CN203930004U - A kind of intelligent digital integrated circuit fault detection system - Google Patents
A kind of intelligent digital integrated circuit fault detection system Download PDFInfo
- Publication number
- CN203930004U CN203930004U CN201420275013.5U CN201420275013U CN203930004U CN 203930004 U CN203930004 U CN 203930004U CN 201420275013 U CN201420275013 U CN 201420275013U CN 203930004 U CN203930004 U CN 203930004U
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- chip
- test
- integrated circuit
- detection system
- fault detection
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Abstract
The utility model discloses a kind of intelligent digital integrated circuit fault detection system, this detection system is comprised of the XC2238N of Infineon single-chip microcomputer, I/O port able to programme, E2PROM, RAM, light-emitting diode display and keyboard etc.The minimum test set and the standard results that in the E2PROM of this system, have various integrated circuit (IC) chip, in circuit, adopt a plurality of programmable I/O interface chips to be connected with test jack, the test set of chip under test is sent in control and measuring program timesharing grouping, and test result data is carried out by LED, showing after analyzing and processing.This digital integrated circuit fault detection system is simple in structure, with low cost, can realize the fault test to TTL74,54 family chips, and can reach raising testing efficiency, reduces the object of test duration, has good transplanting extendability.
Description
Technical field
The utility model belongs to electric and electronic technical field, relates in particular to a kind of intelligent digital integrated circuit fault detection system.
Background technology
The application of digital integrated circuit in circuit is very universal, and conventional has T T L74, T T L54 serial, CMOS4000, CMOS4500 series etc.In debugging and repair circuit process, often need to test chip, to differentiate its quality.In digital circuitry, the mistake of integrated circuit is divided into two classes conventionally: a class is that logic is wrong, and a class is that parameter is wrong.Any end that inputs or outputs of integrated circuit can be by " perseverance sets to 0 " or " perseverance puts 1 ", and logic that Here it is is wrong.In addition, short circuit and open circuit are also considered to logic mistake.In digital display circuit, detect these wrong methods of conventionally using static test and dynamic test.Static test (in-circuit function test) is extremely important to the test of small scale integration and many medium scale integration (MSI) chips.This basic skills that digital integrated circuit chip is carried out to in-circuit function test is to add required pumping signal from input end, detect its corresponding output response, and output response and the correct result of expection are compared, judge thus whether it exists fault.The utility model patent utilization single-chip microcomputer is tested digital integrated circuit, and this tester can be to TT L74, T T L54 series, and CMOS4000, CMOS4500 series integrated circuit (IC) chip is carried out functional fault detection.
Summary of the invention
The defect and the deficiency that for above-mentioned prior art, exist, the purpose of this utility model is, a kind of intelligent digital integrated circuit fault detection system is provided, the fault test that can realize T T L74,54 family chips of the present utility model, and can reach raising testing efficiency, the object that reduces the test duration, has good transplanting extendability.
In order to realize above-mentioned task, the utility model adopts following technical solution:
An intelligent digital integrated circuit fault detection system, is characterized in that, the XC2238N of Infineon single-chip microcomputer, I/O port able to programme, chip under test socket, power supply control, storage area allocation units, 8279 chip units, consists of; The described XC2238N of Infineon single-chip microcomputer is connected with storage area allocation units, I/O port able to programme and 8279 chip units simultaneously; Described I/O port able to programme is connected with chip under test socket; Described power supply is controlled simultaneously with chip under test socket and is connected with Infineon XC2238N single-chip microcomputer; Described storage area allocation units comprise E2PROM and two kinds of storeies of RAM; 8279 described chip units comprise light-emitting diode display and two kinds of input-output device of keyboard.
The beneficial effects of the utility model are:
This IC test macro is to take single-chip microcomputer as core, coordinate control program and peripheral expansion circuit to carry out the comprehensive function of comprehensive simulated measured device, by program, generate required pumping signal and give chip to be measured, and the standard results in the output response of chip to be measured and single-chip microcomputer is compared, thereby judge the quality of tested IC chip.The fault of integrated circuit (IC) chip can be determined corresponding relation with constant fault model.Tested object for this design is mainly integrated digital combinational circuit chip, and the test set that application fixed list logic fault hypothesis is derived just can cover most faults.So-called fixed list logic fault, i.e. supposition only has one to input or output the fault that has S – a-0 or S – a-1.Select Boolean difference to be used as the test set algorithm of this design.
