CN101726405A - Frequency response parameter test system for front-mounted amplifier circuit of photoelectric detector and test method thereof - Google Patents
Frequency response parameter test system for front-mounted amplifier circuit of photoelectric detector and test method thereof Download PDFInfo
- Publication number
- CN101726405A CN101726405A CN200910199926A CN200910199926A CN101726405A CN 101726405 A CN101726405 A CN 101726405A CN 200910199926 A CN200910199926 A CN 200910199926A CN 200910199926 A CN200910199926 A CN 200910199926A CN 101726405 A CN101726405 A CN 101726405A
- Authority
- CN
- China
- Prior art keywords
- amplifier
- lock
- signal
- frequency response
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The invention discloses a frequency response parameter test system for the front-mounted amplifier circuit of a photoelectric detector and a test method thereof, which are applied to the frequency response test of the front-mounted amplifier circuit of all photoelectric detectors. The frequency response parameter test system for the front-mounted amplifier circuit of the photoelectric detector in the invention comprises an externally modulated light source, a phase-locking amplifier, a signal generator, a data acquisition unit and a computer. The frequency response parameter test method for the front-mounted amplifier circuit of the photoelectric detector in the invention is based on the first harmonic detection principle of the phase-locking amplifier, wherein the sinusoidal signal of specific frequency generated by the signal generator is capable of modulating the light intensity of the externally modulated light source, the change of the modulated light intensity is responded to the photoelectric detector and the front-mounted amplifier circuit to output a corresponding photoelectric signal, and the photoelectric signal at the modulation frequency is detected as a first harmonic signal by the phase-locking amplifier. Thus, the frequency of the sinusoidal signal generated by the signal generator is changed in a certain range to obtain the frequency response characteristics of the front-mounted amplifier circuit of the photoelectric detector to be detected.
Description
Technical field
The present invention relates to photoelectric detecting technology, specifically be meant a kind of photodetector preamplifier circuit frequency response parameter test system and method for testing, it is used for the frequency response test of various photo-detector preamplifier circuits.
Background technology
The frequency-response characteristic of all kinds photodetector prime amplifier has directly determined the real response of system to the different spectral photosignal, the true reflection ability of system to measured target in appreciable impact, such as in Fourier transform infrared spectrometer, require the frequency response of photo-detector prime amplifier smooth as far as possible in the interference signal frequency band range, otherwise the spectrogram after the inverting is distortion just, with the actual spectrum feature generation deviation of measured target.Therefore in photodetector prime amplifier design process, be a very important link to the test of its frequency-response characteristic.Common method of testing is to break away from photo-detector, the simple electronics equipment of precision that utilizes is tested the frequency response of prime amplifier on the circuit transmission characteristic, because the electric signal of actual measurement is not that photo-detector self provides, test result often can not truly reflect the actual conditions of integrated circuit.
Summary of the invention
The objective of the invention is to set up a kind of photodetector preamplifier circuit frequency response parameter test system and method for testing, it utilizes the photosignal of photo-detector self output as signal source, utilize the basic skills of optical detection, photosignal with actual different frequency is a measuring object, has truly measured the light intensity response of the preamplifier circuit under each frequency condition.
As shown in Figure 1, it is characterized in that: but it comprises external modulation type light source 1, lock-in amplifier 2, signal generator 3, data acquisition unit 4, computing machine 5.The sinusoidal electric signals of the different frequency that signal generator 3 produces is divided into two, one road electric signal enters the reference channel of lock-in amplifier 2, but another road electric signal carries out intensity modulation to external modulation type light source 1, after but responding the light intensity variation of external modulation type light source 1 and produce corresponding photosignal, photodetector to be measured and preamplifier circuit thereof be input to the signalling channel of lock-in amplifier 2, lock-in amplifier 2 carries out first harmonic and detects, testing result is gathered by data acquisition unit 4, and the data of collection are shown by computing machine and handle.
Photodetector preamplifier circuit frequency response parameter test method of the present invention comprises the following steps:
A. the sinusoidal electric signals of signal generator 3 generations is divided into two, and one road electric signal enters the reference channel of lock-in amplifier 2, but another road electric signal carries out intensity modulated to external modulation type light source 1, keeps the amplitude of alternation light intensity constant in the modulated process;
After but responding the light intensity variation of external modulation type light source 1 and produce corresponding photosignal, photodetector B. to be measured and preamplifier circuit thereof be input to the signalling channel of lock-in amplifier 2;
C. the photosignal of 2 pairs of entering signal passages of lock-in amplifier carries out first harmonic and detects, and testing result is gathered by data acquisition unit 4, by computer interface by Computer Processing and demonstration;
D. in the certain frequency scope, change the frequency of the sinusoidal modulation signal of signal generator 3 outputs, the first harmonic signal of the signalling channel of lock-in amplifier 2 output corresponding frequencies, detectors just to be measured is in the light intensity response of this frequency; Utilize simple computer program just can depict the frequency response curve of detector amplifier circuit to be measured.
