CN203479758U - Multi-probe device - Google Patents
Multi-probe device Download PDFInfo
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- CN203479758U CN203479758U CN201320605361.XU CN201320605361U CN203479758U CN 203479758 U CN203479758 U CN 203479758U CN 201320605361 U CN201320605361 U CN 201320605361U CN 203479758 U CN203479758 U CN 203479758U
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Abstract
The utility model discloses a multi-probe device which comprises a shell, a left tapered wedge, an intermediate tapered wedge, a right tapered wedge, a left wafer, a left damping block, a left cable, an ultrasonic apparatus, an intermediate wafer, an intermediate damping block, an intermediate cable, a right wafer, a right damping block, a right cable, a sound insulation groove and a sound elimination groove.
Description
Technical field
The utility model belongs to the manual detection field of the super reflectometry of A, and it relates to many probe apparatus.
Background technology
Ultrasound wave is frequency higher than the sound wave of 20000 hertz, its good directionality, and penetration capacity is strong, is easy to obtain more concentrated acoustic energy, in water transmission distance, can be used for finding range, tests the speed, cleans, welding, rubble, sterilizing etc.In medical science, military affairs, industry, agricultural, there is a lot of application.Ultrasound wave is gained the name because of the upper limit of hearing that its lower-frequency limit approximates greatly people.
At present, when the super reflectometry of ultrasound wave A is manually checked, be all to use Traditional Man method of detection, the i.e. detection of a people, a machine, a probe.When a weld seam need to adopt the probe of multiple angles to test, need several individuals to detect or a people repeats detection several times to this weld seam simultaneously, just can complete the check of weld seam.As carrying out U.S. ASME standard, to carry out French RCCM standard, carry out that China JB/T4730.3-2005C level detects be exactly, same weld seam to use respectively two or three even the probe of four kinds of angles test, just can complete check.Expended a large amount of human and material resources and valuable time, detected loaded down with trivial details especially.
The relevant multiple probe detector existing in existing patent, as Chinese patent application CN201120263270.3 Twin-lamellae K 1 probe, in the disclosed probe of this patent, two probes have been used, yet this class probe is used pugging between wafer, increased the cost of this class probe; The pitch angle of the wafer in this class probe is fixed simultaneously, makes this class probe application underaction; The easily generation that is limited in scope of two probe detections is undetected.
Due to the problems referred to above, the inventor carries out critical and analyzes existing probe technologies, so as to produce have simple in structure, cost is low, use is flexible, can disposable many probe apparatus of simultaneously detecting a flaw from a plurality of angles during inspected area Datong District.
Utility model content
In order to address the above problem, the inventor has carried out research with keen determination, found that: by the many probe apparatus after improving, undertaken, described many probe apparatus comprise: shell, left wedge, middle wedge, right wedge, left-handed crystal sheet, left damping block, middle wafer, middle damping block, right-handed crystal sheet, right damping block and Ultrasound Instrument, wherein, between left-handed crystal sheet and middle wafer, arrange between sound insulation groove, middle wafer and right-handed crystal sheet sound insulation groove is set, left-handed crystal sheet, middle wafer and right-handed crystal sheet three's front end arranges respectively anechoic trap; Thereby complete the utility model.
The purpose of this utility model is to provide following aspect:
The first, many probe apparatus, is characterized in that: this device comprises:
Left-handed crystal sheet 5a, its front is affixed on left wedge inclined-plane, and left chip back surface and left damping block 6a are affixed, and left-handed crystal sheet is connected with Ultrasound Instrument 1 by left cable 3a,
Middle wafer, its front is affixed on middle wedge inclined-plane, and middle chip back surface and middle damping block are affixed, and middle wafer is connected with Ultrasound Instrument by middle cable 3b,
Right-handed crystal sheet, its front is affixed on right wedge inclined-plane, and right chip back surface and right damping block are affixed, and right-handed crystal sheet is connected with Ultrasound Instrument by right cable 3c,
Wherein, arrange between sound insulation groove, middle wafer and right-handed crystal sheet sound insulation groove is set between left-handed crystal sheet and middle wafer, the front end of left-handed crystal sheet, middle wafer and three wafers of right-handed crystal sheet arranges respectively anechoic trap.
The second, according to the many probe apparatus described in above-mentioned first aspect, it is characterized in that: in left-handed crystal sheet, middle wafer and three wafers of right-handed crystal sheet, between each wafer and shell bottom surface, the size of angle is adjustable.
Three, according to the many probe apparatus described in above-mentioned first aspect, it is characterized in that: the material of this crust of the device bottom is organic glass.
