CN204924451U - Microwave power device transient state temperature measuring system - Google Patents
Microwave power device transient state temperature measuring system Download PDFInfo
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- CN204924451U CN204924451U CN201520534740.3U CN201520534740U CN204924451U CN 204924451 U CN204924451 U CN 204924451U CN 201520534740 U CN201520534740 U CN 201520534740U CN 204924451 U CN204924451 U CN 204924451U
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Abstract
The utility model discloses a microwave power device transient state temperature measuring system relates to microwave power device temperature measuring device technical field. Measurement system includes: the infrared detector is connected with the signal input part of enlarged main road for gather the infrared signal that the microwave power device sent, amplifier circuit is connected with data collection card's signal input part for enlarge the processing with the infrared signal of gathering, data collection card carries out two -way data interaction with the industry control computer for data acquisition is carried out in control according to the industry control computer, the industry control computer for handle the data that data collection card gathered, and save the electric signal transition of capture card collection and show for temperature data. Through measurement system can realize the measurement to microwave power device periodicity and aperiodicity's arbitrary transient state temperature, and the measuring speed is fast, and the precision is high.
Description
Technical field
The utility model relates to microwave power device temperature measuring equipment technical field, particularly relates to a kind of microwave power device transient temperature measuring system.
Background technology
In microwave power device field of temperature measurement, IR thermometry is with its non-cpntact measurement, and the feature not affecting proper device operation condition is widely used in the temperature survey of all kinds of device.
Due to without the need to having direct contact with measured piece, infrared temperature measurement apparatus is applicable to the microwave power device of any kind.For microwave power device, temperature under different condition or its change can reflect the different qualities of device, as: infrared microscopy thermal imaging device can the distribution situation of acquisition device different parts temperature, this is that the thermal design of device and failure analysis provide strong support; Transient state infrared equipment can a certain spot temperature of measuring element periodically variable situation in time, and this effectively supports the thermal characteristics research work of paired pulses high power device.
Above-mentioned two kinds of infrared temperature measurement apparatus are the most general in the application of microwave current power device temperature detection field.But, in some research field, need aperiodicity, measure in the transient temperature signal of change at a high speed, as: the heating curve or the temperature lowering curve that need measuring element when analyzing thermal impedance and the thermo-contact change of microwave power device according to international standard JEDEC51-14, Fig. 1 is the typical temperature lowering curve of a width.Adopt structure function method analysis heating curve or temperature lowering curve effectively can obtain the material thermal characteristics (thermal resistance, thermal capacitance) of device heat conduction path, effectively can find the situation of change of device heat conduction path material thermal characteristics.This signal is acyclic, and the Main change of temperature concentrated in the 100ms even shorter time, and existing infrared temperature measurement apparatus cannot meet these needs.Up to now, only the measurement to heating curve and temperature lowering curve can be realized based on the microwave power device temperature measurement technology of electrical principles and Raman principle.But the duty of electric method meeting disturbance means, also cannot meet at present to the testing requirement of the especially emerging GaNHEMT device of class device; Raman method test macro is complicated, and test speed is slow, and cost is high, and domesticly there is no any mechanism and grasp this technology.
The advantage of existing microwave power device thermometry has:
1) transient state infrared equipment can the temperature signal of sense cycle at a high speed change, effectively meets the temperature survey demand for high power device under pulsed operation condition.
2) thermal microscope can realize imaging type detection, obtains the profiling temperatures of different parts, can differentiate the Temperature Distribution of micro-structure, possess higher spatial resolution.
3) electric method can affect the duty of device, and in the emerging high power device temperature surveys such as GaNHEMT, degree of ripeness is poor, and can not measure transient temperature.
4) Raman method spatial resolution is high, advanced technology, is applicable to the accurate determination and analysis to device junction temperature, is microwave power device temperature detection technology emerging in recent ten years.
Its shortcoming of above-mentioned four kinds of devices or technology is as follows:
1) infrared microscopy thermal imaging device measuring speed is comparatively slow, and can only realize the detection that frame frequency is below 50Hz, the thermal imaging system frame frequency that some precision is lower can reach up to a hundred, but these cannot meet the detection demand to high speed transformation temperature signal.
