CN205140924U - Quick positioner of scanning electron microscope sample microdomain - Google Patents
Quick positioner of scanning electron microscope sample microdomain Download PDFInfo
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- CN205140924U CN205140924U CN201520939005.0U CN201520939005U CN205140924U CN 205140924 U CN205140924 U CN 205140924U CN 201520939005 U CN201520939005 U CN 201520939005U CN 205140924 U CN205140924 U CN 205140924U
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- electron microscope
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Abstract
The utility model relates to a quick positioner especially relates to a quick positioner of scanning electron microscope sample microdomain. Install the supporting shoe on the mount, supporting shoe bottom be equipped with with scanning electron microscope test sample table and the concentric dead lever that corresponds, the top is equipped with left and right sides micromatic setting, still is equipped with the spirit level on the supporting shoe, the supporting shoe top fixed mounting image tube of achieving success, it has an eyepiece to become image tube one end fixed mounting, and objective are installed to the other end, supporting shoe end department is arranged in to objective. The utility model discloses a carry out the microdomain to the scanning electron microscope analytical sample and go on fast observing the location, guaranteed under scanning electron microscope sample quick, pinpoint, direct control scanning electron microscope to the microdomain observe, the analysis, improved analysis speed.
Description
Technical field
The utility model relates to a kind of fast-positioning device, particularly relates to a kind of ESEM sample microcell fast-positioning device.
Background technology
ESEM mainly utilizes secondary electron signal imaging to observe the configuration of surface of sample, namely removes scanning samples with extremely narrow electron beam, and secondary electron can produce the X rays topographs that sample surfaces amplifies, and is convenient to carry out micro-raman spectra analysis.But for some larger fracture sample or metallographic specimen, when fracture face big rise and fall or metallographic specimen contrast less time, microcell location very difficult, make troubles to micro-raman spectra analysis.For this reason, need to prepare ESEM fracture sample microcell fast-positioning device to ensure the quick position of microcell.
Summary of the invention
The purpose of this utility model is to provide a kind of a kind of ESEM sample microcell fast-positioning device accurately can determining larger fracture sample or metallographic specimen micro-raman spectra position.
Technical solution
The utility model comprises: fixed mount, and described fixed mount is provided with back-up block, and be provided with bottom back-up block and ESEM sample bench and corresponding concentric fixed lever, top is provided with fixture, and back-up block is also provided with level meter; Be installed with image forming tube above described back-up block, image forming tube one end is installed with eyepiece, and the other end is provided with object lens, and described object lens are placed in back-up block end place.
Described fixture is two symmetrically arranged clamping plate, and Boards wall is arranged on the two ends of axle, and the axle between clamping plate is provided with spring, clamping plate and can moving on axle.
Described image forming tube is fixedly mounted on crossbeam, and crossbeam two ends are fixedly connected with fixed mount by column, and crossbeam can move up and down on column.
Described crossbeam is moved up and down on column by coarse adjustment motor, carries out coarse adjustment to crossbeam.
Described crossbeam is also provided with fine setting motor, and fine setting driven by motor crossbeam moves up and down on column, finely tunes crossbeam.
The utility model image forming tube, clamping plate carry out microcell to scanning electron microscope analysis sample and carry out rapid examination, location, and direct control ESEM is observed microcell, analyzed, and improves analysis speed.Microcell observation is carried out to sample.
Accompanying drawing explanation
Fig. 1 is the utility model structural representation.
Embodiment
Fixed mount 2 described in the utility model is provided with back-up block 4, and be provided with bottom back-up block 4 and ESEM sample bench and corresponding concentric fixed lever 3, back-up block 4 top is provided with fixture 6, and back-up block 4 is also provided with level meter 5; Image forming tube 12 is installed with above described back-up block 4, image forming tube 12 is fixedly mounted on crossbeam 14, crossbeam 14 two ends are fixedly connected with fixed mount 2 by column 15, crossbeam 14 can move up and down on column 15, crossbeam 14 completes the coarse adjustment of crossbeam 14 on column 15 by coarse adjustment motor 9, completes the fine setting on column 15 by fine setting motor 10.Described image forming tube 12 one end is installed with eyepiece 13, and the other end is provided with object lens 11, and described object lens 11 are placed in back-up block 4 end place.
