CN204788897U - Use total mark ball to survey semiconductor laser tube core device - Google Patents
Use total mark ball to survey semiconductor laser tube core device Download PDFInfo
- Publication number
- CN204788897U CN204788897U CN201520535791.8U CN201520535791U CN204788897U CN 204788897 U CN204788897 U CN 204788897U CN 201520535791 U CN201520535791 U CN 201520535791U CN 204788897 U CN204788897 U CN 204788897U
- Authority
- CN
- China
- Prior art keywords
- tube core
- circuit board
- briquetting
- base
- semiconductor laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 20
- 239000000463 material Substances 0.000 claims abstract description 17
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 15
- 229910052802 copper Inorganic materials 0.000 claims abstract description 15
- 239000010949 copper Substances 0.000 claims abstract description 15
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 5
- 239000010931 gold Substances 0.000 claims description 5
- 229910052737 gold Inorganic materials 0.000 claims description 5
- 238000012360 testing method Methods 0.000 abstract description 7
- 238000013461 design Methods 0.000 abstract description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract description 6
- 238000009434 installation Methods 0.000 abstract description 5
- 238000001816 cooling Methods 0.000 abstract description 4
- 238000002788 crimping Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 description 6
- 230000003139 buffering effect Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000003044 adaptive effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 239000003292 glue Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000010923 batch production Methods 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000003913 materials processing Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
Landscapes
- Semiconductor Lasers (AREA)
Abstract
Description
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201520535791.8U CN204788897U (en) | 2015-07-21 | 2015-07-21 | Use total mark ball to survey semiconductor laser tube core device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201520535791.8U CN204788897U (en) | 2015-07-21 | 2015-07-21 | Use total mark ball to survey semiconductor laser tube core device |
Publications (1)
Publication Number | Publication Date |
---|---|
CN204788897U true CN204788897U (en) | 2015-11-18 |
Family
ID=54528917
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201520535791.8U Active CN204788897U (en) | 2015-07-21 | 2015-07-21 | Use total mark ball to survey semiconductor laser tube core device |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN204788897U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110160426A (en) * | 2018-01-08 | 2019-08-23 | 深圳市技拓光电有限公司 | A kind of semiconductor laser tube core detection device |
-
2015
- 2015-07-21 CN CN201520535791.8U patent/CN204788897U/en active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110160426A (en) * | 2018-01-08 | 2019-08-23 | 深圳市技拓光电有限公司 | A kind of semiconductor laser tube core detection device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US9291645B2 (en) | Probe unit | |
CN101322035A (en) | Probe card | |
CN105204198A (en) | Display panel and test system for display panel | |
CN109596867A (en) | The integrated fixture of laser chip | |
CN201811982U (en) | Liquid crystal television main plate detection fixture | |
CN204788897U (en) | Use total mark ball to survey semiconductor laser tube core device | |
CN200997451Y (en) | Wiring terminal | |
US20110312222A1 (en) | Multi-electrode holders | |
CN212625492U (en) | LED chip detection device | |
CN109459655B (en) | Conduction testing device | |
CN204989232U (en) | A test fixture for individual layer electric capacity | |
CN215728622U (en) | PCBA test fixture | |
CN209894841U (en) | Integrated clamp for laser chip | |
CN204832261U (en) | " stamp hole " encapsulation module testing anchor clamps | |
CN1916643A (en) | Device for testing integrated electric apparatus | |
CN201096810Y (en) | Connector for connecting fuel battery and its monitoring device | |
CN207851108U (en) | Three electrode piezoelectric ceramics piezo detecting tool improved structures | |
CN102183681A (en) | Handheld circuit board test fixture | |
CN107228958B (en) | Jig is used in substrate detection | |
CN101533038B (en) | Novel test socket | |
US10096958B2 (en) | Interface apparatus for semiconductor testing and method of manufacturing same | |
CN2836018Y (en) | Integrated circuit tester | |
KR101397373B1 (en) | Jig for electrical inspection | |
TW200716994A (en) | Circuit board inspecting apparatus and circuit board inspecting method | |
CN108169618B (en) | Testing device and testing method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20220525 Address after: 710065 4th floor, E3 building, No. 103, Xi'an Semiconductor Industrial Park, No. 125, Jinye Road, high tech Zone, Xi'an, Shaanxi Province Patentee after: Xi'an Xinchuang Yimei technology partnership (L.P.) Address before: 100070 115, 1 floor, 1 building, 10 Spark Road, Fengtai District Science City, Beijing. Patentee before: BEIJING REALLIGHT TECHNOLOGY Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20231023 Address after: Room 301, 3rd Floor, Building 7, Kunpeng Zhizaoyuan, Dongjiangdu Village, Diaotai Street, Fengxi New City, Xi'an City, Shaanxi Province, 712000 Patentee after: Lingsu Medical Technology (Shaanxi) Co.,Ltd. Address before: 710065 4th floor, E3 building, No. 103, Xi'an Semiconductor Industrial Park, No. 125, Jinye Road, high tech Zone, Xi'an, Shaanxi Province Patentee before: Xi'an Xinchuang Yimei technology partnership (L.P.) |