CN103823175A - Photoelectric detection circuit frequency response characteristic test method based on OTDR - Google Patents
Photoelectric detection circuit frequency response characteristic test method based on OTDR Download PDFInfo
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- CN103823175A CN103823175A CN201410012090.6A CN201410012090A CN103823175A CN 103823175 A CN103823175 A CN 103823175A CN 201410012090 A CN201410012090 A CN 201410012090A CN 103823175 A CN103823175 A CN 103823175A
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CN201410012090.6A CN103823175B (en) | 2014-01-10 | 2014-01-10 | A kind of photodetection circuit frequency response function test method based on OTDR |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112099037A (en) * | 2020-09-17 | 2020-12-18 | 上海波汇科技有限公司 | Target detection method and device based on FMCW laser radar high point cloud acquisition quantity |
CN112858805A (en) * | 2020-12-29 | 2021-05-28 | 西南技术物理研究所 | Frequency response characteristic parameter measuring device for quadrant photoelectric detector |
CN113091795A (en) * | 2021-03-29 | 2021-07-09 | 上海橙科微电子科技有限公司 | Method, system, device and medium for measuring photoelectric device and channel |
CN114112006A (en) * | 2021-11-26 | 2022-03-01 | 中科传启(苏州)科技有限公司 | Noise monitoring method and device and electronic equipment |
CN115347952A (en) * | 2022-10-19 | 2022-11-15 | 高勘(广州)技术有限公司 | Optical path testing method, device, equipment and storage medium |
Citations (5)
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JPH03134536A (en) * | 1989-10-19 | 1991-06-07 | Yokogawa Electric Corp | Measuring apparatus of frequency characteristic |
US5861980A (en) * | 1995-09-08 | 1999-01-19 | Nec Corporation | Optical spectrum analyzer and method for controlling output of optical amplifier |
CN101793533A (en) * | 2010-03-12 | 2010-08-04 | 上海华魏光纤传感技术有限公司 | Optical fiber radiation sensing system and sensing method thereof |
CN102539983A (en) * | 2011-11-21 | 2012-07-04 | 西南技术物理研究所 | High and low temperature test system for multi-quadrant photoelectric detectors |
CN103389453A (en) * | 2012-05-10 | 2013-11-13 | 鸿富锦精密工业(深圳)有限公司 | Photovoltaic conversion chip testing device and method |
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Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH03134536A (en) * | 1989-10-19 | 1991-06-07 | Yokogawa Electric Corp | Measuring apparatus of frequency characteristic |
US5861980A (en) * | 1995-09-08 | 1999-01-19 | Nec Corporation | Optical spectrum analyzer and method for controlling output of optical amplifier |
CN101793533A (en) * | 2010-03-12 | 2010-08-04 | 上海华魏光纤传感技术有限公司 | Optical fiber radiation sensing system and sensing method thereof |
CN102539983A (en) * | 2011-11-21 | 2012-07-04 | 西南技术物理研究所 | High and low temperature test system for multi-quadrant photoelectric detectors |
CN103389453A (en) * | 2012-05-10 | 2013-11-13 | 鸿富锦精密工业(深圳)有限公司 | Photovoltaic conversion chip testing device and method |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112099037A (en) * | 2020-09-17 | 2020-12-18 | 上海波汇科技有限公司 | Target detection method and device based on FMCW laser radar high point cloud acquisition quantity |
CN112099037B (en) * | 2020-09-17 | 2023-11-10 | 上海波汇科技有限公司 | Target detection method and device based on FMCW laser radar Gao Dian cloud acquisition |
CN112858805A (en) * | 2020-12-29 | 2021-05-28 | 西南技术物理研究所 | Frequency response characteristic parameter measuring device for quadrant photoelectric detector |
CN112858805B (en) * | 2020-12-29 | 2023-02-28 | 西南技术物理研究所 | Frequency response characteristic parameter measuring device for quadrant photoelectric detector |
CN113091795A (en) * | 2021-03-29 | 2021-07-09 | 上海橙科微电子科技有限公司 | Method, system, device and medium for measuring photoelectric device and channel |
CN113091795B (en) * | 2021-03-29 | 2023-02-28 | 上海橙科微电子科技有限公司 | Method, system, device and medium for measuring photoelectric device and channel |
US11942987B2 (en) | 2021-03-29 | 2024-03-26 | Shan Dong Sitrus Technology Co., Ltd. | Methods, systems, apparatuses and media for measuring an optoelectronic device and/or a channel |
CN114112006A (en) * | 2021-11-26 | 2022-03-01 | 中科传启(苏州)科技有限公司 | Noise monitoring method and device and electronic equipment |
CN115347952A (en) * | 2022-10-19 | 2022-11-15 | 高勘(广州)技术有限公司 | Optical path testing method, device, equipment and storage medium |
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CN103823175B (en) | 2016-09-28 |
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Address after: Room 103, Building 299, Zhongchen Road, Songjiang District, Shanghai, 20113 Co-patentee after: Pinghu Bohui Communication Technology Co., Ltd. Patentee after: Shanghai Bohui Technology Co., Ltd. Address before: Room 203, 177 Bibo Road, Zhangjiang High-tech Park, Shanghai, 201203 Co-patentee before: Pinghu Bohui Communication Technology Co., Ltd. Patentee before: Shanghai Bandweaver Technology Co., Ltd. |
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