Advantage of the present invention is: the photosignal that utilizes photo-detector self output is as signal source, utilize the basic skills of optical detection, photosignal with actual different frequency is a measuring object, has truly measured the light intensity response of the preamplifier circuit under each frequency condition.
Description of drawings
Fig. 1 is a photodetector preamplifier circuit frequency response parameter test system structural representation of the present invention;
Wherein:
But 1---external modulation type light source;
2---lock-in amplifier;
3---signal generator;
4---data acquisition unit;
5---computing machine;
6---photo-detector to be measured.
Embodiment
Provide better embodiment of the present invention according to Fig. 1 below.
The system that is used for photodetector preamplifier circuit frequency response parameter testing comprises following several sections:
1) but external modulation type light source 1
But external modulation type light source receives the modulation of the sinusoidal signal that comes from signal generator, produces the light intensity of sinusoidal alternating.Select the laser diode of Japanese NEL company for use, wavelength 1550nm, controller select the LDC-3724B type product of American I LX Lightwave company for use.
2) lock-in amplifier 2
The photosignal of lock-in amplifier offset of sinusoidal modulation carries out first harmonic and detects.Select 5105 type lock-in amplifier modules of AMETEKADVANCED MEASUREMENT TECHNOLOGY company for use.
3) signal generator 3
Signal generator produces the sinusoidal signal of various frequencies.Select the AFG3252 type signal generator of U.S. Tektonix company for use.
4) data acquisition unit 4
Data acquisition unit is responsible for gathering the first harmonic signal of lock-in amplifier output.Select the DAQ2005 type data collecting card of adlink company for use.
5) computing machine 5
Computing machine processs and displays the first harmonic signal of the various frequency correspondences that collect, and provides the character of frequency response of detector prime amplifier to be measured, selects common computer for use.
Claims (2)
1. photodetector preamplifier circuit frequency response parameter test system, but it comprises external modulation type light source (1), lock-in amplifier (2), signal generator (3), data acquisition unit (4), computing machine (5), it is characterized in that: but the wavelength of external modulation light source (1) is responded by photodetector to be measured; The sinusoidal electric signals that signal generator (3) produces is divided into two, one road electric signal enters the reference channel of lock-in amplifier (2), but another road electric signal carries out intensity modulation to external modulation type light source (1), after but responding the light intensity variation of external modulation type light source (1) and produce corresponding photosignal, photodetector to be measured and preamplifier circuit thereof be input to the signalling channel of lock-in amplifier (2), lock-in amplifier (2) carries out first harmonic and detects, testing result is gathered by data acquisition unit (4), and the data of collection are shown by computing machine and handle.
2. one kind based on the photodetector preamplifier circuit frequency response parameter test method of system according to claim 1, it is characterized in that comprising the steps:
A. the sinusoidal electric signals of signal generator (3) generation is divided into two, one road electric signal enters the reference channel of lock-in amplifier (2), but another road electric signal carries out intensity modulated to external modulation type light source (1), keeps the amplitude of alternation light intensity constant in the modulated process;
After but responding the light intensity variation of external modulation type light source (1) and produce corresponding photosignal, photodetector B. to be measured and preamplifier circuit thereof be input to the signalling channel of lock-in amplifier (2);
C. lock-in amplifier (2) carries out first harmonic to the photosignal of entering signal passage and detects, and testing result is gathered by data acquisition unit (4), by computer interface by Computer Processing and demonstration;
D. in the certain frequency scope, continuously change the frequency of the sinusoidal modulation signal of signal generator (3) output, the first harmonic signal of the signalling channel of lock-in amplifier output respective frequencies, detectors just to be measured is in the light intensity response of this frequency; Utilize simple computer program just can depict the frequency response curve of detector amplifier circuit to be measured.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200910199926A CN101726405A (en) | 2009-12-04 | 2009-12-04 | Frequency response parameter test system for front-mounted amplifier circuit of photoelectric detector and test method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200910199926A CN101726405A (en) | 2009-12-04 | 2009-12-04 | Frequency response parameter test system for front-mounted amplifier circuit of photoelectric detector and test method thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
CN101726405A true CN101726405A (en) | 2010-06-09 |