The many probe apparatus that provide according to the utility model, have simple in structure, cost is low, use is flexible, can disposablely from a plurality of angles, detect a flaw during inspected area Datong District simultaneously; This device specifically has following beneficial effect:
The first, this device has been used the probe that several angle resultant wafer form, and just can complete the scanning of detection separately of a plurality of angles in scanning once detects, and makes to check work efficiency at double or the raising of several times;
The second, this device simultaneously multi-angle be used in conjunction with, once check just can be carried out multi-angle to same defect and mutually verifies, qualitative to defect provides more information;
Three, because several wafer set merge row, increase wafer width, the mobile covering of this device each in check increased, reduced because covering undetected that deficiency causes;
Four, because several wafers coexist, by acoustic beam, spread and form angle of a roof and reflect, can detect some inclination defect the 5th, this device is applicable to carry out product, the product that JB/T4730.3-2005C level detects of U.S. ASME standard, the occasion of carrying out the product of French RCCM standard detection or having many probe checks to need.
Accompanying drawing explanation
Fig. 1 illustrates according to the working state figure of many probe apparatus of the utility model preferred implementation;
Fig. 2 illustrates according to the structural representation of many probe apparatus in many probe apparatus of the utility model preferred implementation;
Fig. 3 illustrates according to the left view of many probe apparatus in many probe apparatus of the utility model preferred implementation;
Fig. 4 illustrates the many probe apparatus roof reflector schematic diagram according to the utility model preferred implementation;
Fig. 5 illustrates according to the schematic diagram of the detected test specimen of many probe apparatus of the utility model preferred implementation;
Fig. 6 illustrates the schematic diagram of the super reflectometry pick-up unit of conventional A.
Drawing reference numeral explanation:
1-Ultrasound Instrument
2-shell
The left cable of 3a-
Cable in 3b-
The right cable of 3c-
The left wedge of 4a-
5a-left-handed crystal sheet
The left damping block of 6a-
The 7-groove that insulates against sound
8-anechoic trap
11-defect
13-A type ultra-sonic defect detector
The mono-probe of 14-
15-is detected test specimen
Embodiment
Below by the utility model is elaborated, feature of the present utility model and advantage will become more clear, clear and definite along with these explanations.
Here special-purpose word " exemplary " means " as example, embodiment or illustrative ".Here as " exemplary " illustrated any embodiment, needn't be interpreted as being better than or being better than other embodiment.Although the various aspects of embodiment shown in the drawings, unless otherwise indicated, needn't draw accompanying drawing in proportion.
According in a preferred implementation of the present utility model, as shown in Fig. 1-5, provide many probe apparatus, described many probe apparatus comprise:
Left-handed crystal sheet 5a, its front is affixed on left wedge inclined-plane, and left chip back surface and left damping block 6a are affixed, and left-handed crystal sheet is connected with Ultrasound Instrument 1 by left cable 3a,
Middle wafer, its front is affixed on middle wedge inclined-plane, and middle chip back surface and middle damping block are affixed, and middle wafer is connected with Ultrasound Instrument by middle cable 3b,
Right-handed crystal sheet, its front is affixed on right wedge inclined-plane, and right chip back surface and right damping block are affixed, and right-handed crystal sheet is connected with Ultrasound Instrument by right cable 3c,
Wherein, arrange between sound insulation groove, middle wafer and right-handed crystal sheet sound insulation groove is set between left-handed crystal sheet and middle wafer, the front end of left-handed crystal sheet, middle wafer and three wafers of right-handed crystal sheet arranges respectively anechoic trap;
Wherein, the single probe detector of tradition is used device as shown in Figure 6, this device is connected with an A-mode ultrasonic wave inspection instrument 13 by a single probe 14, this unit efficiency is low, described in the utility model, device is many probe apparatus as shown in Figure 1, and these many probe apparatus have improved detection efficiency, increased sensing range.
Wherein, in the utility model, three wafers are launched respectively incident wave, with intermittent pulse pattern, and are detected in test specimen and propagate with diffusion with angle separately, will produce diffraction and reflection and change with wave mode when incident wave runs into heterogeneous interface (defect).Diffracted wave returns to wafer with shortest path, and reflection wave equals incident angle reflection with reflection angle, if the direction of defect is perpendicular with incident wave direction or near when vertical, diffracted wave and reflection wave are received by wafer after superposeing, thus discovery defect.Several wafer package are in a shell time, when in detected test specimen, ultrasonic propagation is to certain distance, because the diffusion of acoustic beam can be met several roads ultrasound wave, superposition principle by ripple: the vibration of the place's of meeting particle is the synthetic of each train wave vibration, particle displacement is the vector of each train wave displacement, after meeting, each row sound wave still keeps own original frequency, wavelength, direction of vibration continues to propagate, just as not running into other ripple, hyperacoustic independence that Here it is, so mutually do not interfere when several roads ultrasound wave detects and affect detection simultaneously, it is very clear that each passage echo shows, not disorderly.