2) transient state infrared equipment is carry out measuring for periodic temperature signal.Do not possess the ability measuring aperiodicity temperature signal.
3) electric method can affect the duty of device, and cannot measure the emerging high power devices such as GaNHEMT.
4) Raman method system complex, measuring speed is slow, the domestic measurement that there is no method and realize transient temperature.
Utility model content
Technical problem to be solved in the utility model is to provide a kind of wave power device transient measurement system, and can realize the measurement to microwave power device periodicity and acyclic any transient temperature by described measuring system, and measuring speed is fast, precision is high.
For solving the problems of the technologies described above, technical solution adopted in the utility model is: a kind of microwave power device transient temperature measuring system, it is characterized in that described measuring system comprises: infrared radiation detector, amplifying circuit, data collecting card and industrial computer, described infrared radiation detector is connected, for gathering the infrared radiation signal that microwave power device sends with the signal input part amplifying main road; Described amplifying circuit is connected with the signal input part of data collecting card, for the infrared radiation signal of collection being carried out amplification process; Data collecting card and industrial computer carry out bidirectional data interaction, carry out data acquisition for the control according to industrial computer; The data that described industrial computer gathers for the treatment of data collecting card, and the electric signal of capture card collection is converted to temperature data and carries out storing and showing.
Further technical scheme is: described infrared radiation detector is infrared sensor.
Further technical scheme is: described infrared sensor is independently high-speed photodiode.
Further technical scheme is: the band of described amplifying circuit is wider than 20kHz, and enlargement ratio is greater than 100 times.
Further technical scheme is: the sampling rate of described data collecting card is greater than 20MS/s, and sampling depth is at more than 10bit.
Adopt the beneficial effect that produces of technique scheme to be: according to infrared measurement of temperature principle, during device temperature change, its infrared radiation also can change, and infrared radiation detector probe radiation signal also converts it into electric signal and exports to amplifying circuit; Amplifying circuit amplifies more weak electric signal, and data collecting card carries out data acquisition according to the order of industrial computer, and data processing software is by calculate and the transform electrical signals of data collecting card collection is temperature data and shows by matching.Can realize the measurement to microwave power device periodicity and acyclic any transient temperature by described measuring system, and measuring speed is fast, precision is high.
Accompanying drawing explanation
Fig. 1 is typical temperature lowering curve test result figure;
Fig. 2 is the theory diagram of measuring system described in the utility model;
Fig. 3 is the main modular of industrial computer software in the utility model and data and execution graph of a relation;
Fig. 4 is data collector workflow diagram under triggering work pattern;
Wherein: 1, infrared radiation detector 2, amplifying circuit 3, data collecting card 4, industrial computer.
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, be clearly and completely described the technical scheme in the utility model embodiment, obviously, described embodiment is only a part of embodiment of the present utility model, instead of whole embodiments.Based on the embodiment in the utility model, those of ordinary skill in the art are not making the every other embodiment obtained under creative work prerequisite, all belong to the scope of the utility model protection.
Set forth a lot of detail in the following description so that fully understand the utility model, but the utility model can also adopt other to be different from alternate manner described here to implement, those skilled in the art can when doing similar popularization without prejudice to when the utility model intension, and therefore the utility model is by the restriction of following public specific embodiment.
As shown in Figure 2, the utility model discloses a kind of microwave power device transient temperature measuring system, described measuring system comprises: infrared radiation detector 1, amplifying circuit 2, data collecting card 3 and industrial computer 4, described infrared radiation detector 1 is connected, for gathering the infrared radiation signal that microwave power device sends with the signal input part amplifying main road 2; Described amplifying circuit 2 is connected with the signal input part of data collecting card 3, for the infrared radiation signal of collection being carried out amplification process; Data collecting card 3 and industrial computer 4 carry out bidirectional data interaction, carry out data acquisition for the control according to industrial computer 4; The data that described industrial computer 4 gathers for the treatment of data collecting card, and the electric signal of capture card collection is converted to temperature data and carries out storing and showing.