This test macro is comprised of 89c51 single-chip microcomputer, I/O port able to programme, E2 PROM, RAM, LED display and keyboard etc.The minimum test set and the standard results that in the E2 PROM of this system, have various integrated circuit (IC) chip.In circuit, adopt a plurality of programmable I/O interface chips to be connected with test jack, reason is to be not quite similar when the various IC chip of test, and socket pins during circuit design can not be changed once just connecting.In order to guarantee that the information of CPU output can more effectively be sent to the input end of tested IC chip, also to guarantee that CPU can read in response from the output terminal of tested IC chip effectively, just wish not change the connection of hardware, and can change according to the difference of IC chip the position of input and output pin, this only has the programmable interface chip of use just can complete.During test, first chip to be measured is plugged and is inputted by keyboard the model of chip under test, then start test run key.By control and measuring program timesharing grouping, sent the test set of chip under test, and test result data is carried out by LED, showing after analyzing and processing.
This digital integrated circuit fault detection system is simple in structure, with low cost, can realize the fault test to T T L74,54 family chips, and can reach raising testing efficiency, reduces the object of test duration, has good transplanting extendability.
Accompanying drawing explanation
Below in conjunction with the drawings and specific embodiments the utility model is further explained explanation.
Fig. 1 is the frame diagram of digital integrated circuit fault detection system.
Embodiment
If Fig. 1 is a kind of structured flowchart of intelligent digital integrated circuit fault detection system, this test macro is by 89c51 single-chip microcomputer, I/O port able to programme, E2 PROM, RAM, the compositions such as LED display and keyboard, the minimum test set and the standard results that in the E2PROM of Digital ICs trouble testing system, have various integrated circuit (IC) chip, the described XC2238N of Infineon single-chip microcomputer while and storage area allocation units, I/O port able to programme and 8279 chip units are connected, described I/O port able to programme is connected with chip under test socket, described power supply is controlled simultaneously with chip under test socket and is connected with Infineon XC2238N single-chip microcomputer, described storage area allocation units comprise E2PROM and two kinds of storeies of RAM, 8279 described chip units comprise light-emitting diode display and two kinds of input-output device of keyboard.
The Digital ICs trouble testing system that the utility model patent provides can be realized the fault test to TTL74,54 family chips, and can reach raising testing efficiency, reduces the object of test duration, has good transplanting extendability.
Claims (3)
1. an intelligent digital integrated circuit fault detection system, is characterized in that, the XC2238N of Infineon single-chip microcomputer, I/O port able to programme, chip under test socket, power supply control, storage area allocation units, 8279 chip units, consists of; The described XC2238N of Infineon single-chip microcomputer is connected with storage area allocation units, I/O port able to programme and 8279 chip units simultaneously; Described I/O port able to programme is connected with chip under test socket; Described power supply is controlled simultaneously with chip under test socket and is connected with Infineon XC2238N single-chip microcomputer.
2. a kind of intelligent digital integrated circuit fault detection system as claimed in claim 1, is characterized in that, described storage area allocation units comprise E2PROM and two kinds of storeies of RAM.
3. a kind of intelligent digital integrated circuit fault detection system as claimed in claim 1, is characterized in that, 8279 described chip units comprise light-emitting diode display and two kinds of input-output device of keyboard.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420275013.5U CN203930004U (en) | 2014-05-27 | 2014-05-27 | A kind of intelligent digital integrated circuit fault detection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420275013.5U CN203930004U (en) | 2014-05-27 | 2014-05-27 | A kind of intelligent digital integrated circuit fault detection system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203930004U true CN203930004U (en) | 2014-11-05 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201420275013.5U Expired - Fee Related CN203930004U (en) | 2014-05-27 | 2014-05-27 | A kind of intelligent digital integrated circuit fault detection system |
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| CN (1) | CN203930004U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107656194A (en) * | 2017-10-28 | 2018-02-02 | 成都优力德新能源有限公司 | A kind of intelligent digital integrated electronic circuit fault detection system |
-
2014
- 2014-05-27 CN CN201420275013.5U patent/CN203930004U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107656194A (en) * | 2017-10-28 | 2018-02-02 | 成都优力德新能源有限公司 | A kind of intelligent digital integrated electronic circuit fault detection system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C53 | Correction of patent for invention or patent application | ||
| CB03 | Change of inventor or designer information |
Inventor after: Xu Yunpeng Inventor after: Wang Shan Inventor before: Xu Yunpeng |
|
| COR | Change of bibliographic data |
Free format text: CORRECT: INVENTOR; FROM: XU YUNPENG TO: XU YUNPENG WANG SHAN |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20141105 Termination date: 20150527 |
|
| EXPY | Termination of patent right or utility model |