One preferred embodiment in, as shown in Figure 2, described shell 2 bottoms are transparent, here, outer casing bottom material is preferably organic glass; Enclosure is provided with acoustic absorbant;
Wherein, left wedge, middle wedge and right wedge are installed successively by straight line from left to right in shell 2 bottoms; Described left wedge, middle wedge and right wedge are transparent, and three's shape is identical, it is leg-of-mutton prism that left wedge, middle wedge and right wedge three are xsect, wedge can change the angle that enters that ultrasound wave enters wafer, by left wedge, middle wedge and right wedge are set, can be so that this device coverage increase, the dirigibility that has improved this device.
In concrete example, the inclined-plane of described left wedge and shell bottom surface angle are 45 degree; The inclined-plane of described middle wedge and shell bottom surface angle 60 degree; The inclined-plane of described right wedge and shell bottom surface angle 70 degree.
One preferred embodiment in, as shown in Figure 2, left-handed crystal sheet is affixed on the inclined-plane of left wedge, middle wafer is affixed on the inclined-plane of middle wedge, right-handed crystal sheet is affixed on the inclined-plane of right wedge; Here the material of described left-handed crystal sheet, three wafers of middle wafer and right-handed crystal sheet is identical, and the size of three wafers is 13mm * 13mm, and frequency is 2.5MHz; Described wafer is for internal loopback ultrasound wave
Wherein, left-handed crystal sheet is connected with Ultrasound Instrument 1 by left cable 3a; Middle wafer is connected with Ultrasound Instrument by middle cable, and right-handed crystal sheet is connected with Ultrasound Instrument by right cable, and described left cable, three cables of middle cable and right cable are identical, are 75 Ω concentric cable.
Wherein, because three wafers of this device are different from the angle of shell bottom surface, therefore this device is when detecting detected test specimen, easily there is roof reflector, easy like this some unconspicuous defects that detect, the detectability of this device is improved, described roof reflector as shown in Figure 4, when the ultrasound wave sending when 45 degree wafers runs into defect, according to wave reflection principle, the ultrasound wave that 45 degree wafers send can not return on Yan Yuan road, be refracted to the wafer place at 60 degree angles, outside the scope that the wafer at 60 degree angles can receive, and then accepted by the wafer at 60 degree angles or 70 degree angle wafers, make like this some unconspicuous defects be detected, improved the detectability of this device.
In further preferred embodiment, because the inclined-plane of three wedges and the angle between shell bottom surface are adjustable, therefore the angle of three wafers and outer casing bottom is also adjustable, increased like this dirigibility of this device, this device can, according to the needs of actual conditions, be regulated the angle between three wafers and shell bottom surface.
One preferred embodiment in, as shown in Figure 2, left damping block is affixed on to left chip back surface, middle damping block is affixed on to middle chip back surface, right damping block is affixed on to right chip back surface, the material of described left damping block, three damping blocks of middle damping block and right damping block is identical, is conventional damping block.
One preferred embodiment in, as shown in Figure 2, between adjacent wafer, be provided with sound insulation groove 7, front end at each wafer is provided with anechoic trap 8, sound insulation groove 7 makes non-interference between the ultrasound wave of each wafer transmitting, anechoic trap 8 is eliminated the reflection echo that wafer is supervened when producing refraction wave, makes reflection echo not disturb flaw detection.Sound insulation groove and anechoic trap can, so that this device has reduced the cost of production cost, sound insulation groove and anechoic trap lower than common sound insulating material when improving soundproof effect, make the cost of this device.
Embodiment 1
Detected test specimen is set, the mother metal material 20MnMoR steel of its weld seam, specification 1000 * 320 * 62.This weld seam adopts JB/T4730.3-2005 standard, CSK-I A and CSK-III A test block.
Use the super reflectometry pick-up unit of conventional A to detect detected test specimen, check sensitivity φ 1 * 6-6dB, need to check three times, finds that two place's defects are as shown in table 1 below:
Table 1
| Probe | Defect is the degree of depth/amplitude 1. | Defect is the degree of depth/ |
| 45° | 35/φ1×6+4dB | 34/φ1×6-2dB |
| 60° | 35/φ1×6+5dB | 34/φ1×6+4dB |
| 70° | 35/φ1×6+4dB | 34/φ1×6+7dB |
Use many probe apparatus described in the utility model to detect detected test specimen, check sensitivity φ 1 * 6-6dB, only needs to detect once, and testing result is as following table 2:
Table 2
| Probe | Defect is the degree of depth/amplitude 1. | Defect is the degree of depth/ |
| 45° | 35/φ1×6+3dB | 34/φ1×6-2dB |
| 60° | 35/φ1×6+5dB | 34/φ1×6+4dB |
| 70° | 35/φ1×6+4dB | 34/φ1×6+8dB |
From above-mentioned table 1 and table 2 contrast, the super reflectometry of conventional A detects while same detected test specimen being detected to same defect with the utility model, and two kinds of testing results almost do not have difference, and small echo amplitude difference, is negligible.