Choosing of infrared radiation detector:
An independently infrared sensor (photodiode) selected by infrared radiation detector, and it possesses the higher peak response time, is typically 3 μ s.Because detector only has a sensitive element, therefore can read its output signal with high speed.
Choosing of amplifying circuit:
Amplifying circuit should possess enough bandwidth, and the amplifier band width that native system adopts is 20kHz, and enlargement ratio is 100 times.
Choosing of data collecting card:
Realize the collection to the electric signal that infrared radiation detector exports through pre-amplification circuit, require and transient state infrared equipment matched well, support triggering work pattern and continuous operation mode.Consider that the response time of transient state infrared equipment nominal is at musec order, therefore require that the sampling rate of data collecting card should be not less than 20MS/s to guarantee enough sampling bandwidth.For ensureing good measuring accuracy, sampling depth should at more than 10bit.For ease of research measured device temperature variation and the relation driving electric signal, need to support external trigger source, the drive singal of measured device can be used to carry out triggering to realize synchronously.Select high-speed data acquisition card, the sampling rate of the highest support 100MS/s.Two sampling channels are provided, the measured signal that high speed infrared radiation detector exports through prime amplifier and the signal driving measured device can be gathered and using the latter as external trigger source simultaneously.
The design of software systems
Software systems are functionally divided into control software design and data processing software.The main modular of software and data and execution relation are as shown in Figure 3.
The design of 4.1 control software design
During system works, data collecting card mode of operation is divided into trigger mode and continuous mode; The corresponding recurrent pulses temperature survey of trigger mode, the measurement of continuous mode temperature signal corresponding non-periodic.
4.1.1 trigger mode configuration
System works is when trigger mode, and trigger source can select signal to trigger or external trigger as required, and infrared radiation detector temperature data when top falls occurs the drive singal of device should be used as external trigger source.
For ease of analyzing, another data channel can be sent in external trigger source, and using this passage as trigger source, sampling simultaneously, then signal to be sampled and trigger pip together being shown, being convenient to the time relationship between analysis device temperature variation and electric signal.
Under triggering work pattern, data collector workflow as shown in Figure 4.After initial configuration completes, beginning acquisition, starts sampling after external trigger, and fetch immediately after completing, fetches whole record, then initialization acquisition next time, until complete default record quantity.
For guarantee program can be suspended at any time or stop, it is 1 that configuration data capture card gathers record number at every turn, completes required record quantity by program Inner eycle.
4.1.2 continuous operation mode configuration
In application scenarios such as measurement temperature lowering curve etc., need the temperature of continuous coverage measured device within the long period (several seconds was to several minutes), system development continuous operation mode.
Work in a continuous mode, capture card continuous sampling, until manually stop or reaching destination sample time/sampling number software section regularly reads sampled data, guarantee not occur that data overflow data capture card is set to unitary sampling, trigger source is set to soft triggering (Software), thus data collecting card will continue sampling (Pre-ReferenceTriggerSampling) until program sends trigger pip (ReferenceTrigger) terminate sampling.
4.1.3 emissivity obtains
User is allowed to input emissivity voluntarily or obtained by measurement.Measure 70 degree of lower black matrixes in advance, and the level data of measurement is prestored.When measuring emissivity, under 70 degree, measurement target obtains level data, calculates
, (wherein,
v 0for the level that equivalent blackbody radiation is corresponding,
vfor the difference of target level and background radiation level,
εfor backs) obtain backs.
The design of 4.2 data processing softwares
4.2.1 background radiation measurement amount and correction
In each thermometric process, before measurement target radiant quantity, need first to measure background radiation, and the level data obtained is preserved; When measurement target temperature, level point data subtracting background value will be obtained, obtain the ir radiation data after background correction.
4.2.2 level-temperature transition
Revised level data is converted to temperature data.
According to blackbody radiation law, the infrared intensity of object is determined by its temperature and emissivity.For improving operational efficiency, in advance by measuring the infrared radiation of black matrix at series of standards temperature, obtaining the level-temperature data of black matrix and preserving.Level corresponding to equivalent blackbody radiation is calculated according to backs during thermometric
, wherein,
v 0for the level that equivalent blackbody radiation is corresponding,
vfor the difference of target level and background radiation level,
εfor backs, read the level-temperature data of black matrix simultaneously, fit to curve, then according to curve, level is converted into temperature value, namely obtain target temperature data.
