CN109342196A (en) * | 2018-12-04 | 2019-02-15 | 深圳市佳立达五金制品有限公司 | A kind of accurate hardware tool with high-flexural strength |
| CN109884425A (en) * | 2019-01-31 | 2019-06-14 | 王懿琳 | A kind of test device for power tube pin class package module |
| CN110426539A (en) * | 2019-08-30 | 2019-11-08 | 苏州途驰安电子科技有限公司 | A kind of main control board device for detecting performance in automobile head-up display |
| CN111969097A (en) * | 2020-10-20 | 2020-11-20 | 深圳市Tcl高新技术开发有限公司 | LED chip test fixture, method and system and manufacturing method of test fixture |
| WO2021174590A1 (en) * | 2020-03-02 | 2021-09-10 | 瑞声声学科技(深圳)有限公司 | Transmission line test device |
| WO2022077682A1 (en) * | 2020-10-15 | 2022-04-21 | 深圳市聚能车品科技有限公司 | Electric connection apparatus, emergency power supply, and vehicle-mounted electric device |
-
2016
- 2016-10-21 CN CN201621144720.6U patent/CN206223924U/en not_active Expired - Fee Related
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107478968A (en) * | 2017-08-07 | 2017-12-15 | 纳恩博（天津）科技有限公司 | detecting tool |
| CN107861054A (en) * | 2017-12-08 | 2018-03-30 | 张家港市得道电子有限公司 | A kind of quick test fixture of circuit board |
| CN108303634A (en) * | 2017-12-28 | 2018-07-20 | 重庆市中光电显示技术有限公司 | The two-sided rapid detection tool of circuit board |
| CN109342196A (en) * | 2018-12-04 | 2019-02-15 | 深圳市佳立达五金制品有限公司 | A kind of accurate hardware tool with high-flexural strength |
| CN109884425A (en) * | 2019-01-31 | 2019-06-14 | 王懿琳 | A kind of test device for power tube pin class package module |
| CN110426539A (en) * | 2019-08-30 | 2019-11-08 | 苏州途驰安电子科技有限公司 | A kind of main control board device for detecting performance in automobile head-up display |
| WO2021174590A1 (en) * | 2020-03-02 | 2021-09-10 | 瑞声声学科技(深圳)有限公司 | Transmission line test device |
| WO2022077682A1 (en) * | 2020-10-15 | 2022-04-21 | 深圳市聚能车品科技有限公司 | Electric connection apparatus, emergency power supply, and vehicle-mounted electric device |
| CN111969097A (en) * | 2020-10-20 | 2020-11-20 | 深圳市Tcl高新技术开发有限公司 | LED chip test fixture, method and system and manufacturing method of test fixture |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170606 Termination date: 20191021 |