Wherein, adopt the alignment time of super each probe of reflection wave of conventional A to be about 5 minutes, each probe scanning time is about 35 minutes, needs 120 minutes whole detection time.And the multi-probe alignment time be about 35 minutes while adopting many probe apparatus, and the scanning time is 45 minutes, be 80 minutes whole detection time.Although therefore visible many probe apparatus alignment times longer, the scanning time is short, whole weld seam detection time decreased 1/3.To long weld seam and the large weld seam of thickness, will greatly shorten detection time with respect to the super reflectometry of conventional A multi-probe detection time.
The many probe apparatus that provide according to the utility model, have simple in structure, cost is low, use is flexible, can disposablely from a plurality of angles, detect a flaw during inspected area Datong District simultaneously; This device specifically has following beneficial effect:
The first, this device has been used the probe that several angle resultant wafer form, and just can complete the scanning of detection separately of a plurality of angles in scanning once detects, and makes to check work efficiency at double or the raising of several times;
The second, this device simultaneously multi-angle be used in conjunction with, once check just can be carried out multi-angle to same defect and mutually verifies, qualitative to defect provides more information;
Three, because several wafer set merge row, increase wafer width, the mobile covering of this device each in check increased, reduced because covering undetected that deficiency causes;
Four, because several wafers coexist, by acoustic beam, spread and form angle of a roof and reflect, can detect some inclination defect;
Five, this device is applicable to carry out the product of U.S. ASME standard, the product that JB/T4730.3-2005C level detects, the occasion of carrying out the product of French RCCM standard detection or having many probe checks to need.
More than engage embodiment and exemplary example has been described in detail the utility model, but these explanations can not be interpreted as to restriction of the present utility model.It will be appreciated by those skilled in the art that in the situation that not departing from the utility model spirit and scope, can carry out multiple replacement of equal value, modify or improve technical solutions of the utility model and embodiment thereof, these all fall in scope of the present utility model.Protection domain of the present utility model is as the criterion with claims.
Claims (3)
1. probe apparatus more than, is characterized in that: this device comprises:
Shell (2), its bottom is transparent, and transparent left wedge, transparent middle wedge and transparent right wedge are set respectively on its inner bottom surface,
Left-handed crystal sheet (5a), its front is affixed on left wedge inclined-plane, and left chip back surface and left damping block (6a) are affixed, and left-handed crystal sheet is connected with Ultrasound Instrument (1) by left cable (3a),
Middle wafer, its front is affixed on middle wedge inclined-plane, and middle chip back surface and middle damping block are affixed, and middle wafer is connected with Ultrasound Instrument by middle cable (3b),
Right-handed crystal sheet, its front is affixed on right wedge inclined-plane, and right chip back surface and right damping block are affixed, and right-handed crystal sheet is connected with Ultrasound Instrument by right cable (3c),
Wherein, arrange between sound insulation groove (7), middle wafer and right-handed crystal sheet sound insulation groove (7) is set between left-handed crystal sheet and middle wafer, the front end of left-handed crystal sheet, middle wafer and three wafers of right-handed crystal sheet arranges respectively anechoic trap (8).
2. many probe apparatus according to claim 1, is characterized in that: in left-handed crystal sheet, middle wafer and three wafers of right-handed crystal sheet, between each wafer and shell bottom surface, the size of angle is adjustable.
3. many probe apparatus according to claim 1, is characterized in that: the material of this crust of the device bottom is organic glass.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320605361.XU CN203479758U (en) | 2013-09-27 | 2013-09-27 | Multi-probe device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320605361.XU CN203479758U (en) | 2013-09-27 | 2013-09-27 | Multi-probe device |
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| Publication Number | Publication Date |
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| CN203479758U true CN203479758U (en) | 2014-03-12 |
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| CN201320605361.XU Expired - Lifetime CN203479758U (en) | 2013-09-27 | 2013-09-27 | Multi-probe device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103512953A (en) * | 2013-09-27 | 2014-01-15 | 哈电集团（秦皇岛）重型装备有限公司 | Ultrasonic testing method adopting multiple probes |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103512953A (en) * | 2013-09-27 | 2014-01-15 | 哈电集团（秦皇岛）重型装备有限公司 | Ultrasonic testing method adopting multiple probes |
| CN103512953B (en) * | 2013-09-27 | 2015-11-25 | 哈电集团（秦皇岛）重型装备有限公司 | Adopt multi-probe supersonic testing method |
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Granted publication date: 20140312 |