4.2.3 Noise reducing of data process
Transient state infrared measurement of temperature is seriously affected by noise, needs to take effective noise braking measure, to obtain temperature data accurately.
Under triggering work pattern, because the data obtained are stable periodic signal, the effective restraint speckle of method that the cycle of can passing through is average.Average periodicity does not limit, and is configured voluntarily as required by user.
Under continuous operation mode, the cycle can not be utilized average, by sacrificing sampling rate, restraint speckle integral time can only being increased, carrying out the noise suppression effect that block on average can reach identical with increasing integral time in software.The utility model can adopt NI5122 data collecting card, because NI5122 data collecting card does not allow to change sampling rate in sampling process, block on average can select different average block sizes in the different time periods as required, to realize different equivalent sampling rates.
4.2.4 data display and storage
Temperature data after original level data or process is exported in graph form, supports outer triggering signal and data syn-chronization to show.
The time of the temperature data after original level data or process and correspondence is stored to .txt file
Allow user to select trigger port, support that trigger port and data channel show simultaneously, allow user that display cycle number is set, display original level data or temperature data can be selected.Start to sample laggard line period on average, user can set number average period, also can stop sampling at any time.Final data is stored in the file of user's setting.
Working time and average block size are configured as required by user, and click start button and namely start sampling, show working time simultaneously, user can stop sampling at any time.Final data is stored in the file of user's setting.
Interpretation of result
Measuring system of the present utility model can measure the transient temperature signal of any kind, comprising: recurrent pulses temperature signal; Heating curve, temperature lowering curve etc.
Under utilizing described measuring system effectively can carry out any condition of work to the various microwave power devices comprising GaNHEMT, the temperature survey of random time section.
Claims (5)
1. a microwave power device transient temperature measuring system, it is characterized in that described measuring system comprises: infrared radiation detector (1), amplifying circuit (2), data collecting card (3) and industrial computer (4), described infrared radiation detector (1) is connected, for gathering the infrared radiation signal that microwave power device sends with the signal input part amplifying main road (2); Described amplifying circuit (2) is connected with the signal input part of data collecting card (3), for the infrared radiation signal of collection being carried out amplification process; Data collecting card (3) and industrial computer (4) carry out bidirectional data interaction, for carrying out data acquisition according to the control of industrial computer (4); The data that described industrial computer (4) gathers for the treatment of data collecting card, and the electric signal of capture card collection is converted to temperature data and carries out storing and showing.
2. microwave power device transient temperature measuring system according to claim 1, is characterized in that: described infrared radiation detector is infrared sensor.
3. microwave power device transient temperature measuring system according to claim 2, is characterized in that: described infrared sensor is independently high-speed photodiode.
4. microwave power device transient temperature measuring system according to claim 1, is characterized in that: the band of described amplifying circuit (2) is wider than 20kHz, and enlargement ratio is greater than 100 times.
5. microwave power device transient temperature measuring system according to claim 1, is characterized in that: the sampling rate of described data collecting card (3) is greater than 20MS/s, and sampling depth is at more than 10bit.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104977088A (en) * | 2015-07-22 | 2015-10-14 | 中国电子科技集团公司第十三研究所 | Microwave power device transient temperature measurement system and data processing method thereof |
| CN108051093A (en) * | 2017-12-02 | 2018-05-18 | 北京工业大学 | For the infrared thermal imaging temp measuring method in IGBT module temperature field in probe power circulation experiment |
-
2015
- 2015-07-22 CN CN201520534740.3U patent/CN204924451U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104977088A (en) * | 2015-07-22 | 2015-10-14 | 中国电子科技集团公司第十三研究所 | Microwave power device transient temperature measurement system and data processing method thereof |
| CN108051093A (en) * | 2017-12-02 | 2018-05-18 | 北京工业大学 | For the infrared thermal imaging temp measuring method in IGBT module temperature field in probe power circulation experiment |
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