Family
ID=42447622
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200910199926A Pending CN101726405A (en) | 2009-12-04 | 2009-12-04 | Frequency response parameter test system for front-mounted amplifier circuit of photoelectric detector and test method thereof |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN101726405A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103398736A (en) * | 2013-06-25 | 2013-11-20 | 中国科学院半导体研究所 | Measuring system for frequency response of photoelectric detector |
CN104991180A (en) * | 2015-07-15 | 2015-10-21 | 国网智能电网研究院 | Photoelectric detector assembly bandwidth detecting method and device |
CN106501601A (en) * | 2016-11-03 | 2017-03-15 | 南京航空航天大学 | A kind of photodetector frequency response measurement method and measuring system |
CN107091808A (en) * | 2017-07-10 | 2017-08-25 | 西石(厦门)科技有限公司 | A kind of anti-interference of stray light photodetector system based on digital servo-control |
CN110297126A (en) * | 2018-03-21 | 2019-10-01 | 中国科学院金属研究所 | The frequency spectrum multiple scale analysis method of testing of instrumentation amplifier Frequency Response |
CN114137305A (en) * | 2021-12-27 | 2022-03-04 | 苏州格里德医学传感技术有限公司 | Frequency response test instrument and complex impedance test instrument |
-
2009
- 2009-12-04 CN CN200910199926A patent/CN101726405A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103398736A (en) * | 2013-06-25 | 2013-11-20 | 中国科学院半导体研究所 | Measuring system for frequency response of photoelectric detector |
CN103398736B (en) * | 2013-06-25 | 2015-09-09 | 中国科学院半导体研究所 | The measuring system of photodetector frequency response |
CN104991180A (en) * | 2015-07-15 | 2015-10-21 | 国网智能电网研究院 | Photoelectric detector assembly bandwidth detecting method and device |
CN106501601A (en) * | 2016-11-03 | 2017-03-15 | 南京航空航天大学 | A kind of photodetector frequency response measurement method and measuring system |
CN106501601B (en) * | 2016-11-03 | 2019-01-04 | 南京航空航天大学 | A kind of photodetector frequency response measurement method and measuring system |
CN107091808A (en) * | 2017-07-10 | 2017-08-25 | 西石(厦门)科技有限公司 | A kind of anti-interference of stray light photodetector system based on digital servo-control |
CN110297126A (en) * | 2018-03-21 | 2019-10-01 | 中国科学院金属研究所 | The frequency spectrum multiple scale analysis method of testing of instrumentation amplifier Frequency Response |
CN114137305A (en) * | 2021-12-27 | 2022-03-04 | 苏州格里德医学传感技术有限公司 | Frequency response test instrument and complex impedance test instrument |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN103727968B (en) | The method of measuring tempeature, strain, the vibration while of a kind of | |
CN101726405A (en) | Frequency response parameter test system for front-mounted amplifier circuit of photoelectric detector and test method thereof | |
CN105606193A (en) | Optical fiber fabry-perot acoustic-vibration sensing device and demodulation method based on double tunable light sources | |
KR101473287B1 (en) | Method for optical cable distance measurement by using optical cable tracker and optical cable tracker | |
CN104062265A (en) | Detection device and detection method for multi-component gas in transformer oil based on spectrum analysis | |
CN103245369A (en) | Novel fiber bragg grating demodulation method and system thereof based on multi-longitudinal mode F-P laser device | |
CN105277270A (en) | Dual-mode vibration detection system based on fiber grating sensing | |
CN112162229B (en) | State monitoring device for optical fiber current sensor | |
CN101586969A (en) | The demodulation method of optical fiber interferometer sensor change in optical path length and device thereof | |
CN110207733B (en) | Optical fiber interferometer arm length difference measuring device and method based on sweep frequency laser | |
CN113447110A (en) | Distributed optical fiber vibration sensing system and phase carrier demodulation method thereof | |
CN104243018B (en) | A kind of chromatic dispersion measurement system | |
CN102914423A (en) | Measuring device and method for sag frequency of dispersion optical fiber | |
CN108155540A (en) | A kind of detecting system of single-frequency laser mode hopping | |
CN105137201A (en) | Optical fiber insulator insertion loss detector | |
CN105403373A (en) | Diffusion type natural gas station gas leakage laser online monitoring early warning apparatus | |
CN103823175A (en) | Photoelectric detection circuit frequency response characteristic test method based on OTDR | |
CN103424188A (en) | Spectrum measurement system | |
CN103175555A (en) | Multi-parameter distributed fiber-optic sensor based on multi-mechanism fusion | |
CN210071661U (en) | Laser gas analyzer | |
CN102279096A (en) | On-line test method and on-line test system for service life of laser device | |
CN103196472B (en) | Based on fiber grating dynamic strain (FBG) demodulator and the method for random unequal interval sampling | |
CN109781156A (en) | BOTDA system and its method for sensing based on brillouin gain spectrum modulation | |
CN202631153U (en) | Single-port distributed optic fiber temperature sensor with automatic compensation function | |
CN113375830B (en) | Long-distance and wide-measuring-range fast demodulation device and method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Open date: 20100609 |