Described fixture is two symmetrically arranged clamping plate 6, and Boards wall is arranged on the two ends of axle 7, and clamping plate 6 can move on axle 7.
When using the utility model, being placed in by sample 8 on clamping plate 6, can be optical eyepiece, electronic imaging screen by eyepiece 13() location sample 8 microcell, ensure that the quick position of microcell.
Its operation principle is: be placed on by sample 8 on clamping plate 6, by coarse adjustment motor 9 and fine setting 10 adjustment crossbeam 14, sample 8 micro-raman spectra is clearly obtained by eyepiece 13, ensure that horizontal display apparatus 5 is in level simultaneously, then by concentric fixed lever 3 interleave scan electron microscopic sample seat, can observe the micro-raman spectra of location sample 8 fast.
Claims (5)
1. an ESEM sample microcell fast-positioning device, comprise: fixed mount (2), it is characterized in that, described fixed mount (2) is provided with back-up block (4), back-up block (4) bottom is provided with the concentric fixed lever (3) corresponding with ESEM sample bench, top is provided with fixture, back-up block (4) is also provided with level meter (5); Described back-up block (4) top is installed with image forming tube (12), and image forming tube (12) one end is installed with eyepiece (13), and the other end is provided with object lens (11), and described object lens (11) are placed in back-up block (4) end place.
2. a kind of ESEM sample microcell fast-positioning device according to claim 1, it is characterized in that, described fixture is two symmetrically arranged clamping plate (6), clamping plate (6) are fixedly mounted on the two ends of axle (7), axle (7) between clamping plate (6) is provided with spring, clamping plate (6) and can be upper mobile at axle (7).
3. a kind of ESEM sample microcell fast-positioning device according to claim 1, it is characterized in that, image forming tube (12) is fixedly mounted on crossbeam (14), crossbeam (14) two ends are fixedly connected with fixed mount (2) by column (15), and crossbeam (14) can move up and down on column (15).
4. a kind of ESEM sample microcell fast-positioning device according to claim 3, it is characterized in that, crossbeam (14) is moved up and down on column by coarse adjustment motor (9), carries out coarse adjustment to crossbeam (14).
5. a kind of ESEM sample microcell fast-positioning device according to claim 4, it is characterized in that, crossbeam (14) is also provided with fine setting motor (10), fine setting motor (10) drives crossbeam (14) to move up and down on column, finely tunes crossbeam (14).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520939005.0U CN205140924U (en) | 2015-11-23 | 2015-11-23 | Quick positioner of scanning electron microscope sample microdomain |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520939005.0U CN205140924U (en) | 2015-11-23 | 2015-11-23 | Quick positioner of scanning electron microscope sample microdomain |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205140924U true CN205140924U (en) | 2016-04-06 |
Family
ID=55626689
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520939005.0U Active CN205140924U (en) | 2015-11-23 | 2015-11-23 | Quick positioner of scanning electron microscope sample microdomain |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205140924U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108956671A (en) * | 2018-09-27 | 2018-12-07 | 中国航发北京航空材料研究院 | Scanning electron microscope test special-shaped sample carrying and stationary fixture |
| CN111610212A (en) * | 2020-06-03 | 2020-09-01 | 成都理工大学 | Scanning electron microscope sample positioning device and method for oil and gas reservoir transformation experiment |
-
2015
- 2015-11-23 CN CN201520939005.0U patent/CN205140924U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108956671A (en) * | 2018-09-27 | 2018-12-07 | 中国航发北京航空材料研究院 | Scanning electron microscope test special-shaped sample carrying and stationary fixture |
| CN111610212A (en) * | 2020-06-03 | 2020-09-01 | 成都理工大学 | Scanning electron microscope sample positioning device and method for oil and gas reservoir transformation experiment |
| CN111610212B (en) * | 2020-06-03 | 2023-04-18 | 成都理工大学 | Scanning electron microscope sample positioning device and method for oil and gas reservoir transformation experiment |
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|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |